|
|
 |
|
X-Ray Diffraction (XRD) |
|
Phillips PANalytical X'Pert PRO
|
- XRD system specialized on polycrystalline samples, powder samples and nanoparticles
- wide range scans (2 θ) for phase analysis
- Rocking curves (ω) used to quantify grain size and mosaic spread in crystalline materials
- X-ray reflectivity (XRR) for determining thickness, roughness, and density of thin films (<200nm)
- Anode: Cu: non-monochromatized X-rays, with a weighted average wavelength of 0.15418 nm
- Incident beam optics: Automatic Divergent Slit, Mirror for parallel beam
- Sample stages: Spinner (for powder), Capillary Spinner (for particles in solution), IR-Stage (for thin films)
- Detectors: X'Celerator (very fast), Miniprop (for parallel beam optics, XRR)
Photos: XRD setup - sample geometry
Contact:
M. Farle
V. Ney
|
|
|
