High resolution TEM (HR-TEM): FEI Tecnai F20

• Investigation of e.g. nanoparticles from gas and liquid phase
• Schottky field emission gun (FEG)
• Max. acceleration voltage 200 kV- resulting electron wavelength: 2.51 pm
• Super twin lens CS 1.2 mm
• Point resolution 0.23 nm
• Information limit: 0.15 nm
• For imaging: Gatan Multiscan CCD camera model 794IF
• For analytical TEM-methods (static and scanning modes): Gatan GIF2001 - electron spectrometer system with Gatan Multiscan CCD camera model 794
• Energy resolution about 1 eV
• EDX system: Tecnai-30(ST)
• Fishione: High angle-annular dark-field detector
• Pressure at sample: 10^-6 to 10^-7 mbar
• Typical sample thickness: < 50 nm, 10 nm perfect, preparation e.g. with PIPS,
• Max. TEM-grid diameter: 3 mm
• Fishione Ar-O-plasma cleaner for sample and sample holder cleaning

Sample holders:

• FEI single tilt holder
• FEI double tilt holder
• Fishione thomopraphy single tilt holder
• Gatan cooling holder (T_min = 80 K)
• Gatan vacuum transfer holder
• Nanofactory: combined scanning tunneling microscope
• Nanofactory: combined atomic force microscope
• Gatan Heating sample holder for temperatures up to 1000°C

Software:

• Xplore3D
• Inspect3D
• Mac Tempas
• TrueImage

Kontakt:
M. Farle
M. Spasova