HRTEM Labor

High Resolution Transmission electron microscopy (HRTEM)FEI Tecnai F20
High resolution TEM (HR-TEM): FEI Tecnai F20
- Investigation of e.g. nanoparticles from gas and liquid phase
- Schottky field emission gun (FEG)
- Max. acceleration voltage 200 kV- resulting electron wavelength: 2.51 pm
- Super twin lens CS 1.2 mm
- Point resolution 0.23 nm
- Information limit: 0.15 nm
- For imaging: Gatan Multiscan CCD camera model 794IF
- For analytical TEM-methods (static and scanning modes): Gatan GIF2001 - electron spectrometer system with Gatan Multiscan CCD camera model 794
- Energy resolution about 1 eV
- EDX system: Tecnai-30(ST)
- Fishione: High angle-annular dark-field detector
- Pressure at sample: 10-6 to 10-7 mbar
- Typical sample thickness: < 50 nm, 10 nm perfect, preparation e.g. with PIPS,
- Max. TEM-grid diameter: 3 mm
- Fishione Ar-O-plasma cleaner for sample and sample holder cleaning
Sample holders:
- FEI single tilt holder
- FEI double tilt holder
- Fishione thomopraphy single tilt holder
- Gatan cooling holder (Tmin = 80 K)
- Gatan vacuum transfer holder
- Nanofactory: combined scanning tunneling microscope
- Nanofactory: combined atomic force microscope
- Gatan Heating sample holder for temperatures up to 1000°C
Software:
- Xplore3D
- Inspect3D
- Mac Tempas
- TrueImage
Kontakt:
M. Farle
M. Spasova