HRTEM Labor

High Resolution Transmission electron microscopy (HRTEM)FEI Tecnai F20

High resolution TEM (HR-TEM): FEI Tecnai F20

  • Investigation of e.g. nanoparticles from gas and liquid phase
  • Schottky field emission gun (FEG)
  • Max. acceleration voltage 200 kV- resulting electron wavelength: 2.51 pm
  • Super twin lens CS 1.2 mm
  • Point resolution 0.23 nm
  • Information limit: 0.15 nm
  • For imaging: Gatan Multiscan CCD camera model 794IF
  • For analytical TEM-methods (static and scanning modes): Gatan GIF2001 - electron spectrometer system with Gatan Multiscan CCD camera model 794
  • Energy resolution about 1 eV
  • EDX system: Tecnai-30(ST)
  • Fishione: High angle-annular dark-field detector
  • Pressure at sample: 10-6 to 10-7 mbar
  • Typical sample thickness: < 50 nm, 10 nm perfect, preparation e.g. with PIPS,
  • Max. TEM-grid diameter: 3 mm
  • Fishione Ar-O-plasma cleaner for sample and sample holder cleaning

Sample holders:

  • FEI single tilt holder
  • FEI double tilt holder
  • Fishione thomopraphy single tilt holder
  • Gatan cooling holder (Tmin = 80 K)
  • Gatan vacuum transfer holder
  • Nanofactory: combined scanning tunneling microscope
  • Nanofactory: combined atomic force microscope
  • Gatan Heating sample holder for temperatures up to 1000°C

Software:

  • Xplore3D
  • Inspect3D
  • Mac Tempas
  • TrueImage

Kontakt:
M. Farle
M. Spasova