2022 |
- S. Sleziona, A. Pelella, E. Faella, O. Kharsah, L. Skopinski, A. Maas, Y. Liebsch, A. Di Bartolomeo, and M. Schleberger
Manipulation of the electrical and memory properties of MoS2 field-effect transistors by highly charged ion irradiation
submitted; arXiv
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2022 |
- L. Skopinski, S. Kretschmer, P. Ernst, M. Herder, L. Madauß, L. Breuer, A. V. Krasheninnikov, and M.Schleberger
Velocity distributions of particles sputtered from supported 2D-MoS2 during highly charged ion irradiation
submitted; arXiv
|
2021 |
- L. Skopinski, P. Ernst, M. Herder, R. Kozubek, L. Madauß, S. Sleziona, A. Maas, N. Königstein, A. Wucher, and M. Schleberger
Time-of-flight mass spectrometry of particle emission during irradiation with slow, highly charged ions
Rev. Sci. Instr., 92 (2021) 023909; Original Publication
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2020 |
- L. Madauß, E. Pollmann, T. Foller, J. Schumacher, U. Hagemann, T. Heckhoff, M. Herder, L. Skopinski, L. Breuer, A. Hierzenberger, A. Wittmar, H. Lebius, A. Benyagoub, M. Ulbricht, R. Joshi, and M. Schleberger
A swift technique to hydrophobize graphene and increase its mechanical stability and charge carrier density
npj 2D Materials and Applications 4 (2020) 11; Original Publication
- M. Herder, P. Ernst, L. Skopinski, B. Weidtmann, M. Schleberger, and A. Wucher
Ionization Probability of Sputtered Indium Atoms under Impact of Slow Highly Charged Ions
J. Vac. Sci. Technol. B 38 (2020) 044003; Original Publication
see also: SciLight
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