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Fakultät für Physik, Experimentalphysik
Anschrift
Lotharstr. 1
47057 Duisburg
Raum
MF 263

Funktionen

  • Vertrauensdozent der DFG an der Universität Duisburg-Essen, Experimentalphysik
  • Prodekan/in, Dekanat Fakultät für Physik
  • Leiter, Arbeitsgruppe Prof. Horn-von Hoegen
Portrait-Bild

Die folgenden Publikationen sind in der Online-Universitätsbibliographie der Universität Duisburg-Essen verzeichnet. Weitere Informationen finden Sie gegebenenfalls auch auf den persönlichen Webseiten der Person.

    Artikel in Zeitschriften

  • Hafke, Bernd; Brand, Christian; Witte, Tobias; Sothmann, Björn; Horn-von Hoegen, Michael; Erwin, Steven C.
    Thermally Induced Crossover from 2D to 1D Behavior in an Array of Atomic Wires : Silicon Dangling-Bond Solitons in Si(553)-Au
    In: Physical Review Letters Jg. 124 (2020) Nr. 1, S. 016102
    ISSN: 1079-7114; 0031-9007
  • Hafke, Bernd; Witte, Tobias; Janoschka, David; Dreher, Pascal; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Condensation of ground state from a supercooled phase in the Si(111)-(4 × 1) → (8 × 2)-indium atomic wire system
    In: Structural Dynamics Jg. 6 (2019) Nr. 4, S. 045101
    ISSN: 2329-7778
  • Tinnemann, Verena; Streubühr, C.; Hafke, Bernd; Witte, Tobias; Kalus, A.; Hanisch-Blicharski, A.; Ligges, M.; Zhou, Ping; von der Linde, Dietrich; Bovensiepen, Uwe; Horn-von Hoegen, Michael
    Decelerated lattice excitation and absence of bulk phonon modes at surfaces : Ultra-fast electron diffraction from Bi(111) surface upon fs-laser excitation
    In: Structural Dynamics Jg. 6 (2019) Nr. 6, S. 065101
    ISSN: 2329-7778
  • Chen, S.; Horn-von Hoegen, Michael; Thiel, P. A.; Tringides, M. C.
    Diffraction paradox : An unusually broad diffraction background marks high quality graphene
    In: Physical Review B Jg. 100 (2019) Nr. 15, S. 155307
    ISSN: 2469-9969; 2469-9969
  • Chen, S.; Horn-von Hoegen, Michael; Thiel, Patricia A.; Tringides, Michael C.
    Diffraction paradox : An unusually broad diffraction background marks high quality graphene
    In: Physical Review B Jg. 100 (2019) Nr. 15, S. 155307
    ISSN: 2469-9969; 2469-9950
  • Petrović, Marin; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Equilibrium shape of single-layer hexagonal boron nitride islands on iridium
    In: Scientific Reports Jg. 9 (2019) Nr. 1, S. 19553
    ISSN: 2045-2322
  • Hafke, Bernd; Witte, Tobias; Brand, Christian; Duden, Thomas; Horn-von Hoegen, Michael
    Pulsed electron gun for electron diffraction at surfaces with femtosecond temporal resolution and high coherence length
    In: Review of Scientific Instruments Jg. 90 (2019) S. 045119
    ISSN: 1089-7623; 0034-6748
  • Meyer, Dennis; Jnawali, Giriraj; Hattab, Hichem; Horn-von Hoegen, Michael
    Rapid onset of strain relief by massive generation of misfit dislocations in Bi(111)/Si(001) heteroepitaxy
    In: Applied Physics Letters Jg. 114 (2019) Nr. 8, S. 081601-1 - 081601-5
    ISSN: 1077-3118
  • Podbiel, Daniel; Kahl, Philip; Frank, Bettina; Davis, Timothy J.; Giessen, Harald; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Spatiotemporal Analysis of an Efficient Fresnel Grating Coupler for Focusing Surface Plasmon Polaritons
    In: ACS Photonics Jg. 6 (2019) Nr. 3, S. 600 - 604
    ISSN: 2330-4022
  • Omambac, Karim; Hattab, Hichem; Brand, Christian; Jnawali, Giriraj; N'Diaye, Alpha T.; Coraux, Johann; van Gastel, Raoul; Poelsema, Bene; Michely, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Temperature-Controlled Rotational Epitaxy of Graphene
    In: Nano Letters Jg. 19 (2019) Nr. 7, S. 4594 - 4600
    ISSN: 1530-6992; 1530-6984
  • Tinnemann, Verena; Streubühr, Carla; Hafke, Bernd; Kalus, Annika; Hanisch-Blicharski, Anja; Ligges, Manuel; Zhou, Ping; von der Linde, Dietrich; Bovensiepen, Uwe; Horn-von Hoegen, Michael
    Ultrafast electron diffraction from a Bi(111) surface : Impulsive lattice excitation and Debye Waller analysis at large momentum transfer
    In: Structural Dynamics Jg. 6 (2019) Nr. 3, S. 035101
    ISSN: 2329-7778
  • Kahl, Philip; Podbiel, Daniel; Schneider, Christian; Makris, Andreas; Sindermann, Simon; Witt, Christian; Kilbane, Deirdre; Horn-von Hoegen, Michael; Aeschlimann, Martin; Meyer zu Heringdorf, Frank
    Direct observation of Surface Plasmon Polariton Propagation and Interference by Time-Resolved Imaging in Normal-Incidence Two Photon Photoemission Microscopy
    In: Plasmonics Jg. 13 (2018) Nr. 1, S. 239 - 246
    ISSN: 1557-1963; 1557-1955
  • Petrović, Marin; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Lateral heterostructures of hexagonal boron nitride and graphene : BCN alloy formation and microstructuring mechanism
    In: Applied Surface Science Jg. 455 (2018) S. 1086 - 1094
    ISSN: 0169-4332
  • Frigge, Tim; Hafke, Bernd; Witte, Tobias; Krenzer, Boris; Horn-von Hoegen, Michael
    Non-equilibrium lattice dynamics of one-dimensional in chains on Si(111) upon ultrafast optical excitation
    In: Structural Dynamics Jg. 5 (2018) Nr. 2, S. 025101
    ISSN: 2329-7778
  • Horn-von Hoegen, Michael
    Ultrafast switching in an atomic wire system at surfaces
    In: MRS Bulletin Jg. 43 (2018) Nr. 7, S. 512 - 519
    ISSN: 0883-7694
  • Podbiel, Daniel; Kahl, Philip; Makris, Andreas; Frank, Bettina; Sindermann, Simon; Davis, Timothy J.; Giessen, Harald; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Imaging the Nonlinear Plasmoemission Dynamics of Electrons from Strong Plasmonic Fields
    In: Nano Letters Jg. 17 (2017) Nr. 11, S. 6569 - 6574
    ISSN: 1530-6984
  • Petrović, Marin; Hagemann, Ulrich; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Microanalysis of single-layer hexagonal boron nitride islands on Ir(111)
    In: Applied Surface Science Jg. 420 (2017) S. 504 - 510
    ISSN: 0169-4332
  • Witte, Tobias; Frigge, Tim; Hafke, Bernd; Krenzer, Boris; Horn-von Hoegen, Michael
    Nanoscale interfacial heat transport of ultrathin epitaxial hetero films : Few monolayer Pb(111) on Si(111)
    In: Applied Physics Letters Jg. 110 (2017) Nr. 24, S. 243103
    ISSN: 1077-3118; 0003-6951
  • Frigge, Tim; Hafke, Bernd; Witte, Tobias; Krenzer, Boris; Streubühr, Carla; Samad Syed, Abdul; Mikšić Trontl, Vesna; Avigo, Isabella; Zhou, Ping; Ligges, Manuel; von der Linde, Dietrich; Bovensiepen, Uwe; Horn-von Hoegen, Michael; Wippermann, Stefan; Lücke, Andreas; Sanna, Simone; Gerstmann, Uwe; Schmidt, Wolf Gerp
    Optically excited structural transition in atomic wires on surfaces at the quantum limit
    In: Nature Jg. 544 (2017) Nr. 7649, S. 207 - 211
    ISSN: 0028-0836; 1476-4687
  • Frank, Bettina; Kahl, Philip; Podbiel, Daniel; Spektor, Grisha; Orenstein, Meir; Fu, Liwei; Weiss, Thomas; Horn-von Hoegen, Michael; Davis, Timothy J; Meyer zu Heringdorf, Frank; Giessen, Harald
    Short-range surface plasmonics : localized electron emission dynamics from a 60-nm spot on an atomically flat single-crystalline gold surface
    In: Science Advances Jg. 3 (2017) Nr. 7, S. e1700721
    ISSN: 2375-2548
  • Hattab, Hichem; Hupalo, Myron S.; Hershberger, M. T.; Horn-von Hoegen, Michael; Tringides, Michael C.
    A combined STM and SPA-LEED study of the "explosive" nucleation and collective diffusion in Pb/Si(111)
    In: Surface Science Jg. 646 (2016) Nr. April, S. 50 - 55
    ISSN: 0167-2584
  • Kirschbaum, Pierre; Brendel, Lothar; Roos, Kelly R.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Decay of isolated hills and saddles on Si(001)
    In: Materials Research Express Jg. 3 (2016) Nr. 8, S. 085011
    ISSN: 2053-1591
  • McDougall, Daniel; Hattab, Hichem; Hershberger, Matthew; Hupalo, Myron S.; Horn-von Hoegen, Michael; Thiel, Patricia A.; Tringides, Michael C.
    Dy uniform film morphologies on graphene studied with SPA-LEED and STM
    In: Carbon Jg. 108 (2016) S. 283 - 290
    ISSN: 1873-3891; 0008-6223
  • Hafke, Bernd; Frigge, Tim; Witte, Tobias; Krenzer, Boris; Aulbach, Julian; Schäfer, Jörg; Claessen, Ralph; Erwin, Steve C.; Horn-von Hoegen, Michael
    Two-dimensional interaction of spin chains in the Si(553)-Au nanowire system
    In: Physical Review B Jg. 94 (2016) Nr. 16, S. 161403
    ISSN: 2469-9969; 1095-3795
  • Klein, Claudius; Vollmers, N. J.; Gerstmann, Uwe; Zahl, Percy; Lükermann, Daniel; Jnawali, Giriraj; Pfnür, Herbert; Tegenkamp, Christoph; Sutter, Peter; Schmidt, Wolf G.; Horn-von Hoegen, Michael
    Barrier-free subsurface incorporation of 3d metal atoms into Bi(111) films
    In: Physical Review B Jg. 91 (2015) Nr. 19, S. 195441
    ISSN: 2469-9950
  • Frigge, Tim; Hafke, Bernd; Tinnemann, Verena; Krenzer, Boris; Horn-von Hoegen, Michael
    Nanoscale heat transport from Ge hut, dome, and relaxed clusters on Si(001) measured by ultrafast electron diffraction
    In: Applied Physics Letters Jg. 106 (2015) Nr. 5, S. 053108-1 - 053108-4
    ISSN: 0003-6951; 1077-3118
  • Frigge, Tim; Hafke, Bernd; Tinnemann, Verena; Witte, Tobias; Krenzer, Boris; Horn-von Hoegen, Michael
    Nanoscale thermal transport in self-organized epitaxial Ge nanostructures on Si(001)
    In: Semiconductor Science and Technology Jg. 30 (2015) Nr. 10, S. 105027
    ISSN: 1361-6641; 0268-1242
  • Frigge, Tim; Hafke, Bernd; Tinnemann, Verena; Witte, Tobias; Horn-von Hoegen, Michael
    Spot profile analysis and lifetime mapping in ultrafast electron diffraction : lattice excitation of self-organized Ge nanostructures on Si(001)
    In: Structural Dynamics Jg. 2 (2015) Nr. 3, S. 035101
    ISSN: 2329-7778
  • Sokolowski-Tinten, Klaus; Li, Renkai; Reid, Alexander Hume; Weathersby, Stephen P.; Quirin, Florian; Chase, Tyler; Coffee, Ryan; Corbett, Jeff; Fry, Alan R.; Hartmann, Nick; Hast, Carsten; Hettel, Bob; Horn-von Hoegen, Michael; Janoschka, David; Lewandowski, James R.; Ligges, Manuel; Meyer zu Heringdorf, Frank; Shen, Xiaozhe; Vecchione, Theodore; Witt, Christian; Wu, J.; Durr, Hermann; Wang, X. J.
    Thickness-dependent electron-lattice equilibration in laser-excited thin Bismuth films
    In: New Journal of Physics Jg. 2015 (2015) Nr. 17, S. 113047
    ISSN: 1367-2630
  • Streubühr, Carla; Kalus, Annika; Zhou, Ping; Ligges, Manuel; Hanisch-Blicharski, Anja; Kammler, Martin; Bovensiepen, Uwe; Horn-von Hoegen, Michael; von der Linde, Dietrich
    Comparing ultrafast surface and bulk heating using time-resolved electron diffraction
    In: Applied Physics Letters Jg. 104 (2014) S. 161611
    ISSN: 1077-3118
  • Klasing, Friedrich; Frigge, Tim; Hafke, Bernd; Krenzer, Boris; Wall, Simone; Hanisch-Blicharski, Anja; Horn-von Hoegen, Michael
    Hysteresis proves that the In/Si(111) (8x2) to (4x1) phase transition is first-order
    In: Physical Review B Jg. 89 (2014) S. 121107
    ISSN: 2469-9950
  • Hattab, Hichem; Jnawali, Giriraj; Horn-von Hoegen, Michael
    In-situ high-resolution low energy electron diffraction study of strain relaxation in heteroepitaxy of Bi(111) on Si(001) : interplay of strain state, misfit dislocation array and lattice parameter
    In: Thin Solid Films Jg. 570 (2014) Nr. PA, S. 159 - 163
    ISSN: 0040-6090
  • Kahl, Philip; Wall, Simone; Witt, Christian; Schneider, Christian; Bayer, Daniela; Fischer, Alexander; Melchior, Pascal; Horn-von Hoegen, Michael; Aeschlimann, Martin; Meyer zu Heringdorf, Frank
    Normal-Incidence Photoemission Electron Microscopy (NI-PEEM) for Imaging Surface Plasmon Polaritons
    In: Plasmonics Jg. 9 (2014) Nr. 6, S. 1401 - 1407
    ISSN: 1557-1963; 1557-1955
  • Klein, Claudius; Vyshnepolsky, Michael; Kompch, Alexander; Klasing, Friedrich; Hanisch-Blicharski, Anja; Winterer, Markus; Horn-von Hoegen, Michael
    Strain state, film and surface morphology of epitaxial topological insulator Bi2Se3 films on Si(111)
    In: Thin Solid Films Jg. 564 (2014) S. 241 - 245
    ISSN: 0040-6090
  • Klein, Claudius; Heidmann, Inga; Nabbefeld, Tobias; Speckmann, Moritz; Schmidt, Thomas; Meyer zu Heringdorf, Frank; Falta, Jens; Horn-von Hoegen, Michael
    Al-induced faceting of Si(113)
    In: Surface Science Jg. 618 (2013) S. 109 - 114
    ISSN: 0039-6028; 1879-2758
  • Lükermann, Daniel; Sologub, S.; Pfnür, Herbert; Klein, Claudius; Horn-von Hoegen, Michael; Tegenkamp, Christoph
    Effect of adsorbed magnetic and non-magnetic atoms on electronic transport through surfaces with strong spin-orbit coupling
    In: Materials Science and Engineering Technology = Materialwissenschaft und Werkstofftechnik Jg. 44 (2013) Nr. 2-3, S. 210 - 217
    ISSN: 1521-4052; 0049-8688; 0933-5137
  • Vyshnepolsky, Michael; Klein, Claudius; Klasing, Friedrich; Hanisch-Blicharski, Anja; Horn-von Hoegen, Michael
    Epitaxial growth of the topological insulator Bi2Se3 on Si(111) : Growth mode, lattice parameter, and strain state
    In: Applied Physics Letters Jg. 103 (2013) Nr. 11, S. 111909-1 - 111909-4
    ISSN: 0003-6951; 1077-3118
  • Frigge, Tim; Wall, Simone; Krenzer, Boris; Wippermann, Stefan; Sanna, Simone; Klasing, Friedrich; Hanisch-Blicharski, Anja; Kammler, Martin; Schmidt, Wolf G.; Horn-von Hoegen, Michael
    Frigge et al. Reply : Comment on “Atomistic Picture of Charge Density Wave Formation at Surfaces”
    In: Physical Review Letters Jg. 111 (2013) Nr. 14, S. 149601 - 149602
    ISSN: 1079-7114; 0031-9007
  • Sakong, Sung; Kratzer, Peter; Wall, Simone; Kalus, Annika; Horn-von Hoegen, Michael
    Mode conversion and long-lived vibrational modes in lead monolayers on silicon (111) after femtosecond laser excitation : a molecular dynamics simulation
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 88 (2013) S. 115419-1 - 115419-8
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Sojka, Falko; Meissner, Matthias; Zwick, Christian; Forker, Roman; Vyshnepolsky, Michael; Klein, Claudius; Horn-von Hoegen, Michael; Fritz, Torsten
    To tilt or not to tilt : correction of the distortion caused by inclined sample surfaces in low-energy electron diffraction
    In: Ultramicroscopy: a journal committed to the advancement of new methods, tools and theories in microscopy Jg. 133 (2013) S. 35 - 40
    ISSN: 0304-3991; 1879-2723
  • Hanisch-Blicharski, Anja; Janzen, Andreas; Krenzer, Boris; Wallutis, Simone; Klasing, Friedrich; Kalus, Annika; Frigge, Tim; Kammler, Martin; Horn-von Hoegen, Michael
    Ultra-fast electron diffraction at surfaces: From nanoscale heat transport to driven phase transitions
    In: Ultramicroscopy Jg. 127 (2013) S. 2 - 8
    ISSN: 0304-3991; 1879-2723
  • Wall, Simone; Krenzer, Boris; Wippermann, Stefan; Sanna, Simone; Klasing, Friedrich; Hanisch-Blicharski, Anja; Kammler, Martin; Schmidt, Wolf G.; Horn-von Hoegen, Michael
    Atomistic picture of charge density wave formation at surfaces
    In: Physical Review Letters Jg. 109 (2012) Nr. 18, S. 186101
    ISSN: 1079-7114; 0031-9007
  • Hanisch-Blicharski, Anja; Krenzer, Boris; Wall, Simone; Kalus, Annika; Frigge, Tim; Horn-von Hoegen, Michael
    Heat transport through interfaces with and without misfit dislocation arrays
    In: Journal of Materials Research Jg. 27 (2012) Nr. 21, S. 2718 - 2723
    ISSN: 0884-2914; 2044-5326
  • Payer, T.; Klein, Carsten; Acet, Mehmet; Ney, V.; Kammler, Martin; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    High-quality epitaxial Bi(111) films on Si(111) by isochronal annealing
    In: Thin Solid Films Jg. 520 (2012) Nr. 23, S. 6905 - 6908
    ISSN: 0040-6090
  • Hattab, Hichem; N'Diaye, Alpha T.; Wall, Dirk; Klein, Claudius; Jnawali, Giriraj; Coraux, Johann; Busse, Carsten; van Gastel, Raoul; Poelsema, Bene; Michely, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Interplay of wrinkles, strain, and lattice parameter in graphene on iridium
    In: Nano Letters Jg. 12 (2012) Nr. 2, S. 678 - 682
    ISSN: 1530-6992; 1530-6984
  • Jnawali, Giriraj; Klein, Claudius; Wagner, Thomas; Hattab, Hichem; Zahl, Percy; Acharya, Danda P.; Sutter, Peter; Lorke, Axel; Horn-von Hoegen, Michael
    Manipulation of electronic transport in the Bi(111) surface state
    In: Physical Review Letters Jg. 108 (2012) Nr. 26, S. 266804
    ISSN: 1079-7114; 0031-9007
  • Lükermann, Daniel; Sologub, Sergei; Pfnür, Herbert; Klein, Claudius; Horn-von Hoegen, Michael; Tegenkamp, Christoph
    Scattering at magnetic and nonmagnetic impurities on surfaces with strong spin-orbit coupling
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 86 (2012) Nr. 19, S. 195432
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Zhou, Ping; Streubühr, Carla; Ligges, Manuel; Brazda, Thorsten; Payer, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael; von der Linde, Dietrich
    Transient anisotropy in the electron diffraction of femtosecond laser-excited bismuth
    In: New Journal of Physics Jg. 14 (2012) S. 103031
    ISSN: 1367-2630
  • Moutanabbir, Oussama; Senz, Stephan; Scholz, Roland; Alexe, Marin; Kim, Yunseok; Pippel, Eckhard; Wang, Yewu; Wiethoff, Christian; Nabbefeld, Tobias; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Atomically smooth p-doped silicon nanowires catalyzed by aluminum at low temperature
    In: ACS Nano Jg. 5 (2011) Nr. 2, S. 1313 - 1320
    ISSN: 1936-086X; 1936-0851
  • Sindermann, Simon; Witt, Christian; Spoddig, Detlef; Horn-von Hoegen, Michael; Dumpich, Günter; Meyer zu Heringdorf, Frank
    Epitaxial Ag wires with a single grain boundary for electromigration
    In: Review of Scientific Instruments Jg. 82 (2011) Nr. 12, S. 123907
    ISSN: 1089-7623; 0034-6748
  • Hattab, Hichem; N'Diaye, Alpha T.; Wall, Dirk; Jnawali, Giriraj; Coraux, Johann; Busse, Carsten; van Gastel, Raoul; Poelsema, Bene; Michely, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Growth temperature dependent graphene alignment on Ir(111)
    In: Applied Physics Letters Jg. 98 (2011) Nr. 14, S. 141903
    ISSN: 0003-6951; 1077-3118
  • Klein, Claudius; Nabbefeld, Tobias; Hattab, Hichem; Meyer, D.; Jnawali, Giriraj; Kammler, Martin; Meyer zu Heringdorf, Frank; Golla-Franz, A.; Müller, B.H.; Schmidt, T.H.; Henzler, M.; Horn-von Hoegen, Michael
    Lost in reciprocal space? : Determination of scattering condition in spot profile analysis low energy electron diffraction
    In: Review of Scientific Instruments Jg. 82 (2011) Nr. 3, S. 35111
    ISSN: 1089-7623; 0034-6748
  • Wall, Dirk; Tikhonov, S.; Sindermann, Simon; Spoddig, Detlef; Hassel, Christoph; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Shape, orientation, and crystalline composition of silver islands on Si(111)
    In: IBM Journal of Research and Development Jg. 55 (2011) Nr. 4,
    ISSN: 0018-8646
  • Sindermann, Simon; Wall, Dirk; Roos, K.R.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Anisotropy of Ag Diffusion on Vicinal Si Surfaces
    In: e-Journal of Surface Science and Nanotechnology Jg. 8 (2010) S. 372 - 376
    ISSN: 1348-0391
  • Lu, Wei; Nicoul, Matthieu; Shymanovich, Uladzimir; Tarsevitch, Alexander; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    Extreme phonon softening in laser-excited Bismuth - towards an inverse Peierls-transition
    In: MRS Proceedings Jg. 1230E (2010) S. 3 - 5
  • Wall, Dirk; Lohmar, I.; Roos, Kelly Ryan; Krug, J.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Imaging diffusion fields on a surface with multiple reconstructions: Ag/Si(111)
    In: New Journal of Physics Jg. 12 (2010) Nr. 10, S. 103019
    ISSN: 1367-2630
  • Nabbefeld, Tobias; Wiethoff, Christian; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Silver Induced Faceting of Si(112)
    In: Applied Physics Letters Jg. 97 (2010) Nr. 4,
    ISSN: 1077-3118; 0003-6951
  • Jnawali, Giriraj; Wagner, Th.; Hattab, Hichem; Möller, Rolf; Lorke, Axel; Horn-von Hoegen, Michael
    Two-dimensional electron transport and scattering in Bi(111) surface states
    In: e-Journal of Surface Science and Nanotechnology Jg. 8 (2010) S. 27 - 31
    ISSN: 1348-0391
  • Sciaini, Germán; Harb, Maher; Kruglik, Sergei G.; Payer, Thomas; Hebeisen, Christoph T.; Meyer zu Heringdorf, Frank; Yamaguchi, Mariko; Horn-von Hoegen, Michael; Ernstorfer, Ralph; Miller, R. J. Dwayne
    Electronic acceleration of atomic motions and disordering in bismuth
    In: Nature Jg. 458 (2009) S. 56 - 59
    ISSN: 0028-0836; 1476-4687
  • Jnawali, Giriraj; Hattab, Hichem; Bobisch, Christian; Zubkov, E.; Deiter, C.; Weisemoeller, T.; Bertram, F.; Wollschläger, J.; Möller, Rolf; Horn-von Hoegen, Michael
    Epitaxial growth of Bi(111) on Si(001)
    In: e-Journal of Surface Science and Nanotechnology Jg. 7 (2009) S. 441 - 447
    ISSN: 1348-0391
  • N'Diaye, Alpha T.; van Gastel, Raoul; Martínez-Galera, Antonio J; Coraux, Johann; Hattab, Hichem; Meyer zu Heringdorf, Frank; Wall, Dirk; Horn-von Hoegen, Michael; Gomez-Rodriguez, José M; Poelsema, Bene; Busse, Carsten; Michely, Thomas
    In situ observation of stress relaxation in epitaxial graphene
    In: New Journal of Physics Jg. 11 (2009) S. 113056
    ISSN: 1367-2630
  • Jnawali, Giriraj; Hattab, Hichem; Bobisch, Christian; Bernhart, Alexander; Zubkov, E.; Möller, Rolf; Horn-von Hoegen, Michael
    Nanoscale dislocation patterning in Bi(1 1 1)/Si(0 0 1) heteroepitaxy
    In: Surface Science Jg. 603 (2009) Nr. 13, S. 2057 - 2061
    ISSN: 0039-6028; 0039-6028
  • Jnawali, Giriraj; Wagner, Th.; Hattab, Hichem; Möller, Rolf; Horn-von Hoegen, Michael
    Nucleation and initial growth in the semimetallic homoepitaxial system of Bi on Bi(111),
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 79 (2009) Nr. 19, S. 193306
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Krenzer, Boris; Hanisch-Blicharski, Anja; Schneider, P.; Payer, Thomas; Möllenbeck, Simone; Osmani, Orkahn; Kammler, Martin; Meyer, Ralf; Horn-von Hoegen, Michael
    Phonon confinement effects in ultrathin epitaxial bismuth films on silicon studied by time-resolved electron diffraction
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 80 (2009) Nr. 2, S. 24307
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • van Gastel, Raoul; N'Diaye, Alpha T.; Wall, Dirk; Coraux, Johann; Busse, Carsten; Mohamadie Buckanie, Niemma; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael; Michely, Thomas; Poelsema, Bene
    Selecting a single orientation for millimeter sized graphene sheets
    In: Applied Physics Letters Jg. 95 (2009) Nr. 12, S. 121901
    ISSN: 0003-6951; 1077-3118
  • Mohamadie Buckanie, Niemma; Göhre, J.; Zhou, Ping; von der Linde, Dietrich; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Space charge effects in photoemission electron microscopy using amplifed femtosecond laser pulses
    In: Journal of Physics: Condensed Matter Jg. 21 (2009) Nr. 31, S. 314003
    ISSN: 1361-648X; 0953-8984
  • Jnawali, Giriraj; Meyer zu Heringdorf, Frank; Wall, Dirk; Sindermann, Simon; Horn-von Hoegen, Michael
    Stable tungsten disilicide contacts for surface and thin film resistivity measurements
    In: Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics ; Materials, Processing, Measurement, and Phenomena Jg. 27 (2009) Nr. 1, S. 180
    ISSN: 0734-211X; 1071-1023
  • Wall, Dirk; Sindermann, Simon; Roos, K.R.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    The influence of anisotropic diffusion on Ag nanowire formation
    In: Journal of Physics: Condensed Matter Jg. 21 (2009) Nr. 31, S. 314023
    ISSN: 1361-648X; 0953-8984
  • Hanisch-Blicharski, Anja; Krenzer, Boris; Möllenbeck, Simone; Ligges, Manuel; Zhou, Ping; Kammler, Martin; Horn-von Hoegen, Michael
    Transient Cooling of Ultrathin Epitaxial Bi(111)-Films on Si(111) upon Femtosecond Laser Excitation Studied by Ultrafast Reflection High Energy Electron Diffraction"
    In: MRS Proceedings Jg. 1172 (2009) S. 4 - 8
    ISSN: 1946-4274
  • Kury, Peter; Roos, Kelly R.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Absence of surface stress change during pentacene thin film growth on the Si(111)-(7x7) surface : a buried reconstruction interface
    In: New Journal of Physics Jg. 10 (2008) S. 23037
    ISSN: 1367-2630
  • Wiethoff, Christian; Ross, Frances M.; Copel, Matthew; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Au stabilization and coverage of sawtooth facets on Si nanowires grown by vapor-liquid-solid epitaxy
    In: Nanoletters Jg. 8 (2008) Nr. 9, S. 3065 - 3068
    ISSN: 1530-6992; 1530-6984
  • Horn-von Hoegen, Michael
    Der Widerstand eines Atoms : Elektromigration im Miniaturformat
    In: Unikate : Berichte aus Forschung und Lehre (2008) Nr. 32 : Naturwissenschaften – Oberflächenphysik, S. 8 - 21
    ISSN: 0944-6060
  • Kury, Peter; Roos, Kelly Ryan; Thien, Dagmar; Möllenbeck, Simone; Wall, Dirk; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Disorder-mediated ordering by self-interfactant effect in organic thin film growth of pentacene on silicon
    In: Organic Electronics Jg. 9 (2008) Nr. 4, S. 461 - 465
    ISSN: 1566-1199
  • Hattab, Hichem; Zubkov, E.; Bernhart, Alexander; Jnawali, Giriraj; Bobisch, Christian; Krenzer, Boris; Acet, Mehmet; Möller, Rolf; Horn-von Hoegen, Michael
    Epitaxial Bi(111) films on Si(001) : strain state, surface morphology, and defect structure
    In: Thin Solid Films Jg. 516 (2008) Nr. 23, S. 8227 - 8231
    ISSN: 0040-6090
  • Meyer zu Heringdorf, Frank; Roos, Kimberly L.; Wiethoff, Christian; Horn-von Hoegen, Michael; Roos, Kelly R.
    Growth of Ag nanowires on Au-pre-facetted 4° vicinal Si(0 0 1)
    In: Surface Science Jg. 602 (2008) Nr. 10, S. 1852 - 1857
    ISSN: 0039-6028
  • Krenzer, Boris; Hanisch-Blicharski, Anja; Duvenbeck, Andreas; Rethfeld, Bärbel; Horn-von Hoegen, Michael
    Heat transport in nanoscale heterosystems: a numerical simulation and analytical solution
    In: Journal of Nanomaterials (2008) S. 590609
    ISSN: 1687-4110
  • Jnawali, Giriraj; Hattab, Hichem; Bobisch, Christian; Bernhart, Alexander; Zubkov, E.; Möller, Rolf; Horn-von Hoegen, Michael
    Homoepitaxial growth of Bi(111)
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 78 (2008) Nr. 3,
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Wall, Dirk; Roos, Kelly Ryan; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    LEEM/PEEM Study of Anisotropic Diffusion Fields in the Ag/Si(001) System
    In: MRS Online Proceedings Library Archive Jg. 1088 (2008)
    ISSN: 1946-4274
  • Roos, Kelly Ryan; Roos, Kimberly L.; Lohmar, I.; Wall, Dirk; Krug, J.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Real-Time View of Mesoscopic Surface Diffusion
    In: Physical Review Letters Jg. 100 (2008)
    ISSN: 1079-7114; 0031-9007
  • Hanisch-Blicharski, Anja; Krenzer, Boris; Pelka, Tobias; Möllenbeck, Simone; Horn-von Hoegen, Michael
    Thermal response of epitaxial thin Bi films on Si(001) upon femtosecond laser excitation studied by ultrafast electron diffraction
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 77 (2008) Nr. 12, S. 125410
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Payer, Thomas; Rajkovic, Ivan; Ligges, Manuel; von der Linde, Dietrich; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Ultrathin epitaxially grown bismuth (111) membranes
    In: Applied Physics Letters Jg. 93 (2008) Nr. 9, S. 93102
    ISSN: 1077-3118
  • Janzen, A.; Krenzer, Boris; Heinz, Oliver; Zhou, Ping; Thien, Dagmar; Hanisch-Blicharski, Anja; Meyer zu Heringdorf, Frank; von der Linde, Dietrich; Horn-von Hoegen, Michael
    A pulsed electron gun for ultrafast electron diffraction at surfaces
    In: Review of Scientific Instruments Jg. 78 (2007) Nr. 1, S. 13906
    ISSN: 1089-7623; 0034-6748
  • Shymanovich, Uladzimir; Nicoul, Matthieu; Blums, J.; Sokolowski-Tinten, Klaus; Tarasevitch, Alexander; Wietler, T.; Horn-von Hoegen, Michael; von der Linde, Dietrich
    Diffraction of strongly convergent X-rays from picosecondacoustic transients
    In: Applied Physics A: Materials Science & Processing Jg. 87 (2007) Nr. 1, S. 7 - 11
    ISSN: 1432-0630; 0947-8396
  • Thien, Dagmar; Kury, Peter; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank; van Heys, J.; Lindenblatt, M.; Pehlke, E.
    Domain Sensitive Contrast in Photoelectron Emission Microscopy
    In: Physical Review Letters Jg. 99 (2007) Nr. 19, S. 196102
    ISSN: 1079-7114; 0031-9007
  • Meyer zu Heringdorf, Frank; Chelaru, L.I.; Möllenbeck, Simone; Thien, Dagmar; Horn-von Hoegen, Michael
    Femtosecond p „„ hotoemission microscopy.
    In: Surface Science 601 (2007) S. 4700 - 4705
  • Meyer zu Heringdorf, Frank; Chelaru, L.I.; Möllenbeck, S.; Thien, Dagmar; Horn-von Hoegen, Michael
    Femtosecond photoemission microscopy
    In: Surface Science Jg. 601 (2007) Nr. 20, S. 4700 - 4705
    ISSN: 0039-6028
  • Jnawali, Giriraj; Hattab, Hichem; Meyer zu Heringdorf, Frank; Krenzer, Boris; Horn-von Hoegen, Michael
    Lattice-matching periodic array of misfit dislocations: Heteroepitaxy of Bi(111) on Si(001),
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 76 (2007) Nr. 3, S. 35337
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Jnawali, Giriraj; Hattab, Hichem; Bobisch, Christian; Bernhart, A.; Zubkov, E.; Meyer zu Heringdorf, Frank; Möller, Rolf; Krenzer, Boris; Horn-von Hoegen, Michael
    Nanopattern Formation by Periodic Array of Interfacial Misfit Dislocations in Bi(111)/Si(001) Heteroepitaxy
    In: MRS Online Proceedings Library Archive Jg. 1059 (2007)
    ISSN: 1946-4274
  • Fritz, D.M.; Reis, D.A.; Adams, B.; Akre, R.A.; Arthur, J.; Blome, C.; Bucksbaum, P.H.; Cavalieri, A.L.; Engemann, S.; Fahy, S.; Falcone, R.W.; Fuoss, P.H.; Gaffney, K.J; George, M.J.; Hajdu, J.; Hertlein, M.P.; Hillyard, P.B.; Horn-von Hoegen, Michael; Kammler, Martin; Kaspar, J.; Kienberger, R.; Krejcik, P.; Lee, S.H.; Lindenberg, A.M.; McFarland, B.; Meyer, D.; Montagne, T.; Murray, E.D.; Nelson, A.J.; Nicoul, Matthieu; Pahl, R.; Rudati, J.; Schlarb, H.; Siddons, D.P.; Sokolowski-Tinten, Klaus; Tschentscher, Th.; von der Linde, Dietrich; Hastings, J.B.
    Ultrafast bond softening in Bismuth: Mapping a solid`s interatomic potential with X-rays
    In: Science Jg. 315 (2007) Nr. 5812, S. 633 - 636
    ISSN: 0036-8075; 1095-9203
  • Pennec, Y.; Horn-von Hoegen, Michael; Zhu, Xiaobin; Fortin, D.C.; Freeman, M.R.
    Dynamics of an Ising chain under local excitation: An STM study of Si(100) dimer rows at T = 5K
    In: Physical Review Letters Jg. 96 (2006) Nr. 2,
    ISSN: 1079-7114; 0031-9007
  • Stahlmecke, Burkhard; Meyer zu Heringdorf, Frank; Chelaru, L.I.; Horn-von Hoegen, Michael; Roos, Kelly R.; Dumpich, Günter
    Electromigration in single-crystalline self-organized silver nanowires.
    In: Applied Physics Letters Jg. 88 (2006) Nr. 5,
    ISSN: 1098-0121
  • Chelaru, L.I.; Horn-von Hoegen, Michael; Thien, Dagmar; Meyer zu Heringdorf, Frank
    Fringe Fields in Nonlinear Photoemission Microscopy
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 73 (2006) Nr. 11,
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Jnawali, Giriraj; Hattab, Hichem; Krenzer, B.; Horn-von Hoegen, Michael
    Lattice accommodation of epitaxial Bi(111) films on Si(001) studied with SPA-LEED and AFM,
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 74 (2006) Nr. 19,
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Schmidt, Th.; Kröger, R.; Flege, J.I.; Clausen, T.; Falta, J.; Janzen, A.; Zahl, P.; Kury, Peter; Kammler, Martin; Horn-von Hoegen, Michael
    Less strain energy despite fewer misfit dislocations: The impact of ordering
    In: Physical Review Letters Jg. 96 (2006) Nr. 6,
    ISSN: 1079-7114; 0031-9007
  • Krenzer, B.; Janzen, A.; Zhou, Ping; von der Linde, Dietrich; Horn-von Hoegen, Michael
    Thermal Boundary Conductance in Heterostructures Studied by Ultrafast Electron Diffraction,
    In: New Journal of Physics Jg. 8 (2006) S. 190
    ISSN: 1367-2630
  • Janzen, A.; Krenzer, B.; Zhou, Ping; von der Linde, Dietrich; Horn-von Hoegen, Michael
    Ultrafast electron diffraction at surfaces after laser excitation
    In: Surface Science Jg. 600 (2006) Nr. 18, S. 4094 - 4098
    ISSN: 0039-6028
  • Kury, Peter; Hild, R.; Thien, Dagmar; Günter, H.-L.; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Compact and transferable threefold evaporator for molecular beam epitaxy in ultrahigh vacuum
    In: Review of Scientific Instruments Jg. 76 (2005) Nr. 8,
    ISSN: 1089-7623; 0034-6748
  • Roos, Kelly Ryan; Roos, Kimberley L.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    High Temperature self-assembly of Ag nanowires on vicinal Si(001)
    In: Journal of Physics: Condensed Matter Jg. 17 (2005) Nr. 16, S. 1407
    ISSN: 1361-648X; 0953-8984
  • Kammler, Martin; Horn-von Hoegen, Michael
    Low energy electron diffraction of epitaxial growth of bismuth on Si(111),
    In: Surface Science Jg. 576 (2005) Nr. 1-3, S. 56 - 60
    ISSN: 0039-6028
  • Meyer zu Heringdorf, Frank; Pietsch, H.; Horn-von Hoegen, Michael
    Reciprocal Space Mapping by spot profile analyzing low energy electron diffraction
    In: Review of Scientific Instruments Jg. 76 (2005) Nr. 8, S. 85102
    ISSN: 1089-7623; 0034-6748
  • Kury, Peter; Grabosch, T.; Horn-von Hoegen, Michael
    SSIOD: the next generation
    In: Review of Scientific Instruments Jg. 76 (2005) Nr. 2,
    ISSN: 1089-7623; 0034-6748
  • AlFalou, A.A.; Kammler, Martin; Horn-von Hoegen, Michael
    Strain state analysis of hetero-epitaxial systems
    In: EPL (Europhysics Letters) Jg. 69 (2005) Nr. 4, S. 570
    ISSN: 1286-4854; 0295-5075
  • Schmidt, Th.; Kröger, R.; Clausen, T.; Falta, J.; Janzen, A.; Kammler, Martin; Kury, Peter; Zahl, P.; Horn-von Hoegen, Michael
    Surfactant-mediated epitaxy of Ge on Si(111): beyond the surface
    In: Applied Physics Letters Jg. 86 (2005) Nr. 11,
    ISSN: 1077-3118; 0003-6951
  • Sokolowski-Tinten, Klaus; Blome, C.; Blums, J.; Shymanovich, Uladzimir; Nicoul, Matthieu; Cavalleri, Andrea; Tarasevitch, Alexander; Horn-von Hoegen, Michael; Kammler, Martin; von der Linde, Dietrich
    Ultrafast X-Ray Diffraction
    In: Ultrafast Phenomena XIV Jg. 79 (2005) S. 170 - 174
  • Thien, Dagmar; Meyer zu Heringdorf, Frank; Kury, Peter; Horn-von Hoegen, Michael
    Characterizing Single Crystal Surfaces using High Resolution Electron Diffraction,
    In: Analytical and Bioanalytical Chemistry Jg. 379 (2004) Nr. 4, S. 588 - 593
    ISSN: 1618-2642; 1618-2650
  • Kury, Peter; Zahl, P.; Horn-von Hoegen, Michael; Voges, C.; Frischat, H.; Günter, H.-L.; Pfnür, H.; Henzler, M.
    Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperatures
    In: Review of Scientific Instruments Jg. 75 (2004) Nr. 11,
    ISSN: 1089-7623; 0034-6748
  • Kury, Peter; Zahl, P.; Horn-von Hoegen, Michael
    Direct observation of reconstruction induced changes of surface stress for Sb on Si(111),
    In: Analytical and Bioanalytical Chemistry Jg. 379 (2004) Nr. 4, S. 582 - 587
    ISSN: 1618-2642; 1618-2650
  • Kury, Peter; Horn-von Hoegen, Michael
    Impact of thermal dependence of elastic constants on surface stress measurements
    In: Review of Scientific Instruments Jg. 75 (2004) Nr. 5,
    ISSN: 1089-7623; 0034-6748
  • Kury, Peter; Zahl, P.; Horn-von Hoegen, Michael
    Precise calibration for surface stress induced optical deflection measurements
    In: Review of Scientific Instruments Jg. 75 (2004) Nr. 6,
    ISSN: 1089-7623; 0034-6748
  • Horn-von Hoegen, Michael; Müller, B.H.; Grabosch, T.; Kury, Peter
    Strain relief during Ge hut cluster formation on Si(001) studied by high resolution LEED and surface-stress-induced optical deflection,
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 70 (2004) Nr. 23, S. 235213
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Kammler, Martin; Horn-von Hoegen, Michael
    Transition in growth mode by competing strain relaxation mechanisms: surfactant mediated epitaxy of SiGe alloys on Si
    In: Applied Physics Letters Jg. 85 (2004) Nr. 15,
    ISSN: 1077-3118; 0003-6951
  • Menzel, A.; Conrad, E.H.; Tringides, M.C.; Kammler, Martin; Horn-von Hoegen, Michael
    Finite collection time effects in autocovariance function measurements
    In: Journal of Applied Physics Jg. 93 (2003) Nr. 4, S. 2229 - 2235
    ISSN: 0021-8979; 1089-7550
  • Horn-von Hoegen, Michael
    Ge on Si(001) - a hetero epitaxial playground for surface science
    In: Surface Science Jg. 537 (2003) Nr. 1-3, S. 1 - 3
    ISSN: 0039-6028
  • Meyer zu Heringdorf, Frank; Hild, R.; Zahl, P.; Schmidt, Th.; Ressel, B.; Heun, S.; Bauer, E.; Horn-von Hoegen, Michael
    Erratum to: Local Au coverage as driving force for Au induced faceting of vicinal Si(001):a LEEM and XPEEM study
    In: Surface Science Jg. 496 (2002) Nr. 1-2, S. 151
    ISSN: 0039-6028
  • Hild, R.; Seifert, C.; Kammler, Martin; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael; Zachuk, R.; Olshanetsky, B. Z.
    Kinetics of Au induced faceting of vicinal Si(111),
    In: Surface Science Jg. 512 (2002) Nr. 1-2, S. 117 - 127
    ISSN: 0039-6028
  • Hild, R.; Kammler, Martin; Dumkow, I.; Horn-von Hoegen, Michael
    Self-organisation of Ge nanostructures on i(111): A SPA-LEED and STM Study,
    In: Omicron Newsletter Jg. 5 (2002) Nr. 3, S. 2
  • Kammler, Martin; Horn-von Hoegen, Michael; Voss, N.; Tringides, M.; Menzel, A.; Conrad, E.H.
    Si(001)step dynamics: a temporal low-energy electron diffraction study
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 65 (2002) Nr. 7, S. 75312 - 75319
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Tegenkamp, C.; Wollschläger, J.; Pfnür, H.; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Step and kink correlations on vicinal Ge(100) surfaces investigated by electron diffraction
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 65 (2002) Nr. 23, S. 235316
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Zahl, P.; Horn-von Hoegen, Michael
    Third-generation generation cone-shaped SPA-LEED
    In: Review of Scientific Instruments Jg. 73 (2002) Nr. 8, S. 2958 - 2962
    ISSN: 1089-7623; 0034-6748
  • Sokolowski-Tinten, Klaus; Blome, C.; Dietrich, C.; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, Andrea; Squier, J.A.; Kammler, Martin
    Time-Resolved X-ray Diffraction Study of Ultrafast Structural Dynamics in Laser-Excited Solids
    In: Ultrafast Phenomena XIII Jg. 71 (2002) S. 36
  • Seifert, C.; Horn-von Hoegen, Michael; Zhachuk, R.A.; Olshanetsky, B.Z.
    Au induced reconstructions on Si(111)
    In: Surface science Jg. 488 (2001) Nr. 1-2, S. 233 - 238
    ISSN: 0039-6028
  • Yuhara, J.; Morita, K.; Falta, J.; Müller, B.H.; Horn-von Hoegen, Michael
    Characterization of Ge deltadoped Si(111) with RBS-channeling
    In: Surface and Interface Analysis Jg. 31 (2001) Nr. 8, S. 754 - 760
  • Sokolowski-Tinten, Klaus; Blome, C.; Dietrich, C.; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, Andrea; Squier, J.; Kammler, Martin
    Femtosecond X-ray measurement of ultrafast melting and large acoustic transients
    In: Physical Review Letters Jg. 87 (2001) Nr. 22,
    ISSN: 1079-7114; 0031-9007
  • Meyer zu Heringdorf, Frank; Hild, R.; Zahl, P.; Schmidt, Th.; Ressel, B.; Heun, S.; Bauer, E.; Horn-von Hoegen, Michael
    Local Au coverage as driving force for Au induced faceting of vicinal Si(001): a LEEM and XPEEM study,
    In: Surface Science Jg. 480 (2001) Nr. 3, S. 103 - 108
    ISSN: 0039-6028
  • Meyer zu Heringdorf, Frank; Schmidt, Th.; Heun, S.; Hild, R.; Zahl, P.; Ressel, B.; Bauer, E.; Horn-von Hoegen, Michael
    Spatial Variation of Au Coverage as the Driving Force for Nanoscopic Pattern Formation
    In: Physical Review Letters Jg. 86 (2001) Nr. 22, S. 5088 - 5091
    ISSN: 1079-7114; 0031-9007
  • Janzen, A.; Dumkow, I.; Horn-von Hoegen, Michael
    Thermal activation of dislocation array formation
    In: Applied Physics Letters Jg. 79 (2001) Nr. 15,
    ISSN: 0003-6951
  • Sokolowski-Tinten, Klaus; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, Andrea; Siders, Craig W.; Brown, F.L.H.; Leitner, D.M.; Tóth, Csaba; Barty, Christopher P.P.; Squier, J.A.; Wilson, Kent R.; Kammler, Martin
    Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast x-ray diffraction
    In: Journal de Physique . IV France Jg. 11 (2001) Nr. PR2, S. 473 - 477
    ISSN: 1155-4304
  • Cavalleri, Andrea; Siders, Craig W.; Rose-Petruck, Christoph G.; Jimenez, Ralph; Tóth, Csaba; Squier, J.A.; Barty, Christopher P.P.; Wilson, Kent R.; Sokolowski-Tinten, Klaus; Horn-von Hoegen, Michael; von der Linde, Dietrich
    Ultrafast x-ray measurement of laser heating in semiconductors: Parameters determining the melting threshold"
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 63 (2001) Nr. 19,
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Cavalleri, Andrea; Siders, Craig W.; Brown, F.L.H.; Leitner, D.M.; Tóth, Csaba; Squier, J.A.; Barty, Christopher P.P.; Wilson, Kent R.; Sokolowski-Tinten, Klaus; Horn-von Hoegen, Michael; von der Linde, Dietrich; Kammler, Martin
    Anharmonic lattice dynamics in Germanium measured with ultrafast x-ray diffraction
    In: Physical Review Letters Jg. 85 (2000) Nr. 3, S. 586 - 589
    ISSN: 1079-7114; 0031-9007
  • Hild, R.; Meyer zu Heringdorf, Frank; Zahl, P.; Horn-von Hoegen, Michael
    Au induced regular ordered striped domain wall structure of a (5x3) reconstruction on Si(001) studied by STM and SPA-LEED,
    In: Surface Science Jg. 454-456 (2000) S. 851 - 855
    ISSN: 0039-6028
  • Minoda, H.; Shimakura, T.; Yagi, K.; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Formation of hill and valley structures on Si(001) vicinal surfaces studied by spot-profile-analyzing LEED
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 61 (2000) Nr. 8, S. 5672 - 5678
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Meyer zu Heringdorf, Frank; Goldbach, H.; Guenter, H.L.; Horn-von Hoegen, Michael; Dorna, V.; Koehler, U.; Henzler, M.
    Hydrogen induced domain-wall structure on Si(113)
    In: Surface Science Jg. 458 (2000) Nr. 1-3, S. 147 - 154
    ISSN: 0039-6028
  • Sokolowski-Tinten, Klaus; Cavalleri, Andrea; Siders, Craig W.; Brown, F.L.H.; Leitner, D.M.; Tóth, Csaba; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Squier, J.A.; Barty, Christopher P.P.; Wilson, Kent R.
    Time-resolved X-ray diffraction study of ultrafast acoustic phonon dynamics in Ge/Si heterostructures
    In: Ultrafast Phenomena XII Jg. 66 (2000) S. 281 - 283
  • Kammler, Martin; Schmidt, Th.; Zahl, P.; Kury, P.; Falta, J.; Horn-von Hoegen, Michael
    3-dim. Reciprocal space mapping of a quasi periodic misfit dislocation array
    In: HASYLAB/DESY Annual Report (1999)
  • Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank; Hild, R.; Zahl, P.; Schmidt, Th.; Bauer, E.
    Au induced giant faceting of vicinal Si(001)
    In: Surface Science Jg. 433-435 (1999) S. 475 - 480
    ISSN: 0039-6028
  • Meyer zu Heringdorf, Frank; Hild, R.; Zahl, P.; Horn-von Hoegen, Michael; Schmidt, Th.; Heun, S.; Ressel, B.; Bauer, E.
    Au induced giant faceting of vicinal Si(001)
    In: Elettra Highlights Jg. 98-99 (1999) S. 42 - 44
    ISSN: 0391-4259
  • Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank; Kammler, Martin; Schaeffer, C.; Reinking, Dirk; Hofmann, Karl R.
    Bi surfactant mediated epitaxy of Ge on Si(111)
    In: Thin Solid Films Jg. 343-344 (1999) S. 579 - 582
    ISSN: 0040-6090
  • Siders, Craig W.; Cavalleri, Andrea; Sokolowski-Tinten, Klaus; Toth, Csabe; Guo, Ting; Kammler, Martin; Horn-von Hoegen, Michael; Wilson, Kent R.; von der Linde, Dietrich; Barty, Christopher P.P.
    Detection of nonthermal melting by ultrafast X-ray diffraction
    In: Science Jg. 286 (1999) Nr. 5443, S. 1340 - 1342
    ISSN: 0036-8075; 1095-9203
  • Reinking, Dirk; Kammler, Martin; Hoffmann, N.; Horn-von Hoegen, Michael; Hofmann, Karl R.
    Fabrication of high-mobility Ge p-channel MOSFETs on Si substrates
    In: Electronic Letters Jg. 35 (1999) S. 503 - 504
    ISSN: 0013-5194
  • Minoda, H.; Yagi, K.; Meyer zu Heringdorf, Frank; Meier, A.; Kähler, D.; Horn-von Hoegen, Michael
    Gold-induced faceting on a Si(001) vicinal surface: SPA-LEED and REM study
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 59 (1999) Nr. 3, S. 2363 - 2375
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Minoda, H.; Shimakura, T.; Yagi, K.; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Gold-induced faceting on a Si(hhm) surface (m/h=1.4-1.5) studied by SPA-LEED
    In: Surface Science Jg. 432 (1999) Nr. 1-2, S. 69 - 80
    ISSN: 0039-6028
  • Horn-von Hoegen, Michael
    Growth of semiconductor layers studied by spot profile analysing low energy electron diffraction
    In: Zeitschrift für Kristallographie Jg. 214 (1999) S. 684 - 721
    ISSN: 0044-2968
  • Zahl, P.; Kury, Peter; Horn-von Hoegen, Michael
    Interplay of surface morphology and strain relief during surfactant mediated epitaxy of Ge on Si
    In: Applied Physics A: Materials Science & Processing Jg. 69 (1999) Nr. 5, S. 481 - 488
    ISSN: 0947-8396
  • Horn-von Hoegen, Michael
    Spot profile analysis low energy electron diffraction of semiconductor growth
    In: Zeitschrift für Kristallographie Jg. 214 (1999) S. 591 - 629
    ISSN: 0044-2968
  • Kammler, Martin; Reinking, Dirk; Hofmann, Karl R.; Horn-von Hoegen, Michael
    Surfactant-mediated epitaxy of Ge on Si: progress in growth and electrical characterization
    In: Thin Solid Films Jg. 336 (1999) Nr. 1-2, S. 29 - 33
    ISSN: 0040-6090
  • Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank; Kähler, Dirk; Schmidt, Th.; Bauer, Ernst
    Adsorption induced giant faceting of vicinal Si(001)
    In: Thin Solid Films Jg. 336 (1998) Nr. 1-2, S. 16 - 21
    ISSN: 0040-6090
  • Meyer zu Heringdorf, Frank; Schmidt, Th.; Bauer, E.; Kähler, D.; Minoda, H.; Yagi, K.; Horn-von Hoegen, Michael
    Giant faceting of vicinal Si(001) induced by Au adsorption
    In: Surface Review and Letters Jg. 5 (1998) S. 1167 - 1178
    ISSN: 1793-6640
  • Falta, J.; Mielmann, O.; Schmidt, T.; Hille, A.; Sanchez-Hanke, C.; Sonntag, P.; Materlik, G.; Meyer zu Heringdorf, Frank; Kammler, Martin; Horn-von Hoegen, Michael; Copel, M.
    High concentration Bi delta-doping layers on Si(001)
    In: Applied Surface Science Jg. 123/124 (1998) S. 538 - 541
    ISSN: 0169-4332
  • Horn-von Hoegen, Michael; Minoda, H.; Yagi, H.; Meyer zu Heringdorf, Frank; Kähler, D.
    Macroscopic one-dimensional facetting of Si(100) upon Au adsorption
    In: Surface Science Jg. 402-404 (1998) S. 464 - 469
    ISSN: 0039-6028
  • Meier, A.; Zahl, P.; Vockenrodt, R.; Horn-von Hoegen, Michael
    Step arrangement control of vicinal Si(001) by Ag adsorption
    In: Applied Surface Science Jg. 123/124 (1998) S. 694 - 698
    ISSN: 0169-4332
  • Kammler, Martin; Falta, J.; Kury, Peter; Müller, B.H.; Schmidt, T.; Horn-von Hoegen, Michael
    Strain Field of Periodic Dislocation Networks of SME grown Ge on Si(111)
    In: HASYLAB/DESY Annual Report Jg. 0 (1998)
  • Henzler, M.; Thielking, D.; Horn-von Hoegen, Michael; Zielasek, V
    Surface morphology changes due to adsorbates and due to electron bombardement
    In: Physica A: Statistical Mechanics and its Applications Jg. 261 (1998) Nr. 1-2, S. 1 - 12
    ISSN: 0378-4371
  • Hofmann, Karl R.; Reinking, Dirk; Kammler, Martin; Horn-von Hoegen, Michael
    Surfactant-grown low-doped Germanium layers on Silicon with high electron mobilities
    In: Thin Solid Films Jg. 321 (1998) Nr. 1-2, S. 125 - 130
    ISSN: 0040-6090
  • Falta, J.; Bahr, D.; Materlik, G.; Müller, B.H.; Horn-von Hoegen, Michael
    X-ray characterization of buried delta layers
    In: Surface Review and Letters Jg. 5 (1998) S. 145 - 149
    ISSN: 1793-6640
  • Fölsch, S.; Meyer, G.; Winau, D.; Rieder, K.H.; Horn-von Hoegen, Michael; Schmidt, T.; Henzler, M.
    Ag-mediated step-bunching instability on vicinal Si(100)
    In: Surface Science Jg. 394 (1997) Nr. 1-3, S. 60 - 70
    ISSN: 0039-6028
  • Reinking, Dirk; Kammler, Martin; Horn-von Hoegen, Michael; Hofmann, Karl R.
    Enhanced Sb segregation in surfactant-mediated heterogrowth: High-mobility, low-doped Ge on Si
    In: Applied Physics Letters Jg. 71 (1997) Nr. 7, S. 924 - 926
    ISSN: 1077-3118; 0003-6951
  • Reinking, Dirk; Kammler, Martin; Horn-von Hoegen, Michael; Hofmann, Karl R.
    High electron mobilities in surfactant-grown Germanium on Silicon substrates
    In: Japanese Journal of Applied Physics Jg. 36 (1997) S. 1082 - 1085
    ISSN: 1347-4065
  • Horn-von Hoegen, Michael; Golla, Anke
    Adsorbate induced change of equilibrium surface during crystal growth: Si on Si(111)/H
    In: Physical Review Letters Jg. 76 (1996) Nr. 16, S. 2953 - 2956
    ISSN: 1079-7114; 0031-9007
  • Falta, J.; Bahr, D.; Hille, A.; Materlik, G.; Kammler, Martin; Horn-von Hoegen, Michael
    Stress reduction and interface quality of buried Sb delta-layers on Si(001)
    In: Applied Physics Letters Jg. 69 (1996) Nr. 19, S. 2906 - 2908
    ISSN: 0003-6951; 1077-3118
  • Falta, J.; Bahr, D.; Materlik, G.; Müller, B.H.; Horn-von Hoegen, Michael
    Towards perfect Ge delta layers on Si(001)
    In: Applied Physics Letters Jg. 68 (1996) Nr. 10, S. 1394 - 1396
    ISSN: 0003-6951; 1077-3118
  • Bahr, D.; Falta, J.; Materlik, G.; Müller, B.H.; Horn-von Hoegen, Michael
    X-ray interface characterization of Ge delta layers on Si(001)
    In: Physica B: Condensed Matter Jg. 221 (1996) Nr. 1-4, S. 96 - 100
    ISSN: 0921-4526
  • Fölsch, S.; Winau, D.; Meyer, G.; Rieder, K.H.; Horn-von Hoegen, Michael; Schmidt, T.; Henzler, M.
    Ag-induced multi-step formation on Si(001)
    In: Applied Physics Letters Jg. 67 (1995) Nr. 15, S. 2185 - 2187
    ISSN: 0003-6951; 1077-3118
  • Horn-von Hoegen, Michael; Schmidt, T.; Meyer, G.; Winau, D.; Rieder, K.H.
    Epitaxial layer growth of Ag(111)-films on Si(100)
    In: Surface Science Jg. 331–333 (1995) Nr. A, S. 575 - 579
    ISSN: 0039-6028
  • Falta, J.; Gog, T.; Materlik, G.; Müller, B.H.; Horn-von Hoegen, Michael
    Ge d -Layers on Si(111) and Si(001) grown by MBE and SPE
    In: MRS Proceedings Jg. 375 (1995) S. 177 - 180
  • Horn-von Hoegen, Michael; Golla, Anke
    Influence of H on low temperature Si(111) homoepitaxy
    In: Surface Science Jg. 337 (1995) Nr. 1–2, S. L777 - L782
    ISSN: 0039-6028
  • Falta, J.; Gog, T.; Materlik, G.; Müller, B.H.; Horn-von Hoegen, Michael
    Interface roughening of Ge delta layers on Si(111)
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 51 (1995) Nr. 12, S. 7598
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Horn-von Hoegen, Michael; Schmidt, T.; Henzler, M.; Meyer, G.; Winau, D.; Rieder, K.H.
    Lattice accomodation of Si(001) and Ag(111)
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 52 (1995) Nr. 15, S. 10764 - 10767
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Fölsch, S.; Meyer, G.; Winau, D.; Rieder, K.H.; Schmidt, T.; Horn-von Hoegen, Michael
    Reconstruction dependent orientation of Ag(111) films on Si(001)
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 52 (1995) Nr. 19, S. 13745 - 13748
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Horn-von Hoegen, Michael; Falta, J.; Copel, M.; Tromp, R.M.
    Surfactants in Si(111) homoepitaxy
    In: Applied Physics Letters Jg. 66 (1995) Nr. 4, S. 487 - 489
    ISSN: 0003-6951; 1077-3118
  • Horn-von Hoegen, Michael; Pietsch, Holger
    Homoepitaxy of Si(111) is surface defect mediated
    In: Surface Science Jg. 321 (1994) Nr. 1-2, S. 129 - 136
    ISSN: 0039-6028
  • Horn-von Hoegen, Michael; Henzler, M.
    Lattice matching periodic interfacial dislocation network in surfactant-mediated growth of Ge on Si(111)
    In: Physica status solidi: A - Applications and materials science Jg. 146 (1994) Nr. 1, S. 337 - 352
    ISSN: 1862-6319
  • Horn-von Hoegen, Michael; Müller, B.H.; Al Falou, A.
    Strain relief by micro roughness in surfactant mediated growth of Ge on Si(001)
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 50 (1994) Nr. 16, S. 11640 - 11652
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Horn-von Hoegen, Michael; Copel, Matthew; Tsang, J.; Reuter, M.C.; Tromp, R.M.
    Surfactant-mediated growth of Ge on Si(111)
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 50 (1994) Nr. 15, S. 10811 - 10822
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Horn-von Hoegen, Michael; Al Falou, A.; Müller, B.H.; Köhler, U.; Andersohn, L.; Dahlheimer, B.; Henzler, M.
    Surfactant-stabilized strained Ge cones on Si(100)
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 49 (1994) Nr. 4, S. 2637 - 2650
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Horn-von Hoegen, Michael
    Surfactants: Perfect heteroepitaxy of Ge on Si(111)
    In: Applied Physics A: Materials Science & Processing Jg. 59 (1994) Nr. 5, S. 503 - 515
    ISSN: 1432-0630
  • Horn-von Hoegen, Michael; Al Falou, A.; Pietsch, Holger; Müller, B.H.; Henzler, M.
    Formation of interfacial dislocation network in surfactant mediated growth of Ge on Si(111) investigated by Spa-Leed: Part I
    In: Surface Science Jg. 298 (1993) Nr. 1, S. 29 - 42
    ISSN: 0039-6028
  • Horn-von Hoegen, Michael; Pook, M.; Al Falou, A.; Müller, B.H.; Henzler, M.
    Surface morphology and strain relief in surfactant mediated growth of Ge on Si(111)
    In: Scanning Microscopy Jg. 7 (1993) S. 481 - 488
    ISSN: 0891-7035
  • Horn-von Hoegen, Michael; Müller, B.H.; Al Falou, A.; Henzler, M.
    Surfactant induced reversible changes of surface morphology
    In: Physical Review Letters Jg. 71 (1993) Nr. 19, S. 3170 - 3173
    ISSN: 1079-7114; 0031-9007
  • Horn-von Hoegen, Michael; Pook, M.; Al Falou, A.; Müller, B.H.; Henzler, M.
    The interplay of surface morphology and strain relief in surfactant mediated growth of Ge on Si(111)
    In: Surface Science Jg. 284 (1993) Nr. 1-2, S. 53 - 66
    ISSN: 0039-6028
  • Henzler, M.; Horn-von Hoegen, Michael; Köhler, U.
    Growth of monoatomic layers: investigations with electron diffraction and scanning tunneling microscopy,
    In: Advances in Solid State Physics Jg. 32 (1992) S. 333 - 353
    ISSN: 1438-4329
  • Köhler, U.; Jusko, O.; Müller, B.; Horn-von Hoegen, Michael; Pook, M.
    Layer-by -layer growth of germanium on Si(100): Strain induced morphology and the influence of surfactants
    In: Ultramicroscopy Jg. 42–44 (1992) Nr. 1, S. 832 - 837
    ISSN: 0304-3991
  • Tromp, R.M.; Copel, Matthew; Reuter, M.C.; Horn-von Hoegen, Michael; Speidell, J.
    A new two-dimensional particle detector for a toroidal electrostatic analyzer
    In: Review of Scientific Instruments Jg. 62 (1991) Nr. 11, S. 2679
    ISSN: 1089-7623; 0034-6748
  • Horn-von Hoegen, Michael; LeGoues, F.K.; Copel, Matthew; Reuter, M.C.; Tromp, R.M.
    Defect self-annihilation in surfactant-mediated epitaxial growth
    In: Physical Review Letters Jg. 67 (1991) Nr. 9, S. 1130
    ISSN: 1079-7114; 0031-9007
  • LeGoues, F.K.; Horn-von Hoegen, Michael; Copel, Matthew; Tromp, R.M.
    Strain-relief mechanism in surfactant-grown epitaxial germanium films on Si(111)
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 44 (1991) Nr. 23, S. 12894 - 12902
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Copel, Matthew; Reuter, M.C.; Horn-von Hoegen, Michael; Tromp, R.M.
    Influence of surfactants in Ge and Si epitaxy on Si(001),
    In: Physical Review B: Condensed Matter and Materials Physics Jg. 42 (1990) Nr. 18, S. 11682 - 11689
    ISSN: 1098-0121; 0163-1829; 1095-3795
  • Falta, J.; Horn-von Hoegen, Michael; Henzler, M.
    SPA-LEED studies of defects in thin epitaxial NiSi2 layers on Si(111)
    In: Applied Surface Science Jg. 41–42 (1989) S. 230 - 235
    ISSN: 0169-4332
  • Horn-von Hoegen, Michael; Falta, J.; Henzler, M.
    The initial stages of growth of silicon on Si(111) by spot profile analysing low-energy electron diffraction
    In: Thin Solid Films Jg. 183 (1989) Nr. 1-2, S. 213 - 220
    ISSN: 0040-6090
  • Horn-von Hoegen, Michael; Gotter, U.; Henzler, M.
    Low-energy electron diffraction investigations of Si molecular-beam epitaxy on Si(100)
    In: Journal of Vacuum Science & Technology B Jg. 6 (1988) Nr. 2, S. 727 - 730
    ISSN: 0734-211X
  • Altsinger, R.; Busch, H.; Horn-von Hoegen, Michael; Henzler, M.
    Nucleation and growth during molecular beam epitaxy (MBE) of Si on Si(111)
    In: Surface Science Jg. 200 (1988) Nr. 2-3, S. 235 - 246
    ISSN: 0039-6028
  • Horn-von Hoegen, Michael; Henzler, M.
    LEED studies of Si molecular beam epitaxy on Si(111)
    In: Journal of Crystal Growth Jg. 81 (1987) Nr. 1-4, S. 428 - 433
    ISSN: 0022-0248; 1873-5002
  • Beiträge in Sammelwerken und Tagungsbänden

  • Horn-von Hoegen, Michael
    Optically excited structural transition in atomic wires on surfaces at the quantum limit : A femtosecond ultrafast surface electron diffraction study
    In: Proceedings of SPIE: The International Society for Optical Engineering / Advances in Ultrafast Condensed Phase Physics 2018; Strasbourg; France; 23 - 24 April 2018 / Jg. 10673 2018, S. 1067304
    ISBN: 9781510618725 ISSN: 1996-756X; 0277-786X
  • Schröder, Jörg; Skatulla, S; Horn-von Hoegen, Michael
    A micromorphic continuum formulation for cardiac tissue mechanics
    In: Insights and Innovations in Structural Engineering, Mechanics and Computation: Proceedings of the Sixth International Conference on Structural Engineering, Mechanics and Computation, Cape Town, South Africa, 5-7 September 2016 / 6th International Conference on Structural Engineering, Mechanics, and Computation, SEMC 2016, 5-7 September 2016, Cape Town, South Africa; / Zingoni, Alphose (Hrsg.), 2016, S. 612 - 617
    ISBN: 978-1-138-02927-9
  • Sokolowski-Tinten, Klaus; Li, Renkai; Reid, Alex Hume M.; Weathersby, Stephen P.; Quirin, Florian; Chase, Tyler F.; Coffee, Ryan N.; Corbett, Jeff W.; Fry, Alan R.; Hartmann, Nick; Hast, Carsten; Hettel, Robert; Horn-von Hoegen, Michael; Janoschka, David; Jermann, M.; Lewandowski, James R.; Ligges, Manuel; Meyer zu Heringdorf, Frank; Mo, Mianzhen; Shen, Xiaozhe; Vecchione, Theodore; Witt, Christian; Wu, Juhao; Dürr, Hermann A.; Wang, Xijie
    Thickness dependent electron-lattice equilibration in thin Bi films studied by time-resolved MeV electron diffraction
    In: Proccedings of the International Conference on Ultrafast Phenomena 2016 / International Conference on Ultrafast Phenomena 2016, Santa Fe, New Mexico United States, 17-22 July 2016 / 2016
    ISBN: 978-1-943580-18-7
  • Meyer zu Heringdorf, Frank; Kahl, Philip; Makris, Andreas; Sindermann, Simon; Podbiel, Daniel; Horn-von Hoegen, Michael
    Signatures of plasmoemission in two photon photoemission electron microscopy
    In: Ultrafast phenomena and nanophotonics XIX / Betz, Markus (Hrsg.), 2015
    ISBN: 9781628414516
  • Schröder, Jörg; Brinkhues, S.; Brands, Dominik; Horn-von Hoegen, Michael
    Simulation of arterial walls under condsideration of residual stresses : A numerical approach
    In: Proceedings of the jointly organised 11th World Congress on Computational Mechanics (WCCM XI) / 11th World Congress of Computational Mechanics (WCCM XI), 20-25 July 2014, Barcelona, Spain; / Oñate, Eugenio (Hrsg.), 2014, S. 971 - 981
    ISBN: 978-84-942844-7-2
  • Nicoul, Matthieu; Quirin, Florian; Lindenberg, A.M.; Barty, A.; Fritz, D.M.; Zhu, D.; Lemke, H.; Chollet, M.; Reis, D.A.; Chen, J.; Ghimire, S.; Trigo, M.; Fuchs, M.; Gaffney, K.J.; Larsson, J.; Becker, Tim; Meyer, Sven; Payer, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael; Jerman, Martin; Sokolowski-Tinten, Klaus
    Ultrafast laser-induced melting and ablation studied by time-resolved diffuse X-ray scattering
    In: XVIIIth International Conference on Ultrafast Phenomena / XVIIIth International Conference on Ultrafast Phenomena Lausanne, Switzerland, July 8-13, 2012; / Chergui, M.; Taylor, A.; Cundiff, S. (Hrsg.), 2013, S. 04013
    ISBN: 978-2-7598-0956-1
  • Zhou, Ping; Streubühr, Carla; Kalus, Annika; Frigge, Tim; Wall, Simone; Hanisch-Blicharski, Anja; Kammler, Martin; Ligges, Manuel; Bovensiepen, Uwe; von der Linde, Dietrich; Horn-von Hoegen, Michael
    Ultrafast time resolved reflection high energy electron diffraction with tilted pump pulse fronts
    In: XVIIIth International Conference on Ultrafast Phenomena / XVIIIth International Conference on Ultrafast Phenomena Lausanne, Switzerland, July 8-13, 2012; / Chergui, M.; Taylor, A.; Cundiff, S. (Hrsg.), 2013, S. 10016-p1 - 10016-p3
    ISBN: 978-2-7598-0956-1
  • Frigge, Tim; Kalus, Annika; Klasing, Friedrich; Kammler, Martin; Hanisch-Blicharski, Anja; Horn-von Hoegen, Michael
    Nanoscale Heat Transport in Self-Organized Ge Clusters on Si(001)
    In: Nanoscale Thermoelectrics 2012: Materials and Transport Phenomena / Symposium JJ, Nanoscale Thermoelectrics - Materials and Transport Phenomena, April 9 - 13, 2012, San Francisco, California, USA / 2012, S. 51 - 56
    ISBN: 978-1-62748-252-3
  • Meyer zu Heringdorf, Frank; Wall, Dirk; Roos, K. R.; Lohmar, I.; Krug, J.; Horn-von Hoegen, Michael
    Dynamics of Reconstructed Zones Formed Around Islands on Si During Desorption: Diffusion Made Visible
    In: Proceedings of the ALC (International Symposium on Atomic Level Characterizations for New Materials and Devices) 11th Conference 2011, S. 372
  • Hanisch-Blicharski, Anja; Wall, Simone; Kalus, Annika; Frigge, Tim; Horn-von Hoegen, Michael
    Nanoscale Heat Transport through Epitaxial Ultrathin Hetero Films : Bi(111)/Si(001) and Bi(111)/Si(111)
    In: Phonons in nanomaterials: theory, experiments and applications / Symposium W, Phonons in Nanomaterials - Theory, Experiments and Applications, November 28 - December 3, 2011, Boston, Massachusetts, USA; / Shinde, S.L. (Hrsg.), 2011
    ISSN: 1946-4274
  • Lu, Wei; Nicoul, Matthieu; Shymanovich, Uladzimir; Tarasevitch, Alexander; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    Transient reversal of a Peierls-transition: Extreme phonon softening in laser-excited Bismuth
    In: Ultrafast Phenomena XVII: Proceedings of the 17th International Conference,The Silvertree Hotel and Snowmass Conference Center / Chergui, Majed; Jonas, David; Riedle, Eberhard; Schoenlein, Robert; Taylor, Antoinette (Hrsg.), 2011, S. 314
    ISBN: 9780199768370; 0199768374
  • Shymanovich, Uladzimir; Nicoul, Matthieu; Lu, Wei; Tarasevitch, Alexander; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    Coherent acoustic and optical phonons in laser-excited solids studied by ultrafast time-resolved X-ray diffraction
    In: International Symposium on High Power Laser Ablation 2010 / International Symposium on High Power Laser Ablation, Santa Fe, New Mexico, 18 - 22 April 2010; / Phipps, Claude R. (Hrsg.), 2010, S. 558 - 566
    ISBN: 978-0-7354-0828-9
  • Lu, Wei; Nicoul, Matthieu; Shymanovich, Uladzimir; Tarasevitch, Alexander; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    Extreme phonon softening in laser-excited Bismuth - Towards an inverse Peierls-transitiom
    In: Ultrafast processes in materials science / Ultrafast processes in materials science, November 30 - December 4, 2009, Boston, Massachusetts, USA / 2010, S. 18 - 22
    ISBN: 978-1-61738-761-6 ISSN: 1946-4274
  • Shymanovich, Uladzimir; Nicoul, Matthieu; Kähle, Stefan; Lu, Wei; Tarsevitch, Alexander; Zhou, Ping; Wietler, Tobias; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    The role of thermal and electronic pressure in the picosecond acoustic response of femtosecond laser-excited solids
    In: Ultrafast processes in materials science / Ultrafast processes in materials science, November 30 - December 4, 2009, Boston, Massachusetts, USA / 2010, S. 6
    ISBN: 978-1-61738-761-6 ISSN: 0272-9172
  • Lu, Wei; Nicoul, M.; Shymanovich, Uladzimir; Tarasevitch, Alexander; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    Transient reversal of a peierls-transition : Extreme phonon softening in laser-excited bismuth
    In: International Conference on Ultrafast Phenomena / International Conference on Ultrafast Phenomena, 18 - 23 July 2010, Snowmass Village, Colorado, United States / 2010
    ISBN: 978-1-55752-894-0 ISSN: 2162-2701
  • Möllenbeck, Simone; Hanisch-Blicharski, Anja; Schneider, Paul; Ligges, Manuel; Zhou, Ping; Kammler, Martin; Krenzer, Boris; Horn-von Hoegen, Michael
    Ultra-fast time-resolved electron diffraction of strongly driven phase transitions on silicon surfaces
    In: Materials Research Society Symposium Proceedings / Ultrafast processes in materials science, November 30 - December 4, 2009, Boston, Massachusetts, USA / 2010, S. 86 - 93
    ISBN: 978-1-61738-761-6 ISSN: 1946-4274
  • Ernstorfer, Ralph; Harb, Maher; Hebeisen, Christoph T.; Sciaini, German; Dartigalongue, T.; Rajkovic, Ivan; Ligges, Manuel; von der Linde, Dietrich; Payer, Thomas; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank; Kruglik, Sergei; Miller, R.J. Dwayne
    Atomic View of the Photoinduced Collapse of Gold and Bismuth
    In: Ultrafast Phenomena XVI: Proceedings of the 16th International Conference, Palazzo dei Congressi Stresa, Italy, June 9--13, 2008 2009, S. 113 - 115
    ISBN: 978-3-540-95946-5
  • Rajkovic, Ivan; Ligges, Manuel; Zhou, Ping; Payer, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael; von der Linde, Dietrich
    Electron-phonon energy transfer in Bi observed by time resolved electron diffraction
    In: Ultrafast Phenomena XVI: Proceedings of the 16th International Conference, Palazzo dei Congressi Stresa, Italy, June 9--13, 2008 2009, S. 110 - 112
    ISBN: 978-3-540-95946-5
  • Sokolowski-Tinten, Klaus; Shymanovich, Uladzimir; Nicoul, Matthieu; Blums, J.; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Morak, A.; Wietler, T.
    Energy relaxation and anomalies in the thermo-acoustic response of femtosecond laser-excited Germanium,
    In: Ultrafast Phenomena XV: Springer series in chemical physics ; 88 / Weiner, A.M.; Miller, R. J. D. (Hrsg.), 2006, S. 597 - 599
    ISBN: 3-540-68779-3; 978-3-540-68779-5
  • Horn-von Hoegen, Michael; Henzler, M.; Meyer, G.
    Ag on Si surfaces: from insulator to metal
    In: Morphological Organization in Epitaxial Growth: (Series on Directions in Condensed Matter Physics, Vol. 14) / Zhang, Zhenyu; Lagally, Max G. (Hrsg.), 1999, S. 403 - 420
    ISBN: 978-981-02-3471-3; 981-02-3471-6
  • Reinking, Dirk; Kammler, Martin; Hoffmann, N.; Horn-von Hoegen, Michael; Hofmann, Karl R.
    Ge p-MOSFETs Compatible with Si CMOS-Technology
    In: ESSDERC'99 : Proceedings of the 29th European solid-state device research conference / Maes,, H.E.; Mertens, R.P.; Declerk, G. (Hrsg.), 1999, S. 300 - 303
    ISBN: 2863322451; 9782863322451
  • Siders, Craig W.; Cavalleri, Andrea; Guo, Ting; Tóth, Csaba; Jimenez, Ralph; Rose-Petruck, Christoph G.; Wilson, Kent R.; Barty, Christopher P. P.; Sokolowski-Tinten, Klaus; von der Linde, Dietrich; Kammler, Martin; Horn-von Hoegen, Michael
    Ultrafast movies of atomic motion with femtosecond laser-based X-rays
    In: Soft X-Ray Lasers and Applications III / SPIE's International Symposium on Optical Science. Engineering, and Instrumentation, 18-23 July 1999, Denver, United State / 1999
  • Horn-von Hoegen, Michael
    Surfactant mediated heteroepitaxy: Interplay of diffusion, strain relief, and surface morphology
    In: Proc. NATO-ASI Workshop on Surface Diffusion: atomistic and Collective Processes / Tringide, M.C. (Hrsg.), 1997, S. 309 - 317
  • Horn-von Hoegen, Michael
    Formation of lattice matching interfacial dislocation network in surfactant mediated growth of Ge on Si(111) by an in situ SPA-LEED study
    In: Proceedings : 4th international conference on the formation of semiconductor interfaces (ICSFI-4) / Lengeler, Bruno (Hrsg.), 1994
    ISBN: 9810215592; 9789810215590
  • Horn-von Hoegen, Michael; Henzler, M.
    Crystal Growth Studies with LEED
    In: Proceedings of the 2nd Symposium of Surface Science in Kaprun, Österreich 1988
  • Horn-von Hoegen, Michael; Gotter, U.; Henzler, M.
    LEED investigations of Si MBE on Si(100)
    In: Proc. NATO-Workshop on RHEED and Reflection Electron Imaging of Surfaces / Larsen, P.K. (Hrsg.), 1988
  • Vorträge

  • Horn-von Hoegen, Michael;
    "It's not a trick, it's atomic soap" : Kristallwachstum mit Surfactants
    Die kleine Form, 28. Januar 2004, Essen,
    (2004)
    (Die kleine Form 2003/2004)