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www.leem-user.com
is hosted by the University of
Duisburg-Essen

 
 
 

X-ray Microscopy & AFM of PS-PMMA blends
by A. Hitchcock, C. Morin, H. Ade

Phase segregation in copolymer blends of polystyrene (PS) and polymethylmethacrylate (PMMA) has been studied using Scanning Transmission X-Ray Microscopy (STXM) to probe the bulk structure, and Photoemission Electron Microscopy (PEEM) to probe surface structure. Chemical maps of a 60+/-5 nm thin film of a 30:70 (w/w) PS-PMMA blend have been derived from PEEM and STXM C 1s image sequences. These are compared to atomic force microscopy (AFM) height and phase images in the figure. Both PEEM and STXM indicate the continuous phase is PS, not the majority PMMA component. The evolution of the bulk with annealing is clearly visualized by STXM. 

Authors:

Adam Hitchcock, Cynthia Morin, Harald Ade
Affiliation: The image was taken at the Advanced Light Source BL 7.0 with the Scanning Transmission X-ray Microscope (STXM)
Website: www-als.lbl.gov
Publication: C. Morin et al, JESRP 121 (2001) 203



 
 

University of Duisburg-Essen | AG Horn-von Hoegen


 
 



Au (5x3.2) Reconstruction Domains grown on Si(111). Courtesy of F. Meyer zu Heringdorf and R. Tromp, IBM.


Growth of Lead on Cu(111). Courtesy of Gary Kellog, Sandia



PEEM Images of Pentacene Islands on Si. Courtesy of F. Meyer zu Heringdorf and R. Tromp, IBM