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Welcome to the Literature Database
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Author
Journal
  Title Keyword   
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332 Results found

    E. Bauer,
    "Low Energy Electron Reflection Microscopy",
    Fifth Intern. Congress for Electron Microscopy (1962), Vol.1, ed. Sydney S. Breese, Jr. (Academic Press, New York), p.11-0.

    W. Koch, B. Bischoff and E. Bauer,
    "Combined ultrahigh vacuum electron emission and low energy electron microscopy",
    Proc. Fifth Europ. Congress on Electron Microscopy (1972), , p.58-59.

    E. Bauer and W. Dietzel,
    "Elastic and Inelastic Low Energy Electron Diffraction and Low Energy Electron Microscopy",
    Moderne Verfahren der Oberflächenanalyse. Dechema (1975), 78, p.23-56.

    E. Bauer,
    "Low energy electron reflection microscopy: possibilities and limitations",
    Electron Microscopy, eds. P. Csanady and D. Szabo, Budapest (1984), , p.591-592.

    E. Bauer,
    "The resolution of the low energy electron reflection microscope",
    Ultramicroscopy (1985), 17, p.51-56.
    click here for on-line version

    W. Telieps and E. Bauer,
    "An analytical reflection and emission UHV surface electron microscope",
    Ultramicroscopy (1985), 17, p.57-66.
    click here for on-line version

    E. Bauer and W. Telieps,
    "Low energy electron microscopy",
    Proc. XIth Inernt. Congress on Electron Microscopy, Kyoto (1986), , p.67-70.

    E. Bauer and W. Telieps,
    "Low energy electron microscopy",
    Scanning Microscopy Suppl. (Scanning Microscopy Int., Chicago) (1987), 1, p.99-108.

    W. Telieps, M. Mundschau and E. Bauer,
    "Dark field imaging with LEEM",
    Optik (1987), 77, p.93-97.

    W. Telieps and E. Bauer,
    "Low energy electron microscopy (LEEM)",
    Springer Series in Surface Science (Springer, Berlin) (1988), 11, p.53-57.

    E. Bauer and W. Telieps,
    "Low energy electron reflection microscopy (LEEM) and its application to the study of Si surfaces",
    Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces , eds. P.K. (1988), 188, p.381-384.

    W. Telieps and E. Bauer,
    "Low energy electron microscopy of surfaces",
    Surf. Sci. (1988), 200, p.512-513.
    click here for on-line version

    E. Bauer and W. Telieps,
    "Emission and low energy reflection electron microscopy",
    Surface and Interface Characterization by Electron Optical Methods, eds. A. Howie and U. Valdre, NAT (1988), 191, p.195-233.

    E. Bauer, W. Telieps and G. Turner,
    "Low energy electron microscopy (LEEM)",
    J. Vac. Sci. Technol. A (1988), 6, p.573-574.
    click here for on-line version

    E. Bauer,
    "Oberflaechenabbildung mit langsamen Elektronen",
    Physik. Blaetter (1988), 44, p.255-259.

    E. Bauer, M. Mundschau, W. Swiech and W. Telieps,
    "Low Energy Electron Microscopy",
    Inst. Phys. Conf. Ser.,EUREM 88, No.93 (IOP Publ. Ltd, York) (1988), 1, p.213-218.

    E. Bauer, M. Mundschau, W. Swiech and W. Telieps,
    "Low energy electron microscopy (LEEM) and photoemission microscopy (PEEM) of semiconductor surfaces",
    Evaluation of advanced semiconductor materials by electron microscopy (NATO ASI Series B: Physics), (1989), 203, p.283-294.

    E. Bauer, M. Mundschau, W. Swiech and W. Telieps,
    "Surface Studies by low energy electron microscopy (LEEM) and conventional UV photoemission electron microscopy",
    Ultramicroscopy (1989), 31, p.49-57.
    click here for on-line version

    E. Bauer,
    "Low energy electron microscopy",
    Chemistry and Physics of Solid Surfaces VIII (Springer Ser. Surface Science 22) eds. R. Vanselow and (1990), , p.267-287.

    E. Bauer, M. Mundschau, H. Pinkvos and W. Swiech,
    "Low energy electron microscopy of thin films",
    Le vide, les couches minces. Suppl. (1991), 259, p.26-31.

    E. Bauer, M. Mundschau and W. Swiech,
    "Low energy electron microscopy of nanometer scale phenomena",
    J. Vac. Sci. Technol. B (1991), 9, p.403-406.
    click here for on-line version

    E. Bauer, M. Mundschau, W. Swiech and W. Telieps,
    "Low energy electron microscopy of semiconductor surfaces",
    J. Vac. Sci. Technol. B (1991), 9, p.1007-1013.

    R.M. Tromp and M.C. Reuter,
    "Design of a New Photo-Emission / Low-Energy Electron Microscope for Surface Studies",
    Ultramicroscopy (1991), 36, p.99-106.
    click here for on-line version

    E. Bauer,
    "Low energy electron microscopy",
    Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Application. eds. Vu Thien (1993), , p.13-18.

    E. Bauer,
    "Low energy electron microscopy of surface processes",
    Appl. Surf. Sci. (1992), 60/61, p.350-358.

    E. Bauer,
    "Low Energy Electron Microscopy Studies of Growth Patterns on Surfaces and of Thin Films",
    Surface Disordering: Growth, Roughening and Phase Transitions, eds. R. Jullien, J. Kertesz, P. Meaki (1992), , p.125-132.

    R.M. Tromp and M.C. Reuter,
    "Low Energy Electron Microscopy",
    Materials Research Society Proceedings K.S. Liang, M.P. Anderson, R.F. Bruinsma, G. Scoles editors) (1992), 237, p.349-0.

    M. Mundschau, E. Bauer and W. Swiech,
    "Morphology of Monolayer Films Observed by Photoelectron and Low-Energy-Electron Microscopy",
    MRS Symp. Proc. (1993), 280, p.333-336.

    R.M. Tromp and M.C. Reuter,
    "Imaging with a Low Energy Electron Microscope",
    Ultramicroscopy (1993), 50, p.171-178.
    click here for on-line version

    R.M. Tromp, A.W. Denier van der Gon and M.C. Reuter,
    "In situ studies with the Low Energy Electron Microscope",
    Proceedings of the International Conference on the Formation of Semiconductor Interfaces, Julich 14- (1993), , p.0-0.

    E. Bauer,
    "Surface electron microscopy: the first thirty years",
    Surf. Sci. (1994), 299/300, p.102-115.
    click here for on-line version

    E. Bauer,
    "Low Energy Electron Microscopy",
    Rep. Prog. Phys. (1994), 57, p.895-938.
    click here for on-line version

    R.M. Tromp,
    "Low Energy Electron Microscopy",
    Materials Research Society Bulletin, June (1994), , p.0-0.

    E. Bauer,
    "Low Energy Electron Microscopy of Nanostructures",
    phys. stat. sol. (b) (1995), 192, p.375-387.

    R.M. Tromp,
    "In situ studies with Low Energy Electron Microscopy",
    Surface Review and Letters (1995), 2, p.103-0.

    E. Bauer,
    "Low Energy Electron Microscopy",
    Handbook of Surface Imaging and Visualization, ed. A.T. Hubbard (CRC Press, Boca Raton) (1996), , p.365-373.

    E. Bauer,
    "Low Energy Electron Microscopy",
    Handbook of Microscopy, eds. S. Amelinckx, D. Van Dyck, J.F. Van Landuyt and G. Van Tendeloo (VCH Ve (1997), , p.487-503.

    E. Bauer,
    "Multi-Method Surface Microscopy with Slow Electrons",
    Advanced Surface Analytical Techniques, ed. by R. Shimizu and Y. Nihei (Jap. Soc. Promotion Sci.) (1997), , p.87-92.

    E. Bauer,
    "LEEM basics",
    Surf. Rev. Lett. (1998), 5, p.1275-1286.

    E. Bauer and T. Duden,
    "LEEM Studies of Epitaxial Nanostructures",
    J. Surf. Analysis (1997), 3, p.222-227.

    E. Bauer,
    "In-situ Applications of Low Energy Electron Microscopy",
    In-situ Microscopy in Materials Research, ed. by P.L. Gai (Kluwer, Boston) (1997), , p.1-12.

    E. Bauer, A. Pavlovska and I.S.T. Tsong,
    "In Situ Growth Studies by Low Energy Electron Microscopy (LEEM) and Low Electron Diffraction (LEED)",
    Microscopy and Microanalysis (1997), 3, Suppl. 2, p.611-612.

    J. B. Hannon, M. C. Bartlet, N. C. Bartelt, and G. L. Kellogg,
    "Quantitative Analysis of the Evolution of Surface Growth Morphology in LEEM",
    Surface Review and Letters (1998), 5, p.1151-0.

    W.F. Chung and M.S. Altman,
    "Step Contrast in Low Energy Electron Microscopy",
    Utramicroscopy (1998), 74, p.237-246.
    click here for on-line version

    M.S. Altman, W.F. Chung and C.H. Liu,
    "LEEM Phase Contrast",
    Surface Review and Letters (1998), 5, p.1129-0.

    R.M.Tromp,
    "Low Energy Electron Microscopy",
    IBM Journal Of Research And Development (2000), Vol.44, No.4, p.503-516.

    E. Bauer,
    "The possibilities for analytical methods in photoemission and low energy electron microscopy",
    Ultramicroscopy (1991), 36, p.52-62.
    click here for on-line version

    T. Schmidt, J. Slezak, S. Heun, J. Diaz, R.R. Blyth, R. Delaunay, D. Cocco, K.C.Prince, E. Bauer and M. Coreno,
    "Optical layout of a beamline for photoemission microscopy",
    J. Synchrotron Rad. (1999), 6, p.957-963.

    S. Anders, H.A. Padmore, R.M. Duarte, T. Renner, T. Stammler, A. Scholl, M.R. Scheinfein, J. Stöhr, L. Séve, and B. Sinkovic,
    "Photoemission electron microscope for the study of magnetic materials",
    Rev. Sci. Instrum. (1999), 70, p.3973-3981.
    click here for on-line version

    J. Stöhr, H. A. Padmore, S. Anders, T. Stammler, and M. Scheinfein,
    "Principles of x-ray magnetic dichroism spectromicroscopy",
    Surface Rev. Lett. (1999), 5, p.1297-0.

    E. Bauer, T. Franz, C. Koziol, G. Lilienkamp and T. Schmidt,
    "Recent Advances in LEEM/PEEM for Structural and Chemical Analysis",
    Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale, ed. R.,Ro (1997), , p.73-84.

    E. Bauer, C. Koziol, G. Lilienkamp and T. Schmidt,
    "Spectromicroscopy in a Low Energy Electron Microscope",
    J. Electron Spectrosc.Rel.Phenomena (1997), 84, p.201-209.

    T. Schmidt, S. Heun, J. Slezak, J. Diaz, K.C.Prince, G. Lilienkamp and E. Bauer,
    "SPELEEM: combining LEEM and spectroscopic imaging",
    Surf. Rev. Lett. (1998), 5, p.1287-1296.

    S. Heun, Th. Schmid, B. Ressel, E. Bauer and K.C. Prince,
    "Nanospectroscopy at ELETTRA",
    Synchrotron Radiation News (1999), 12, p.25-29.

    E. Bauer, T. Schmidt and T. Duden,
    "Multi-Method Surface Analysis in the 10 nm Range",
    Precision Science and Technology of Perfect Surfaces, ed. by Y.Furukawa, Y. Mori and T. Kataoka (The (1999), , p.753-762.

    E. Bauer,
    "Photoelectron spectromicroscopy: present and future",
    J. Electron Spectrosc.Relat. Phenom. (2001), 114 – 116, p.976-987.

    E. Bauer,
    "Photoelectron Microscopy",
    J. Phys.: Condens. Matter (2001), 13, p.11391-11405.

    T. Duden and E. Bauer,
    "A Compact Electron Spin Polarization Manipulator",
    Rev. Sci. Istrum. (1995), 66, p.2861-2864.
    click here for on-line version

    H. Poppa, E. Bauer and H. Pinkvos,
    "SPLEEM of Magnetic Surfaces and Layered Structures",
    MRS Bulletin (1995), 20, p.38-40.

    M.S. Altman, H. Pinkvos and E. Bauer,
    "Spin Polarized Low Energy Electron Microscopy for Thin Film Magnetism and Microstructure",
    J. Magn. Soc. Jpn. (1995), 19, Suppl. No. S1, p.129-134.

    E. Bauer,
    "Spin-polarized Low Energy Electron Microscopy",
    Handbook of Microscopy, eds. by S. Amelinckx, D. Van Dyck, J.F. Van Landuyt and G. Van Tendeloo (VCH (1997), , p.751-759.

    T. Duden and E. Bauer,
    "Spin-polarized low energy electron microscopy of ferromagnetic layers",
    J. Electron Microscopy (1998), 47, p.379-385.

    T. Duden and E. Bauer,
    "Spin-polarized low energy electron microscopy",
    Surf. Rev. Lett. (1998), 5, p.1213-1220.

    E. Bauer, T. Schmidt and T. Duden,
    "Multi-Method Surface Analysis in the 10 nm Range",
    Precision Science and Technology of Perfect Surfaces, ed. by Y.Furukawa, Y. Mori and T. Kataoka (The (1999), , p.753-762.

    Tober ED, Witte G, Poppa H,
    "Variable temperature and ex situ spin-polarized low-energy electron microscope",
    J. Vac. Sci. Technol. A (2000), 18(4) Part2 Jul-Aug, p.1845-1847.
    click here for on-line version

    K.L. Man, M.S. Altman, H. Poppa,
    "Spin Polarized Low Energy Electron Microscopy Investigations of Magnetic Transitions in Fe/Cu(100)",
    Surface Science (2001), 480, p.163-172.
    click here for on-line version

    K.L. Man, W.L. Ling, Silena Y. Paik, H. Poppa, M.S.Altman, Z.Q. Qiu,
    "Modification of Initial Growth and Magnetism oin Fe/Cu(100)",
    Phys. Rev. B (2001), 65, p.24409-0.
    click here for on-line version

    E. Bauer,
    "Low energy electron microscopy and normal incidence VLEED",
    Physics of Solid Surfaces, Studies in Surface Science and Catalysis, ed. J. Koukal (Elsevier, Amster (1988), 40, p.26-36.

    C. Quitmann, U. Flechsig, L. Patthey, T. Schmidt, G. Ingold, M. Howells, M. Janousch, R. Abela,
    "A Beamline for time resolved Photoelectron-Microscopy on Magnetic Materials at the Swiss Light Source (SLS)",
    2 nd LEEM/PEEM Workshop (Sept. , Paris), Surface Science in press (2000), , p.0-0.
    click here for on-line version

    E. Bauer,
    "Ultrahigh vacuum surface electron microscopy with a cathode lens",
    Inst. Phys. Conf. Ser. (lOP Publishing Ltd.) (1991), No.119, Sect. I, p.1-12.

    K. Grzelakowski, T. Duden, E. Bauer, H. Poppa and S. Chiang,
    "A New Surface Microscope For Magnetic Imaging",
    IEEE Trans. Magnetics (1994), 30, p.4500-4502.

    T. Duden and E. Bauer,
    "A Compact Electron Spin Polarization Manipulator",
    Rev. Sci. Istrum. (1995), 66, p.2861-2864.
    click here for on-line version

    K. Grzelakowski and E. Bauer,
    "A Flange-on Type Low Energy Electron Microscope",
    Rev. Sci. Instrum. (1996), 67, p.742-747.
    click here for on-line version

    G. Lilienkamp, C. Koziol, T. Schmidt and E. Bauer,
    "Cathode Lens Spectromicroscopy with a Low Energy Electron Microscope",
    X-Ray Microscopy and Spectromicroscopy, eds. J. Thieme, G. Schmahl, E. Umbach and D. Rudolph (Spring (1997), , p.0-0.

    R. Fink et al,
    "SMART: a planned ultrahigh-resolution spectromicroscopy for BESSY II",
    J. Electr. Spectrosc. Relat. Phenom. (1997), 84, p.231-250.

    M. Mankos, R.M. Tromp, M.C. Reuter and E. Cartier,
    "Imaging hot-electron emission from metal-oxide-semiconductor structures",
    Physical Review Letters (1996), 76, p.3200-3.
    click here for on-line version

    R.M.Tromp, M. Mankos, M.C. Reuter, A.W. Ellis, M. Copel,
    "A New and Improved Low Energy Electron Microscope",
    Surface Review and Letters (1998), 5, p.1189-0.

    P. Adamec, E. Bauer and B. Lencova,
    "Compact low-energy electron microscope for surface imaging",
    Rev. Sci. Instrum. (1998), 69, p.3583-3587.
    click here for on-line version

    R. Wichtendahl et al,
    "SMART - an aberration-corrected XPEEM/LEEM with energy-filter",
    Surf. Rev. Lett. (1998), 5, p.1249-1256.

    L. Frank, I. Muellerova, K. Faulian and E. Bauer,
    "The Scanning LEEM: First Attainment of Diffraction Contrast in the SEM",
    Scanning (1999), 21, p.1-13.

    Th. Schmidt, U. Groh, R. Fink, E. Umbach, O. Schaff, W. Engel, B. Richter, H.Kuhlenbeck, R. Schloegl, H.-J. Freund, A. M Bradshaw, D. Preikszas, P. Hartel, R. Spehr, H. Rose, G. Lilienkamp, E. Bauer and G. Benner,
    "XPEEM with energy-filtering: Advantages and first results from the SMART project",
    Surf. Rev. Lett. (2002), 9, p.223-232.

    Th. Schmidt, U. Groh, R. Fink, E. Umbach, H. Marchetto, W. Engel, H.-J. Freund, P. Hartel, R. Spehr, H. Rose, G. Lilienkamp, E. Bauer, D. Preikszas and GG. Benner,
    "The SMART project: Spectromicroscopy with aberration correction",
    J. Vac. Sci. Technol. B (2003), 21, p.0-0.

    W. Telieps and E. Bauer,
    "The (7x7)«(1x1) phase transition on Si( 111 )",
    Surf. Sci. (1985), 162, p.163-168.
    click here for on-line version

    W. Telieps and E. Bauer,
    "Kinetics of the (7x7)« (lx1) transition on Si(111)",
    Ber. Bunsenges. Phys. Chem. (1986), 90, p.197-200.

    M. Mundschau, E. Bauer, W. Telieps and W. Swiech,
    "Atomic step and defect structure on surfaces of Si(100) and Si(111) observed by low energy electron microscopy",
    Phil. Mag. A (1990), 61, p.257-280.

    M. Mundschau, E. Bauer, W. Telieps and W. Swiech,
    "Atomic steps on Si(100) and step dynamics during sublirnation studied by low energy electron microscopy",
    Surf. Sci. (1989), 223, p.413-423.
    click here for on-line version

    E. Bauer, M. Mundschau, W. Swiech and W. Telieps,
    "Low energy electron microscopy and surface processes on clean Si(111) and Si(100)",
    Atomic Scale Structure of Interfaces, eds. R.D. Bringans, R.M. Feenstra and J.M. Gibson, MRS Symp. P (1990), Vol. 159, p.225-233.

    R.J. Phaneuf, W. Swiech, N.C. Bartelt, E.D. Williams and E. Bauer,
    "LEEM investigations of orientational phase separation on vicinal Si(111) surfaces",
    Phys. Rev. Lett. (1991), 67, p.2986-2989.
    click here for on-line version

    R.M. Tromp, A.W. Denier van der Gon, M.C. Reuter,
    "Surface stress as a driving force for interfacial mixing.",
    Physical Review Letters (1992), 68, p.2313-2316.
    click here for on-line version

    R.M. Tromp and M.C. Reuter,
    "Local dimer exchange in surfactant-mediated epitaxial growth",
    Physical Review Letters (1992), 68, p.954-957.
    click here for on-line version

    R.M. Tromp and M.C. Reuter,
    "Wavy steps on Si(001)",
    Physical Review Letters (1992), 68, p.820-822.
    click here for on-line version

    R.J. Phaneuf, N.C. Bartelt, E.D. Williams, W. Swiech and E. Bauer,
    "LEEM Investigations of the domain growth of the (7x7) reconstruction on Si(111)",
    Surf. Sci. (1992), 268, p.227-237.
    click here for on-line version

    E.D. Williams, R.J. Phaneuf, N.C. Bartelt, W. Swiech and E. Bauer,
    "The role of surface stress in the facetting of stepped Si(111) surfaces",
    MRS Symp. Proc. (1992), Vol. 238, p.219-227.

    R.J. Phaneuf, N.C. Bartelt, E.D. Williams, W. Swiech and E. Bauer,
    "Crossover from metastable to unstable facet growth on Si(111)",
    Phys. Rev. Lett. (1993), 71, p.2284-2287.
    click here for on-line version

    R.M. Tromp and M.C. Reuter,
    "Step Morphologies on Small-Miscut Si(001) Surfaces",
    Physical Review B (1993), 47, p.7598-7601.
    click here for on-line version

    R.M. Tromp,
    "Surface Stress and Interface Formation",
    Physical Review B (1993), 47, p.7125-7127.
    click here for on-line version

    J. Tersoff, A.W. Denier van der Gon, R.M. Tromp,
    "Shape Oscillations in Growth of Small Crystals",
    Physical Review Letters (1993), 70, p.1143-1146.
    click here for on-line version

    J. Tersoff and R.M. Tromp,
    "Shape Transition in Growth of Strained Islands: Spontaneous Formation of Quantum Wires",
    Physical Review Letters (1993), 70, p.2782-2785.
    click here for on-line version

    J. Tersoff, A.W. Denier van der Gon and R.M. Tromp,
    "Critical island size for layer-by-layer growth",
    Physical Review Letters (1994), 72, p.266-269.
    click here for on-line version

    N. C. Bartelt and R. M. Tromp,
    "Low-energy electron microscopy study of step mobilities on Si(001)",
    Physical Review B (1996), 54, p.11731-11740.
    click here for on-line version

    N. Bartelt, R.M. Tromp and E.D. Williams,
    "Step capillary waves and equilibrium island shapes on Si(001)",
    Physical Review Letters (1994), 73, p.1656-1659.
    click here for on-line version

    W. Theis, N.C. Bartelt and R.M. Tromp,
    "Chemical potential maps and spatial correlations in 2D-island ripening on Si(001)",
    Physical Review Letters (1995), 75, p.3328-3331.
    click here for on-line version

    D.E. Jones, J.P. Pelz, Y. Hong, E. Bauer and I.S.T. Tsong,
    "Striped phase and temperature dependent step shape transition of highly B-doped Si(001)-(2x1) surfaces",
    Phys.Rev.Lett. (1996), 77, p.330-333.
    click here for on-line version

    W. Theis and R.M. Tromp,
    "Nucleation in Si(001) homoepitaxial growth",
    Physical Review Letters (1996), 76, p.2770-2773.
    click here for on-line version

    N. C. Bartelt, W. Theis, and R. M. Tromp,
    "Ostwald ripening of two-dimensional islands on Si(001 )",
    Physical Review B (1996), 54, p.11741-11751.
    click here for on-line version

    R.M. Tromp, W. Theis, and N.C. Bartelt,
    "Real-time microscopy of 2-dimensional critical fluctuations: disordering of theSi(113)-(3x1) reconstruction",
    Physical Review Letters (1996), 77, p.2522-2525.
    click here for on-line version

    S. Tanaka, C.C. Umbach, J.M. Blakely, R.M. Tromp, M. Mankos,
    "Fabrication of large step free regions on Si(001)",
    Applied Physics Letters (1996), 69, p.1235-0.
    click here for on-line version

    S. Tanaka, C.C. Umbach, J.M. Blakely,R.M. Tromp, M. Mankos,
    "Atomic Step Distributions on Annealed Periodic Si(001) Gratings",
    Journal of Vacuum Science and Technology A (1997), 15, p.1345-1350.
    click here for on-line version

    S. Tanaka, N.C. Bartelt, C.C. Umbach, R.M. Tromp and J.M. Blakely,
    "Step permeability and the relaxation of bi-periodic gratings on Si(001)",
    Physical Review Letters (1997), 78, p.3342-3345.
    click here for on-line version

    S.Tanaka, C.C.Umbach, R.M.Tromp, J.M.Blakely, M. Mankos,
    "Step contours in the development of periodically modulated vicinal surfaces",
    MRS symposium proceedings \"Structure and Evolution of Surfaces (1997), , p.25-0.

    D.E. Jones, J.P. Pelz, Y .Hong, E. Bauer and I.S.T. Tsong,
    "Mesoscopic Striped Phase on Si(001)-(2xl) Studied by LEEM and STM",
    Proc. Intern. Symp. on Atomic Level Characterizations for New Materials and Devices \'97, Hawaii (1997), , p.119-124.

    R.M. Tromp and M. Mankos,
    "Thermal adatoms on Si(001)",
    Physical Review Letters (1998), 81, p.1050-1053.
    click here for on-line version

    J.M. Blakely, S. Tanaka and R.M. Tromp,
    "Atomic step dynamics on periodic semiconductor surface structures",
    Proceedings of the International Symposium on Hybrid Analyses for Functional Nanostructures (Japan, (1998), , p.0-0.

    J.B Maxson,. D.E. Savage, Feng Liu, R.M. Tromp,M.C. Reuter, M.G.Lagally,
    "Thermal roughening of a thin film: a new type of roughening transition",
    Phys. Rev. Lett. (USA) (2000), Vol.85, No.10, p.2152-2155.
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    J. B. Hannon, H. Hibino, N. C. Bartelt, B. S. Swartzentruber, T. Ogino and G. L. Kellogg,
    "Dynamics of the Si(111) Surface Phase Transition",
    Nature (2000), 405, p.552-554.
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    A.Pavlovska, V.M. Torres, E. Bauer, R.B. Doak, I.S.T. Tsong, D.B. Thomson and R.F. Davis,
    "Low-energy electron microscopy observations of GaN homoepitaxy using a supersonic jet source",
    Appl.Phys.Lett. (1999), 75, p.989-991.
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    A. Pavlovska, V.M. Torres, J.L. Edwards, E. Bauer, David J. Smith, R.B. Doak and I.S.T. Tsong,
    "Homoepitaxial GaN Layers Studied by Low-Energy Electron Microscopy and Atomic Force Microscopy",
    Phys.Stat.Sol. (a) (1999), 176, p.176-0.

    W. Swiech and E. Bauer,
    "The growth of Si on Si(100): a video-LEEM study",
    Surf. Sci. (1991), 255, p.219-228.
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    E. Bauer,
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    Appl. Surf. Sci. (1996), 92, p.20-29.
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    A. Pavlovska, E. Bauer and D.J. Smith,
    "In situ studies of the role of excess Ga on the growth morphology of thin GaN layers",
    Surf. Sci. (2002), 496, p.160-178.
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    R.M. Tromp, A.W. Denier van der Gon, F.K. LeGoues and M.C. Reuter,
    "Observation of Buried Interfaces with Low Energy Electron Microscopy",
    Physical Review Letters (1993), 71, p.3299-3302.
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    A.W. Denier van der Gon, R.M. Tromp and M.C. Reuter,
    "LEEM Studies of Ge and Ag Growth on Si(111).",
    Thin Solid Films (1993), 236, p.140-0.
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    J. Falta, M. Copel, M.C. Reuter, F.K. LeGoues and R.M. Tromp,
    "LEEM and MEIS studies of Ge growth on GaAs(001)",
    Proceedings of the International Conference on the Formation of Semiconductor Interfaces, Julich 14- (1993), , p.0-0.

    E. Bauer,
    "Epitaxial Growth Studies by Low Energy Electron Microscopy",
    Scanning Microscopy (Scanning Microscopy Intern., Chicago) (1994), Vol. 8, p.765-772.

    M.S. Altman, Q. Cai, W.F. Chung, E.Z. Luo, H. Pinkvos and E. Bauer,
    "Role of Surface Steps in Thin Film Growth and Properties Studied by LEEM",
    MRS Symp. Proc. (1995), 355, p.235-246.

    E. Bauer, Y. Wei, T. Müller, A. Pavlovska and I.S.T. Tsong,
    "Reactive crystal growth in two dimensions: Silicon nitride on Si(111)",
    Phys.Rev. B (1995), 51, p.17891-17901.
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    E. Bauer, A. Pavlovska and I.T.S.Tsong,
    "In Situ Growth Studies by Low Energy Electron Microscopy (LEEM) and Low Energy Electron Diffraction (LEED)",
    Microscopy and Microanalysis (1997), 3, Suppl.2, p.611-0.

    A. Pavlovska, E. Bauer, V.M. Torres, J.L. Edwards, R.B. Doak, I.S.T. Tsong, V.Ramachadran and R.M. Feenstra,
    "LEEM Studies of GaN and AlN Epitaxy",
    Proceedings of the International Symposium on Atomic Level Characterization for New Materials and De (1997), , p.0-0.

    A. Pavlovska, E. Bauer, V.M. Torres, J.L. Edwards, R.B. Doak, I.S.T. Tsong, V. Ramachadran and R.M. Feenstra,
    "In Situ Real-Time Studies of GaN Growth on 6H-SiC(0001) by Low Energy Electron Microscopy (LEEM)”",
    J. Crystal Growth (1998), 189/190, p.310-0.

    F. M. Ross, J. Tersoff and R. M. Tromp,
    "Ostwald ripening of self-assembled Ge islands on Si(100)",
    Microscopy and Microanalysis (1998), 4, p.254-0.

    F. M. Ross, R. M. Tromp and M. C. Reuter,
    "Transition states between pyramids and domes during Si/Ge island growth.",
    Science (1999), 286, p.1931-1934.
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    F. M. Ross, R. M. Tromp, J. Tersoff and M. C. Reuter,
    "Real time observations of the growth and development of self-assembled GeSi islands on Si(001)",
    To appear in \"Proceedings of MSM 1999\", Inst. Phys. Conf. Series (1999), ed. A. G. Cullis and R. B (1999), , p.0-0.

    R. M. Tromp, F. M. Ross and M. C. Reuter,
    "Instability-driven nucleation-free SiGe island growth",
    Physical Review Letters (2000), in press, p.0-0.

    R.M. Tromp, F.M. Ross,
    "Advances in in-situ Ultra High Vacuum Electron Microscopy: Growth of SiGe on Si.",
    Annual Reviews in Materials Science, (2000), in press, p.0-0.

    A. Pavlovska and E. Bauer,
    "Low Energy Electron Microscopy Studies of the Growth of GaN on 6H-SiC(0001)",
    Surf. Rev. Lett. (2001), 8, p.337-346.

    M. Mundschau, E. Bauer, W. Telieps and W. Swiech,
    "Initial epitaxial growth of copper silicide on Si( 111) studied by low energy electron microscopy and photoemission electron microscopy",
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    A.W. Denier van der Gon and R.M. Tromp,
    "Phase Formation Sequence and Domain Structure: The Si(111)- Ag Surface",
    Physical Review Letters (1992), 69, p.3519-3522.
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    L. Li, C. Koziol, K. Wurm, Y. Hong, E. Bauer and I.S.T. Tsong,
    "Surface Morphology of Pb Overlayers Grown on Si(100)-(2x1)",
    Phys. Rev. B (1994), 50, p.10834-10842.
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    T. Michely, M.C. Reuter, M. Copel and R.M. Tromp,
    "Symmetry, structure and step induced ordering of the Si(001)(2x3)Ag surface",
    Physical Review Letters (1994), 73, p.2095-2098.
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    T. Michely, M.C. Reuter and R.M. Tromp,
    "Al on Si(111): Phase Diagram and Atomic Mechanisms",
    Physical Review B (1696), 53, p.4105-4108.
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    Th. Schmidt and E. Bauer,
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    Phys. Rev. B (2000), 62, p.15815-15825.
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    T. Yasue, T. Koshikawa and E. Bauer,
    "Dynamic Observations of the formation of thin Cu layers on clean and hydrogen-terminated Si(111) surfaces",
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    Th. Schmidt and E. Bauer,
    "Influence of interfactants on thin metal film growth",
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    T. Yasue, T. Koshikawa, M. Jalochowski and E. Bauer,
    "LEEM observation of formation of Cu nano-islands on Si(111) surface by hydrogen termination",
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    M. Jalochowski and E. Bauer,
    "Self-assembled parallel mesoscopic Pb-wires on Au- modified Si(533) substrates",
    Progr. Surf. Sci. (2001), 67, p.79-97.

    A. Pavlovska, E. Bauer and M. Giesen,
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    T. Yasue, T. Koshikawa and E. Bauer,
    "LEEM and LEED study of the growth of Ge on the Si(113) surface",
    J. Vac. Sci. Technol. B (2002), 20, p.2496-2499.
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    W. Swiech, E. Bauer and M. Mundschau,
    "A low energy electron microscopy study of the system Si(111)-Au",
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    E. Bauer, Y. Wei, T. Muller, A. Pavlovska and I.S.T. Tsong,
    "Reactive Crystal Growth in Two Dimensions: Silicon Nitride on Si(111)",
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    J. B. Hannon, N. C. Bartelt, B. S. Swartzentruber, J. C. Hamilton, and G. L. Kellogg,,
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    M. Horn von Hoegen, F.-J. Meyer zu Heringdorf, R. Hild, P. Zahl, Th. Schmidt and E. Bauer,
    "Au induced giant faceting of vicinal Si(001)",
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    F.-J. Meyer zu Heringdorf, R. Hild, P. Zahl, M. Horn von Hoegen, Th. Schmidt, S. Heun, B. Ressel, E. Bauer,
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    Elettra Highlights (1999), 98-99, p.42-44.

    F.-J. Meyer zu Heringdorf, Th. Schmidt, E. Bauer, D. Kähler, H. Minoda, K. Yagi and M. Horn von Hoegen,
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    Surface Review and Letters (1998), 5, p.1167-1178.

    R.M. Tromp and M.C. Reuter,
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    R.M. Tromp, M.C. Reuter and F.K. LeGoues,
    "Strain relief during growth: CaF2 on Si(111)",
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    R.M. Tromp and T. Michely,
    "Atomic Layer Titration of Surface Reactions",
    Nature (1995), 373, p.499-0.

    G.H. Turner and E. Bauer,
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    M. Mundschau, E. Bauer and W. Swiech,
    "Defects on the surface of Mo{011} observed by low-energy electron microscopy",
    Phil. Mag. A (1989), 59, p.217-226.

    M. Mundschau, E. Bauer and W. Swiech,
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    W. Telieps, M. Mundschau and E. Bauer,
    "Surface domain structure of reconstructed Au(100) observed by dark field low energy electron microscopy",
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    M.S. Altmann and E.Bauer,
    "The Reconstruction of the Pb(110) Surface Studied by Low Energy Electron Microscopy",
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    M.S. Altman, S. Chiang, P. Statiris, T. Gustafsson and E. Bauer,
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    The Structure of Surfaces IV. eds. Xie Xide, S.Y. Tong, M.A.van Hove (World Scientific Publ., Singap (1994), , p.183-191.

    M. Mundschau, E. Bauer, W. Telieps and W. Swiech,
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    Th. Schmidt, B. Ressel, S. Heun, K.C. Prince and E. Bauer,
    "Growth of Thin Metal Films studuied by Spectromicroscopy",
    VIth Internat. Conf. on X-Ray Microscopy, eds. W. Meyer-Ilse and T. Altwood (AIP Melville, New York (2000), , p.27-32.

    A. Pavlovska and E. Bauer,
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    M. Mundschau, E. Bauer and W. Swiech,
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    Appl. Phys. (1989), 65, p.581-584.

    M. Mundschau, E. Bauer and W. Swiech,
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    M. Mundschau, E. Bauer and W. Swiech,
    "The role of ledges in vapor/solid phase transformations observed by low-energy electron microscopy and photoemission electron microscopy",
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    E. Bauer,
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    H. Poppa, H. Pinkvos, K. Wurm and E. Bauer,
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    E.Z.Luo, Q. Cai, W.F. Chung, B.G. Orr, M.S. Altman,
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    Phys. Rev. B (1999), 54, p.14673-14678.
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    T. Duden and E. Bauer,
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    K. Pelhos, J. B. Hannon, G. L. Kellogg, and T. E. Madey,,
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    Surface Science (1999), 432, p.115-124.
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    K. Pelhos, T. E. Madey, J. B. Hannon, and G. L. Kellogg,,
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    Surface Review and Letters (1999), 6, p.767-0.

    G. L. Kellogg and R. Plass,
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    Surface Review and Letters (2000), 7, p.649-0.

    G. L. Kellogg and R. Plass,
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    Surface Science Letters (2000), 465, p.0-0.

    R. Plass and G. L. Kellogg,
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    D. Wu, W.K. Lau, Z.Q. He, Y.J. Feng, M.S. Altman, C.T. Chan,
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    Phys. Rev. B (2000), 62, p.8366-8375.
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    M. Jalochowski and E. Bauer,
    "Growth of Metallic Nanowires on Anisotropic Si Substrates: Pb on Vicinal Si(001), Si(755), Si(533) and Si(110)",
    Surf. Sci. (2001), 480, p.109-117.
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    Th. Schmidt and E. Bauer,
    "Influence of interfactants on thin metal growth",
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    M.S. Altman, W.F. Chung, Z.Q. He, H.C. Poon, S.Y. Tong,
    "Quantum Size Effect in Low Energy Electron Diffraction of Thin Films",
    Appl. Surf. Sci. (2001), 169-170, p.82-87.
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    M.S. Altman and E. Bauer,
    "The reaction of oxygen. with the hot W(001) surface studied by low-energy electron microscopy",
    J. Vac. Sci. Technol. A (1991), 9, p.659-660.
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    M.S. Altman and E. Bauer,
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    Th. Schmidt, A. Schaak, S.G. Guenther, B. Ressel, E. Bauer and R. Imbihl,
    "In situ Imaging of structural changes in a chemical wave with low energy electron Microscopy: The system Rh(110) / NO +H2",
    Chem. Phys. Lett. (200), 318, p.549-0.

    M.S. Altman, I. Hurst, G. Marx, H. Pinkvos, H. Poppa and E. Bauer,
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    Magnetic Materials: Microstructure and Properties, eds. Suzuki, Y. Sugita, H.M. Clemens, K. Ouchi an (1991), Vol. 232, p.125-132.

    H. Pinkvos, H. Poppa, E. Bauer and J. Hurst,
    "A spin-polarized low energy electron microscopy study of the magnetic microstructure of ultrathin epitaxial cobalt films on W(110)",
    Ultramicroscopy (1992), 47, p.339-345.
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    H. Pinkvos, H. Poppa, E. Bauer and G.-M. Kim,
    "A time-resolved SPLEEM study of magnetic microstructure in ultrathin Co films on W(110)",
    Magnetism and Structure in Systems of Reduced Dimensions , eds. R.F.C Farrow, B. Dieny, M. Donath, A (1993), , p.25-31.

    B. P. Tonner, D. Dunham, J. Zhang, W. L. O’Brien, M. Samant, D. Weller, B. D. Hermsmeier, and J. Stöhr,
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    J. Stöhr, Y. Wu, B. D. Hermsmeier, M. G. Samant, G. R. Harp, S. Koranda, D. Dunham, and B. P. Tonner,
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    Science (1993), 259, p.658-0.

    E. Bauer, T. Duden, H. Pinkvos, H. Poppa and K. Wurm,
    "LEEM Studies of the Microstructure and Magnetic Domain Structure of Ultrathin Films",
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    T. Duden and E. Bauer,
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    T. Duden and E. Bauer,
    "Magnetic Domain Structure and Spin Reorientation Transition in the System Co/Au/W(110)",
    MRS Symp.Proc. (1997), 475, p.283-288.

    T. Scheunemann, R. Feder, J. Henk, E. Bauer, T. Duden, H. Pinkvos, H. Poppa and K. Wurm,
    "Quantum Well Resonances In Ferromagnetic Co Films",
    Solid State Commun. (1997), 104, p.787-792.

    T. Kachel, W. Gudat, C. Koziol, Th. Schmidt, G. Lilienkamp, E. Bauer and M. Altman,
    "Magnetic domain imaging with low energy electron microscopy",
    J. Appl. Phys. (1997), 81, p.5025-0.

    T. Duden and E. Bauer,
    "Spin-Polarized Low Energy Electron Microscopy of Ultrathin Ferromagnetic Layers and Ferromagnetic/Nonferromagnetic Sandwiches",
    Proc. Intern. Symp. on Atomic Level Characterizations for New Materials and Devices\'97, Hawaii (1997), , p.111-118.

    W. Kuch, R. Fr\"omter, J. Gilles, D. Hartmann, Ch. Ziethen, C. M. Schneider, G. Sch\"onhense, W. Swiech, J. Kirschner,
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    Surface Review and Letters (1998), 5, p.1241-1248.

    T. Duden and E. Bauer,
    "Exchange Coupling in Co/Cu/Co Sandwiches Studied by Spin-Polarized Low Energy Electron Microscopy",
    J. Magn. Mater. (1999), 191, p.301-312.

    T. Duden and E. Bauer,
    "Biquadratic exchange in ferromagnetic/nonferromagnetic sandwiches: A spin-polarized low energy electron microscopy study",
    Phys. Rev. B (1999), 59, p.474-479.
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    J. Stöhr, A. Scholl, T. J. Regan, S. Anders, J. Lüning, M. R. Scheinfein, H. A. Padmore, and R. L. White,
    "Images of the Antiferromagnetic Structure of a NiO(100) Surface by Means of X-Ray Magnetic Linear Dichroism Spectromicroscopy",
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    E. Bauer,
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    W. Kuch, J. Gilles, F. Offi, S. S. Kang, S. Imada, S. Suga, and J. Kirschner,
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    W. Kuch, J. Gilles, S. S. Kang, S. Imada, S. Suga, and J. Kirschner,
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    S. Imada, S. Ueda, R. Jung, Y. Saitoh, M. Kotsugi, W. Kuch, J. Gilles, S. S. Kang, F. Offi, J. Kirschner, H. Daimon, T. Kimura, J. Yanagisawa, K. Gamoh, S. Suga,
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    W. Kuch, J. Gilles, S. S. Kang, F. Offi, J. Kirschner, S. Imada, S. Suga,
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    F. Nolting, A. Scholl, J. Stöhr, J. Fompeyrine, H. Siegwart, J.-P. Locquet, S. Anders, J. Lüning, E.E. Fullerton, M.F. Toney, M.R. Scheinfein, and H.A. Padmore,
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    Luc Thomas, Jan Lüning, Andreas Scholl, Frithjof Nolting, Simone Anders, Joachim Stöhr, and Stuart S. P. Parkin,
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    A. Scholl, J. Stöhr, J. Lüning. J.W. Seo, J. Fompeyrine, H. Siegwart, J.-P. Locquet, F. Nolting, S. Anders, E.E. Fullerton, M.R. Scheinfein, and H.A. Padmore,
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    Th. Duden, R. Zdyb, M. Altmann and E. Bauer,
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    H. Ohldag, A. Scholl, F. Nolting, S. Anders, F. U. Hillebrecht, and J. Stöhr,
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    W. Kuch, J. Gilles, F. Offi, S. S. Kang, S. Imada, S. Suga, and J. Kirschner,
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    W. Kuch, Xingyu Gao, and J. Kirschner,
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    W. Kuch, F. Offi, L. I. Chelaru, M. Kotsugi, K. Fukumoto, and J. Kirschner,
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    A. Locatelli, S. Cherifi, S. Heun, M. Marsi, K. Ono, A. Pavlovska and E. Bauer,
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    R. Zdyb and E. Bauer,
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    R. Zdyb and E. Bauer,
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    E. Bauer. T. Duden and R. Zdyb,
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    E. Bauer, S. Cherifi, L. Daeweritz, M. Kaestner, S. Heun and A. Locatelli,
    "A LEEM/XMCDPEEM study of epitaxial MnAs on GaAs",
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    J. Stöhr and S. Anders,
    "X-ray spectro-microscopy of complex materials and surfaces",
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    Diaz, S. Anders, A. Cossy-Favre, M. Samant, and J. Stöhr,
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    S. Anders, Th. Stammler, W. Fong, C.-Y. Chen, D. B. Bogy, C. S. Bhatia, and J. Stöhr,
    "Study of tribochemical processes on hard disks using photoemission electron microscopy",
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    S. Anders, Th. Stammler, W. Fong, D. B. Bogy, C. S. Bhatia, and J. Stöhr,
    "Investigation of slider surfaces after wear using photoemission electron microscopy",
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    Cossy-Favre, J. Diaz, Y. Liu, H. R. Brown, M. G. Samant, J. Stöhr, A. J. Hanna, S. Anders, and T. P. Russell,
    "X-PEEM study on surface orientation of stylized and rubbed polymides",
    Macromolecules (1998), 31, p.4957-0.

    H. Ade, D. A. Winesett, A. P. Smith, S. Anders, T. Stammler, C. Heske, D. Slep, M. H. Rafailovich, J. Sokolov, and J. Stöhr,
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    S. Singh, H. Solak, N. Krasnoperov, F. Cerrina, A. Cossy, J. Diaz, J. Stöhr, and M. G. Samant,
    "An X-ray spectromicroscopic study of the local structure of patterned titanium silicide",
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    A. Cossy-Favre, J. Diaz, S. Anders, H. Padmore, Y. Liu, M. G. Samant, J. Stöhr, H. Brown, and T. P. Russell,
    "Photoelectron emission microscopy and its application to the study of polymer surfaces",
    Acta Phys. Polonica A (1997), 91, p.923-0.

    W. Kuch, L.I. Chelaru, F. Offi, J. Wang, M. Kotsugi and J. Kirschner,
    "Three-Dimensional Noncollinear Antiferromagnetic Order in Single-Crystalline FeMn Ultrathin Films",
    Physical Review Letters (2004), 92, p.17201-0.
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    W. Kuch, L.I. Chelaru, F. Fukumoto, F. Porrati, F. Offi, M. Kotsugi and J. Kirschner,
    "Layer-resolved imaging of magnetic interlayer coupling by domain-wall stray fields",
    Physical Review B (2003), 67, p.214403-0.
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    W. Kuch,
    "Layer-resolved microscopy of magnetic domains in multi-layered systems",
    Applied Physics A (2003), 76, p.665-671.
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    J. Vogel, W. Kuch, M. bonfim, J. Camarero, F. Offi, Y. Pennec, K. Fukumoto, A. Fontaine, J. Kirschner and S. Pizzini,
    "Time-resolved magnetic domain imaging by x-ray photoelectron emission microscopy",
    Applied Physics Letter (2003), 82, p.2299-2301.
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    M. Kotsugi, W. Kuch, F. Offi, L.I. Chelaru and J. Kirschner,
    "Microspectroscopic two-dimensional Fermi surface mapping using a photoelectron emission microscope",
    Review of Scientific Instruments (2003), 74, p.2754-0.
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    F. Offi, W. Kuch, L.I. chelaru, K. Fukumoto and J. Kirschner,
    "Induced Fe and Mn magnetic moments in Co-FeMn bilayers on Cu(001)",
    Physical Review B (2003), 67, p.94419-0.
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    F. Offi, W. Kuch, L.I. Chelaru, M. Kotsugi and J. Kirschner,
    "Local exchange bias observed by photoemission microscopy",
    Journal of Magnetism and Magnetic Materials (2003), 261, p.0-0.
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    W. Kuch, L.I. Chelaru, F. oofi, M. Kotsugi and J. Kirschner,
    "Magnetic dichroisms in adsorption and photoemission for the magnetic characterization in x-ray photoelectron emission microscopy",
    Journal of vacuum Science and Technology B (2002), 20, p.2543-0.
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    W. Kuch, J. Gilles, X. Gao and J. Kirschner,
    "Layer-resolved magnetic imaging of soin-reorientation transitions in Ni/Cu/Co trilayers",
    Journal of Magnetism and Magnetic Material (2002), 242-245, p.1246-0.
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    S. Imada, S. Suga, W. Kuch and J. Kirschner,
    "Magnetic microspectroscopy by a combination of XMCD and PEEM",
    Surface Review and Letters (2002), 9, p.877-0.
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    F. Fukumoto, H. Daimon, L. Chelaru, F. Offi, W. Kuch and J. Kirschner,
    "Micromagnetic properties of the Cu/Ni crossed-wedge film on Cu(001)",
    Surface Science (2002), 514, p.151-0.
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    F.-J. Meyer zu Heringdorf, D. Kähler, M. Horn-von Hoegen, Th. Schmidt, E. Bauer, M. Copel and H. Minoda,
    "Giant faceting of vicinal Si(001) induced by Au adsorption",
    Surf. Rev. and Lett. (1998), 5(6), p.1167-1178.

    M. Horn-von Hoegen, F.-J. Meyer zuHeringdorf, D. Kähler, Th. Schmidt and E. Bauer,
    "Au induced giant faceting of vicinal Si(001)",
    Surf. Sci. (2000), 433-435, p.475-480.
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    F.-J. Meyer zu Heringdorf, Th. Schmidt, R. Hild, P. Zahl, S. Heun, B. Ressel, E. Bauer and M. Horn-von Hoegen,
    "Au induced giant faceting of vicinal Si(001)",
    ELETTRA Highlights (0), 1998-99, p.20-0.

    F.-J. Meyer zu Heringdorf , R. Hild, P. Zahl , Th. Schmidt, B. Ressel , S.Heun , E. Bauer and M. Horn-von Hoegen,
    "Local Au coverage as driving force for the Au induced faceting of vicinal Si(001): a LEEM and XPEEM study",
    Surf. Science (2001), 480, p.103-108.
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    J. B. Hannon, F.-J. Meyer zu Heringdorf, J. Tersoff, and R. M. Tromp,
    "Phase Coexistence during Surface Phase Transitions",
    Phys. Rev. Lett. (2001), 86, p.4871-4874.
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    F.-J. Meyer zu Heringdorf, R. Hild, P. Zahl, Th. Schmidt, B. Ressel, S. Heun, E. Bauer and M. Horn-von Hoegen,
    "Spatial variation of Au coverage as driving force for nanoscopic pattern formation",
    Phys. Rev. Lett. (2001), 86, p.5088-5091.
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    F.-J. Meyer zu Heringdorf, M.C. Reuter, R.M. Tromp,
    "Growth Dynamics of Pentacene Thin Films",
    NATURE (2001), 412, p.517-520.
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    F.-J. Meyer zu Heringdorf, M.C. Reuter, R.M. Tromp,
    "The nucleation of pentacene thin films",
    Applied Physics A (2004), 78, p.787-791.
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    W.F. Chung, Y.J. Feng, H.C. Poon, C.T. Chan, S.Y. Tong and M.S. Altmann,
    "Layer Spacings in Coherently Strained Epitaxial Metal Films",
    Phys. Rev. Lett (2003), 90, p.216105-0.
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    K.L. Man, R. Zdyb, S.F. Huang, T.C. Leung, C.T. Chan, E. Bauer and M.S. Altman,
    "Growth Morphology, Structure and Magnetism of Ultrathin Co Films on W(111)",
    Phys. Rev. B (2003), 67, p.184402-0.
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    W.F. Chung and M.S. Altman,
    "Kinetic Length, Step Permeability and Kinetic Coefficient Asymmetry on the Si(111) (7x) Surface",
    Phs. Rev. B (2002), 66, p.75338-0.
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    W.X. Tang, K.L. Man, H. Huang, C.H. Woo and M.S. Altman,
    "Growth Shapes of Ag Crystallites on the Si(111) Surface",
    J. Vac. Sci. Technol. B (2002), 20(6), p.2492-2495.
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    W.F. Chung, K. Bromann and M.S. Altman,
    "The Transition to Step flow Growth on the Clean and Surfactant Covered Si(111) Surface Studied by in-situ LEEM",
    Inl. J. Mod. Phys. B (2002), 16, p.4353-4362.
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    M.S. Altman, E.Z. Luo, W.F. Chung, and B.G. Orr,
    "Growth Kinetics and Structure of Ultrathin Copper Films on the W(110) Surface Studied by LEEM",
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    Y. Pennec, J. Camarero, J. C. Toussaint, S. Pizzini, M. Bonfim, F. Petroff, W. Kuch, K. Fukumoto, F. Nguyen van Dau, J. Vogel,
    "Switching-mode-dependent magnetic interlayer coupling strength in spin valves and magnetic tunnel junctions",
    Phys. Rev. B (2004), 69, p.180402-180402.
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    J. Vogel, W. Kuch, J. Camarero, K. Fukumoto, Y. Pennec, M. Bonfim, S. Pizzini, F. Petroff, A. Fontaine, J. Kirschner,
    "Time and layer resolved magnetic domain imaging of FeNi/Cu/Co trilayers using x-ray photoelectron emission microscopy",
    J. Appl. Phys. (2004), 95, p.6533-6536.
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    J. Wang, W. Kuch, F. Offi, L. I. Chelaru, M. Kotsugi, J. Kirschner,
    "Magnetic domain investigation in Co/Cu/FeMn trilayers",
    J. Appl. Phys. (2004), 95, p.7504-7506.
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    C. Morin, H. Ikeura-Sekiguchi, T. Tyliszczak, R. Cornelius, J.L. Brash, A.P. Hitchcock A. Scholl, F. Nolting, G. Appel, A. D. Winesett, K. Kaznacheyev and H. Ade,
    "X-ray Spectromicroscopy of immiscible polymer blends: polystyrene-poly(methyl methacrylate)",
    J. Electron Spectroscopy (2001), 121, p.203-224.

    J.P. Pierce K.F. McCarty,
    "Self assembly and dynamics of oxide nano-rods on NiAl(110)",
    Phys. Rev. B (2005), 71, p.1255428-1255439.
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    G. K. L. Marx, V. Gerheim, G. Schönhense,
    "Multipole Wienfilter for a High-Resolution X-PEEM",
    Journal of Electron Spectroscopy and Related Phenomena (1997), 84, p.251-261.

    H. Spiecker, O. Schmidt, Ch. Ziethen, D. Menke, U. Kleineberg, R. G. Ahuja, M. Merkel, U. Heinzmann, G. Schönhense,
    "Time-Of-Flight Photoelectron Emission Microscopy TOF-PEEM-First Results",
    Nucl. Instr. and Meth. A (1998), 406, p.499-506.

    L. Singleton, Y. Ansel, R. Baron, G. K. L. Marx, M. Nienhaus, F. Schmitz, G. Schönhense, A. Schmidt,
    "Miniaturized Objective Lens for a Photoelectron Emission Microscope",
    in Micromachining Technology for Micro-Optics Ed. S.H. Lee, SPIE Proceedings Series (2000), 4179, p.146-157.

    L. Singleton, R. Baron, G. K. L. Marx, G. Schönhense, A. Schmidt,
    "Fabrication of a miniaturised objective lens for a Photoemission Electron Microscope (PEEM)",
    Conference Proceedings Microtec 2000, Hannover (2001), , p.699-704.

    A. Oelsner, O. Schmidt, M. Schicketanz, M. J. Klais, G. Schönhense, V. Mergel, O. Jagutzki, H. Schmidt-Böcking,
    "Microspectroscopy and imaging using a delayline-detector in time-of-flight photoemission microscopy",
    Rev. Sci. Instrum. (2001), 72, p.3968-3974.
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    G. Schönhense, A. Oelsner, O. Schmidt, G. H. Fecher, V. Mergel, O. Jagutzki, H. Schmidt-Böcking,
    "Time-Of-Flight Photoemission Electron Microscopy - A New Way To Chemical Surface Analysis",
    Surface Science (2001), 480, p.180-187.
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    S. A. Nepijko, N. N. Sedov, G. Schönhense, M. Escher,
    "Use of Emission Electron Microscope for Potential Mapping in Semiconductor Microelectronics",
    J. of Microscopy (2002), 206, p.132-138.
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    C. M. Schneider, R. Frömter, Ch. Ziethen, W. Swiech, N. B. Brookes, G. Schönhense, J. Kirschner,
    "Magnetic Domain Imaging with a Photoemission Microscope",
    Mat. Res. Soc. Symp. Proc. (1997), 475, p.381-393.

    W. Swiech, G. H. Fecher, Ch. Ziethen, O. Schmidt, G. Schönhense, K. Grzelakowski, C. M. Schneider, R. Frömter, J. Kirschner,
    "Recent Progress in Photoemission Microscopy with Emphasis on Chemical and Magnetic Sensitivity",
    J. Electron Spectr. Relat. Phenom. (1997), 84, p.171-188.

    W. Swiech, R. Frömter, C. M. Schneider, W. Kuch, Ch. Ziethen, O. Schmidt, G. H. Fecher, G. Schönhense, J. Kirschner,
    "Magnetically resolved and element specific imaging with photoelectrons using an immersion lens column",
    in: Electron Microscopy 1998, IOP Bristol and Philadelphia (1998), II, p.511-0.

    Ch. Ziethen, O. Schmidt, G. H. Fecher, C. M. Schneider, G. Schönhense, R. Frömter, M. Seider, K. Grzelakowski, M. Merkel, D. Funnemann, W. Swiech, H. Gundlach, J. Kirschner,
    "Fast Elemental Mapping and Magnetic Imaging with High Lateral Resolution Using a Novel Photoemission Microscope",
    J. Electron Spectr. Relat. Phenom. (1998), 88-91, p.983-989.

    W. Kuch, R. Frömter, J. Gilles, D. Hartmann, Ch. Ziethen, C. M. Schneider, G. Schönhense, W. Swiech, J. Kirschner,
    "Element-selective magnetic imaging in exchange-coupled systems by magnetic photoemission microscopy",
    Surf. Rev. and Lett. (1998), 5(6), p.1241-1248.
    click here for on-line version

    G. Schönhense,
    "Imaging of Magnetic Structures by Photoemission Electron Microscopy",
    J. Phys.: Condens. Matter (1999), 11(48), p.9517-9547.
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    S. A. Nepijko, N. N. Sedov, G. Schönhense,
    "Measurement of Magnetic Fields and Domain Structures Using a Photoemission Electron Microscope",
    In: Advances in Imaging and Electron Physics (Ed. P.Hawkes) (2000), 113, p.205-248.

    G. K. L. Marx, H. J. Elmers, G. Schönhense,
    "Magneto-Optical Linear Dichroism in Threshold Photoemission Electron Microscopy of Polycrystalline Fe Films",
    Phys. Rev. Lett. (2000), 84(25), p.5888-5891.
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    C. M. Schneider, O. de Haas, U. Muschiol, N. Cramer, A. Oelsner, M. Klais, O. Schmidt, G. H. Fecher, W. Jark, G. Schönhense,
    "Photoemission Microscopy from Magnetically Coupled Thin Film Systems",
    J. Magn. Magn. Mater. (2001), 233(1), p.14-20.
    click here for on-line version

    G. Schönhense,
    "Magnetic Domain Imaging of Thin Metallic Layers Using PEEM",
    in: Physics of Low-Dimensional Systems, Ed. By J.L. Moran-Lopez, Kluwer Academic/Plenum Publishers, (2001), , p.309-333.

    S. A. Nepijko, M. Klais, A. Oelsner, O. Schmidt, G.H. Fecher, G. Schönhense, U. Muschiol, C. M. Schneider, S. Zennaro, N. Zema, N. N. Sedov,
    "New Applications of the Magnetic X-ray Circular Dichroism Method for Surface-Magnetism Investigations in a Photoemission Electron Microscope",
    Appl. Phys. A (2002), 74(2), p.295-298.
    click here for on-line version

    C. M. Schneider, G. Schönhense,
    "Investigating Surface Magnetism by Means of Photoexcitation Electron Emission Microscopy (PEEM)",
    Rep. Prog. Phys. (2002), 65(12), p.0-0.
    click here for on-line version

    C. M. Schneider, O. de Haas, D. Tietjen, U. Muschiol, N. Cramer, Z. Celinski, A. Oelsner, M. Klais, Ch. Ziethen, O. Schmidt, G. Schönhense, N. Zema, S. Zennaro,
    "Size-Dependence of Magnetic Domain Patterns in Exchange-Biased Permalloy/NiO Microstructures",
    J. Phys. D: Appl. Phys. (2002), 35(20), p.2472-2478.
    click here for on-line version

    S. A. Nepijko, M. Klais, G. Schönhense, N. Cramer, Z. Celinski, C. M. Schneider, S. Zennaro, N. Zema, N. N. Sedov,
    "Micromagnetism of two-dimensional permalloy particles with different aspect ratio",
    Appl. Phys. A (2003), 76(5), p.809-815.
    click here for on-line version

    C. Felser, B. Heitkamp, F. Kronast, D. Schmitz, S. Cramm, H. A. Dürr, H. J. Elmers, G. H. Fecher, S. Wurmehl, T. Block, D. Valdaitsev, S. A. Nepijko, A.Gloskovskii, G. Jakob, G. Schönhense, W. Eberhardt,
    "Investigation of a novel material for magnetoelectronics: Co2Cr0.6Fe0.4Al",
    J. Phys.: Condens.Matter (2003), 15, p.7019-7027.
    click here for on-line version

    O. Schmidt, Ch. Ziethen, G. H. Fecher, M. Merkel, M. Escher, D. Menke, U. Kleineberg, U. Heinzmann, G. Schönhense,
    "Chemical Microanalysis by Selected-Area ESCA Using an Electron Energy Filter in a Photoemission Microscope",
    J. Electron Spectrosc. Relat. Phenom. (1998), 88-91, p.1009-1014.

    U. Kleineberg, D. Menke, F. Hamelmann, U. Heinzmann, O. Schmidt, G. H. Fecher, G. Schönhense,
    "Photoemission Microscopy with Microspot-XPS by use of Undulator Radiation and a High-Throughput Multilayer Monochromator at BESSY",
    J. Electron Spectr. Relat. Phenom (1999), 101-103, p.931-936.

    W. Grahneis, Ch. Ziethen, G. H. Fecher, G. Schönhense,
    "Combined chemical Microanalysis using SAM and X-PEEM",
    Jap. J. Appl. Phys. Suppl. (1999), 38-1, p.317-0.

    Ch. Ziethen, O. Schmidt, G. K. L. Marx, G. Schönhense, R. Frömter, J. Gilles, J. Kirschner, C. M. Schneider, O. Gröning,
    "Orbital Mapping of Carbon Thin Films by XANES-Spectromicroscopy",
    J. Electron Spectr. Relat. Phenom. (2000), 107, p.261-271.

    M. Merkel, M. Escher, J. Settemeyer, D. Funnemann, A. Oelsner, Ch. Ziethen, O. Schmidt, M. Klais, G. Schönhense,
    "Microspectroscopy and Spectromicroscopy with Photoemission Electron Microscopy Using a New Kind of Imaging Energy Filter",
    Surf. Sci. (2001), 480, p.196-202.
    click here for on-line version

    M. Escher, N. Weber, M. Merkel, B. Krömker, D. Funnemann, S. Schmidt, F. Reinert, F. Forster, S. Hüfner, P. Bernhard, Ch. Ziethen, H. J. Elmers, G. Schönhense,
    "NanoESCA: Imaging UPS and XPS with high energy resolution",
    J. Electron Spectrosc. Relat. Phenom. (2005), 144-147, p.1189-1182.

    M. Escher, N. Weber, M. Merkel, Ch. Ziethen, P. Bernhard, G. Schönhense, S. Schmidt, F. Forster, F. Reinert, B. Krömker, D. Funnemann,
    "NanoESCA: a novel energy filter for imaging X-ray photoemission spectroscopy",
    J. Phys.: Condens. Matter (2005), 17(16), p.0-0.
    click here for on-line version

    S. A. Nepijko, N. N. Sedov, G. Schönhense, M. Escher, X. Bao, W. Huang,
    "Resolution Deterioration in Emission Electron Microscopy due to Object Roughness",
    Ann. Phys. (2000), 9, p.441-451.
    click here for on-line version

    S. A. Nepijko, N. N. Sedov, O. Schmidt, G. Schönhense, X. Bao, W. Huang,
    "Imaging of Three-Dimensional Objects in Emission Electron Microscopy",
    Journal of Microscopy (2001), 202, p.480-487.
    click here for on-line version

    S. A. Nepijko, N. N. Sedov, Ch. Ziethen, G. Schönhense, M. Merkel, M. Escher,
    "Peculiarities of Imaging One- and Two-Dimensional Structures in an Emission Electron Microscope. I Theory",
    Journal of Microscopy (2000), 199, p.124-129.
    click here for on-line version

    S. A. Nepijko, N. N. Sedov, O. Schmidt, G. H. Fecher, G. Schönhense,
    "Size of Three-Dimensional Objects Measured by Means of Photoemission Electron Microscopy",
    Ann. Phys. (2002), 11(1), p.39-48.

    A. Oelsner, Ch. Ziethen, G. H. Fecher, G. Schönhense,
    "Imaging of Dichroism in Photoemission Electron Microscopy at Non-Magnetic Materials Using Circularly Polarized Soft X-rays",
    Surf. Rev. Lett. (2002), 9(1), p.509-513.
    click here for on-line version

    S. A. Nepijko, N. N. Sedov, G. Schönhense, U. Muschiol, C. M. Schneider, S. Zennaro, N. Zema,
    "Resolution of an Emission Electron Microscope in the Presence of Magnetic Fields on the Object",
    Ann. Phys. (2002), 11(6), p.461-471.

    S. A.Nepijko, A. V. Gloskovskii, N. N. Sedov, G. Schönhense,
    "Measurement of the electric field distribution and potentials on the object surface in an emission electron microscope without restriction of the electron beam",
    Journal of Microscopy (2003), 211, p.89-94.
    click here for on-line version

    A. Gloskovskii, D. A.Valdaitsev, S. A. Nepijko, G. Schönhense,
    "Electrical and emission properties of current-carrying silver nanocluster films investigated by emission electron microscopy",
    Microsc. Microanal. (2003), 9(3), p.176-177.

    A. Gloskovskii, D.Valdaitsev, S. A. Nepijko, N. N. Sedov, G. Schönhense,
    "Electrical and emission properties of current-carrying silver cluster films detected by an emission electron microscope",
    Appl. Phys. A (2004), 79(3), p.707-712.
    click here for on-line version

    S. A. Nepijko, A. Oelsner, A. Krasyuk, A. Gloskovskii, N. N. Sedov, C. M. Schneider, G. Schönhense,
    "Lateral resolving power of a time-of-flight photoemission electron microscope",
    Appl. Phys. A (2004), 78, p.47-51.
    click here for on-line version

    O. Schmidt, G. H. Fecher, Y. Hwu, G. Schönhense,
    "The Spatial Distribution of Non-linear Effects in Sub-Threshold Photoemission from Metallic Adsorbates on Si(111)",
    Surf. Sci. (2001), 482-485, p.687-692.
    click here for on-line version

    O. Schmidt, M. Bauer, C. Wiemann, R. Porath, M. Scharte, O. Andreyev, G. Schönhense, M. Aeschlimann,
    "Time-Resolved Two Photon Photoemission Electron Microscopy",
    Appl. Phys. B (2002), 74, p.223-227.
    click here for on-line version

    G. H. Fecher, O. Schmidt, Y. Hwu, G. Schönhense,
    "Multiphoton Photoemission Electron Microscopy Using Femtosecond Laser Radiation",
    J. Electr. Spectr. Relat. Phenom. (2002), 126, p.77-87.
    click here for on-line version

    M. Cinchetti, A. Oelsner, G. H. Fecher, H. J. Elmers, G. Schönhense,
    "Observation of Cu surface inhomogeneities by multiphoton photoemission spectromicroscopy",
    Appl. Phys. Lett. (2003), 83, p.1503-1505.
    click here for on-line version

    M. Cinchetti, A. V. Gloskovskii, D. A. Valdaitsev, A. Oelsner, G. H. Fecher, S. A. Nepijko, H. J. Elmers, G. Schönhense,
    "Emission electron microscopy of nanoparticles in strong fs laser fields",
    Microsc. Microanal. (2003), 9(3), p.168-169.

    M. Cinchetti, D. A.Valdaitsev, A. Gloskovskii, A. Oelsner, S. A. Nepijko, G. Schönhense,
    "Photoemission time-of-flight spectromicroscopy of Ag nanoparticle films on Si(111)",
    J. Electron. Spectr. Rel. Phenom. (2004), 137-140, p.249-257.
    click here for on-line version

    M. Cinchetti, G. Schönhense,
    "Two-photon photoemission spectromicroscopy of noble metal clusters on surfaces studied using time-of-flight photoemission electron microscopy",
    J. Phys.: Condens. Matter (2005), 17(!&), p.0-0.
    click here for on-line version

    M. Cinchetti, A. Gloskovskii, S. A. Nepjiko, G. Schönhense, H. Rochholz, M. Kreiter,
    "Photoemission Electron Microscopy as a tool for the investigation of optical near fields",
    Phys. Rev. Lett. (2005), 95, p.47601-4.
    click here for on-line version

    F. Wegelin, Ch. Ziethen, G. Schönhense, M. Neuhäuser, R. Ohr, H. Hilgers,
    "Defektanalyse von a-C- und CNx -Schichten mittels Röntgen-Photoemissions-Elektronenmikroskopie (X-PEEM)",
    Vakuum in Forschung und Praxis (2001), 13, p.287-292.

    Ch. Ziethen, F. Wegelin, G. Schönhense, R. Ohr, M. Neuhäuser, H. Hilgers,
    "Soft X-ray Photoelectron Microscopy Used for the Characterisation of Stoichiometric Defects in Diamond, a-C and CNx Thin Films",
    Diamond and Related Materials (2002), 11, p.1068-1073.
    click here for on-line version

    P. Bernhard, Ch. Ziethen, R. Ohr, H. Hilgers, G. Schönhense,
    "Investigations of the corrosion protection of ultrathin a-C and a-C:N overcoats for magnetic storage devices",
    Surf. and Coatings Techn. (2004), 180-181, p.621-626.
    click here for on-line version

    G. Schönhense, H. Spiecker,
    "Correction of Chromatic and Spherical Aberrations in Electron Microscopy Utilizing the Time-Structure of Pulsed Excitation Sources",
    J. Vac. Sci. Technol. B (2002), 20, p.2526-2534.
    click here for on-line version

    G. Schönhense, H. Spiecker,
    "Chromatic and spherical aberration correction using time dependent acceleration and lens fields",
    in: Recent Trends in Charged Particle Optics, Brno 2002 (ISBN 80-238-8986-9) (2002), , p.71-73.

    A. Oelsner, A. Krasyuk, G. H. Fecher, C. M. Schneider, G. Schönhense,
    "Image enhancement in photoemission electron microscopy by means of imaging time-of-flight analysis",
    J. Electron. Spectr. Rel. Phenom. (2004), 137-140, p.757-761.
    click here for on-line version

    G. Schönhense, A. Oelsner, A. Krasyuk, C. M. Schneider, M. Bauer, M. Aeschlimann,
    "Imaging sub-nanosecond processes using photoemission electron microscopy",
    in: Recent Trends in Charged Particle Optics, Brno 2002 (ISBN 80-238-8986-9) (0), , p.87-90.

    A. Krasyuk, A. Oelsner, S. A. Nepijko, A. Kuksov, C. M. Schneider, G. Schönhense,
    "Time-resolved photoemission electron microscopy of magnetic field and magnetisation changes",
    Appl. Phys. A (2003), 76(6), p.863-868.
    click here for on-line version

    A. Krasyuk, A. Oelsner, S. A. Nepijko, A. Kuksov, C. M. Schneider, G. Schönhense,
    "Real-time observation of magnetisation processes in magnetic thin films by means of time-resolved photoemission electron microscopy",
    Microsc. Microanal. (2003), 9(3), p.254-255.

    G. Schönhense,
    "Surface magnetism studied by photoelectron spectromicroscopy with high spatial and time resolution",
    J. Electron. Spectr. Rel. Phenom. (204), 137-140, p.769-783.
    click here for on-line version

    A. Oelsner, A. Krasyuk, D. Neeb, S. A. Nepijko, A. Kuksov, C. M. Schneider, G. Schönhense,
    "Magnetisation changes visualized using Photoemission Electron Microscopy",
    J. Electron. Spectr. Rel. Phenom. (2004), 137-140, p.751-756.
    click here for on-line version

    A. Krasyuk, A. Oelsner, S. A. Nepijko, N. N. Sedov, A. Kuksov, C. M. Schneider, G. Schönhense,
    "Dynamics of magnetic stray fields at initial stage of magnetization reversal of micrometer-sized Co dots",
    Appl. Phys. A (2004), 79, p.1925-1930.
    click here for on-line version

    A. Kuksov, C. M. Schneider, A. Oelsner, A. Krasyuk, D. Neeb, G. Schönhense, C. de Nadai, N. B. Brookes,
    "Investigating magnetisation dynamics in Permalloy Microstructures using time-resolved X-PEEM",
    J. Appl. Phys. (2004), 95, p.6530-6532.
    click here for on-line version

    C. M. Schneider, A. Kuksov, A. Krasyuk, A. Oelsner, D. Neeb, S. A. Nepijko, G. Schönhense, I. Mönch, R. Kaltofen, C. de Nadai, B. Brookes,
    "Incoherent magnetization rotation observed in subnanosecond time-resolving x-ray photoemission electron microscopy",
    Appl. Phys. Lett. (2004), 85, p.2562-2564.
    click here for on-line version

    D. Neeb, A. Krasyuk, A. Oelsner, S. A. Nepijko, H. J. Elmers, A. Kuksov, C. M. Schneider, G. Schönhense,
    "Sub-nanosecond resolution x-ray magnetic circular dichroism photoemission electron microscopy of magnetization processes in a Permalloy ring",
    J. Phys.: Condens. Matter (2005), 17, p.0-0.
    click here for on-line version

    C. M. Schneider, A. Kuksov, A. Krasyuk, A.Oelsner, S. A. Nepijko, G. Schönhense,
    "Time-resolved X-ray photoemission electron microscopy: Imaging magnetodynamics on the 100 ps time scale",
    J. Electron Spectrosc. Relat. Phenom. (2005), 144-147, p.967-971.
    click here for on-line version

    A. Krasyuk, F. Wegelin, S.A. Nepijko, H.J. Elmers, G. Schönhense, M. Bolte, C.M. Schneider,
    "Self-trapping of magnetic oscillation modes in Landau flux-closure structures",
    Phys. Rev. Lett. (2005), 95, p.207201-4.
    click here for on-line version

    G. Schönhense, H. J. Elmers, A. Krasyuk, F. Wegelin, S. A. Nepijko, A. Oelsner, C. M. Schneider,
    "Transient Spatio-Temporal Domain Patterns in Permalloy Microstructures Induced By Fast Magnetic Field Pulses",
    Nucl. Instr. and Methods B (2006), 246(1), p.1-12.
    click here for on-line version

    M. Klais, D. Averty, H. W. Gundel, G. Schönhense,
    "Visualization of field induced ferroelectric electron emission from TGS using emission electron microscopy",
    Appl. Phys. A (2004), 78(1), p.67-72.
    click here for on-line version

    M. Klais, H. W. Gundel, G. Schönhense,
    "Energy-resolved analysis of ferroelectric electron emission from TGS using emission electron microscopy",
    Appl. Phys. A (2005), 80, p.545-549.
    click here for on-line version

    U. Ott, Ch. Sudek, J. Maul, P. Bernhard, H. J. Elmers, G. Schönhense,
    "Nano-ESCA: A valuable tool for studying pre-solar grains and other extraterrestrial materials",
    Lunar and Planetary Science (2005), XXXVI, p.1294-1295.

    G. Schönhense, P. Bernhard, J. Maul, G. Huber, H. J. Elmers, N. Weber, M. Escher, D. Funnemann, Ch. Sudek, U. Ott,
    "Reading messages from space - Nano-ESCA study of pre-solar meteorite dust",
    essy Highlights, Annual Report (2004), , p.34-35.

    P. Bernhard, J. Maul, H. J. Elmers, Ch. Sudek, U. Ott, M. Escher, N. Weber, M. Merkel, B. Krömker, D. Funnemann, G. Schönhense,
    "Trace Element Analysis in Presolar Stardust Grains via Full-field XPS-Imaging (nanoESCA)",
    Nucl. Instr. and Methods B (2006), 246(1), p.275-280.
    click here for on-line version

    M. Dunin v. Przychowski, H. Wiechert, G. K. L. Marx, G. Schönhense,
    "Real-Space Observation of Xenon Adsorption and Desorption Kinetics on Graphite(0001) by Photoemission Electron Microscopy",
    Surf. Sci. (2003), 541, p.46-58.
    click here for on-line version

    M. Dunin v. Przychowski, G. K. L. Marx, G. H. Fecher, G. Schönhense,
    "A Spatially Resolved Investigation of Oxygen Adsorption on Polycrystalline Copper and Titanium by Means of Photoemission Electron Microscopy",
    Surf. Sci. (2004), 549, p.37-51.
    click here for on-line version

    T. Schmitt, P. Guttmann, O. Schmidt, P. Müller-Buschbaum, M. Stamm, G. Schönhense, G. Schmahl,
    "Microscopy of Thin Polymer Blend Films of Polystyrene and Poly-n-butyl-methacrylate",
    in X-Ray Microscopy: Proceedings of the Sixth International Conference (2000), , p.245-249.

    M. Pohl, A. Oelsner, G. Schönhense, M. Möller, H. Decker, U. Kleineberg, U. Heinzmann,
    "Transmission photoelectron microscopy of dry and wet biomaterials",
    Ultramicroscopy (2005), in print, p.0-0.

    A. Gloskovskii, S. A. Nepijko, M. Cinchetti, G. Schönhense, G. H. Fecher, H. C. Kandpal, C. Felser, H. A. Therese, N. Zink, W. Tremel, A. Oelsner,
    "Time-of-Flight Photoelectron Spectromicroscopy of Single MoS2 Nanotubes",
    (0), submitted, p.0-0.

    Liviu I. Chelaru and Frank-J. Meyer zu Heringdorf,
    "Three-dimensional size determination of particles with photoelectron emission microscopy",
    Appl. Phys. Lett. (2006), 89, p.241908-3.
    click here for on-line version



 
 

University of Duisburg-Essen | AG Horn-von Hoegen


 
 



Au (5x3.2) Reconstruction Domains grown on Si(111). Courtesy of F. Meyer zu Heringdorf and R. Tromp, IBM.


Growth of Lead on Cu(111). Courtesy of Gary Kellog, Sandia



PEEM Images of Pentacene Islands on Si. Courtesy of F. Meyer zu Heringdorf and R. Tromp, IBM