measurement and correction of geometric distortions

“Determination and correction of distortions and systematic errors in low-energy electron diffraction”, F. Sojka, M. Meissner, C. Zwick, R. Forker, T. Fritz; Rev.Sci.Instrum. 84, 015111 (2013) doi

“To tilt or not to tilt: Correction of the distortion caused by inclined sample surfaces in low-energy electron diffraction”, F. Sojka, M. Meissner, C. Zwick, R. Forker, M. Vyshnepolsky, C. Klein, M. Horn-von Hoegen, T. Fritz; Ultramicroscopy 133, 35 (2013) doi