The focus of the work in the AG Buck is on the deposition and characterization of self-organized nanostructures – e.g. graphene, nanowalls (MoS2, carbon), ultrananocrystalline diamond as well as amorphous structures on the one hand and surface modifications of nanomaterial by plasma treatment (activation, etching,…) on the other hand. These works are imbedded in the framework of CeNIDE (Center for Nanointegration Duisburg-Essen) and in NETZ (NanoEnergieTechnikZentrum).
The type of work encompasses everything from fundamental research to industrial applications, giving a scientific overlap for the fundamental science with other work groups of the faculty of physics (e.g. surface physics) and cooperation with work groups of the faculty of engineering science when it comes to applications (which is reflected in mutual third party funded projects).
Recently the modification of surfaces by low-pressure and atmospheric-pressure plasma treatment gained importance in the scientific profile of the working group. The plasma treatment of surfaces offers another way to activate und modify those surfaces and improve the surface properties for an application. The AG Buck is excellently equipped with different types of plasma sources that differ in particle density and particle energy. This allows the systematical investigation of the processes at the substrate surface and the optimization of the plasma treatment for technological tasks. Current research work in this field includes tasks that result from the participation in CeNIDE and NETZ. For example the surfaces of bipolar plates are optimized particularly with regard to the wettability by the plasma treatment.

The technical equipment includes systems for virtually any common plasma-assisted deposition and surface modification method (electron beam evaporator, DC- and RF- magnetron sputtering, anodic and cathodic arc, RF-ICP/CCP, microwave plasma CVD and hot filament CVD) – including custom made sources developed in the working group.

For plasma analysis mass spectroscopy, energy analyzer, energy-resolved mass spectrometer (“Plasma monitor”), Langmuir-probe, and Optical Emission Spectroscopy (visual light and IR) are available. The surface analysis includes REM, STM, XRD, FT-IR, Micro-Raman, Hall-Effect, Ellipsometry, Profilometry, as well as special equipment to measure the residual stress and the adhesion of films that was developed in the working group. In addition a high resolution SIMS is intended to be acquired in the framework of NETZ, that will be available for the working group in the future.