In our electron microscopy lab we have scanning electron microscopes with acceleration voltages between 0.05 kV and 40 kV and a spatial resolution down to 1.2 nm. Technical Equipment
Scanning Force Microscopy
Four Scanning Force Microscopes providing a spatial resolution of 10 nm are currently used for the following techniques:
Based on two picosecond/ femtosecond Ti-Saphir-lasers incl. frequency doublers and triplers the dynamic properties of modern materials and devices are investigated in the femtosecond spectroscopy lab. In combination with a streak-camera and a microchannel plate following measurement techniques are used:
time resolved
Photoluminescence-Spectroscopy
time resolved Kerr-Rotation
The core of the micro and nano optic lab are two measurement systems for temperatures between 1.5 K and room temperature. Electrical and magnetic fields up to 5 T could be applied to the systems. Several lasers emitting wavelength between 350 nm and 1 µm are used for the following techniques:
