Universität Duisburg-Essen


Service


Bild Service
       Service
  • Scientific and technical consultation on fabrication and analysis of nanostructures for semiconductor and optoelectronic industry

  • Technical consultation on electrical and physical measurement techniques

  • Services in the fields of technology and analytics

  • Advanced training programs for partners in industry, small enterprises and education centers
          Contact:
          Prof. Dr. Gerd Bacher
          Dr.-Ing. Wolfgang Mertin
          Tel. 0203 / 379 - 3407
          Fax. 0203 / 379 - 3404
          e-mail:
          Prof. Dr. rer. nat. Gerd Bacher
          Dr.-Ing. Wolfgang Mertin



Scanning Force Microscopy

We analyze materials and devices with respect to topography and surface roughness, determine local potential and current distributions in micro- and optoelectronic devices and measure magnetic fields and conductivities with a spatial resolution down to the 10 nm range. The following techniques are available:
  • Kelvin force microscopy
  • Scanning probe current and scanning probe voltage microscopy
  • Magnetic force microscopy
  • Conductive scanning force microscopy
Technical Equipment

Electron Microscopy

We prepare materials and devices (e.g. metal-semiconductor hybrids, semiconductor heterostructures, nanoparticles, optoelectronic devices) for electron microscopy and scanning transmission electron microscopy. A well equipped preparation lab including metallization, polishing and sawing techniques and ion thinning is available.

Combining conventional electron microscopy and scanning transmission electron microscopy we are able to achieve high resolution images of materials and devices and, in addition, get access to morphology, strain, chemical composition and local crystal structure (e.g. lattice constant) with a spatial resolution of about 1 nm. The following techniques are used in our lab:
  • Bright field imaging
  • Z-contrast measurements
  • Parallel electron energy loss spectroscopy (EELS)
  • Convergent beam electron diffraction
Technical Equipment

Time- and Spatially Resolved Optical Spectroscopy

We analyze nanostructures with high spatial (Sub-µm) and temporal (fs/ps-regime) resolution. Besides the analysis of optoelectronics devices we are specialized on the characterization of magnetic semiconductors, ferromagnet-semiconductor hybrids, semiconductor nanostructures and nanoparticles. By time-resolved experiments, characteristic carrier lifetimes, spin lifetimes and scattering time constants of semiconductors, nanostructures and devices can be determined. We can offer the following techniques:
  • Highly spatially resolved magneto-optics
  • Micro-photoluminescence spectroscopy
  • Time-resolved photoluminescence spectroscopy
  • Time-resolved Kerr rotation
Technical Equipment

Nanotechnology and Preparation

In our newly established clean room (120 m2, class 100 and 1000), a variety of nanotechnological equipment is available. Lateral nanostructures with sizes down to 20 nm can be achieved. The following techniques are used:
  • Electron beam lithography
  • Optical lithography
  • Metallization using thin film techniques
  • Wet chemical etching and semiconductor processing
  • Contact technology with ultrasonic bonders
Mainly compound semiconductors and metal-semiconductor hybrids are processed

Technical Equipment

Last modified: Tuesday, 1/25/2011
© Universität Duisburg-Essen - Contact: wet@uni-due.de