- Freeze dryer
- Critical point dryer (CPD)
The Cross Section Polisher is used for the preparation of cross sections for REM- EPMA- and SAM measurements. Any hard or soft samples, as well as compsites materials, are formed with minimal damage and the result is a smooth surface on nearly any metal, ceramic, glas, paper or synthetic material.
An argon beam polishes cross sections on a large, 1mm², area. The grazing incident angle minimizes Ar contamination. The sample can be partially protected from the Ar beam using a shadow mask system.
An embedding of the sample is usually not necessary.
|Ionbeam width (FWHM – full width half maximum):||500µm (at 6kV on Si sample)|
|Sputtering speed:||100µm/ hours on Si|
|Sample size (max.):||11mm (W) x 10mm (L) x 2mm (H)|
|Travel distance:||+/- 10mm (X-Achse), +/- 3mm (Y-Achse)|
|Gas for ion source:||Argon|
|Pressure gauge:||Penning tube|
|Main vacuum pump:||Turbomolecular pump(TMP) 10-4 Pa|
|Pre pump:||Rotary vane pump|
|Alignment camera:||Magnification 70 x (on a 16,5 cm display)|