Mitarbeiter Prof. Buck

Prof. i.R. Dieter Mergel

Raum
MC 385
Telefon
+49 203 379 2190/2335
Telefax
+49 203 379 46 06
E-Mail
dieter.mergel@uni-due.de

Funktionen

  • Professor/in, Technische Physik

Aktuelle Veranstaltungen

Keine aktuellen Veranstaltungen.

Vergangene Veranstaltungen (max. 10)

Die folgenden Publikationen sind in der Online-Universitätsbibliographie der Universität Duisburg-Essen verzeichnet. Weitere Informationen finden Sie gegebenenfalls auch auf den persönlichen Webseiten der Person.

    Artikel in Zeitschriften

  • Schipporeit, Sebastian; Jerman, Martin; Mergel, Dieter
    Crystallization and conductivity of large-domain Nb-doped TiO₂ films prepared by electron beam evaporation
    In: Thin Solid Films, Jg. 754, 2022, 139299
    DOI
  • Dorow-Gerspach, Daniel; Mergel, Dieter; Wuttig, Matthias
    Effects of different amounts of nb doping on electrical, optical and structural properties in sputtered tio₂−ₓ films
    In: Crystals, Jg. 11, 2021, Nr. 3, 301
    DOI (Open Access)
  • Doyle, T.B.; Mergel, Dieter; Schröter, W.; Wagner, R.
    Line defects in crystals and flux pinning in superconductors Scientific work of Reiner Labusch (1935 - 2016)
    18th International Conference on Extended Defects in Semiconductors, EDS 2016, 25-29 September 2016, Saint Aygulf, France,
    In: Materials Today: Proceedings, Jg. 5, 2018, Nr. 6, S. 14662 – 14692
    DOI
  • Schipporeit, Sebastian; Mergel, Dieter
    Spectral decomposition of Raman spectra of mixed-phase TiO₂ thin films on Si and silicate substrates
    In: Journal of Raman Spectroscopy, Jg. 49, 2018, Nr. 7, S. 1217 – 1229
    DOI
  • Mukherjee, Sanat Kumar; Nebatti, Abdelkader; Mohtascham, F.; Schipporeit, Sebastian; Notthoff, C.; Mergel, Dieter
    Influence of thickness on the structural properties of radio-frequency and direct-current magnetron sputtered TiO2 anatase thin films
    In: Thin Solid Films, Jg. 558, 2014, S. 443 – 448
    DOI
  • Mukherjee, Sugata K.; Becker, Hans Werner; Cadiz Bedini, Andrew P.; Nebatti, Abdelkader; Notthoff, Christian; Rogalla, Detlef; Schipporeit, Sebastian; Soleimani-Esfahani, A.; Mergel, Dieter
    Structural and electrical properties of Nb-doped TiO₂ films sputtered with plasma emission control
    In: Thin Solid Films, Jg. 568, 2014, Nr. 1, S. 94 – 101
    DOI
  • Mukherjee, Sugata K.; Mergel, Dieter
    Thickness dependence of the growth of magnetron-sputtered TiO₂ films studied by Raman and optical transmittance spectroscopy
    In: Journal of Applied Physics, Jg. 114, 2013, Nr. 1
    DOI
  • Piegdon, Karoline; Lexow, Matthias Michael; Grundmeier, Guido; Kitzerow, Heinz Siegfried R.; Pärschke, Klaus; Mergel, Dieter; Reuter, Dirk; Wieck, Andreas Dirk; Meier, Cedrik
    All-optical tunability of microdisk lasers via photo-adressable polyelectrolyte functionalization
    In: Optics Express (OpEx), Jg. 20, 2012, Nr. 6, S. 6060 – 6067
    DOI (Open Access)
  • Mergel, Dieter
    Keimbildung und Wachstum von TiO2 in dünnen Schichten : Bombardierung erzeugt Rutil-Keime; bei 250°C entstehen große Anatas-Körner
    In: Vakuum in Forschung und Praxis, Jg. 23, 2011, Nr. 1, S. 20 – 23
    DOI
  • Mergel, Dieter; Jerman, Martin
    Density and refractive index of thin evaporated films
    In: Chinese Optics Letters, Jg. 8, 2010, Nr. Suppl., S. 67 – 72
    DOI
  • Qiao, Zhaohui; Mergel, Dieter
    Dielectric modeling of transmittance and ellipsometric spectra of thin In ₂O ₃ : Sn films
    In: Physica Status Solidi (A) - Applications and Materials Science, Jg. 207, 2010, Nr. 7, S. 1543 – 1548
    DOI
  • Jerman, Martin; Mergel, Dieter
    Post-heatig of SiO2 films for optical coatings
    In: Thin Solid Films, Jg. 516, 2008, Nr. 23, S. 8749 – 8751
    DOI
  • Davies, Patrick Laurie; Gather, U.; Meise, Monika; Mergel, Dieter; Mildenberger, T.
    Residual Based Localisation and Quantification of Peaks in X-Ray Diffractograms.
    In: Annals of Applied Statistics, 2, 2008, S. 861 – 886
  • Reddy, Kesava Y.K.V.; Mergel, Dieter
    Frequency and temperature-dependent dielectric properties of BaTiO3 thin film capacitors studied by complex impedance spectroscopy
    In: Physica B: Condensed Matter, Jg. 391, 2007, Nr. 2, S. 212 – 221
    Online Volltext
  • Jerman, Martin; Mergel, Dieter
    Structural investigation of thin TiO2 films prepared by evaporation and post-heating
    In: Thin Solid Films, Jg. 515, 2007, Nr. 17, S. 6904 – 6908
    DOI
  • Reddy, Kesava Y.K.V.; Mergel, Dieter
    Impedance spectroscopy study of RuO2/SrTiO3 thin film capacitors prepared by radio-frequency magnetron sputtering
    In: Materials Science and Engineering: B, Jg. 130, 2006, Nr. 1-3, S. 237 – 245
    Online Volltext
  • Reddy, Kesava Y.K.V.; Mergel, Dieter
    Structural and electrical properties of RuO2 thin films prepared by rf-magnetron sputtering and annealing at different temperatures
    In: Journal of Materials Science: Materials in Electronics, Jg. 17, 2006, Nr. 12, S. 1029 – 1034
    Online Volltext
  • Reddy, Kesava Y.K.V.; Mergel, D.; Reuter, S.; Buck, Volker; Sulkowski, Martin
    Structural and optical properties of BaTiO3 thin films prepared by radio-frequency magnetron sputtering at various substrate temperatures
    In: Journal of Physics D: Applied Physics, Jg. 39, 2006, Nr. 6, S. 1161 – 1168
    DOI
  • Jerman, Martin; Qiao, Zhaohui; Mergel, Dieter
    Refractive index of thin films of SiO2, ZrO2, and HfO2 as a function of the films' mass density
    In: Applied Optics, Jg. 44, 2005, Nr. 15, S. 3006 – 3012
  • Mergel, Dieter; Schenkel, M.; Ghebre, M.; Sulkowski, Margareta
    Structural and electrical properties of In2O3 : Sn films prepared by radio-frequency sputtering
    In: Thin Solid Films, Jg. 392, 2001, Nr. 1, S. 91 – 97
    DOI

    • Bücher/Sammelwerke/Tagungsbände

  • Mergel, Dieter
    Physics with Excel and Python : Using the Same Data Structure ; Volume I: Basics, Exercises and Tasks
    Cham: Springer, 2023
    DOI