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MC 385

Funktionen

  • Professor/in, Technische Physik

Die folgenden Publikationen sind in der Online-Universitätsbibliographie der Universität Duisburg-Essen verzeichnet. Weitere Informationen finden Sie gegebenenfalls auch auf den persönlichen Webseiten der Person.

    Artikel in Zeitschriften

  • Dorow-Gerspach, Daniel; Mergel, Dieter; Wuttig, Matthias
    Effects of different amounts of nb doping on electrical, optical and structural properties in sputtered tio₂−ₓ films
    In: Crystals Jg. 11 (2021) Nr. 3, S. 301
    ISSN: 2073-4352
  • Doyle, T.B.; Mergel, Dieter; Schröter, W.; Wagner, R.;
    Line defects in crystals and flux pinning in superconductors Scientific work of Reiner Labusch (1935 - 2016)
    18th International Conference on Extended Defects in Semiconductors, EDS 2016, 25-29 September 2016, Saint Aygulf, France,
    In: Materials Today: Proceedings Jg. 5 (2018) Nr. 6, S. 14662 - 14692
    ISSN: 2214-7853
  • Schipporeit, Sebastian; Mergel, Dieter
    Spectral decomposition of Raman spectra of mixed-phase TiO₂ thin films on Si and silicate substrates
    In: Journal of Raman Spectroscopy Jg. 49 (2018) Nr. 7, S. 1217 - 1229
    ISSN: 1097-4555; 0377-0486
  • Mukherjee, Sanat Kumar; Nebatti, Abdelkader; Mohtascham, F.; Schipporeit, Sebastian; Notthoff, C.; Mergel, Dieter
    Influence of thickness on the structural properties of radio-frequency and direct-current magnetron sputtered TiO2 anatase thin films
    In: Thin Solid Films Jg. 558 (2014) S. 443 - 448
    ISSN: 0040-6090
  • Mukherjee, Sugata K.; Becker, Hans Werner; Cadiz Bedini, Andrew P.; Nebatti, Abdelkader; Notthoff, Christian; Rogalla, Detlef; Schipporeit, Sebastian; Soleimani-Esfahani, A.; Mergel, Dieter
    Structural and electrical properties of Nb-doped TiO₂ films sputtered with plasma emission control
    In: Thin Solid Films Jg. 568 (2014) Nr. 1, S. 94 - 101
    ISSN: 0040-6090
  • Mukherjee, Sugata K.; Mergel, Dieter
    Thickness dependence of the growth of magnetron-sputtered TiO₂ films studied by Raman and optical transmittance spectroscopy
    In: Journal of Applied Physics Jg. 114 (2013) Nr. 1,
    ISSN: 0021-8979; 1089-7550
  • Piegdon, Karoline; Lexow, Matthias Michael; Grundmeier, Guido; Kitzerow, Heinz Siegfried R.; Pärschke, Klaus; Mergel, Dieter; Reuter, Dirk; Wieck, Andreas Dirk; Meier, Cedrik
    All-optical tunability of microdisk lasers via photo-adressable polyelectrolyte functionalization
    In: Optics Express Jg. 20 (2012) Nr. 6, S. 6060 - 6067
    ISSN: 1094-4087
  • Mergel, Dieter
    Keimbildung und Wachstum von TiO2 in dünnen Schichten : Bombardierung erzeugt Rutil-Keime; bei 250°C entstehen große Anatas-Körner
    In: Vakuum in Forschung und Praxis: Zeitschrift für Vakuumtechnologie, Oberflächen und Dünne Schichten Jg. 23 (2011) Nr. 1, S. 20 - 23
    ISSN: 1522-2454; 0947-076X
  • Mergel, Dieter; Jerman, Martin
    Density and refractive index of thin evaporated films
    In: Chinese Optics Letters Jg. 8 (2010) Nr. Suppl., S. 67 - 72
    ISSN: 1671-7694
  • Qiao, Zhaohui; Mergel, Dieter
    Dielectric modeling of transmittance and ellipsometric spectra of thin In ₂O ₃ : Sn films
    In: Physica Status Solidi (A) Applications and Materials Science Jg. 207 (2010) Nr. 7, S. 1543 - 1548
    ISSN: 1862-6319
  • Jerman, Martin; Mergel, Dieter
    Post-heatig of SiO2 films for optical coatings
    In: Thin Solid Films Jg. 516 (2008) Nr. 23, S. 8749 - 8751
    ISSN: 0040-6090
  • Davies, Patrick Laurie; Gather, U.; Meise, Monika; Mergel, Dieter; Mildenberger, T.
    Residual Based Localisation and Quantification of Peaks in X-Ray Diffractograms.
    In: Annals of Applied Statistics, 2 (2008) S. 861 - 886
  • Reddy, Kesava Y.K.V.; Mergel, Dieter
    Frequency and temperature-dependent dielectric properties of BaTiO3 thin film capacitors studied by complex impedance spectroscopy
    In: Physica B: Condensed Matter Jg. 391 (2007) Nr. 2, S. 212 - 221
    ISSN: 0921-4526
  • Jerman, Martin; Mergel, Dieter
    Structural investigation of thin TiO2 films prepared by evaporation and post-heating
    In: Thin Solid Films Jg. 515 (2007) Nr. 17, S. 6904 - 6908
    ISSN: 0040-6090
  • Reddy, Kesava Y.K.V.; Mergel, Dieter
    Impedance spectroscopy study of RuO2/SrTiO3 thin film capacitors prepared by radio-frequency magnetron sputtering
    In: Materials Science and Engineering: B Jg. 130 (2006) Nr. 1-3, S. 237 - 245
    ISSN: 0921-5107
  • Reddy, Kesava Y.K.V.; Mergel, Dieter
    Structural and electrical properties of RuO2 thin films prepared by rf-magnetron sputtering and annealing at different temperatures
    In: Journal of Materials Science: Materials in Electronics Jg. 17 (2006) Nr. 12, S. 1029 - 1034
    ISSN: 1573-482X; 0957-4522
  • Reddy, Y. K. Vayunandana; Mergel, D.; Reuter, S.; Buck, V.; Sulkowski, M.
    Structural and optical properties of BaTiO3 thin films prepared by radio-frequency magnetron sputtering at various substrate temperatures.
    In: Journal of Physics D: Applied Physics Jg. 39 (2006) Nr. 6, S. 1161 - 1168
    ISSN: 0022-3727
  • Jerman, Martin; Qiao, Zhaohui; Mergel, Dieter
    Refractive index of thin films of SiO2, ZrO2, and HfO2 as a function of the films' mass density
    In: Applied Optics Jg. 44 (2005) Nr. 15, S. 3006 - 3012
    ISSN: 0003-6935; 1539-4522
  • Mergel, Dieter; Schenkel, M.; Ghebre, M.; Sulkowski, Margareta
    Structural and electrical properties of In2O3:Sn films prepared by radio-frequency sputtering
    In: Thin Solid Films Jg. 392 (2001) Nr. 1, S. 91 - 97
    ISSN: 0040-6090