x-ray structure analysis
Welcome to the X-ray facility
Powder X-Ray Diffraction (PXRD)
Measurement at ambient temperature in reflection (powder and solid specimens) and transmission (capillary and foils), qualitative (EVA 4.2.2 Bruker) and quantitative phase analysis (Rietveld refinement with TOPAS 5.0 Bruker) e.g. for determination of lattice parameters, phase contents, crystallite size and microstrain.
In-situ X-ray diffraction in temperature chamber Anton Paar (HTK 16N with Ta heating strip, up to T=1600 °C in high vacuum), small angle (SAXS) and wide angle X-ray scattering (WAXS) for determination of particle size and atomic arrangement with vacuum chamber Scatter X78 (up to 78° 2Θ), thin-film application under grazing incidence (GI-XRD), measurement of texture (Pole figures) and macrostress (d=f(sin2(ψ)).
Single-Crystal X-Ray Diffraction (SCXRD)
Structure determination of single crystals larger than 0.01 mm in the smallest dimension (different wavelength available: MoKα 0.71 Å Sealed Tube, CuKα 1.54 Å Micro Focus Source). On demand including intermolecular interactions/analysis of the packing, solution of twinned crystal structures, determination of absolute configuration of chiral compounds. Sample preparation at low temperature, advice on growing crystals