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Prof. Dr.rer.nat. Michael Horn-von Hoegen

Fakultät für Physik, Experimentalphysik

Anschrift
Lotharstr. 1
47057 Duisburg
Raum
MF 263
Telefon
+ 49 203 37 91438 / 91439
Telefax
+49 203 37 91555
E-Mail
horn-von-hoegen@uni-due.de
Webseite
http://www.uni-due.de/ag-hvh/

Funktionen

  • Vertrauensdozent der DFG an der Universität Duisburg-Essen, Experimentalphysik

  • Prodekan/in, Dekanat Fakultät für Physik

  • Leiter, Arbeitsgruppe Prof. Horn-von Hoegen

Die folgenden Publikationen sind in der Online-Universitätsbibliographie der Universität Duisburg-Essen verzeichnet. Weitere Informationen finden Sie gegebenenfalls auch auf den persönlichen Webseiten der Person.

    Artikel in Zeitschriften

  • Fortmann, Jonas D.; Kaßen, Alexander; Brand, Christian; Duden, Thomas; Horn-Von Hoegen, Michael
    Implementation and performance of a fiber-coupled CMOS camera in an ultrafast reflective high-energy electron diffraction experiment
    In: Structural Dynamics / American Crystallographic Association (ACA) (Hrsg.) , Jg. 12 2025, Nr. 2, 024301
    DOI, Online Volltext (Open Access)
  • Lu, Wei; Nicoul, Matthieu; Shymanovich, Uladzimir; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    A modular table-top setup for ultrafast X-ray diffraction
    In: Review of Scientific Instruments , Jg. 95 2024, 013002
    Online Volltext, DOI (Open Access)
  • Pfnür, H.; Tegenkamp, C.; Sanna, S.; Jeckelmann, E.; Horn-von Hoegen, Michael; Bovensiepen, Uwe; Esser, N.; Schmidt, W.G.; Dähne, M.; Wippermann, S.; Bechstedt, F.; Bode, M.; Claessen, R.; Ernstorfer, R.; Hogan, C.; Ligges, M.; Pucci, A.; Schäfer, J.; Speiser, E.; Wolf, M.; Wollschläger, J.
    Atomic wires on substrates : Physics between one and two dimensions
    In: Surface Science Reports , Jg. 79 2024, Nr. 2, 100629
    DOI (Open Access)
  • Brand, Christian; Hucht, Alfred; Mehdipour, Hamid; Jnawali, Giriraj; Fortmann, Jonas D.; Tajik, Mohammad; Hild, Rüdiger; Sothmann, Björn; Kratzer, Peter; Schützhold, Ralf; Horn-von Hoegen, Michael
    Critical behavior of the dimerized Si(001) surface : Continuous order-disorder phase transition in the two-dimensional Ising universality class
    In: Physical Review B , Jg. 109 2024, Nr. 13, 134104
    DOI, Online Volltext (Open Access)
  • Thiemann, Fabian; Sciaini, G.; Kassen, A.; Lott, T. S.; Horn-von Hoegen, Michael
    Disentangling the electronic and lattice contributions to the dielectric response of photoexcited bismuth
    In: Physical Review B , Jg. 109 2024, Nr. 4, L041105
    DOI, Online Volltext (Open Access)
  • Dreher, Pascal; Janoschka, David; Giessen, Harald; Schützhold, Ralf; Davis, Timothy J.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Momentum space separation of quantum path interferences between photons and surface plasmon polaritons in nonlinear photoemission microscopy
    In: Nanophotonics , Jg. 13 2024, Nr. 9, S. 1593 – 1602
    DOI, Online Volltext (Open Access)
  • Horn-von Hoegen, Michael
    Structural dynamics at surfaces by ultrafast reflection high-energy electron diffraction
    In: Structural Dynamics / American Crystallographic Association (ACA) (Hrsg.) , Jg. 11 2024, Nr. 2, 021301
    DOI, Online Volltext (Open Access)
  • Brand, Christian; Hucht, Alfred; Jnawali, Giriraj; Fortmann, Jonas Darius; Sothmann, Björn; Mehdipour, Hamid; Kratzer, Peter; Schützhold, Ralf; Horn-von Hoegen, Michael
    Dimer coupling energies of the Si(001) surface
    In: Physical Review Letters , Jg. 130 2023, Nr. 12, 126203
    DOI, Online Volltext (Open Access)
  • Kriegel, Marko A.; Omambac, Karim; Franzka, Steffen; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Incommensurability and negative thermal expansion of single layer hexagonal boron nitride
    In: Applied Surface Science , Jg. 624 2023, 157156
    DOI
  • Omambac, Karim; Kriegel, Marko A.; Petrović, Marin; Finke, Birk; Brand, Christian; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Interplay of Kinetic Limitations and Disintegration : Selective Growth of Hexagonal Boron Nitride and Borophene Monolayers on Metal Substrates
    In: ACS Nano , Jg. 17 2023, Nr. 18, S. 17946 – 17955
    DOI
  • Koç, Azize; Gonzalez-Vallejo, Isabel; Runge, Matthias; Ghalgaoui, Ahmed; Reimann, Klaus; Kremeyer, Laurenz; Thiemann, Fabian; Horn-von Hoegen, Michael; Sokolowski-Tinten, Klaus; Woerner, Michael; Elsaesser, Thomas
    Quantum pathways of carrier and coherent phonon excitation in bismuth
    In: Physical Review B , Jg. 107 2023, Nr. 18, L180303
    DOI
  • Runge, Matthias; Ghalgaoui, Ahmed; Gonzalez-Vallejo, Isabel; Thiemann, Fabian; Horn-von Hoegen, Michael; Reimann, Klaus; Woerner, Michael; Elsaesser, Thomas
    Ultrafast carrier dynamics and symmetry reduction in bismuth by nonperturbative optical excitation in the terahertz range
    In: Physical Review B , Jg. 107 2023, Nr. 24, 245140
    DOI
  • Dreher, Pascal; Janoschka, David; Neuhaus, Alexander; Frank, Bettina; Giessen, Harald; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Quantitative determination of the electric field strength in a plasmon focus from ponderomotive energy shifts
    In: Nanophotonics , Jg. 11 2022, Nr. 16, S. 3687 – 3694
    DOI, Online Volltext (Open Access)
  • Thiemann, Fabian; Sciaini, G.; Kassen, A.; Hagemann, Ulrich; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Ultrafast transport-mediated homogenization of photoexcited electrons governs the softening of the A1g phonon in bismuth
    In: Physical Review B , Jg. 106 2022, Nr. 1, 014315
    DOI, Online Volltext (Open Access)
  • Petrović, Marin; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael; Thiel, Patricia A.; Tringides, Michael C.
    Broad background in electron diffraction of 2D materials as a signature of their superior quality
    In: Nanotechnology , Jg. 32 2021, Nr. 50, S. 505706
    DOI (Open Access)
  • Jnawali, Giriraj; Boschetto, Davide; Malard, Leandro M.; Heinz, Tony; Sciaini, Germán; Thiemann, F.; Payer, Thomas; Kremeyer, Laurenz; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Hot carrier transport limits the displacive excitation of coherent phonons in bismuth
    In: Applied Physics Letters (APL) , Jg. 119 2021, Nr. 9, 091601
    DOI
  • Janoschka, David; Dreher, Pascal; Rödl, Alexandra; Franz, Torsten; Schaff, Oliver; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Implementation and operation of a fiber-coupled CMOS detector in a low energy electron Microscope
    In: Ultramicroscopy , Jg. 221 2021, 113180
    DOI
  • Omambac, Karim; Kriegel, Marko; Brand, Christian; Finke, B.; Kremeyer, Laurenz; Hattab, H.; Janoschka, David; Dreher, Pascal; Meyer zu Heringdorf, Frank; Momeni Pakdehi, Davood; Pierz, Klaus; Schumacher, H.W.; Petrović, Marin; van Houselt, Arie; Poelsema, B.; Tringides, M.C.; Horn-von Hoegen, Michael
    Non-conventional bell-shaped diffuse scattering in low-energy electron diffraction from high-quality epitaxial 2D-materials
    In: Applied Physics Letters (APL) , Jg. 118 2021, Nr. 24, 241902
    DOI (Open Access)
  • Omambac, Karim; Petrović, Marin; Bampoulis, Pantelis; Brand, Christian; Kriegel, Marko A.; Dreher, Pascal; Janoschka, David; Hagemann, Ulrich; Hartmann, Nils; Valerius, Philipp; Michely, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Segregation-Enhanced Epitaxy of Borophene on Ir(111) by Thermal Decomposition of Borazine
    In: ACS Nano , Jg. 15 2021, Nr. 4, S. 7421 – 7429
    DOI
  • Hanisch-Blicharski, Anja; Tinnemann, Verena; Wall, Simone; Thiemann, Fabian; Groven, Thorben; Fortmann, Jonas Darius; Tajik, Mohammad; Brand, Christian; Frost, Bengt-Olaf; von Hoegen, Alexander; Horn-von Hoegen, Michael
    Violation of Boltzmann Equipartition Theorem in Angular Phonon Phase Space Slows down Nanoscale Heat Transfer in Ultrathin Heterofilms
    In: Nano Letters , Jg. 21 2021, Nr. 17, S. 7145 – 7151
    DOI
  • Hafke, Bernd; Witte, Tobias; Brand, Christian; Horn-von Hoegen, Michael
    Adsorbate induced manipulation of 1D atomic wires : Degradation of long-range order in the Si(553)-Au system
    In: Surface Science , Jg. 700 2020, 121673
    DOI, Online Volltext (Open Access)
  • Chen, S.; Horn-von Hoegen, Michael; Thiel, Patricia A.; Kaminski, Adam; Schrunk, Benjamin; Speliotis, Athanassios; Conrad, Edward H.; Tringides, Michael C.
    High Layer Uniformity of Two-Dimensional Materials Demonstrated Surprisingly from Broad Features in Surface Electron Diffraction
    In: The Journal of Physical Chemistry Letters , Jg. 11 2020, Nr. 21, S. 8937 – 8943
    DOI (Open Access)
  • Hafke, Bernd; Brand, Christian; Witte, Tobias; Sothmann, Björn; Horn-von Hoegen, Michael; Erwin, Steven C.
    Thermally Induced Crossover from 2D to 1D Behavior in an Array of Atomic Wires : Silicon Dangling-Bond Solitons in Si(553)-Au
    In: Physical Review Letters , Jg. 124 2020, Nr. 1, 016102
    DOI, Online Volltext (Open Access)
  • Maldonado, Pablo; Chase, Tyler F.; Reid, Alexander H.; Shen, Xiaozhe; Li, Ren Kai; Carva, Karel; Payer, Thomas; Horn-von Hoegen, Michael; Sokolowski-Tinten, Klaus; Wang, Xi J.; Oppeneer, Peter M.; Dürr, Hermann A.
    Tracking the ultrafast nonequilibrium energy flow between electronic and lattice degrees of freedom in crystalline nickel
    In: Physical Review B , Jg. 101 2020, Nr. 10, 100302
    DOI (Open Access)
  • Hafke, Bernd; Witte, Tobias; Janoschka, David; Dreher, Pascal; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Condensation of ground state from a supercooled phase in the Si(111)-(4 × 1) → (8 × 2)-indium atomic wire system
    In: Structural Dynamics / American Crystallographic Association (ACA) (Hrsg.) , Jg. 6 2019, Nr. 4, S. 045101
    DOI, Online Volltext (Open Access)
  • Tinnemann, Verena; Streubühr, C.; Hafke, Bernd; Witte, Tobias; Kalus, A.; Hanisch-Blicharski, A.; Ligges, M.; Zhou, Ping; von der Linde, Dietrich; Bovensiepen, Uwe; Horn-von Hoegen, Michael
    Decelerated lattice excitation and absence of bulk phonon modes at surfaces : Ultra-fast electron diffraction from Bi(111) surface upon fs-laser excitation
    In: Structural Dynamics / American Crystallographic Association (ACA) (Hrsg.) , Jg. 6 2019, Nr. 6, S. 065101
    DOI (Open Access)
  • Chen, S.; Horn-von Hoegen, Michael; Thiel, P. A.; Tringides, M. C.
    Diffraction paradox : An unusually broad diffraction background marks high quality graphene
    In: Physical Review B , Jg. 100 2019, Nr. 15, 155307
    DOI (Open Access)
  • Petrović, Marin; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Equilibrium shape of single-layer hexagonal boron nitride islands on iridium
    In: Scientific Reports , Jg. 9 2019, Nr. 1, S. 19553
    DOI, Online Volltext (Open Access)
  • Hafke, Bernd; Witte, Tobias; Brand, Christian; Duden, Thomas; Horn-von Hoegen, Michael
    Pulsed electron gun for electron diffraction at surfaces with femtosecond temporal resolution and high coherence length
    In: Review of Scientific Instruments , Jg. 90 2019, S. 045119
    DOI
  • Meyer, Dennis; Jnawali, Giriraj; Hattab, Hichem; Horn-von Hoegen, Michael
    Rapid onset of strain relief by massive generation of misfit dislocations in Bi(111)/Si(001) heteroepitaxy
    In: Applied Physics Letters (APL) , Jg. 114 2019, Nr. 8, S. 081601-1 – 081601-5
    DOI
  • Podbiel, Daniel; Kahl, Philip; Frank, Bettina; Davis, Timothy J.; Giessen, Harald; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Spatiotemporal Analysis of an Efficient Fresnel Grating Coupler for Focusing Surface Plasmon Polaritons
    In: ACS Photonics , Jg. 6 2019, Nr. 3, S. 600 – 604
    DOI
  • Omambac, Karim; Hattab, Hichem; Brand, Christian; Jnawali, Giriraj; N'Diaye, Alpha T.; Coraux, Johann; van Gastel, Raoul; Poelsema, Bene; Michely, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Temperature-Controlled Rotational Epitaxy of Graphene
    In: Nano Letters , Jg. 19 2019, Nr. 7, S. 4594 – 4600
    DOI (Open Access)
  • Tinnemann, Verena; Streubühr, Carla; Hafke, Bernd; Kalus, Annika; Hanisch-Blicharski, Anja; Ligges, Manuel; Zhou, Ping; von der Linde, Dietrich; Bovensiepen, Uwe; Horn-von Hoegen, Michael
    Ultrafast electron diffraction from a Bi(111) surface : Impulsive lattice excitation and Debye Waller analysis at large momentum transfer
    In: Structural Dynamics / American Crystallographic Association (ACA) (Hrsg.) , Jg. 6 2019, Nr. 3, S. 035101
    DOI, Online Volltext (Open Access)
  • Kahl, Philip; Podbiel, Daniel; Schneider, Christian; Makris, Andreas; Sindermann, Simon; Witt, Christian; Kilbane, Deirdre; Horn-von Hoegen, Michael; Aeschlimann, Martin; Meyer zu Heringdorf, Frank
    Direct observation of Surface Plasmon Polariton Propagation and Interference by Time-Resolved Imaging in Normal-Incidence Two Photon Photoemission Microscopy
    In: Plasmonics , Jg. 13 2018, Nr. 1, S. 239 – 246
    DOI
  • Petrović, Marin; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Lateral heterostructures of hexagonal boron nitride and graphene : BCN alloy formation and microstructuring mechanism
    In: Applied Surface Science , Jg. 455 2018, S. 1086 – 1094
    DOI, Online Volltext (Open Access)
  • Frigge, Tim; Hafke, Bernd; Witte, Tobias; Krenzer, Boris; Horn-von Hoegen, Michael
    Non-equilibrium lattice dynamics of one-dimensional in chains on Si(111) upon ultrafast optical excitation
    In: Structural Dynamics / American Crystallographic Association (ACA) (Hrsg.) , Jg. 5 2018, Nr. 2, S. 025101
    DOI (Open Access)
  • Horn-von Hoegen, Michael
    Ultrafast switching in an atomic wire system at surfaces
    In: MRS Bulletin , Jg. 43 2018, Nr. 7, S. 512 – 519
    DOI
  • Podbiel, Daniel; Kahl, Philip; Makris, Andreas; Frank, Bettina; Sindermann, Simon; Davis, Timothy J.; Giessen, Harald; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Imaging the Nonlinear Plasmoemission Dynamics of Electrons from Strong Plasmonic Fields
    In: Nano Letters , Jg. 17 2017, Nr. 11, S. 6569 – 6574
    DOI
  • Petrović, Marin; Hagemann, Ulrich; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Microanalysis of single-layer hexagonal boron nitride islands on Ir(111)
    In: Applied Surface Science , Jg. 420 2017, S. 504 – 510
    DOI, Online Volltext (Open Access)
  • Witte, Tobias; Frigge, Tim; Hafke, Bernd; Krenzer, Boris; Horn-von Hoegen, Michael
    Nanoscale interfacial heat transport of ultrathin epitaxial hetero films : Few monolayer Pb(111) on Si(111)
    In: Applied Physics Letters (APL) , Jg. 110 2017, Nr. 24, S. 243103
    DOI
  • Frigge, Tim; Hafke, Bernd; Witte, Tobias; Krenzer, Boris; Streubühr, Carla; Samad Syed, Abdul; Mikšić Trontl, Vesna; Avigo, Isabella; Zhou, Ping; Ligges, Manuel; von der Linde, Dietrich; Bovensiepen, Uwe; Horn-von Hoegen, Michael; Wippermann, Stefan; Lücke, Andreas; Sanna, Simone; Gerstmann, Uwe; Schmidt, Wolf Gerp
    Optically excited structural transition in atomic wires on surfaces at the quantum limit
    In: Nature , Jg. 544 2017, Nr. 7649, S. 207 – 211
    DOI
  • Frank, Bettina; Kahl, Philip; Podbiel, Daniel; Spektor, Grisha; Orenstein, Meir; Fu, Liwei; Weiss, Thomas; Horn-von Hoegen, Michael; Davis, Timothy J; Meyer zu Heringdorf, Frank; Giessen, Harald
    Short-range surface plasmonics : localized electron emission dynamics from a 60-nm spot on an atomically flat single-crystalline gold surface
    In: Science Advances , Jg. 3 2017, Nr. 7, S. e1700721
    DOI (Open Access)
  • Hattab, Hichem; Hupalo, Myron S.; Hershberger, M. T.; Horn-von Hoegen, Michael; Tringides, Michael C.
    A combined STM and SPA-LEED study of the "explosive" nucleation and collective diffusion in Pb/Si(111)
    In: Surface Science , Jg. 646 2016, S. 50 – 55
    DOI
  • Kirschbaum, Pierre; Brendel, Lothar; Roos, Kelly R.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Decay of isolated hills and saddles on Si(001)
    In: Materials Research Express (MRX) , Jg. 3 2016, Nr. 8, 085011
    DOI
  • McDougall, Daniel; Hattab, Hichem; Hershberger, Matthew; Hupalo, Myron S.; Horn-von Hoegen, Michael; Thiel, Patricia A.; Tringides, Michael C.
    Dy uniform film morphologies on graphene studied with SPA-LEED and STM
    In: Carbon , Jg. 108 2016, S. 283 – 290
    DOI
  • Hafke, Bernd; Frigge, Tim; Witte, Tobias; Krenzer, Boris; Aulbach, Julian; Schäfer, Jörg; Claessen, Ralph; Erwin, Steve C.; Horn-von Hoegen, Michael
    Two-dimensional interaction of spin chains in the Si(553)-Au nanowire system
    In: Physical Review B , Jg. 94 2016, Nr. 16, S. 161403
    DOI
  • Klein, Claudius; Vollmers, N. J.; Gerstmann, Uwe; Zahl, Percy; Lükermann, Daniel; Jnawali, Giriraj; Pfnür, Herbert; Tegenkamp, Christoph; Sutter, Peter; Schmidt, Wolf G.; Horn-von Hoegen, Michael
    Barrier-free subsurface incorporation of 3d metal atoms into Bi(111) films
    In: Physical Review B: Condensed matter and materials physics , Jg. 91 2015, Nr. 19, S. 195441
    DOI (Open Access)
  • Frigge, Tim; Hafke, Bernd; Tinnemann, Verena; Krenzer, Boris; Horn-von Hoegen, Michael
    Nanoscale heat transport from Ge hut, dome, and relaxed clusters on Si(001) measured by ultrafast electron diffraction
    In: Applied Physics Letters (APL) , Jg. 106 2015, Nr. 5, S. 053108-1 – 053108-4
    DOI
  • Frigge, Tim; Hafke, Bernd; Tinnemann, Verena; Witte, Tobias; Krenzer, Boris; Horn-von Hoegen, Michael
    Nanoscale thermal transport in self-organized epitaxial Ge nanostructures on Si(001)
    In: Semiconductor Science and Technology , Jg. 30 2015, Nr. 10, S. 105027
    DOI
  • Frigge, Tim; Hafke, Bernd; Tinnemann, Verena; Witte, Tobias; Horn-von Hoegen, Michael
    Spot profile analysis and lifetime mapping in ultrafast electron diffraction : lattice excitation of self-organized Ge nanostructures on Si(001)
    In: Structural Dynamics / American Crystallographic Association (ACA) (Hrsg.) , Jg. 2 2015, Nr. 3, S. 035101
    DOI (Open Access)
  • Sokolowski-Tinten, Klaus; Li, Renkai; Reid, Alexander Hume; Weathersby, Stephen P.; Quirin, Florian; Chase, Tyler; Coffee, Ryan; Corbett, Jeff; Fry, Alan R.; Hartmann, Nick; Hast, Carsten; Hettel, Bob; Horn-von Hoegen, Michael; Janoschka, David; Lewandowski, James R.; Ligges, Manuel; Meyer zu Heringdorf, Frank; Shen, Xiaozhe; Vecchione, Theodore; Witt, Christian; Wu, J.; Durr, Hermann; Wang, X. J.
    Thickness-dependent electron-lattice equilibration in laser-excited thin Bismuth films
    In: New Journal of Physics (NJP) , Jg. 2015 2015, Nr. 17, S. 113047
    DOI (Open Access)
  • Streubühr, Carla; Kalus, Annika; Zhou, Ping; Ligges, Manuel; Hanisch-Blicharski, Anja; Kammler, Martin; Bovensiepen, Uwe; Horn-von Hoegen, Michael; von der Linde, Dietrich
    Comparing ultrafast surface and bulk heating using time-resolved electron diffraction
    In: Applied Physics Letters (APL) , Jg. 104 2014, S. 161611
    DOI
  • Klasing, Friedrich; Frigge, Tim; Hafke, Bernd; Krenzer, Boris; Wall, Simone; Hanisch-Blicharski, Anja; Horn-von Hoegen, Michael
    Hysteresis proves that the In/Si(111) (8x2) to (4x1) phase transition is first-order
    In: Physical Review B: Condensed matter and materials physics , Jg. 89 2014, S. 121107
    DOI
  • Hattab, Hichem; Jnawali, Giriraj; Horn-von Hoegen, Michael
    In-situ high-resolution low energy electron diffraction study of strain relaxation in heteroepitaxy of Bi(111) on Si(001) : interplay of strain state, misfit dislocation array and lattice parameter
    In: Thin Solid Films , Jg. 570 2014, Nr. Part A, S. 159 – 163
    DOI
  • Kahl, Philip; Wall, Simone; Witt, Christian; Schneider, Christian; Bayer, Daniela; Fischer, Alexander; Melchior, Pascal; Horn-von Hoegen, Michael; Aeschlimann, Martin; Meyer zu Heringdorf, Frank
    Normal-Incidence Photoemission Electron Microscopy (NI-PEEM) for Imaging Surface Plasmon Polaritons
    In: Plasmonics , Jg. 9 2014, Nr. 6, S. 1401 – 1407
    DOI
  • Klein, Claudius; Vyshnepolsky, Michael; Kompch, Alexander; Klasing, Friedrich; Hanisch-Blicharski, Anja; Winterer, Markus; Horn-von Hoegen, Michael
    Strain state, film and surface morphology of epitaxial topological insulator Bi2Se3 films on Si(111)
    In: Thin Solid Films , Jg. 564 2014, S. 241 – 245
    DOI
  • Klein, Claudius; Heidmann, Inga; Nabbefeld, Tobias; Speckmann, Moritz; Schmidt, Thomas; Meyer zu Heringdorf, Frank; Falta, Jens; Horn-von Hoegen, Michael
    Al-induced faceting of Si(113)
    In: Surface Science , Jg. 618 2013, S. 109 – 114
    DOI
  • Lükermann, Daniel; Sologub, S.; Pfnür, Herbert; Klein, Claudius; Horn-von Hoegen, Michael; Tegenkamp, Christoph
    Effect of adsorbed magnetic and non-magnetic atoms on electronic transport through surfaces with strong spin-orbit coupling
    In: Materials Science and Engineering Technology , Jg. 44 2013, Nr. 2-3, S. 210 – 217
    DOI
  • Vyshnepolsky, Michael; Klein, Claudius; Klasing, Friedrich; Hanisch-Blicharski, Anja; Horn-von Hoegen, Michael
    Epitaxial growth of the topological insulator Bi2Se3 on Si(111) : Growth mode, lattice parameter, and strain state
    In: Applied Physics Letters (APL) , Jg. 103 2013, Nr. 11, S. 111909-1 – 111909-4
    DOI
  • Frigge, Tim; Wall, Simone; Krenzer, Boris; Wippermann, Stefan; Sanna, Simone; Klasing, Friedrich; Hanisch-Blicharski, Anja; Kammler, Martin; Schmidt, Wolf G.; Horn-von Hoegen, Michael
    Frigge et al. Reply : Comment on “Atomistic Picture of Charge Density Wave Formation at Surfaces”
    In: Physical Review Letters , Jg. 111 2013, Nr. 14, S. 149601 – 149602
    DOI
  • Sakong, Sung; Kratzer, Peter; Wall, Simone; Kalus, Annika; Horn-von Hoegen, Michael
    Mode conversion and long-lived vibrational modes in lead monolayers on silicon (111) after femtosecond laser excitation : a molecular dynamics simulation
    In: Physical Review B: Condensed matter and materials physics , Jg. 88 2013, S. 115419-1 – 115419-8
    DOI
  • Sojka, Falko; Meissner, Matthias; Zwick, Christian; Forker, Roman; Vyshnepolsky, Michael; Klein, Claudius; Horn-von Hoegen, Michael; Fritz, Torsten
    To tilt or not to tilt : correction of the distortion caused by inclined sample surfaces in low-energy electron diffraction
    In: Ultramicroscopy , Jg. 133 2013, S. 35 – 40
    DOI
  • Hanisch-Blicharski, Anja; Janzen, Andreas; Krenzer, Boris; Wallutis, Simone; Klasing, Friedrich; Kalus, Annika; Frigge, Tim; Kammler, Martin; Horn-von Hoegen, Michael
    Ultra-fast electron diffraction at surfaces: From nanoscale heat transport to driven phase transitions
    In: Ultramicroscopy , Jg. 127 2013, S. 2 – 8
    DOI
  • Wall, Simone; Krenzer, Boris; Wippermann, Stefan; Sanna, Simone; Klasing, Friedrich; Hanisch-Blicharski, Anja; Kammler, Martin; Schmidt, Wolf G.; Horn-von Hoegen, Michael
    Atomistic picture of charge density wave formation at surfaces
    In: Physical Review Letters , Jg. 109 2012, Nr. 18, 186101
    DOI
  • Hanisch-Blicharski, Anja; Krenzer, Boris; Wall, Simone; Kalus, Annika; Frigge, Tim; Horn-von Hoegen, Michael
    Heat transport through interfaces with and without misfit dislocation arrays
    In: Journal of Materials Research (JMR) , Jg. 27 2012, Nr. 21, S. 2718 – 2723
    DOI
  • Payer, T.; Klein, Carsten; Acet, Mehmet; Ney, V.; Kammler, Martin; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    High-quality epitaxial Bi(111) films on Si(111) by isochronal annealing
    In: Thin Solid Films , Jg. 520 2012, Nr. 23, S. 6905 – 6908
    DOI
  • Hattab, Hichem; N'Diaye, Alpha T.; Wall, Dirk; Klein, Claudius; Jnawali, Giriraj; Coraux, Johann; Busse, Carsten; van Gastel, Raoul; Poelsema, Bene; Michely, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Interplay of wrinkles, strain, and lattice parameter in graphene on iridium
    In: Nano Letters , Jg. 12 2012, Nr. 2, S. 678 – 682
    DOI
  • Jnawali, Giriraj; Klein, Claudius; Wagner, Thomas; Hattab, Hichem; Zahl, Percy; Acharya, Danda P.; Sutter, Peter; Lorke, Axel; Horn-von Hoegen, Michael
    Manipulation of electronic transport in the Bi(111) surface state
    In: Physical Review Letters , Jg. 108 2012, Nr. 26, S. 266804
    DOI
  • Lükermann, Daniel; Sologub, Sergei; Pfnür, Herbert; Klein, Claudius; Horn-von Hoegen, Michael; Tegenkamp, Christoph
    Scattering at magnetic and nonmagnetic impurities on surfaces with strong spin-orbit coupling
    In: Physical Review B: Condensed matter and materials physics , Jg. 86 2012, Nr. 19, S. 195432
    DOI
  • Zhou, Ping; Streubühr, Carla; Ligges, Manuel; Brazda, Thorsten; Payer, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael; von der Linde, Dietrich
    Transient anisotropy in the electron diffraction of femtosecond laser-excited bismuth
    In: New Journal of Physics (NJP) , Jg. 14 2012, S. 103031
    DOI (Open Access)
  • Moutanabbir, Oussama; Senz, Stephan; Scholz, Roland; Alexe, Marin; Kim, Yunseok; Pippel, Eckhard; Wang, Yewu; Wiethoff, Christian; Nabbefeld, Tobias; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Atomically smooth p-doped silicon nanowires catalyzed by aluminum at low temperature
    In: ACS Nano , Jg. 5 2011, Nr. 2, S. 1313 – 1320
    DOI
  • Sindermann, Simon; Witt, Christian; Spoddig, Detlef; Horn-von Hoegen, Michael; Dumpich, Günter; Meyer zu Heringdorf, Frank
    Epitaxial Ag wires with a single grain boundary for electromigration
    In: Review of Scientific Instruments , Jg. 82 2011, Nr. 12, S. 123907
    DOI
  • Hattab, Hichem; N'Diaye, Alpha T.; Wall, Dirk; Jnawali, Giriraj; Coraux, Johann; Busse, Carsten; van Gastel, Raoul; Poelsema, Bene; Michely, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Growth temperature dependent graphene alignment on Ir(111)
    In: Applied Physics Letters (APL) , Jg. 98 2011, Nr. 14, S. 141903
    DOI
  • Klein, Claudius; Nabbefeld, Tobias; Hattab, Hichem; Meyer, D.; Jnawali, Giriraj; Kammler, Martin; Meyer zu Heringdorf, Frank; Golla-Franz, A.; Müller, B.H.; Schmidt, T.H.; Henzler, M.; Horn-von Hoegen, Michael
    Lost in reciprocal space? : Determination of scattering condition in spot profile analysis low energy electron diffraction
    In: Review of Scientific Instruments , Jg. 82 2011, Nr. 3, S. 35111
    DOI
  • Wall, Dirk; Tikhonov, S.; Sindermann, Simon; Spoddig, Detlef; Hassel, Christoph; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Shape, orientation, and crystalline composition of silver islands on Si(111)
    In: IBM Journal of Research and Development , Jg. 55 2011, Nr. 4 , 9:1-9:6
    DOI
  • Sindermann, Simon; Wall, Dirk; Roos, K.R.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Anisotropy of Ag Diffusion on Vicinal Si Surfaces
    In: e-Journal of Surface Science and Nanotechnology , Jg. 8 2010, S. 372 – 376
    DOI
  • Lu, Wei; Nicoul, Matthieu; Shymanovich, Uladzimir; Tarsevitch, Alexander; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    Extreme phonon softening in laser-excited Bismuth - towards an inverse Peierls-transition
    In: MRS Proceedings , Jg. 1230E 2010, S. 3 – 5
  • Wall, Dirk; Lohmar, I.; Roos, Kelly Ryan; Krug, J.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Imaging diffusion fields on a surface with multiple reconstructions: Ag/Si(111)
    In: New Journal of Physics (NJP) , Jg. 12 2010, Nr. 10, S. 103019
    DOI (Open Access)
  • Nabbefeld, Tobias; Wiethoff, Christian; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Silver Induced Faceting of Si(112)
    In: Applied Physics Letters (APL) , Jg. 97 2010, Nr. 4 , 41905 (3p)
    DOI
  • Jnawali, Giriraj; Wagner, Th.; Hattab, Hichem; Möller, Rolf; Lorke, Axel; Horn-von Hoegen, Michael
    Two-dimensional electron transport and scattering in Bi(111) surface states
    In: e-Journal of Surface Science and Nanotechnology , Jg. 8 2010, S. 27 – 31
    DOI
  • Sciaini, Germán; Harb, Maher; Kruglik, Sergei G.; Payer, Thomas; Hebeisen, Christoph T.; Meyer zu Heringdorf, Frank; Yamaguchi, Mariko; Horn-von Hoegen, Michael; Ernstorfer, Ralph; Miller, R. J. Dwayne
    Electronic acceleration of atomic motions and disordering in bismuth
    In: Nature , Jg. 458 2009, S. 56 – 59
    DOI
  • Jnawali, Giriraj; Hattab, Hichem; Bobisch, Christian; Zubkov, E.; Deiter, C.; Weisemoeller, T.; Bertram, F.; Wollschläger, J.; Möller, Rolf; Horn-von Hoegen, Michael
    Epitaxial growth of Bi(111) on Si(001)
    In: e-Journal of Surface Science and Nanotechnology , Jg. 7 2009, S. 441 – 447
    DOI
  • N'Diaye, Alpha T.; van Gastel, Raoul; Martínez-Galera, Antonio J; Coraux, Johann; Hattab, Hichem; Meyer zu Heringdorf, Frank; Wall, Dirk; Horn-von Hoegen, Michael; Gomez-Rodriguez, José M; Poelsema, Bene; Busse, Carsten; Michely, Thomas
    In situ observation of stress relaxation in epitaxial graphene
    In: New Journal of Physics (NJP) , Jg. 11 2009, S. 113056
    DOI (Open Access)
  • Jnawali, Giriraj; Hattab, Hichem; Bobisch, Christian A.; Bernhart, Alexander M.; Zubkov, E.; Möller, Rolf; Horn-von Hoegen, Michael
    Nanoscale dislocation patterning in Bi(1 1 1)/Si(0 0 1) heteroepitaxy
    In: Surface Science , Jg. 603 2009, Nr. 13, S. 2057 – 2061
    DOI
  • Jnawali, Giriraj; Wagner, Th.; Hattab, Hichem; Möller, Rolf; Horn-von Hoegen, Michael
    Nucleation and initial growth in the semimetallic homoepitaxial system of Bi on Bi(111),
    In: Physical Review B: Condensed matter and materials physics , Jg. 79 2009, Nr. 19, S. 193306
    DOI
  • Krenzer, Boris; Hanisch-Blicharski, Anja; Schneider, P.; Payer, Thomas; Möllenbeck, Simone; Osmani, Orkhan; Kammler, Martin; Meyer, Ralf; Horn-von Hoegen, Michael
    Phonon confinement effects in ultrathin epitaxial bismuth films on silicon studied by time-resolved electron diffraction
    In: Physical Review B: Condensed matter and materials physics , Jg. 80 2009, Nr. 2, 024307
    DOI
  • van Gastel, Raoul; N'Diaye, Alpha T.; Wall, Dirk; Coraux, Johann; Busse, Carsten; Mohamadie Buckanie, Niemma; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael; Michely, Thomas; Poelsema, Bene
    Selecting a single orientation for millimeter sized graphene sheets
    In: Applied Physics Letters (APL) , Jg. 95 2009, Nr. 12, S. 121901
    DOI
  • Mohamadie Buckanie, Niemma; Göhre, J.; Zhou, Ping; von der Linde, Dietrich; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Space charge effects in photoemission electron microscopy using amplifed femtosecond laser pulses
    In: Journal of Physics: Condensed Matter , Jg. 21 2009, Nr. 31, 314003
    DOI
  • Jnawali, Giriraj; Meyer zu Heringdorf, Frank; Wall, Dirk; Sindermann, Simon; Horn-von Hoegen, Michael
    Stable tungsten disilicide contacts for surface and thin film resistivity measurements
    In: Journal of Vacuum Science and Technology (JVST) B: Nanotechnology and Microelectronics , Jg. 27 2009, Nr. 1, S. 180
    DOI
  • Wall, Dirk; Sindermann, Simon; Roos, K.R.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    The influence of anisotropic diffusion on Ag nanowire formation
    In: Journal of Physics: Condensed Matter , Jg. 21 2009, Nr. 31, 314023
    DOI
  • Hanisch-Blicharski, Anja; Krenzer, Boris; Möllenbeck, Simone; Ligges, Manuel; Zhou, Ping; Kammler, Martin; Horn-von Hoegen, Michael
    Transient Cooling of Ultrathin Epitaxial Bi(111)-Films on Si(111) upon Femtosecond Laser Excitation Studied by Ultrafast Reflection High Energy Electron Diffraction"
    In: MRS Proceedings , Jg. 1172 2009, S. 4 – 8
  • Kury, Peter; Roos, Kelly R.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Absence of surface stress change during pentacene thin film growth on the Si(111)-(7x7) surface : a buried reconstruction interface
    In: New Journal of Physics (NJP) , Jg. 10 2008, S. 23037
    DOI (Open Access)
  • Wiethoff, Christian; Ross, Frances M.; Copel, Matthew; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Au stabilization and coverage of sawtooth facets on Si nanowires grown by vapor-liquid-solid epitaxy
    In: Nano Letters , Jg. 8 2008, Nr. 9, S. 3065 – 3068
    DOI
  • Horn-von Hoegen, Michael
    Der Widerstand eines Atoms : Elektromigration im Miniaturformat
    In: Essener Unikate: Berichte aus Forschung und Lehre 2008, Nr. 32: Naturwissenschaften - Physik: Energieumwandlungen an Oberflächen, S. 8 – 21
    DOI, Online Volltext (Open Access)
  • Kury, Peter; Roos, Kelly Ryan; Thien, Dagmar; Möllenbeck, Simone; Wall, Dirk; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Disorder-mediated ordering by self-interfactant effect in organic thin film growth of pentacene on silicon
    In: Organic Electronics , Jg. 9 2008, Nr. 4, S. 461 – 465
    DOI
  • Hattab, Hichem; Zubkov, E.; Bernhart, Alexander; Jnawali, Giriraj; Bobisch, Christian; Krenzer, Boris; Acet, Mehmet; Möller, Rolf; Horn-von Hoegen, Michael
    Epitaxial Bi(111) films on Si(001) : strain state, surface morphology, and defect structure
    In: Thin Solid Films , Jg. 516 2008, Nr. 23, S. 8227 – 8231
    DOI
  • Meyer zu Heringdorf, Frank; Roos, Kimberly L.; Wiethoff, Christian; Horn-von Hoegen, Michael; Roos, Kelly R.
    Growth of Ag nanowires on Au-pre-facetted 4° vicinal Si(0 0 1)
    In: Surface Science , Jg. 602 2008, Nr. 10, S. 1852 – 1857
    DOI
  • Krenzer, Boris; Hanisch-Blicharski, Anja; Duvenbeck, Andreas; Rethfeld, Bärbel; Horn-von Hoegen, Michael
    Heat transport in nanoscale heterosystems: a numerical simulation and analytical solution
    In: Journal of Nanomaterials 2008, S. 590609
    DOI (Open Access)
  • Jnawali, Giriraj; Hattab, Hichem; Bobisch, Christian; Bernhart, Alexander; Zubkov, E.; Möller, Rolf; Horn-von Hoegen, Michael
    Homoepitaxial growth of Bi(111)
    In: Physical Review B: Condensed matter and materials physics , Jg. 78 2008, Nr. 3 , 35321 (9p)
    DOI
  • Wall, Dirk; Roos, Kelly Ryan; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    LEEM/PEEM Study of Anisotropic Diffusion Fields in the Ag/Si(001) System
    In: MRS (Materials Research Society) Online Proceedings Library Archive , Jg. 1088 2008
    DOI
  • Roos, Kelly Ryan; Roos, Kimberly L.; Lohmar, I.; Wall, Dirk; Krug, J.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Real-Time View of Mesoscopic Surface Diffusion
    In: Physical Review Letters , Jg. 100 2008 , 16103 (4p)
    DOI
  • Hanisch-Blicharski, Anja; Krenzer, Boris; Pelka, Tobias; Möllenbeck, Simone; Horn-von Hoegen, Michael
    Thermal response of epitaxial thin Bi films on Si(001) upon femtosecond laser excitation studied by ultrafast electron diffraction
    In: Physical Review B: Condensed matter and materials physics , Jg. 77 2008, Nr. 12, S. 125410
    DOI
  • Payer, Thomas; Rajkovic, Ivan; Ligges, Manuel; von der Linde, Dietrich; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Ultrathin epitaxially grown bismuth (111) membranes
    In: Applied Physics Letters (APL) , Jg. 93 2008, Nr. 9, S. 93102
    DOI
  • Janzen, A.; Krenzer, Boris; Heinz, Oliver; Zhou, Ping; Thien, Dagmar; Hanisch-Blicharski, Anja; Meyer zu Heringdorf, Frank; von der Linde, Dietrich; Horn-von Hoegen, Michael
    A pulsed electron gun for ultrafast electron diffraction at surfaces
    In: Review of Scientific Instruments , Jg. 78 2007, Nr. 1, S. 13906
    DOI
  • Shymanovich, Uladzimir; Nicoul, Matthieu; Blums, J.; Sokolowski-Tinten, Klaus; Tarasevitch, Alexander; Wietler, T.; Horn-von Hoegen, Michael; von der Linde, Dietrich
    Diffraction of strongly convergent X-rays from picosecondacoustic transients
    In: Applied Physics A: Materials Science & Processing , Jg. 87 2007, Nr. 1, S. 7 – 11
  • Thien, Dagmar; Kury, Peter; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank; van Heys, J.; Lindenblatt, M.; Pehlke, E.
    Domain Sensitive Contrast in Photoelectron Emission Microscopy
    In: Physical Review Letters , Jg. 99 2007, Nr. 19, S. 196102
    DOI
  • Meyer zu Heringdorf, Frank; Chelaru, L.I.; Möllenbeck, Simone; Thien, Dagmar; Horn-von Hoegen, Michael
    Femtosecond photoemission microscopy
    5th International Conference on LEEM/PEEM (LEEM/PEEM 5) ; 15-19 October 2006, Himeji, Japan,
    In: Surface Science , Jg. 601 2007, Nr. 20, S. 4700 – 4705
    DOI
  • Jnawali, Giriraj; Hattab, Hichem; Meyer zu Heringdorf, Frank; Krenzer, Boris; Horn-von Hoegen, Michael
    Lattice-matching periodic array of misfit dislocations: Heteroepitaxy of Bi(111) on Si(001),
    In: Physical Review B: Condensed matter and materials physics , Jg. 76 2007, Nr. 3, S. 35337
    DOI
  • Jnawali, Giriraj; Hattab, Hichem; Bobisch, Christian; Bernhart, A.; Zubkov, E.; Meyer zu Heringdorf, Frank; Möller, Rolf; Krenzer, Boris; Horn-von Hoegen, Michael
    Nanopattern Formation by Periodic Array of Interfacial Misfit Dislocations in Bi(111)/Si(001) Heteroepitaxy
    In: MRS (Materials Research Society) Online Proceedings Library Archive , Jg. 1059 2007
    DOI
  • Fritz, D.M.; Reis, D.A.; Adams, B.; Akre, R.A.; Arthur, J.; Blome, C.; Bucksbaum, P.H.; Cavalieri, A.L.; Engemann, S.; Fahy, S.; Falcone, R.W.; Fuoss, P.H.; Gaffney, K.J; George, M.J.; Hajdu, J.; Hertlein, M.P.; Hillyard, P.B.; Horn-von Hoegen, Michael; Kammler, Martin; Kaspar, J.; Kienberger, R.; Krejcik, P.; Lee, S.H.; Lindenberg, A.M.; McFarland, B.; Meyer, D.; Montagne, T.; Murray, E.D.; Nelson, A.J.; Nicoul, Matthieu; Pahl, R.; Rudati, J.; Schlarb, H.; Siddons, D.P.; Sokolowski-Tinten, Klaus; Tschentscher, Th.; von der Linde, Dietrich; Hastings, J.B.
    Ultrafast bond softening in Bismuth: Mapping a solid`s interatomic potential with X-rays
    In: Science , Jg. 315 2007, Nr. 5812, S. 633 – 636
  • Pennec, Y.; Horn-von Hoegen, Michael; Zhu, Xiaobin; Fortin, D.C.; Freeman, M.R.
    Dynamics of an Ising chain under local excitation: An STM study of Si(100) dimer rows at T = 5K
    In: Physical Review Letters , Jg. 96 2006, Nr. 2 , 26102 (4p)
  • Stahlmecke, Burkhard; Meyer zu Heringdorf, Frank; Chelaru, L.I.; Horn-von Hoegen, Michael; Roos, Kelly R.; Dumpich, Günter
    Electromigration in single-crystalline self-organized silver nanowires.
    In: Applied Physics Letters , Jg. 88 2006, Nr. 5 , 53122 (3p)
  • Chelaru, L.I.; Horn-von Hoegen, Michael; Thien, Dagmar; Meyer zu Heringdorf, Frank
    Fringe Fields in Nonlinear Photoemission Microscopy
    In: Physical Review B: Condensed matter and materials physics , Jg. 73 2006, Nr. 11 , 115416 (5p)
  • Jnawali, Giriraj; Hattab, Hichem; Krenzer, B.; Horn-von Hoegen, Michael
    Lattice accommodation of epitaxial Bi(111) films on Si(001) studied with SPA-LEED and AFM,
    In: Physical Review B: Condensed matter and materials physics , Jg. 74 2006, Nr. 19 , 195340 (5p)
  • Schmidt, Th.; Kröger, R.; Flege, J.I.; Clausen, T.; Falta, J.; Janzen, A.; Zahl, P.; Kury, Peter; Kammler, Martin; Horn-von Hoegen, Michael
    Less strain energy despite fewer misfit dislocations: The impact of ordering
    In: Physical Review Letters , Jg. 96 2006, Nr. 6 , 66101 (4p)
  • Krenzer, B.; Janzen, A.; Zhou, Ping; von der Linde, Dietrich; Horn-von Hoegen, Michael
    Thermal Boundary Conductance in Heterostructures Studied by Ultrafast Electron Diffraction,
    In: New Journal of Physics (NJP) , Jg. 8 2006, S. 190
  • Janzen, A.; Krenzer, Boris; Zhou, Ping; von der Linde, Dietrich; Horn-von Hoegen, Michael
    Ultrafast electron diffraction at surfaces after laser excitation
    23th European Conference on Surface Science (ECOSS-23) ; 4–9 September 2005, Berlin, Germany,
    In: Surface Science , Jg. 600 2006, Nr. 18, S. 4094 – 4098
    DOI
  • Kury, Peter; Hild, R.; Thien, Dagmar; Günter, H.-L.; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Compact and transferable threefold evaporator for molecular beam epitaxy in ultrahigh vacuum
    In: Review of Scientific Instruments , Jg. 76 2005, Nr. 8 , 83906 (5p)
  • Roos, Kelly Ryan; Roos, Kimberley L.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    High Temperature self-assembly of Ag nanowires on vicinal Si(001)
    In: Journal of Physics: Condensed Matter , Jg. 17 2005, Nr. 16, S. 1407
  • Kammler, Martin; Horn-von Hoegen, Michael
    Low energy electron diffraction of epitaxial growth of bismuth on Si(111)
    In: Surface Science , Jg. 576 2005, Nr. 1-3, S. 56 – 60
    DOI
  • Meyer zu Heringdorf, Frank; Pietsch, H.; Horn-von Hoegen, Michael
    Reciprocal Space Mapping by spot profile analyzing low energy electron diffraction
    In: Review of Scientific Instruments , Jg. 76 2005, Nr. 8, S. 85102
  • Kury, Peter; Grabosch, T.; Horn-von Hoegen, Michael
    SSIOD: the next generation
    In: Review of Scientific Instruments , Jg. 76 2005, Nr. 2 , 23903 (7p)
  • AlFalou, A.A.; Kammler, Martin; Horn-von Hoegen, Michael
    Strain state analysis of hetero-epitaxial systems
    In: EPL (Europhysics Letters) , Jg. 69 2005, Nr. 4, S. 570
  • Schmidt, Th.; Kröger, R.; Clausen, T.; Falta, J.; Janzen, A.; Kammler, Martin; Kury, Peter; Zahl, P.; Horn-von Hoegen, Michael
    Surfactant-mediated epitaxy of Ge on Si(111): beyond the surface
    In: Applied Physics Letters , Jg. 86 2005, Nr. 11 , 111910 (3p)
  • Sokolowski-Tinten, Klaus; Blome, C.; Blums, J.; Shymanovich, Uladzimir; Nicoul, Matthieu; Cavalleri, Andrea; Tarasevitch, Alexander; Horn-von Hoegen, Michael; Kammler, Martin; von der Linde, Dietrich
    Ultrafast X-Ray Diffraction
    In: Ultrafast Phenomena XIV , Jg. 79 2005, S. 170 – 174
  • Thien, Dagmar; Meyer zu Heringdorf, Frank; Kury, Peter; Horn-von Hoegen, Michael
    Characterizing Single Crystal Surfaces using High Resolution Electron Diffraction,
    In: Analytical and Bioanalytical Chemistry , Jg. 379 2004, Nr. 4, S. 588 – 593
  • Kury, Peter; Zahl, P.; Horn-von Hoegen, Michael; Voges, C.; Frischat, H.; Günter, H.-L.; Pfnür, H.; Henzler, M.
    Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperatures
    In: Review of Scientific Instruments , Jg. 75 2004, Nr. 11 , 4911 (5p)
  • Kury, Peter; Zahl, P.; Horn-von Hoegen, Michael
    Direct observation of reconstruction induced changes of surface stress for Sb on Si(111),
    In: Analytical and Bioanalytical Chemistry , Jg. 379 2004, Nr. 4, S. 582 – 587
  • Kury, Peter; Horn-von Hoegen, Michael
    Impact of thermal dependence of elastic constants on surface stress measurements
    In: Review of Scientific Instruments , Jg. 75 2004, Nr. 5 , 1357 (2p)
  • Kury, Peter; Zahl, P.; Horn-von Hoegen, Michael
    Precise calibration for surface stress induced optical deflection measurements
    In: Review of Scientific Instruments , Jg. 75 2004, Nr. 6 , 2211 (2p)
  • Horn-von Hoegen, Michael; Müller, B.H.; Grabosch, T.; Kury, Peter
    Strain relief during Ge hut cluster formation on Si(001) studied by high resolution LEED and surface-stress-induced optical deflection,
    In: Physical Review B: Condensed matter and materials physics , Jg. 70 2004, Nr. 23, S. 235213
  • Kammler, Martin; Horn-von Hoegen, Michael
    Transition in growth mode by competing strain relaxation mechanisms: surfactant mediated epitaxy of SiGe alloys on Si
    In: Applied Physics Letters , Jg. 85 2004, Nr. 15 , 3056 (3p)
  • Menzel, A.; Conrad, E.H.; Tringides, M.C.; Kammler, Martin; Horn-von Hoegen, Michael
    Finite collection time effects in autocovariance function measurements
    In: Journal of Applied Physics , Jg. 93 2003, Nr. 4, S. 2229 – 2235
  • Horn-von Hoegen, Michael
    Ge on Si(001) - a hetero epitaxial playground for surface science
    In: Surface Science , Jg. 537 2003, Nr. 1-3, S. 1 – 3
    DOI
  • Meyer zu Heringdorf, Frank; Hild, R.; Zahl, P.; Schmidt, Th.; Ressel, B.; Heun, S.; Bauer, E.; Horn-von Hoegen, Michael
    Erratum to: Local Au coverage as driving force for Au induced faceting of vicinal Si(001):a LEEM and XPEEM study
    In: Surface Science , Jg. 496 2002, Nr. 1-2, S. 151
    DOI
  • Hild, R.; Seifert, C.; Kammler, Martin; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael; Zachuk, R.; Olshanetsky, B. Z.
    Kinetics of Au induced faceting of vicinal Si(111)
    In: Surface Science , Jg. 512 2002, Nr. 1-2, S. 117 – 127
    DOI
  • Hild, R.; Kammler, Martin; Dumkow, I.; Horn-von Hoegen, Michael
    Self-organisation of Ge nanostructures on i(111): A SPA-LEED and STM Study,
    In: Omicron Newsletter , Jg. 5 2002, Nr. 3, S. 2
  • Kammler, Martin; Horn-von Hoegen, Michael; Voss, N.; Tringides, M.; Menzel, A.; Conrad, E.H.
    Si(001)step dynamics: a temporal low-energy electron diffraction study
    In: Physical Review B: Condensed matter and materials physics , Jg. 65 2002, Nr. 7, S. 75312 – 75319
  • Tegenkamp, C.; Wollschläger, J.; Pfnür, H.; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Step and kink correlations on vicinal Ge(100) surfaces investigated by electron diffraction
    In: Physical Review B: Condensed matter and materials physics , Jg. 65 2002, Nr. 23, S. 235316
    DOI
  • Zahl, P.; Horn-von Hoegen, Michael
    Third-generation generation cone-shaped SPA-LEED
    In: Review of Scientific Instruments , Jg. 73 2002, Nr. 8, S. 2958 – 2962
  • Sokolowski-Tinten, Klaus; Blome, C.; Dietrich, C.; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, Andrea; Squier, J.A.; Kammler, Martin
    Time-Resolved X-ray Diffraction Study of Ultrafast Structural Dynamics in Laser-Excited Solids
    In: Ultrafast Phenomena XIII , Jg. 71 2002, S. 36
  • Seifert, C.; Hild, R.; Horn-von Hoegen, Michael; Zhachuk, R.A.; Olshanetsky, B.Z.
    Au induced reconstructions on Si(111)
    In: Surface Science , Jg. 488 2001, Nr. 1-2, S. 233 – 238
    DOI
  • Yuhara, J.; Morita, K.; Falta, J.; Müller, B.H.; Horn-von Hoegen, Michael
    Characterization of Ge deltadoped Si(111) with RBS-channeling
    In: Surface and Interface Analysis , Jg. 31 2001, Nr. 8, S. 754 – 760
  • Sokolowski-Tinten, Klaus; Blome, C.; Dietrich, C.; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, Andrea; Squier, J.; Kammler, Martin
    Femtosecond X-ray measurement of ultrafast melting and large acoustic transients
    In: Physical Review Letters , Jg. 87 2001, Nr. 22 , 225701 (4p)
  • Meyer zu Heringdorf, Frank; Hild, R.; Zahl, P.; Schmidt, Th.; Ressel, B.; Heun, S.; Bauer, E.; Horn-von Hoegen, Michael
    Local Au coverage as driving force for Au induced faceting of vicinal Si(001) : a LEEM and XPEEM study
    In: Surface Science , Jg. 480 2001, Nr. 3, S. 103 – 108
    DOI
  • Meyer zu Heringdorf, Frank; Schmidt, Th.; Heun, S.; Hild, R.; Zahl, P.; Ressel, B.; Bauer, E.; Horn-von Hoegen, Michael
    Spatial Variation of Au Coverage as the Driving Force for Nanoscopic Pattern Formation
    In: Physical Review Letters , Jg. 86 2001, Nr. 22, S. 5088 – 5091
  • Janzen, A.; Dumkow, I.; Horn-von Hoegen, Michael
    Thermal activation of dislocation array formation
    In: Applied Physics Letters , Jg. 79 2001, Nr. 15 , 2387 (3p)
  • Sokolowski-Tinten, Klaus; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, Andrea; Siders, Craig W.; Brown, F.L.H.; Leitner, D.M.; Tóth, Csaba; Barty, Christopher P.P.; Squier, J.A.; Wilson, Kent R.; Kammler, Martin
    Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast x-ray diffraction
    In: Journal de Physique . IV France , Jg. 11 2001, Nr. PR2, S. 473 – 477
    DOI
  • Cavalleri, Andrea; Siders, Craig W.; Rose-Petruck, Christoph G.; Jimenez, Ralph; Tóth, Csaba; Squier, J.A.; Barty, Christopher P.P.; Wilson, Kent R.; Sokolowski-Tinten, Klaus; Horn-von Hoegen, Michael; von der Linde, Dietrich
    Ultrafast x-ray measurement of laser heating in semiconductors: Parameters determining the melting threshold"
    In: Physical Review B: Condensed matter and materials physics , Jg. 63 2001, Nr. 19 , 193306 (4p)
  • Cavalleri, Andrea; Siders, Craig W.; Brown, F.L.H.; Leitner, D.M.; Tóth, Csaba; Squier, J.A.; Barty, Christopher P.P.; Wilson, Kent R.; Sokolowski-Tinten, Klaus; Horn-von Hoegen, Michael; von der Linde, Dietrich; Kammler, Martin
    Anharmonic lattice dynamics in Germanium measured with ultrafast x-ray diffraction
    In: Physical Review Letters , Jg. 85 2000, Nr. 3, S. 586 – 589
  • Hild, R.; Meyer zu Heringdorf, Frank; Zahl, P.; Horn-von Hoegen, Michael
    Au induced regular ordered striped domain wall structure of a (5x3) reconstruction on Si(001) studied by STM and SPA-LEED
    In: Surface Science , Jg. 454-456 2000, S. 851 – 855
    DOI
  • Minoda, H.; Shimakura, T.; Yagi, K.; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Formation of hill and valley structures on Si(001) vicinal surfaces studied by spot-profile-analyzing LEED
    In: Physical Review B: Condensed matter and materials physics , Jg. 61 2000, Nr. 8, S. 5672 – 5678
  • Meyer zu Heringdorf, Frank; Goldbach, H.; Guenter, H.L.; Horn-von Hoegen, Michael; Dorna, V.; Koehler, U.; Henzler, M.
    Hydrogen induced domain-wall structure on Si(113)
    In: Surface Science , Jg. 458 2000, Nr. 1-3, S. 147 – 154
    DOI
  • Sokolowski-Tinten, Klaus; Cavalleri, Andrea; Siders, Craig W.; Brown, F.L.H.; Leitner, D.M.; Tóth, Csaba; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Squier, J.A.; Barty, Christopher P.P.; Wilson, Kent R.
    Time-resolved X-ray diffraction study of ultrafast acoustic phonon dynamics in Ge/Si heterostructures
    In: Ultrafast Phenomena XII , Jg. 66 2000, S. 281 – 283
  • Kammler, Martin; Schmidt, Th.; Zahl, P.; Kury, P.; Falta, J.; Horn-von Hoegen, Michael
    3-dim. Reciprocal space mapping of a quasi periodic misfit dislocation array
    In: HASYLAB/DESY Annual Report 1999
  • Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank; Hild, R.; Zahl, P.; Schmidt, Th.; Bauer, E.
    Au induced giant faceting of vicinal Si(001)
    In: Surface Science , Jg. 433-435 1999, S. 475 – 480
    DOI
  • Meyer zu Heringdorf, Frank; Hild, R.; Zahl, P.; Horn-von Hoegen, Michael; Schmidt, Th.; Heun, S.; Ressel, B.; Bauer, E.
    Au induced giant faceting of vicinal Si(001)
    In: Elettra Highlights , Jg. 98-99 1999, S. 42 – 44
  • Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank; Kammler, Martin; Schaeffer, C.; Reinking, Dirk; Hofmann, Karl R.
    Bi surfactant mediated epitaxy of Ge on Si(111)
    In: Thin Solid Films , Jg. 343-344 1999, S. 579 – 582
    DOI
  • Siders, Craig W.; Cavalleri, Andrea; Sokolowski-Tinten, Klaus; Toth, Csabe; Guo, Ting; Kammler, Martin; Horn-von Hoegen, Michael; Wilson, Kent R.; von der Linde, Dietrich; Barty, Christopher P.P.
    Detection of nonthermal melting by ultrafast X-ray diffraction
    In: Science , Jg. 286 1999, Nr. 5443, S. 1340 – 1342
  • Reinking, Dirk; Kammler, Martin; Hoffmann, N.; Horn-von Hoegen, Michael; Hofmann, Karl R.
    Fabrication of high-mobility Ge p-channel MOSFETs on Si substrates
    In: Electronic Letters , Jg. 35 1999, S. 503 – 504
  • Minoda, H.; Yagi, K.; Meyer zu Heringdorf, Frank; Meier, A.; Kähler, D.; Horn-von Hoegen, Michael
    Gold-induced faceting on a Si(001) vicinal surface: SPA-LEED and REM study
    In: Physical Review B: Condensed matter and materials physics , Jg. 59 1999, Nr. 3, S. 2363 – 2375
  • Minoda, H.; Shimakura, T.; Yagi, K.; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Gold-induced faceting on a Si(hhm) surface (m/h=1.4-1.5) studied by SPA-LEED
    In: Surface Science , Jg. 432 1999, Nr. 1-2, S. 69 – 80
    DOI
  • Horn-von Hoegen, Michael
    Growth of semiconductor layers studied by spot profile analysing low energy electron diffraction
    In: Zeitschrift für Kristallographie , Jg. 214 1999, S. 684 – 721
  • Zahl, P.; Kury, Peter; Horn-von Hoegen, Michael
    Interplay of surface morphology and strain relief during surfactant mediated epitaxy of Ge on Si
    In: Applied Physics A: Materials Science & Processing , Jg. 69 1999, Nr. 5, S. 481 – 488
  • Horn-von Hoegen, Michael
    Spot profile analysis low energy electron diffraction of semiconductor growth
    In: Zeitschrift für Kristallographie , Jg. 214 1999, S. 591 – 629
  • Kammler, Martin; Reinking, Dirk; Hofmann, Karl R.; Horn-von Hoegen, Michael
    Surfactant-mediated epitaxy of Ge on Si: progress in growth and electrical characterization
    In: Thin Solid Films , Jg. 336 1999, Nr. 1-2, S. 29 – 33
    DOI
  • Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank; Kähler, Dirk; Schmidt, Th.; Bauer, Ernst
    Adsorption induced giant faceting of vicinal Si(001)
    In: Thin Solid Films , Jg. 336 1998, Nr. 1-2, S. 16 – 21
    DOI
  • Meyer zu Heringdorf, Frank; Schmidt, Th.; Bauer, E.; Kähler, D.; Minoda, H.; Yagi, K.; Horn-von Hoegen, Michael
    Giant faceting of vicinal Si(001) induced by Au adsorption
    In: Surface Review and Letters , Jg. 5 1998, S. 1167 – 1178
    DOI
  • Falta, J.; Mielmann, O.; Schmidt, T.; Hille, A.; Sanchez-Hanke, C.; Sonntag, P.; Materlik, G.; Meyer zu Heringdorf, Frank; Kammler, Martin; Horn-von Hoegen, Michael; Copel, M.
    High concentration Bi delta-doping layers on Si(001)
    In: Applied Surface Science , Jg. 123/124 1998, S. 538 – 541
    DOI
  • Horn-von Hoegen, Michael; Minoda, H.; Yagi, H.; Meyer zu Heringdorf, Frank; Kähler, D.
    Macroscopic one-dimensional facetting of Si(100) upon Au adsorption
    In: Surface Science , Jg. 402-404 1998, S. 464 – 469
    DOI
  • Meier, A.; Zahl, P.; Vockenrodt, R.; Horn-von Hoegen, Michael
    Step arrangement control of vicinal Si(001) by Ag adsorption
    In: Applied Surface Science , Jg. 123/124 1998, S. 694 – 698
    DOI
  • Kammler, Martin; Falta, J.; Kury, Peter; Müller, B.H.; Schmidt, T.; Horn-von Hoegen, Michael
    Strain Field of Periodic Dislocation Networks of SME grown Ge on Si(111)
    In: HASYLAB/DESY Annual Report , Jg. 0 1998
  • Henzler, M.; Thielking, D.; Horn-von Hoegen, Michael; Zielasek, V
    Surface morphology changes due to adsorbates and due to electron bombardement
    In: Physica A: Statistical Mechanics and its Applications , Jg. 261 1998, Nr. 1-2, S. 1 – 12
    DOI
  • Hofmann, Karl R.; Reinking, Dirk; Kammler, Martin; Horn-von Hoegen, Michael
    Surfactant-grown low-doped Germanium layers on Silicon with high electron mobilities
    In: Thin Solid Films , Jg. 321 1998, Nr. 1-2, S. 125 – 130
    DOI
  • Falta, J.; Bahr, D.; Materlik, G.; Müller, B.H.; Horn-von Hoegen, Michael
    X-ray characterization of buried delta layers
    In: Surface Review and Letters , Jg. 5 1998, S. 145 – 149
    DOI
  • Fölsch, S.; Meyer, G.; Winau, D.; Rieder, K.H.; Horn-von Hoegen, Michael; Schmidt, T.; Henzler, M.
    Ag-mediated step-bunching instability on vicinal Si(100)
    In: Surface Science , Jg. 394 1997, Nr. 1-3, S. 60 – 70
    DOI
  • Reinking, Dirk; Kammler, Martin; Horn-von Hoegen, Michael; Hofmann, Karl R.
    Enhanced Sb segregation in surfactant-mediated heterogrowth: High-mobility, low-doped Ge on Si
    In: Applied Physics Letters , Jg. 71 1997, Nr. 7, S. 924 – 926
  • Reinking, Dirk; Kammler, Martin; Horn-von Hoegen, Michael; Hofmann, Karl R.
    High electron mobilities in surfactant-grown Germanium on Silicon substrates
    In: Japanese Journal of Applied Physics , Jg. 36 1997, S. 1082 – 1085
  • Horn-von Hoegen, Michael; Golla, Anke
    Adsorbate induced change of equilibrium surface during crystal growth: Si on Si(111)/H
    In: Physical Review Letters , Jg. 76 1996, Nr. 16, S. 2953 – 2956
  • Falta, J.; Bahr, D.; Hille, A.; Materlik, G.; Kammler, Martin; Horn-von Hoegen, Michael
    Stress reduction and interface quality of buried Sb delta-layers on Si(001)
    In: Applied Physics Letters , Jg. 69 1996, Nr. 19, S. 2906 – 2908
  • Falta, J.; Bahr, D.; Materlik, G.; Müller, B.H.; Horn-von Hoegen, Michael
    Towards perfect Ge delta layers on Si(001)
    In: Applied Physics Letters , Jg. 68 1996, Nr. 10, S. 1394 – 1396
  • Bahr, D.; Falta, J.; Materlik, G.; Müller, B.H.; Horn-von Hoegen, Michael
    X-ray interface characterization of Ge delta layers on Si(001)
    In: Physica B: Condensed Matter , Jg. 221 1996, Nr. 1-4, S. 96 – 100
    DOI
  • Fölsch, S.; Winau, D.; Meyer, G.; Rieder, K.H.; Horn-von Hoegen, Michael; Schmidt, T.; Henzler, M.
    Ag-induced multi-step formation on Si(001)
    In: Applied Physics Letters , Jg. 67 1995, Nr. 15, S. 2185 – 2187
    DOI
  • Horn-von Hoegen, Michael; Schmidt, T.; Henzler, M.; Meyer, G.; Winau, D.; Rieder, K.H.
    Epitaxial layer growth of Ag(111)-films on Si(100)
    14th European Conference on Surface Science (ECOSS-14) ; 17.9.-23.9.1994, Leipzig, Germany,
    In: Surface Science , Jg. 331–333 1995, Nr. A, S. 575 – 579
    DOI
  • Falta, J.; Gog, T.; Materlik, G.; Müller, B.H.; Horn-von Hoegen, Michael
    Ge d -Layers on Si(111) and Si(001) grown by MBE and SPE
    In: MRS Proceedings , Jg. 375 1995, S. 177 – 180
  • Horn-von Hoegen, Michael; Golla, Anke
    Influence of H on low temperature Si(111) homoepitaxy
    In: Surface Science , Jg. 337 1995, Nr. 1–2, S. L777 – L782
    DOI
  • Falta, J.; Gog, T.; Materlik, G.; Müller, B.H.; Horn-von Hoegen, Michael
    Interface roughening of Ge delta layers on Si(111)
    In: Physical Review B: Condensed matter and materials physics , Jg. 51 1995, Nr. 12, S. 7598
  • Horn-von Hoegen, Michael; Schmidt, T.; Henzler, M.; Meyer, G.; Winau, D.; Rieder, K.H.
    Lattice accomodation of Si(001) and Ag(111)
    In: Physical Review B: Condensed matter and materials physics , Jg. 52 1995, Nr. 15, S. 10764 – 10767
  • Fölsch, S.; Meyer, G.; Winau, D.; Rieder, K.H.; Schmidt, T.; Horn-von Hoegen, Michael
    Reconstruction dependent orientation of Ag(111) films on Si(001)
    In: Physical Review B: Condensed matter and materials physics , Jg. 52 1995, Nr. 19, S. 13745 – 13748
  • Horn-von Hoegen, Michael; Falta, J.; Copel, M.; Tromp, R.M.
    Surfactants in Si(111) homoepitaxy
    In: Applied Physics Letters , Jg. 66 1995, Nr. 4, S. 487 – 489
  • Horn-von Hoegen, Michael; Pietsch, Holger
    Homoepitaxy of Si(111) is surface defect mediated
    In: Surface Science , Jg. 321 1994, Nr. 1-2, S. L129 – L136
    DOI
  • Horn-von Hoegen, Michael; Henzler, M.
    Lattice matching periodic interfacial dislocation network in surfactant-mediated growth of Ge on Si(111)
    In: Physica status solidi: A - Applications and materials science , Jg. 146 1994, Nr. 1, S. 337 – 352
  • Horn-von Hoegen, Michael; Müller, B.H.; Al Falou, A.
    Strain relief by micro roughness in surfactant mediated growth of Ge on Si(001)
    In: Physical Review B: Condensed matter and materials physics , Jg. 50 1994, Nr. 16, S. 11640 – 11652
  • Horn-von Hoegen, Michael; Copel, Matthew; Tsang, J.; Reuter, M.C.; Tromp, R.M.
    Surfactant-mediated growth of Ge on Si(111)
    In: Physical Review B: Condensed matter and materials physics , Jg. 50 1994, Nr. 15, S. 10811 – 10822
  • Horn-von Hoegen, Michael; Al Falou, A.; Müller, B.H.; Köhler, U.; Andersohn, L.; Dahlheimer, B.; Henzler, M.
    Surfactant-stabilized strained Ge cones on Si(100)
    In: Physical Review B: Condensed matter and materials physics , Jg. 49 1994, Nr. 4, S. 2637 – 2650
  • Horn-von Hoegen, Michael
    Surfactants: Perfect heteroepitaxy of Ge on Si(111)
    In: Applied Physics A: Materials Science & Processing , Jg. 59 1994, Nr. 5, S. 503 – 515
  • Horn-von Hoegen, Michael; Al Falou, A.; Pietsch, Holger; Müller, B.H.; Henzler, M.
    Formation of interfacial dislocation network in surfactant mediated growth of Ge on Si(111) investigated by Spa-Leed : Part I
    In: Surface Science , Jg. 298 1993, Nr. 1, S. 29 – 42
    DOI
  • Horn-von Hoegen, Michael; Pook, M.; Al Falou, A.; Müller, B.H.; Henzler, M.
    Surface morphology and strain relief in surfactant mediated growth of Ge on Si(111)
    In: Scanning Microscopy , Jg. 7 1993, S. 481 – 488
  • Horn-von Hoegen, Michael; Müller, B.H.; Al Falou, A.; Henzler, M.
    Surfactant induced reversible changes of surface morphology
    In: Physical Review Letters , Jg. 71 1993, Nr. 19, S. 3170 – 3173
  • Horn-von Hoegen, Michael; Pook, M.; Al Falou, A.; Müller, B.H.; Henzler, M.
    The interplay of surface morphology and strain relief in surfactant mediated growth of Ge on Si(111)
    In: Surface Science , Jg. 284 1993, Nr. 1-2, S. 53 – 66
    DOI
  • Henzler, M.; Horn-von Hoegen, Michael; Köhler, U.
    Growth of monoatomic layers: investigations with electron diffraction and scanning tunneling microscopy,
    In: Advances in Solid State Physics , Jg. 32 1992, S. 333 – 353
  • Köhler, U.; Jusko, O.; Müller, B.; Horn-von Hoegen, Michael; Pook, M.
    Layer-by -layer growth of germanium on Si(100): Strain induced morphology and the influence of surfactants
    In: Ultramicroscopy , Jg. 42–44 1992, Nr. 1, S. 832 – 837
    DOI
  • Tromp, R.M.; Copel, Matthew; Reuter, M.C.; Horn-von Hoegen, Michael; Speidell, J.
    A new two-dimensional particle detector for a toroidal electrostatic analyzer
    In: Review of Scientific Instruments , Jg. 62 1991, Nr. 11, S. 2679
  • Horn-von Hoegen, Michael; LeGoues, F.K.; Copel, Matthew; Reuter, M.C.; Tromp, R.M.
    Defect self-annihilation in surfactant-mediated epitaxial growth
    In: Physical Review Letters , Jg. 67 1991, Nr. 9, S. 1130
  • LeGoues, F.K.; Horn-von Hoegen, Michael; Copel, Matthew; Tromp, R.M.
    Strain-relief mechanism in surfactant-grown epitaxial germanium films on Si(111)
    In: Physical Review B: Condensed matter and materials physics , Jg. 44 1991, Nr. 23, S. 12894 – 12902
  • Copel, Matthew; Reuter, M.C.; Horn-von Hoegen, Michael; Tromp, R.M.
    Influence of surfactants in Ge and Si epitaxy on Si(001),
    In: Physical Review B: Condensed matter and materials physics , Jg. 42 1990, Nr. 18, S. 11682 – 11689
  • Falta, J.; Horn-von Hoegen, Michael; Henzler, M.
    SPA-LEED studies of defects in thin epitaxial NiSi2 layers on Si(111)
    In: Applied Surface Science , Jg. 41–42 1989, S. 230 – 235
    DOI
  • Horn-von Hoegen, Michael; Falta, J.; Henzler, M.
    The initial stages of growth of silicon on Si(111) by spot profile analysing low-energy electron diffraction
    In: Thin Solid Films , Jg. 183 1989, Nr. 1-2, S. 213 – 220
    DOI
  • Horn-von Hoegen, Michael; Gotter, U.; Henzler, M.
    Low-energy electron diffraction investigations of Si molecular-beam epitaxy on Si(100)
    In: Journal of Vacuum Science & Technology B , Jg. 6 1988, Nr. 2, S. 727 – 730
    DOI
  • Altsinger, R.; Busch, H.; Horn-von Hoegen, Michael; Henzler, M.
    Nucleation and growth during molecular beam epitaxy (MBE) of Si on Si(111)
    The 11th International Seminar on Surface Physics ; May 11-16, 1987, Piechowice, Poland,
    In: Surface Science , Jg. 200 1988, Nr. 2-3, S. 235 – 246
    DOI
  • Horn-von Hoegen, Michael; Henzler, M.
    LEED studies of Si molecular beam epitaxy on Si(111)
    In: Journal of Crystal Growth , Jg. 81 1987, Nr. 1-4, S. 428 – 433
    DOI

    • Abstracts

  • Meyer zu Heringdorf, Frank; Wall, Dirk; Roos, K. R.; Lohmar, I.; Krug, J.; Horn-von Hoegen, Michael
    Dynamics of Reconstructed Zones Formed Around Islands on Si During Desorption : Diffusion Made Visible
    In: Proceedings of the 8th International Symposium on Atomic Level Characterizations for New Materials and Devices / ALC 2011; 22 – 27 May 2011; Seoul, Korea 2011, S. 372
  • Siders, C. W.; Cavalleri, A.; Tóth, C.; Wilson, K. R.; Squier, J. A.; Barty, C. P. J.; Kammler, Martin; Sokolowski-Tinten, Klaus; Horn-von Hoegen, Michael; von der Linde, Dietrich
    Femtosecond X-ray diffraction of short-pulse irradiated semiconductors
    In: Technical Digest: Summaries of Papers Presented at the Conference on Lasers and Electro-Optics ; Long Beach Convention Center, Long Beach, California, May 19-24, 2002 / Conference on Lasers and Electro-Optics ; CLEO 2002 ; May 19-24, 2002, Long Beach, California, USA / Optical Society of America (Hrsg.) 2002, S. 297 – 298
    DOI, Online Volltext
  • Sokolowski-Tinten, Klaus; Blome, C.; Dietrich, C.; Blums, J.; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, A.; Squier, J.; Kammler, Martin
    Structural dynamics in laser-excited solids investigated with femtosecond X-ray diffraction
    In: Technical Digest: Summaries of Papers Presented at the Conference on Lasers and Electro-Optics ; Long Beach Convention Center, Long Beach, California, May 19-24, 2002 / Conference on Lasers and Electro-Optics ; CLEO 2002 ; May 19-24, 2002, Long Beach, California, USA / Optical Society of America (Hrsg.) 2002, S. 300
    DOI, Online Volltext

    • Preprints

  • Brand, Christian; Tinnemann, Verena; Hanisch-Blicharski, Anja; Tajik, Mohammad; Fortmann, Jonas Darius; Kaßen, Alexander; Thiemann, Fabian; Horn-von Hoegen, Michael
    Non-Equilibrium Pathways for Excitation of Bulk and Surface Phonons through Anharmonic Coupling
    2023
    Online Volltext, DOI (Open Access)
  • Schaller, Gernot; Queisser, Friedemann; Parya Katoorani, Seyedeh; Brand, Christian; Kohlfürst, Christian; Freeman, Mark R.; Hucht, Alfred; Kratzer, Peter; Sothmann, Björn; Horn-von Hoegen, Michael; Schützhold, Ralf
    Sequential Kibble-Zurek dynamics in the anisotropic Ising model of the Si(001) surface
    2023
    Online Volltext, DOI (Open Access)

    • Beiträge in Sammelwerken und Tagungsbänden

  • Runge, Matthias; Ghalgaoui, Ahmed; Gonzalez-Vallejo, Isabel; Thiemann, Fabian; Horn-von Hoegen, Michael; Reimann, Klaus; Woerner, Michael; Elsaesser, Thomas
    Nonperturbative carrier generation and symmetry reduction in bismuth by intense terahertz excitation
    In: Proceedings of CLEO Fundamental Science 2023, Conference on Lasers and Electro-Optics (CLEO 2023) / Conference on Lasers and Electro-Optics (CLEO 2023): 7–12 May 2023; San Jose, United States / The Optical Society (Hrsg.) 2023, FTh5B.5
    DOI
  • Koc, Azize; Gonzalez-Vallejo, Isabel; Runge, Matthias; Ghalgaoui, Ahmed; Reimann, Klaus; Kremeyer, Laurenz; Thiemann, Fabian; Horn-von Hoegen, Michael; Sokolowski-Tinten, Klaus; Woerner, Michael; Elsaesser, Thomas
    Ultrafast long-wavelength excitation of coherent optical phonons in bismuth
    In: Proceedings of CLEO Fundamental Science 2023, Conference on Lasers and Electro-Optics (CLEO 2023) / Conference on Lasers and Electro-Optics (CLEO 2023): 7–12 May 2023; San Jose, United States / The Optical Society (Hrsg.) 2023, FF1G.7
    DOI
  • Horn-von Hoegen, Michael
    Optically excited structural transition in atomic wires on surfaces at the quantum limit : A femtosecond ultrafast surface electron diffraction study
    In: Proceedings of SPIE: The International Society for Optical Engineering / Advances in Ultrafast Condensed Phase Physics 2018; Strasbourg; France; 23 - 24 April 2018 , Jg. 10673 2018, S. 1067304
    DOI
  • Schröder, Jörg; Skatulla, S; Horn-von Hoegen, Michael
    A micromorphic continuum formulation for cardiac tissue mechanics
    In: Insights and Innovations in Structural Engineering, Mechanics and Computation: Proceedings of the Sixth International Conference on Structural Engineering, Mechanics and Computation, Cape Town, South Africa, 5-7 September 2016 / 6th International Conference on Structural Engineering, Mechanics, and Computation, SEMC 2016, 5-7 September 2016, Cape Town, South Africa / Zingoni, Alphose (Hrsg.) 2016, S. 612 – 617
  • Sokolowski-Tinten, Klaus; Li, Renkai; Reid, Alex Hume M.; Weathersby, Stephen P.; Quirin, Florian; Chase, Tyler F.; Coffee, Ryan N.; Corbett, Jeff W.; Fry, Alan R.; Hartmann, Nick; Hast, Carsten; Hettel, Robert; Horn-von Hoegen, Michael; Janoschka, David; Jermann, M.; Lewandowski, James R.; Ligges, Manuel; Meyer zu Heringdorf, Frank; Mo, Mianzhen; Shen, Xiaozhe; Vecchione, Theodore; Witt, Christian; Wu, Juhao; Dürr, Hermann A.; Wang, Xijie
    Thickness dependent electron-lattice equilibration in thin Bi films studied by time-resolved MeV electron diffraction
    In: Proceedings of the International Conference on Ultrafast Phenomena / International Conference on Ultrafast Phenomena 2016, Santa Fe, New Mexico United States, 17-22 July 2016 2016
    DOI
  • Meyer zu Heringdorf, Frank; Kahl, Philip; Makris, Andreas; Sindermann, Simon; Podbiel, Daniel; Horn-von Hoegen, Michael
    Signatures of plasmoemission in two photon photoemission electron microscopy
    In: Ultrafast phenomena and nanophotonics XIX / Betz, Markus (Hrsg.) 2015
    DOI
  • Siders, C.W.; Cavalieri, A.; Tóth, Cs.; Wilson, K.R.; Barty, C.P.J.; Sokolowski-Tinten, Klaus; Horn-von Hoegen, Michael; von der Linde, Dietrich; Kammler, Martin
    Direct Observation of Ultrafast Non-thermal Melting by Ultrafast X-ray Diffraction
    In: Optical Sensors / Optical Society of America; Part of Advanced Photonics, 27 - 31 July 2014, Barcelona, Spain 2014, S. 334 – 336
  • Sokolowski-Tinten, Klaus; von der Linde, Dietrich; Siders, C.W.; Cavalleri, A.; Toth, C.; Guo, T.; Wilson, K.R.; Barty, C.P.J.; Kammler, Martin; Horn-von Hoegen, Michael
    Lattice dynamics of femtosecond laser-excited semiconductors probed by ultrafast x-ray diffraction
    In: Specialty Optical Fibers: Part of Advanced Photonics / Specialty Optical Fibers, Part of Advanced Photonics ; 27 - 31 July 2014, Barcelona, Spain / Optical Society of America (Hrsg.) 2014, PD3
  • Sokolowski-Tinten, Klaus; Blome, C.; Dietrich, Constanze; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, A.; Squier, J.; Uschmann, I.; Förster, E.; Kammler, Martin
    Observation of ultrafast structural transitions in solids using femtosecond x-ray pulses
    In: Specialty Optical Fibers: Part of Advanced photonics / Specialty Optical Fibers, Part of Advanced photonics ; 27 - 31 July 2014, Barcelona, Spain / Optical Society of America (Hrsg.) 2014, CPD18
  • Cavalleri, A.; Siders, C.W.; Guo, T.; Wilson, K.R.; Barty, C.P.J.; Sokolowski-Tinten, Klaus; von der Linde, Dietrich; Kammler, Martin; Horn-von Hoegen, Michael
    Propagation of picosecond acoustic pulses in semiconductor heterostructures probed by ultrafast X-ray diffraction
    In: Specialty Optical Fibers: Part of Advanced Photonics / Specialty Optical Fibers, Part of Advanced photonics ; 27 - 31 July 2014, Barcelona, Spain / Optical Society of America (Hrsg.) 2014, QPD8
  • Schröder, Jörg; Brinkhues, S.; Brands, Dominik; Horn-von Hoegen, Michael
    Simulation of arterial walls under condsideration of residual stresses : A numerical approach
    In: Proceedings of the jointly organised 11th World Congress on Computational Mechanics (WCCM XI) / 11th World Congress of Computational Mechanics (WCCM XI), 20-25 July 2014, Barcelona, Spain / Oñate, Eugenio (Hrsg.) 2014, S. 971 – 981
  • Sokolowski-Tinten, Klaus; Blome, C.; Dietrich, Constanze; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, A.; Squier, J.; Kammler, Martin
    Ultrafast structural dynamics in solids investigated with femtosecond x-ray pulses
    In: Specialty Optical Fibers: Part of Advanced photonics / Specialty Optical Fibers, Part of Advanced photonics ; 27 - 31 July 2014, Barcelona, Spain / Optical Society of America (Hrsg.) 2014, TuD2
  • Horn-von Hoegen, Michael
    Surfaces of Elemental Semiconductors
    In: Surface and Interface Science: Volume 2 - Properties of Elemental Surfaces / Wandelt, Klaus (Hrsg.) 2013, S. 350 – 422
    DOI
  • Nicoul, Matthieu; Quirin, Florian; Lindenberg, A.M.; Barty, A.; Fritz, D.M.; Zhu, D.; Lemke, H.; Chollet, M.; Reis, D.A.; Chen, J.; Ghimire, S.; Trigo, M.; Fuchs, M.; Gaffney, K.J.; Larsson, J.; Becker, Tim; Meyer, Sven; Payer, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael; Jerman, Martin; Sokolowski-Tinten, Klaus
    Ultrafast laser-induced melting and ablation studied by time-resolved diffuse X-ray scattering
    In: XVIIIth International Conference on Ultrafast Phenomena / XVIIIth International Conference on Ultrafast Phenomena Lausanne, Switzerland, July 8-13, 2012 / Chergui, M.; Taylor, A.; Cundiff, S. (Hrsg.) 2013, S. 04013
    DOI
  • Zhou, Ping; Streubühr, Carla; Kalus, Annika; Frigge, Tim; Wall, Simone; Hanisch-Blicharski, Anja; Kammler, Martin; Ligges, Manuel; Bovensiepen, Uwe; von der Linde, Dietrich; Horn-von Hoegen, Michael
    Ultrafast time resolved reflection high energy electron diffraction with tilted pump pulse fronts
    In: XVIIIth International Conference on Ultrafast Phenomena / XVIIIth International Conference on Ultrafast Phenomena Lausanne, Switzerland, July 8-13, 2012 / Chergui, M.; Taylor, A.; Cundiff, S. (Hrsg.) 2013, S. 10016-p1 – 10016-p3
    DOI
  • Frigge, Tim; Kalus, Annika; Klasing, Friedrich; Kammler, Martin; Hanisch-Blicharski, Anja; Horn-von Hoegen, Michael
    Nanoscale Heat Transport in Self-Organized Ge Clusters on Si(001)
    In: Nanoscale Thermoelectrics 2012: Materials and Transport Phenomena / Symposium JJ, Nanoscale Thermoelectrics - Materials and Transport Phenomena, April 9 - 13, 2012, San Francisco, California, USA 2012, S. 51 – 56
    DOI
  • Hanisch-Blicharski, Anja; Wall, Simone; Kalus, Annika; Frigge, Tim; Horn-von Hoegen, Michael
    Nanoscale Heat Transport through Epitaxial Ultrathin Hetero Films : Bi(111)/Si(001) and Bi(111)/Si(111)
    In: Phonons in nanomaterials: theory, experiments and applications / Symposium W, Phonons in Nanomaterials - Theory, Experiments and Applications, November 28 - December 3, 2011, Boston, Massachusetts, USA / Shinde, S.L. (Hrsg.) 2011
    DOI
  • Shymanovich, Uladzimir; Nicoul, Matthieu; Lu, Wei; Tarasevitch, Alexander; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    Coherent acoustic and optical phonons in laser-excited solids studied by ultrafast time-resolved X-ray diffraction
    In: International Symposium on High Power Laser Ablation 2010 / International Symposium on High Power Laser Ablation, Santa Fe, New Mexico, 18 - 22 April 2010 / Phipps, Claude R. (Hrsg.) 2010, S. 558 – 566
    DOI
  • Lu, Wei; Nicoul, Matthieu; Shymanovich, Uladzimir; Tarasevitch, Alexander; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    Extreme phonon softening in laser-excited Bismuth - Towards an inverse Peierls-transitiom
    In: Ultrafast processes in materials science / Ultrafast processes in materials science, November 30 - December 4, 2009, Boston, Massachusetts, USA 2010, S. 18 – 22
  • Shymanovich, Uladzimir; Nicoul, Matthieu; Kähle, Stefan; Lu, Wei; Tarsevitch, Alexander; Zhou, Ping; Wietler, Tobias; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    The role of thermal and electronic pressure in the picosecond acoustic response of femtosecond laser-excited solids
    In: Ultrafast processes in materials science / Ultrafast processes in materials science, November 30 - December 4, 2009, Boston, Massachusetts, USA 2010, S. 6
  • Lu, Wei; Nicoul, Matthieu; Shymanovich, Uladzimir; Tarasevitch, Alexander; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    Transient reversal of a peierls-transition : Extreme phonon softening in laser-excited bismuth
    In: International Conference on Ultrafast Phenomena 2010 / UP2010; 18 - 23 July 2010; Snowmass Village, United States 2010, S. ME41
    DOI
  • Möllenbeck, Simone; Hanisch-Blicharski, Anja; Schneider, Paul; Ligges, Manuel; Zhou, Ping; Kammler, Martin; Krenzer, Boris; Horn-von Hoegen, Michael
    Ultra-fast time-resolved electron diffraction of strongly driven phase transitions on silicon surfaces
    In: Materials Research Society Symposium Proceedings / Ultrafast processes in materials science, November 30 - December 4, 2009, Boston, Massachusetts, USA 2010, S. 86 – 93
    DOI
  • Ernstorfer, Ralph; Harb, Maher; Hebeisen, Christoph T.; Sciaini, Germán; Dartigalongue, Thibault; Rajkovic, Ivan; Ligges, Manuel; von der Linde, Dietrich; Payer, Thomas; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank; Kruglik, Sergei G.; Miller, Ryan J. Dwayne
    Atomic View of the Photoinduced Collapse of Gold and Bismuth
    In: Ultrafast Phenomena XVI: Proceedings / 16th International Conference, Palazzo dei Congressi Stresa, Italy, June 9-13, 2008 / Corkum, Paul; Silvestri, Sandro; Nelson, Keith A.; Riedle, Eberhard; Schoenlein, Robert W. (Hrsg.) 2009, S. 113 – 115
    DOI
  • Rajkovic, Ivan; Ligges, Manuel; Zhou, Ping; Payer, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael; von der Linde, Dietrich
    Electron-phonon energy transfer in Bi observed by time resolved electron diffraction
    In: Ultrafast Phenomena XVI: Proceedings of the 16th International Conference, Palazzo dei Congressi Stresa, Italy, June 9--13, 2008 2009, S. 110 – 112
    DOI
  • Sokolowski-Tinten, Klaus; Shymanovich, Uladzimir; Nicoul, Matthieu; Blums, J.; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Morak, A.; Wietler, T.
    Energy relaxation and anomalies in the thermo-acoustic response of femtosecond laser-excited Germanium,
    In: Ultrafast Phenomena XV: Springer series in chemical physics ; 88 / Weiner, A.M.; Miller, R. J. D. (Hrsg.) 2006, S. 597 – 599
  • Sokolowski-Tinten, Klaus; Shymanovich, Uladzimir; Nicoul, Matthieu; Blums, Juris; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Morak, Andreas; Wietler, Tobias F.
    Energy relaxation and anomalies in the thermo-acoustic response of femtosecond laser-excited germanium
    In: International Conference on Ultrafast Phenomena / UP 2006; Pacific Grove, United States; 31 July 2006 2006, S. MG5
    DOI
  • Fritz, David M.; Adams, Bernhard W.; Blome, Christian; Bucksbaum, Phillip H.; Cavalieri, Adrian L.; Engemann, S.; Fahy, Stephen B.; Fuoss, Paul H.; Gaffney, Kelly J.; Hillyard, P.; Horn-von Hoegen, Michael; Kammler, Martin; Kaspar, Jen D.; Lindenberg, Aaron M.; Lee, Soo Heyong; McFarland, Brian K.; Meyer, D.; Murray, Éamonn D.; Nicou, M.; Pahl, Reinhard; Rudati, Juana I.; Siddons, David P.; Sokolowski-Tinten, Klaus; von der Linde, Dietrich; Wahlstrand, Jared K.; Hastings, Jerome B.; Reis, David A.
    Ultrafast optical and X-ray measurements of femtosecond lattice dynamics in photoexcited bismuth
    In: 15th International Conference on Ultrafast Phenomena / UP 2006; Pacific Grove, United States; 31 July – 4 August 2006 2006, S. WD7
    DOI
  • Sokolowski-Tinten, Klaus; Blome, Christian; Blums, Juris; Dietrich, Constanze; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, Andrea; Kammler, Martin; Uschmann, Ingo; Förster, Eckhard
    Femtosecond X-ray Diffraction Study of Large Amplitude Coherent Optical Phonons in Laser-Excited Bismuth
    In: Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference / Conference on Lasers and Electro-Optics (CLEO): Baltimore, United States; 1–6 June 2003 2003, CMZ6
  • Sokolowski-Tinten, Klaus; Blome, C.; Dietrich, Constanze; Blums, J.; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, A.; Squier, J.; Kammler, Martin
    Femtosecond time-resolved X-ray diffraction study of ultrafast structural dynamics in laser-excited solids
    In: Optics InfoBase Conference Papers / International Conference on Ultrafast Phenomena, UP 2002, Vancouver,12 May 2002 / Gakkai, Ōyō Butsuri (Hrsg.) 2002, S. 19 – 20
  • Horn-von Hoegen, Michael; Henzler, M.; Meyer, G.
    Ag on Si surfaces: from insulator to metal
    In: Morphological Organization in Epitaxial Growth: (Series on Directions in Condensed Matter Physics, Vol. 14) / Zhang, Zhenyu; Lagally, Max G. (Hrsg.) 1999, S. 403 – 420
  • Reinking, Dirk; Kammler, Martin; Hoffmann, N.; Horn-von Hoegen, Michael; Hofmann, Karl R.
    Ge p-MOSFETs Compatible with Si CMOS-Technology
    In: ESSDERC'99 : Proceedings of the 29th European solid-state device research conference / Maes,, H.E.; Mertens, R.P.; Declerk, G. (Hrsg.) 1999, S. 300 – 303
  • Siders, Craig W.; Cavalleri, Andrea; Sokolowski-Tinten, Klaus; Guo, Ting; Toth, Csaba; Jimenez, Ralph; Rose-Petruck, Christoph; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Wilson, Kent R.; Barty, Christopher P.J.
    Ultrafast movies of atomic motion with femtosecond laser-based X-rays
    In: Soft X-Ray Lasers and Applications III: 19 - 20 July 1999, Denver, Colorado / SPIE Conference on Soft X-Ray Lasers and Applications ; 2; 1999; Denver, Colo. / Rocca, Jorge J. (Hrsg.) 1999, S. 302 – 311
    DOI
  • Horn-von Hoegen, Michael
    Surfactant mediated heteroepitaxy: Interplay of diffusion, strain relief, and surface morphology
    In: Proc. NATO-ASI Workshop on Surface Diffusion: atomistic and Collective Processes / Tringide, M.C. (Hrsg.) 1997, S. 309 – 317
  • Horn-von Hoegen, Michael
    Formation of lattice matching interfacial dislocation network in surfactant mediated growth of Ge on Si(111) by an in situ SPA-LEED study
    In: Proceedings : 4th international conference on the formation of semiconductor interfaces (ICSFI-4) / Lengeler, Bruno (Hrsg.) 1994
  • Horn-von Hoegen, Michael; Henzler, M.
    Crystal Growth Studies with LEED
    In: Proceedings of the 2nd Symposium of Surface Science in Kaprun, Österreich 1988
  • Horn-von Hoegen, Michael; Gotter, U.; Henzler, M.
    LEED investigations of Si MBE on Si(100)
    In: Proc. NATO-Workshop on RHEED and Reflection Electron Imaging of Surfaces / Larsen, P.K. (Hrsg.) 1988

    • Bücher/Sammelwerke/Tagungsbände

  • Hafke, Bernd; Witte, Tobias; Brand, Christian; Janoschka, David; Dreher, Pascal; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael (Hrsg.)
    Structural Dynamics in the Si(111)-In atomic wire systems studied by femtosecond-RHEED : excitation, metastable states and relaxation
    ALC´19: 12th International Symposium on Atomic Level Characterizations for New Materials and Devices; 19 - 25 October 2019; Kyoto, Japan,
    2019

    • Vorträge

  • Horn-von Hoegen, Michael
    "It's not a trick, it's atomic soap" : Kristallwachstum mit Surfactants
    Die kleine Form, 28. Januar 2004, Essen,
    2004 (Die kleine Form 2003/2004)
    Online Volltext