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Prof. Dr. rer. nat. Andreas Wucher

Fakultät für Physik

Anschrift
Lotharstraße 1
47057 Duisburg
E-Mail
andreas.wucher@uni-due.de

Funktionen

  • ---, Experimentalphysik

Die folgenden Publikationen sind in der Online-Universitätsbibliographie der Universität Duisburg-Essen verzeichnet. Weitere Informationen finden Sie gegebenenfalls auch auf den persönlichen Webseiten der Person.

    Artikel in Zeitschriften

  • Yao, Yifan; Kononov, Alina; Metzlaff, Arne; Wucher, Andreas; Kalkhoff, Lukas; Breuer, Lars; Schleberger, Marika; Schleife, André
    Nonequilibrium Dynamics of Electron Emission from Cold and Hot Graphene under Proton Irradiation
    In: Nano Letters, Jg. 24, 2024, Nr. 17, S. 5174 – 5181
    DOI, Online Volltext (Open Access)
  • Kalkhoff, Lukas; Golombek, Alexander; Schleberger, Marika; Sokolowski-Tinten, Klaus; Wucher, Andreas; Breuer, Lars
    Path to ion-based pump-probe experiments: Generation of 18 picosecond keV Ne+ ion pulses from a cooled supersonic gas beam
    In: Physical Review Research, Jg. 5, 2023, Nr. 3, 033106
    DOI, Online Volltext (Open Access)
  • Kucharczyk, Pawel; Golombek, Alexander; Schleberger, Marika; Wucher, Andreas; Breuer, Lars
    Ultrashort Ne+ ion pulses for use in pump-probe experiments : numerical simulations
    In: New Journal of Physics (NJP), Jg. 25, 2023, Nr. 12, 123015
    DOI (Open Access)
  • Golombek, Alexander; Breuer, Lars; Danzig, Lisa; Kucharczyk, Pawel; Schleberger, Marika; Sokolowski-Tinten, Klaus; Wucher, Andreas
    Generation of ultrashort keV-Ar+ ion pulses via femtosecond laser photoionization
    In: New Journal of Physics (NJP), Jg. 23, 2021, Nr. 3, S. 033023
    DOI (Open Access)
  • Skopinski, Lucia; Ernst, Philipp; Herder, Matthias; Kozubek, Roland; Madauß, Lukas; Sleziona, Stephan; Maas, Andre; Königstein, N.; Lebius, Henning; Wucher, Andreas; Schleberger, Marika
    Time-of-flight mass spectrometry of particle emission during irradiation with slow, highly charged ions
    In: Review of Scientific Instruments, Jg. 92, 2021, Nr. 2, S. 023909
    DOI, Online Volltext (Open Access)
  • Golombek, Alexander; Danzig, Lisa; Wucher, Andreas
    Characterization of a supersonic gas jet via laser-induced photoelectron ionization
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 480, 2020, S. 1 – 9
    DOI, Online Volltext (Open Access)
  • Breuer, Lars; Ernst, Philipp; Herder, Matthias; Meinerzhagen, Florian; Bender, Markus; Severin, Daniel; Wucher, Andreas
    Corrigendum to “Mass spectrometric investigation of material sputtered under swift heavy ion bombardment” [Nucl. Instrum. Methods B 435 (2018) 101–110](S0168583X17309382)(10.1016/j.nimb.2017.10.019)
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 469, 2020, S. 57
    DOI (Open Access)
  • Kucharczyk, Pawel; Golombek, Alexander; Wucher, Andreas
    Generation of ultrashort ion pulses in the keV range : Numerical simulations
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 483, 2020, S. 41 – 49
    DOI
  • Herder, Matthias; Ernst, Philipp; Skopinski, Lucia; Weidtmann, Boris; Schleberger, Marika; Wucher, Andreas
    Ionization probability of sputtered indium atoms under impact of slow highly charged ions
    In: Journal of Vacuum Science and Technology (JVST) B: Nanotechnology and Microelectronics, Jg. 38, 2020, Nr. 4, S. 044003
    DOI
  • Breuers, Alexander; Herder, Matthias; Kucharczyk, Pawel; Schleberger, Marika; Sokolowski-Tinten, Klaus; Wucher, Andreas
    A concept to generate ultrashort ion pulses for pump-probe experiments in the keV energy range
    In: New Journal of Physics (NJP), Jg. 21, 2019, Nr. 5, S. 053017
    DOI (Open Access)
  • Herder, Matthias; Klein, Julia; Sevim, A.; Wucher, Andreas
    Ionization probability of sputtered coronene molecules
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 460, 2019, S. 193 – 200
    DOI
  • Wucher, Andreas; Breuer, Lars; Winograd, Nicholas
    Ionization probability of sputtered indium under irradiation with 20-keV fullerene and argon gas cluster projectiles
    In: International Journal of Mass Spectrometry and Ion Physics, Jg. 438, 2019, S. 13 – 21
    DOI
  • Breuer, Lars; Tian, Hua; Wucher, Andreas; Winograd, Nicholas
    Molecular SIMS Ionization Probability Studied with Laser Postionization : Influence of the Projectile Cluster
    In: Journal of Physical Chemistry C: Nanomaterials and Interfaces, Jg. 123, 2019, Nr. 1, S. 565 – 574
    DOI
  • Pino, Thomas; Chabot, Marin; Béroff, Karine; Godard, M.; Fernandez-Villoria, F.; Le, Kim Cuong; Breuer, Lars; Herder, Matthias; Wucher, Andreas; Bender, Markus; Severin, Daniel; Trautmann, Christina; Dartois, Emmanuel
    Release of large polycyclic aromatic hydrocarbons and fullerenes by cosmic rays from interstellar dust : Swift heavy ion irradiations of interstellar carbonaceous dust analogue
    In: Astronomy and Astrophysics (A&A), Jg. 623, 2019, S. 1834855
    DOI (Open Access)
  • Pino, Thomas; Chabot, M.; Béroff, K.; Godard, M.; Fernandez-Villoria, F.; Le, K. C.; Breuer, Lars; Herder, Matthias; Wucher, Andreas; Bender, M.; Severin, D.; Trautmann, C.; Dartois, Emmanuel
    Release of large polycyclic aromatic hydrocarbons and fullerenes by cosmic rays from interstellar dust. : Swift heavy ion irradiations of interstellar carbonaceous dust analogue
    In: Astronomy and Astrophysics (A&A), Jg. 623, 2019, S. A134
    DOI (Open Access)
  • Hanke, S.; Heuser, Christian; Weidtmann, Boris; Wucher, Andreas
    A ballistic transport model for electronic excitation following particle impact
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 415, 2018, S. 127 – 135
    DOI
  • Kucharczyk, Pawel; Füngerlings, A.; Weidtmann, Boris; Wucher, Andreas
    Computer simulation of sputtering induced by swift heavy ions
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 426, 2018, S. 5 – 12
    DOI
  • Breuers, Alexander; Penning, R.; Wucher, Andreas
    Ion induced electron emission statistics under Agm - cluster bombardment of Ag
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 422, 2018, S. 24 – 30
    DOI
  • Breuer, Lars; Ernst, Philipp; Herder, Matthias; Meinerzhagen, Florian; Bender, Markus; Severin, Daniel; Wucher, Andreas
    Mass spectrometric investigation of material sputtered under swift heavy ion bombardment
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 435, 2018, S. 101 – 110
    DOI
  • Wucher, Andreas
    Molecular ionization probability in cluster-sims
    In: Journal of Vacuum Science and Technology (JVST) B: Nanotechnology and Microelectronics, Jg. 36, 2018, Nr. 3, S. 03F123
    DOI
  • Breuer, Lars; Ernst, Philipp; Herder, Matthias; Meinerzhagen, F.; Bender, M.; Severin, D.; Wucher, Andreas
    Secondary ion formation during electronic and nuclear sputtering of germanium
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 424, 2018, S. 1 – 9
    DOI
  • Herder, Matthias; Ernst, Philipp; Breuer, Lars; Bender, Markus; Severin, Daniel; Wucher, Andreas
    Secondary ion formation on indium under nuclear and electronic sputtering conditions
    In: Journal of Vacuum Science and Technology (JVST) B: Nanotechnology and Microelectronics, Jg. 36, 2018, Nr. 3, S. 03F110
    DOI
  • Marpe, Mario; Wucher, Andreas; Diesing, Detlef
    The influence of internal and external electric fields on the transport of energetic electrons in nanostructures
    In: Journal of Electron Spectroscopy and Related Phenomena, Jg. 227, 2018, S. 51 – 68
    DOI
  • Marpe, Mario; Wucher, Andreas; Diesing, Detlef
    Transport of 75–1000 eV electrons in metal–insulator–metal devices
    In: Journal of Electron Spectroscopy and Related Phenomena, Jg. 223, 2018, S. 37 – 52
    DOI
  • Popczun, Nicholas J.; Breuer, Lars; Wucher, Andreas; Winograd, Nicholas
    Effect of SIMS ionization probability on depth resolution for organic/inorganic interfaces
    In: Surface and Interface Analysis, Jg. 49, 2017, Nr. 10, S. 933 – 939
    DOI
  • Popczun, Nicholas; Breuer, Lars; Wucher, Andreas; Winograd, Nicholas
    Ionization probability in molecular SIMS: protonation efficiency of sputtered guanine molecules studied by laser post-ionization
    In: Journal of Physical Chemistry C: Nanomaterials and Interfaces, 2017
    DOI
  • Popczun, Nicholas J.; Breuer, Lars; Wucher, Andreas; Winograd, Nicholas
    On the SIMS Ionization Probability of Organic Molecules
    In: Journal of the American Society for Mass Spectrometry (JASMS), 2017, S. 1 – 10
    DOI
  • Breuer, Lars; Popczun, Nicholas J.; Wucher, Andreas; Winograd, Nicholas
    Reducing the matrix effect in molecular secondary ion mass spectrometry by laser post-ionization
    In: Journal of Physical Chemistry C: Nanomaterials and Interfaces, Jg. 121, 2017, Nr. 36, S. 19705 – 19715
    DOI
  • Meinerzhagen, Florian; Breuer, Lars; Bukowska, Hanna; Bender, Markus; Severin, Daniel; Herder, Matthias; Lebius, Henning; Schleberger, Marika; Wucher, Andreas
    A new setup for the investigation of swift heavy ion induced particle emission and surface modifications
    In: Review of Scientific Instruments, Jg. 87, 2016, Nr. 1, S. 013903
    DOI, Online Volltext (Open Access)
  • Tian, Hua; Wucher, Andreas; Winograd, Nicholas
    Dynamic Reactive Ionization with Cluster Secondary Ion Mass Spectrometry
    In: Journal of the American Society for Mass Spectrometry (JASMS), Jg. 27, 2016, Nr. 2, S. 285 – 292
    DOI (Open Access)
  • Hua, Tian; Winograd, Nicholas; Wucher, Andreas
    Reduce the matrix effect in biological tissue imaging using dynamic reactive ionization and gas cluster ion beams
    In: Biointerphases, Jg. 11, 2016, Nr. 2, S. 02A320
    DOI, Online Volltext (Open Access)
  • Tian, Hua; Wucher, Andreas; Winograd, Nicholas
    Reducing the Matrix Effect in Organic Cluster SIMS Using Dynamic Reactive Ionization
    In: Journal of the American Society for Mass Spectrometry (JASMS), Jg. 27, 2016, Nr. 12, S. 2014 – 2024
    DOI, Online Volltext (Open Access)
  • Breuer, Lars; Wucher, Andreas; Severin, Daniel; Bender, Markus; Herder, Matthias; Meinerzhagen, Florian
    Secondary ion and neutral mass spectrometry with swift heavy ions : Organic molecules
    In: Journal of Vacuum Science and Technology (JVST) B: Nanotechnology and Microelectronics, Jg. 34, 2016, Nr. 3, S. 03H130
    DOI
  • Hanke, Sylvia; Duvenbeck, Andreas; Heuser, Christian; Weidtmann, Boris; Wucher, Andreas
    A hybrid model describing ion induced kinetic electron emission
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 352, 2015, S. 18 – 21
    DOI
  • Shard, Alexander G.; Havelund, Rasmus; Spencer, Steve J.; Gilmore, Ian S.; Alexander, Morgan R.; Angerer, Tina B.; Aoyagi, Satoka; Barnes, Jean-Paul; Benayad, Anass; Bernasik, Andrzej; Ceccone, Giacomo; Counsell, Jonathan D. P.; Deeks, Christopher; Fletcher, John S.; Graham, Daniel J.; Heuser, Christian; Lee, Tae Geol; Marie, Camille; Marzec, Mateusz M.; Mishra, Gautam; Rading, Derk; Renault, Olivier; Scurr, David J.; Shon, Hyun Kyong; Spampinato, Valentina; Tian, Hua; Wang, Fuyi; Winograd, Nicholas; Wu, Kui; Wucher, Andreas; Zhou, Yufan; Zhu, Zihua
    Measuring compositions in organic depth profiling : Results from a VAMAS interlaboratory study
    In: Journal of Physical Chemistry B: Condensed Matter, Materials, Surfaces, Interfaces & Biophysical Chemistry, Jg. 119, 2015, Nr. 33, S. 10784 – 10797
    DOI
  • Shen, Kan; Wucher, Andreas; Winograd, Nicholas
    Molecular Depth Profiling with Argon Gas Cluster Ion Beams
    In: Journal of Physical Chemistry C: Nanomaterials and Interfaces, Jg. 119, 2015, Nr. 27, S. 15316 – 15324
    DOI
  • Weidtmann, Boris; Duvenbeck, Andreas; Wucher, Andreas
    The influence of crater formation for electron excitation processes in cluster induced collision cascades
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 352, 2015, S. 186 – 189
    DOI
  • Breuer, Lars; Meinerzhagen, Florian; Bender, Markus; Severin, Daniel; Wucher, Andreas
    Time-of-flight secondary neutral & ion mass spectrometry using swift heavy ions
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 365, 2015, Nr. Part B, S. 482 – 489
    DOI
  • Wucher, Andreas; Tian, Huan; Winograd, Nicholas
    A mixed cluster ion beam to enhance the ionization efficiency in molecular secondary ion mass spectrometry
    In: Rapid Communications in Mass Spectrometry, Jg. 28, 2014, Nr. 4, S. 396 – 400
    DOI, Online Volltext (Open Access)
  • Weidtmann, Boris; Duvenbeck, Andreas; Wucher, Andreas
    Does local disorder influence secondary ion formation?
    In: Surface and Interface Analysis, Jg. 46, 2014, Nr. S1, S. 18 – 21
    DOI
  • Breuer, Lars; Winograd, Nicholas; Wucher, Andreas; Herder, Matthias; Kucher, Andrew
    Formation of Neutral InmCn Clusters under C60 Ion Bombardment of Indium
    In: Journal of Physical Chemistry A: Molecules, Clusters, and Aerosols, Jg. 118, 2014, Nr. 37, S. 8542 – 8552
    DOI
  • Tian, Hua; Wucher, Andreas; Winograd, Nicholas
    Molecular imaging of biological tissue using gas cluster ions
    In: Surface and Interface Analysis, Jg. 46, 2014, Nr. S1, S. 115 – 117
    DOI, Online Volltext (Open Access)
  • Kucher, Andrew; Winograd, Nicholas; Wucher, Andreas; Jackson, Lauren; Lerach, Jordan
    Near Infrared (NIR) Strong Field Ionization and Imaging of C₆₀ Sputtered Molecules : Overcoming Matrix Effects and Improving Sensitivity
    In: Analytical Chemistry, Jg. 86, 2014, Nr. 17, S. 8613 – 8620
    DOI
  • Kucher, Andrew; Wucher, Andreas; Winograd, Nicholas
    Strong field ionization of β-estradiol in the IR : strategies to optimize molecular postionization in secondary neutral mass spectrometry
    In: Journal of Physical Chemistry C: Nanomaterials and Interfaces, Jg. 118, 2014, Nr. 44, S. 25534 – 25544
    DOI
  • Wucher, Andreas; Weidtmann, Boris; Duvenbeck, Andreas
    A microscopic view of secondary ion formation
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 303, 2013, S. 108 – 111
    DOI
  • Wucher, Andreas; Winograd, Nicholas; Krantzman, K.D.; Lu, C.
    A statistical interpretation of molecular delta layer depth profiles
    In: Surface and Interface Analysis, Jg. 45, 2013, Nr. 1, Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 ‐ 23, 2011, S. 39 – 41
    DOI
  • Brenes, Daniel A.; Winograd, Nicholas; Postawa, Zbigniew; Wucher, Andreas; Blenkinsopp, Paul; Garrison, Barbara J.
    An experimental and theoretical view of energetic C60 cluster bombardment onto molecular solids
    In: Surface and Interface Analysis, Jg. 45, 2013, Nr. 1, Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 ‐ 23, 2011, S. 50 – 53
    DOI
  • Weidtmann, Boris; Hanke, Stefanie; Duvenbeck, Andreas; Wucher, Andreas
    Computer simulation of cluster impact induced electronic excitation of solids
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 303, 2013, S. 51 – 54
    DOI
  • Hanke, Stefanie; Wucher, Andreas; Marpe, Mario; Diesing, Detlef; Weidtmann, Boris; Duvenbeck, Andreas; Heuser, Christian
    Computer simulation of internal electron emission in ion-bombarded metals
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 303, 2013, S. 55 – 58
    DOI
  • Shen, Kan; Mao, Dan; Garrison, Barbara J.; Wucher, Andreas; Winograd, Nicholas
    Depth profiling of metal overlayers on organic substrates with cluster SIMS
    In: Analytical Chemistry, Jg. 85, 2013, Nr. 21, S. 10565 – 10572
    DOI
  • Heuser, Christian; Wucher, Andreas
    Energy and impact angle dependence of sub-threshold external electron emission
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 317, 2013, Nr. Part A, S. 37 – 43
    DOI
  • Lu, Caiyan; Winograd, Nicholas; Wucher, Andreas
    Investigations of molecular depth profiling with dual beam sputtering
    In: Surface and Interface Analysis, Jg. 45, 2013, Nr. 1, Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 ‐ 23, 2011, S. 175 – 177
    DOI
  • Samartsev, A.V.; Heuser, Christian; Wucher, Andreas
    Ionization probabilities of sputtered indium atoms under atomic and polyatomic Aum− ion bombardment
    In: Surface and Interface Analysis, Jg. 45, 2013, Nr. 1, Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 ‐ 23, 2011, S. 87 – 89
    DOI
  • Mai, M.; Weidtmann, Boris; Marpe, Mario; Wucher, Andreas
    Ionization probability of sputtered indium atoms: Dependence on projectile impact angle
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 317, 2013, Nr. Part A, S. 130 – 136
    DOI
  • Mao, Dan; Winograd, Nicholas; Wucher, Andreas; Brenes, Daniel A.; Lu, Caiyan
    Temperature effects of sputtering of Langmuir–Blodgett multilayers
    In: Surface and Interface Analysis, Jg. 45, 2013, Nr. 1, Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 ‐ 23, 2011, S. 65 – 67
    DOI
  • Weidtmann, Boris; Wucher, Andreas; Hanke, Stefanie; Duvenbeck, Andreas
    The role of electron temperature dynamics for secondary ion formation
    In: Surface and Interface Analysis, Jg. 45, 2013, Nr. 1, Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 ‐ 23, 2011, S. 72 – 74
    DOI
  • Wucher, Andreas; Krantzman, Kristin D.
    A statistical approach to delta layer depth profiling
    In: Surface and Interface Analysis, Jg. 44, 2012, Nr. 9, S. 1243 – 1248
    DOI
  • Mao, Dan; Wucher, Andreas; Brenes, Daniel A.; Lu, Caiyan; Winograd, Nicholas
    Cluster Secondary Ion Mass Spectrometry and the Temperature Dependence of Molecular Depth Profiles
    In: Analytical Chemistry, Jg. 84, 2012, Nr. 9, S. 3981 – 3989
    DOI
  • Paruch, Robert J.; Postawa, Zbigniew; Wucher, Andreas; Garrison, Barbara J.
    Steady-state statistical sputtering model for extracting depth profiles from molecular dynamics simulations of dynamic SIMS
    In: Journal of Physical Chemistry C: Nanomaterials and Interfaces, Jg. 116, 2012, Nr. 1, S. 1042 – 1051
    DOI
  • Duvenbeck, Andreas; Hanke, Stefanie; Weidtmann, Boris; Wucher, Andreas
    A molecular dynamics investigation of kinetic electron emission from silver surfaces under varying angle of projectile impact
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 269, 2011, Nr. 14, S. 1661 – 1664
    DOI
  • Krantzman, K. D.; Cook, E. L.; Wucher, Andreas; Garrison, B. J.
    A statistical analysis of the lateral displacement of Si atoms in molecular dynamics simulations of successive bombardment with 20-keV C-60 projectiles
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 269, 2011, Nr. 14, S. 1591 – 1594
    DOI
  • Poerschke, David; Wucher, Andreas
    Depth profiling of anodic tantalum oxide films with gold cluster ions
    In: Surface and Interface Analysis, Jg. 43, 2011, Nr. 1-2, S. 171 – 174
    DOI
  • Brenes, Daniel A.; Blenkinsopp, Paul; Winograd, Nicholas; Garrison, Barbara J.; Postawa, Zbigniew; Wucher, Andreas
    Fluid Flow and Effusive Desorption : Dominant Mechanisms of Energy Dissipation after Energetic Cluster Bombardment of Molecular Solids
    In: The Journal of Physical Chemistry Letters, Jg. 2, 2011, Nr. 16, S. 2009 – 2014
    DOI
  • Lu, C.; Winograd, Nicholas; Wucher, Andreas
    Fundamental studies of molecular depth profiling using organic delta layers as model systems
    In: Surface and Interface Analysis, Jg. 43, 2011, Nr. 1-2, S. 81 – 83
    DOI
  • Hanke, Stefanie; Duvenbeck, Andreas; Weidtmann, Boris; Wucher, Andreas
    Influence of the polar angle of incidence on electronic substrate excitations in keV self-bombardment of solid silver
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 269, 2011, Nr. 14, S. 1665 – 1667
    DOI
  • Weidtmann, Boris; Wucher, Andreas; Hanke, Stefanie; Duvenbeck, Andreas
    Influence of the polar angle of incidence on secondary ion formation in self-sputtering of silver
    In: Surface and Interface Analysis, Jg. 43, 2011, Nr. 1-2, S. 24 – 27
    DOI
  • Weidtmann, Boris; Hanke, Stefan; Duvenbeck, Andreas; Wucher, Andreas
    Influence of the projectile charge state on the ionization probability of sputtered particles
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 269, 2011, Nr. 11, S. 1306 – 1309
    DOI
  • Marpe, Mario; Wucher, Andreas; Diesing, Detlef; Heuser, Christian
    Internal electron emission in metal–insulator–metal thin film tunnel devices bombarded with keV argon and gold-cluster projectiles
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 269, 2011, Nr. 9, S. 972 – 976
    DOI
  • Willingham, D.; Wucher, Andreas; Winograd, Nicholas; Brenes, Daniel
    Investigating the fundamentals of molecular depth profiling using strong-field photoionization of sputtered neutrals
    In: Surface and Interface Analysis, Jg. 43, 2011, Nr. 1-2, S. 45 – 48
    DOI
  • Lu, Caiyan; Wucher, Andreas; Winograd, Nicholas
    Ionization effects in molecular depth profiling of trehalose films using buckminsterfullerene (C60) cluster ions
    In: Surface and Interface Analysis, Jg. 43, 2011, Nr. 1-2, S. 99 – 102
    DOI
  • Wucher, Andreas; Duvenbeck, Andreas
    Kinetic excitation of metallic solids: Progress towards a microscopic model
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 269, 2011, Nr. 14, S. 1655 – 1660
    DOI
  • Lu, Caiyan; Wucher, Andreas; Winograd, Nicholas
    Molecular Depth Profiling of Buried Lipid Bilayers Using C60-Secondary Ion Mass Spectrometry
    In: Analytical Chemistry, Jg. 83, 2011, Nr. 1, S. 351 – 358
    DOI
  • Mao, Dan; Lu, Caiyan; Winograd, Nicholas; Wucher, Andreas
    Molecular depth profiling by wedged crater bevelling
    In: Analytical Chemistry, Jg. 83, 2011, Nr. 16, S. 6410 – 6417
    DOI
  • Zheng, Leiliang; Wucher, Andreas; Winograd, Nicholas
    Retrospective sputter depth profiling using 3D mass spectral imaging
    In: Applied Surface Science, Jg. 43, 2011, Nr. 1-2, S. 41 – 44
    DOI
  • Wucher, Andreas; Kucher, Andrew; Winograd, Nicholas; Briner, C. A.; Krantzman, K. D.
    Sputtered neutral SinCm clusters as a monitor for carbon implantation during C-60 bombardment of silicon
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 269, 2011, Nr. 11, S. 1300 – 1305
    DOI
  • Heuser, Christian; Marpe, Mario; Diesing, Detlef; Wucher, Andreas
    The possible role of anisotropy in kinetic electronic excitation of solids by particle bombardment
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 269, 2011, Nr. 11, S. 1190 – 1194
    DOI
  • Krantzman, Kristin D.; Wucher, Andreas
    Fluence Effects in C60 Cluster Bombardment of Silicon
    In: Journal of Physical Chemistry C: Nanomaterials and Interfaces, Jg. 114, 2010, Nr. 12, S. 5480 – 5490
    DOI
  • Mao, D.; Wucher, Andreas; Winograd, Nicholas
    Molecular Depth Profiling with Cluster Secondary Ion Mass Spectrometry and Wedges
    In: Analytical Chemistry, Jg. 82, 2010, Nr. 1, S. 57 – 60
    DOI
  • Wucher, Andreas; Winograd, Nicholas
    Molecular sputter depth profiling using carbon cluster beams
    In: Analytical and Bioanalytical Chemistry, Jg. 396, 2010, Nr. 1, S. 105 – 114
    DOI
  • Duvenbeck, Andreas; Weidtmann, Boris; Wucher, Andreas
    Predicting Kinetic Electron Emission in Molecular Dynamics Simulations of Sputtering
    In: Journal of Physical Chemistry C: Nanomaterials and Interfaces, Jg. 114, 2010, Nr. 12, S. 5715 – 5720
    DOI
  • Willingham, D.; Winograd, Nicholas; Brenes, Daniel A.; Wucher, Andreas
    Strong-Field Photoionization of Sputtered Neutral Molecules for Molecular Depth Profiling
    In: Journal of Physical Chemistry C: Nanomaterials and Interfaces, Jg. 114, 2010, Nr. 12, S. 5391 – 5399
    DOI
  • Weidtmann, Boris; Duvenbeck, Andreas; Hanke, Stefanie; Wucher, Andreas
    Crystallographic effects in the kinetic excitation of metal surfaces: A computational study
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 267, 2009, Nr. 4, S. 598 – 600
    DOI
  • Peters, Thorsten; Haake, Christian; Hopster, Johannes; Sokolovsky, Valentin; Wucher, Andreas; Schleberger, Marika
    HICS : Highly charged ion collisions with surfaces
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 267, 2009, Nr. 4, S. 687 – 690
    DOI
  • Heuser, Christian; Marpe, Mario; Diesing, Detlef; Wucher, Andreas
    Kinetic excitation of solids induced by energetic particle bombardment: Influence of impact angle
    In: Nuclear instruments & methods in physics research, Jg. 4, 2009, Nr. 267, S. 601 – 604
    DOI
  • Meyer, Stefan; Wucher, Andreas
    The influence of projectile charge state on ionization probabilities of sputtered atoms
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 267, 2009, Nr. 4, S. 646 – 648
    DOI
  • Wucher, Andreas; Cheng, Juan; Zheng, L.; Winograd, Nicholas
    Three-dimensional depth profiling of molecular structures
    In: Analytical and Bioanalytical Chemistry, Jg. 393, 2009, Nr. 8, S. 1835 – 1842
    DOI
  • Wucher, Andreas
    A simple erosion dynamics model for molecular sputter depth profiling
    In: Surface and Interface Analysis, Jg. 40, 2008, Nr. 12, S. 1545 – 1551
    DOI
  • Wucher, Andreas
    Billard mit Atomen : Oberflächenphysik mit Ionenstrahlen
    In: Essener Unikate: Berichte aus Forschung und Lehre, 2008, Nr. 32: Naturwissenschaften - Physik: Energieumwandlungen an Oberflächen, S. 80 – 89
    DOI, Online Volltext (Open Access)
  • Zheng, Leiliang; Wucher, Andreas; Winograd, Nicholas
    Chemically alternating Langmuir-Blodgett thin films as a model for molecular depth profiling by mass spectrometry
    In: Journal of the American Society for Mass Spectrometry (JASMS), Jg. 19, 2008, Nr. 1, S. 96 – 102
    DOI
  • Zheng, Leiliang; Wucher, Andreas; Winograd, Nicholas
    Depth Resolution During C60+ Profiling of Multilayer Molecular Films
    In: Analytical Chemistry, Jg. 80, 2008, Nr. 19, S. 7363 – 7371
    DOI
  • Kozole, Joseph; Wucher, Andreas; Winograd, Nicholas
    Energy deposition during molecular depth profiling experiments with cluster ion beams
    In: Analytical Chemistry, Jg. 80, 2008, Nr. 14, S. 5293 – 5301
    DOI
  • Wucher, Andreas
    Formation of Atomic Secondary Ions in Sputtering
    In: Applied Surface Science, Jg. 255, 2008, Nr. 4, S. 1194 – 1200
    DOI
  • Zheng, Leiliang; Wucher, Andreas; Winograd, Nicholas
    Fundamental Studies of Molecular Depth Profiling and 3-D Imaging using Langmuir-Blodgett Films as a Model
    In: Applied Surface Science, Jg. 255, 2008, Nr. 4, S. 816 – 818
    DOI
  • Williams, Peter; Urbassek, Herbert M.; Hiraoka, Kenzo; Boxer, Steven; Wucher, Andreas; Matsuo, Jiro; Postawa, Zbigniew; Vickerman, John C.; Webb, Roger; Garrison, Barbara; Gillen, Greg; Krantzman, K.D.; Hagenhoff, Birgit; Delcorte, Arnaud; Bertrand, Patrick
    General Discussion
    In: Applied Surface Science, Jg. 255, 2008, Nr. 4, S. 1239 – 1240
    DOI
  • Peters, Thorsten; Haake, Christian; Diesing, Detlef; Kovacs, D.; Golczewski, A.; Kowarik, G.; Aumayr, F.; Wucher, Andreas; Schleberger, Marika
    Hot electrons induced by cold multiply charged ions
    In: New Journal of Physics (NJP), Jg. 10, 2008, S. 073019 – 073011
    DOI (Open Access)
  • Meyer, Stefan; Heuser, Christian; Diesing, Detlef; Wucher, Andreas
    Kinetic electronic excitation of solids induced by fast-particle bombardment
    In: Physical Review B: Condensed matter and materials physics, Jg. 78, 2008, Nr. 3, S. 035428
    DOI
  • Duvenbeck, Andreas; Weidtmann, Boris; Weingart, Oliver; Wucher, Andreas
    Modeling hot electron generation induced by electron promotion in atomic-collision cascades in metals
    In: Physical Review B: Condensed matter and materials physics, Jg. 77, 2008, Nr. 24, S. 245444 – 245441
    DOI
  • Wucher, Andreas; Cheng, Juan; Winograd, Nicholas
    Molecular Depth Profiling using a C60 Cluster Beam : the Role of Impact Energy
    In: Journal of Physical Chemistry C: Nanomaterials and Interfaces, Jg. 112, 2008, Nr. 42, S. 16550 – 16555
    DOI
  • Wucher, Andreas; Cheng, Juan; Winograd, Nicholas
    Molecular depth profiling of trehalose using a C60 cluster ion beam
    In: Applied Surface Science, Jg. 255, 2008, Nr. 4, S. 959 – 961
    DOI
  • Wucher, Andreas; Staudt, C.; Neukermans, S.; Janssens, E.; Vanhoutte, F.; Silverans, R.E.; Lievens, P.
    On the internal energy of sputtered clusters
    In: New Journal of Physics (NJP), Jg. 10, 2008, S. 103007
    DOI (Open Access)
  • Kovacs, D.; Peters, Thorsten; Haake, Christian; Wucher, Andreas; Schleberger, Marika; Golczewski, A.; Aumayr, F.; Diesing, Detlef
    Potential electron emission induced by multiply charged ions in thin films tunnel junctions
    In: Physical Review B: Condensed matter and materials physics, Jg. 77, 2008, Nr. 24, S. 245432
    DOI
  • Weidtmann, Boris; Duvenbeck, Andreas; Wucher, Andreas
    Predicting Secondary Ion Formation in Molecular Dynamics Simulations of Sputtering
    In: Applied Surface Science, Jg. 255, 2008, Nr. 4, S. 813 – 815
    DOI
  • Wucher, Andreas; Cheng, Juan; Zheng, Leilang; Willingham, David; Winograd, Nicholas
    Three-dimensional molecular imaging using mass spectrometry and atomic force microscopy
    In: Applied Surface Science, Jg. 255, 2008, Nr. 4, S. 984 – 986
    DOI
  • Duvenbeck, A.; Weingart, Oliver; Buß, Volker; Wucher, A.
    Electron promotion and electronic friction in atomic collision cascades
    In: New Journal of Physics (NJP), Jg. 9, 2007, 38
    DOI
  • Duvenbeck, Andreas; Weingart, Oliver; Buß, Volker; Wucher, Andreas
    On the role of electronic friction and electron promotion in kinetic excitation of solids
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 255, 2007, Nr. 1, S. 281 – 285
    DOI
  • Kovacs, Domocos A.; Winter, Jörg; Meyer, Stefan; Wucher, Andreas; Diesing, Detlef
    Photo and particle induced transport of excited carriers in thin film tunnel junctions
    In: Physical Review B: Condensed matter and materials physics, Jg. 76, 2007, Nr. 23, S. 235408
    DOI
  • Wucher, Andreas; Cheng, Juan; Winograd, Nicholas
    Protocols for Three-Dimensional Molecular Imaging Using Mass Spectrometry
    In: Analytical Chemistry, Jg. 79, 2007, Nr. 15, S. 5529 – 5539
    DOI
  • Duvenbeck, Andreas; Weingart, Oliver; Buß, Volker; Wucher, A.
    The role of electronic friction of low-energy recoils in atomic collision cascades
    In: Nuclear Instruments & Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Jg. 258, 2007, Nr. 1, S. 83 – 86
    DOI
  • Mazarov, P.; Samartsev, A.; Wucher, Andreas
    Determination of energy dependent ionization probabilities of sputtered particles
    In: Applied Surface Science, Jg. 252, 2006, Nr. 19, S. 6452 – 6455
    DOI
  • Samartsev, A.; Wucher, Andreas
    Kinetic energy distributions of neutral In and In2 sputtered by polyatomic ion bombardment
    In: Applied Surface Science, Jg. 252, 2006, Nr. 19, S. 6470 – 6473
    DOI
  • Lindenblatt, M.; Pehlke, E.; Duvenbeck, Andreas; Rethfeld, B.; Wucher, Andreas
    Kinetic excitation of solids : The concept of electronic friction
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 246, 2006, Nr. 2, S. 333 – 339
    DOI
  • Cheng, Juan; Wucher, Andreas; Winograd, Nicholas
    Molecular Depth Profiling with Cluster Ion Beams
    In: Journal of Physical Chemistry B: Condensed Matter, Materials, Surfaces, Interfaces & Biophysical Chemistry, Jg. 110, 2006, Nr. 16, S. 8329 – 8336
    DOI
  • Wucher, Andreas
    Molecular secondary ion formation under cluster bombardment : A fundamental review
    In: Applied Surface Science, Jg. 252, 2006, Nr. 19, S. 6482 – 6489
    DOI
  • Wucher, Andreas
    Sputtering : Experiment
    In: Matematisk-Fysiske Meddelelser, Jg. 52, 2006, Nr. 2, S. 405 – 432
  • Samartsev, A.; Wucher, Andreas
    Yields and ionization probabilities of sputtered Inn particles under atomic and polyatomic Aum -ion bombardment
    In: Applied Surface Science, Jg. 252, 2006, Nr. 19, S. 6474 – 6477
    DOI
  • Duvenbeck, Andreas; Sroubek, Z.; Wucher, Andreas
    Electronic excitation in atomic collision cascades
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 228, 2005, Nr. 1-4, S. 325 – 329
    DOI
  • Sun, Shixin; Szakal, Christopher; Winograd, Nicholas; Wucher, Andreas
    Energetic ion bombardment of Ag surfaces with C60+ and Ga+ projectiles
    In: Journal of the American Society for Mass Spectrometry (JASMS), Jg. 16, 2005, Nr. 10, S. 1677 – 1686
    DOI
  • Veryovkin, Igor V.; Calaway, Wallis F.; Emil Tripa, C.; Moore, Jerry F.; Wucher, Andreas; Pellin, Michael J.
    Laser post-ionization secondary neutral mass spectrometry for ultra-trace analysis of samples from space return missions
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 241, 2005, Nr. 1-4, S. 356 – 360
    DOI
  • Duvenbeck, Andreas; Wucher, Andreas
    Low-energy electronic excitation in atomic collision cascades: A nonlinear transport model
    In: Physical Review B: Condensed matter and materials physics, Jg. 72, 2005, Nr. 16, S. 165408
    DOI
  • Duvenbeck, Andreas; Lindenblatt, M.; Wucher, Andreas
    Self sputtering yields of silver under bombardment with polyatomic projectiles
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 228, 2005, Nr. 1-4, S. 170 – 175
    DOI
  • Samartsev, A.; Duvenbeck, Andreas; Wucher, Andreas
    Sputtering of Indium using Aum Projectiles: Transition from Linear Cascade to Spike Regime
    In: Physical Review B: Condensed matter and materials physics, Jg. 72, 2005, Nr. 11, S. 115417
    DOI
  • Meyer, S.; Diesing, Detlef; Wucher, Andreas
    The use of MIM tunnel junctions to investigate kinetic electron excitation in atomic collision cascades
    In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 230, 2005, Nr. 1-4, S. 608 – 612
    DOI
  • Szakal, Christopher; Sun, Shixin; Wucher, Andreas; Winograd, Nicholas
    C60 Molecular Depth Profiling of a Model Polymer
    In: Applied Surface Science, Jg. 231-232, 2004, S. 183 – 185
    DOI
  • Ghalab, S.; Wucher, Andreas
    Cluster formation at metal surfaces under bombardment with SF(sub m)(sup +) (m=1,..., 5) and Ar(sup +) projectiles
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 226, 2004, Nr. 3, S. 264 – 273
    DOI
  • Duvenbeck, Andreas; Sroubek, F.; Sroubek, Z.; Wucher, Andreas
    Computer simulation of low-energy electronic excitations in atomic collision cascades
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 225, 2004, Nr. 6, S. 464 – 477
    DOI
  • Sostarecz, A.G.; Sun, S.; Szakal, C.; Wucher, Andreas; Winograd, Nicholas
    Depth Profiling Studies of Multilayer Films with a C60+ Ion Source
    In: Applied Surface Science, Jg. 231-232, 2004, S. 179 – 182
    DOI
  • Sun, Shixin; Wucher, Andreas; Szakal, Christopher; Winograd, Nicholas
    Depth Profiling of Polycrystalline Multilayers using a Buckminsterfullerene Projectile
    In: Applied Physics Letters, Jg. 84, 2004, Nr. 25, S. 5177 – 5179
    DOI
  • Sostarecz, Audra G.; McQuaw, Carolyn M.; Wucher, Andreas; Winograd, Nicholas
    Depth profiling of Langmuir-Blodgett films with a buckminsterfullerene probe
    In: Analytical Chemistry, Jg. 76, 2004, Nr. 22, S. 6651 – 6658
  • Meyer, S.; Diesing, Detlef; Wucher, Andreas
    Kinetic electron excitation in atomic collision cascades
    In: Physical Review Letters, Jg. 93, 2004, Nr. 13, S. 137601 – 137601
    DOI
  • Wucher, Andreas; Sun, S.; Szakal, C.; Winograd, Nicholas
    Molecular Depth Profiling in Ice Matrices Using C60 Projectiles
    In: Applied Surface Science, Jg. 231-232, 2004, S. 68 – 71
    DOI
  • Wucher, Andreas; Sun, Shixin; Szakal, Christopher; Winograd, Nicholas
    Molecular Depth Profiling of Histamine in Ice using a Backmininster fullerence probe
    In: Analytical Chemistry, Jg. 76, 2004, Nr. 24, S. 7234 – 7242
    DOI
  • Xu, Jiyun; Szakal, Christopher; Martin, Scott E.; Peterson, B.R.; Wucher, Andreas; Winograd, Nicholas
    Molecule-specific imaging with mass spectrometry and a buckminsterfullerene probe : Application to characterizing solid-phase synthesized combinatorial libraries
    In: Journal of the American Chemical Society: JACS, Jg. 126, 2004, Nr. 12, S. 3902 – 3909
    DOI
  • Sun, S.; Szakal, C.; Smiley, E.J.; Postawa, Z.; Wucher, Andreas; Garrison, B.J.; Winograd, Nicholas
    Sputtering of Ag under C60+ and Ga+ Projectile Bombardment
    In: Applied Surface Science, Jg. 231-232, 2004, S. 64 – 67
    DOI
  • Samartsev, A.; Wucher, Andreas
    Sputtering of indium using polyatomic projectiles
    In: Applied Surface Science, Jg. 231-232, 2004, S. 191 – 195
    DOI
  • Sun, S.; Szakal, C.; Roll, Tino; Mazarov, P.; Wucher, Andreas; Winograd, Nicholas
    The Use of C60 Cluster Projectiles for Sputter Depth Profiling of Polycrystalline Metals
    In: Surface and Interface Analysis, Jg. 36, 2004, Nr. 10, S. 1367 – 1372
    DOI
  • Sroubek, Z.; Sroubek, F.; Wucher, Andreas; Yarmoff, J.A.
    Formation of excited Ag atoms in sputtering of silver
    In: Physical Review B: Condensed matter and materials physics, Jg. 68, 2003, Nr. 11, S. 115426 – 115421
    DOI
  • Meyer, Stefan; Staudt, C.; Wucher, Andreas
    Ionization probability of atoms and molecules sputtered from a cesium covered silver surface
    In: Applied Surface Science, Jg. 203-204, 2003, S. 48 – 51
    DOI
  • Berry, Jamal I.; Sun, Shixin; Dou, Yusheng; Wucher, Andreas; Winograd, Nichoals
    Laser desorption and imaging of proteins from ice via UV femtosecond laser pulses
    In: Analytical Chemistry, Jg. 75, 2003, Nr. 19, S. 5146 – 5151
    DOI
  • Heinrich, R.; Wucher, Andreas
    Projectile Size Effects on Cluster Formation in Sputtering
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 207, 2003, Nr. 2, S. 136 – 144
    DOI
  • Wucher, Andreas
    Formation of clusters in Sputtering
    In: Izvestija Rossijskoj Akademii Nauk, Jg. 66, 2002, Nr. 4, S. 499 – 508
  • Ghalab, S.; Staudt, C.; Maksimov, S.E.; Mazarov, P.; Tugushev, V.I.; Dzhemilev, N.Kh; Wucher, Andreas
    Formation of sputtered silver clusters under bombardment with SF5+ ions
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 197, 2002, Nr. 1-2, S. 43 – 48
    DOI
  • Staudt, C.; Wucher, Andreas
    Generation of Large Indium Clusters by Sputtering
    In: Physical Review B: Condensed matter and materials physics, Jg. 66, 2002, Nr. 7, S. 075419 – 075411
    DOI
  • Heinrich, R.; Wucher, Andreas
    Self Sputtering of Silver using Polyatomic Projectiles
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 193, 2002, S. 781 – 786
    DOI
  • Staudt, C.; Wucher, Andreas; Bastiaansen, J.; Philipsen, V.; Vandeweert, E.; Lievens, P.; Silverans, R.E.; Sroubek, Z.
    Sputtering of Ag atoms into metastable excited states
    In: Physical Review B: Condensed matter and materials physics, Jg. 66, 2002, Nr. 8, S. 085415 – 085411
    DOI
  • Staudt, C.; Wucher, Andreas; Neukermans, S.; Janssens, E.; Vanhoutte, F.; Vandeweert, E.; Silverans, R.E.; Lievens, P.
    Internal Excitation of Sputtered Neutral Indium Clusters
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 193, 2001, S. 787 – 793
    DOI
  • Lindenblatt, M.; Heinrich, R.; Wucher, Andreas; Garrison, B.J.
    Self-sputtering of silver by mono- and polyatomic projectiles : A molecular dynamics investigation
    In: The Journal of Chemical Physics (JCP), Jg. 115, 2001, Nr. 18, S. 8643 – 8654
    DOI
  • Heinrich, R.; Wucher, Andreas
    Cluster Formation under Bombardment with Polyatomic Projectiles
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 164-165, 2000, S. 720 – 726
    DOI
  • Staudt, C.; Heinrich, R.; Wucher, Andreas
    Formation of Large Clusters during Sputtering of Silver
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 164-165, 2000, S. 677 – 686
    DOI
  • Staudt, C.; Heinrich, R.; Mazarov, P.; Wucher, Andreas; Tugushev, V.I.; Dzhemilev, N.Kh
    On the Temperature Dependence of Sputtered Cluster Yields
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 164-165, 2000, S. 715 – 719
    DOI
  • Wucher, Andreas; Dzhemilev, N.Kh; Veryovkin, I.V.; Verkhoturov, S.V.
    Fragmentation lifetimes and the internal energy of sputtered clusters
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 149, 1999, Nr. 3, S. 285 – 293
    DOI
  • Hansen, C.S.; Calaway, W.F.; Pellin, M.J.; King, B.V.; Wucher, Andreas
    Effects of oxygen dosing on Ca cluster yields and energy distributions
    In: Surface Science, Jg. 432, 1998, Nr. 3, S. 199 – 210
    DOI
  • Colla, T.J.; Urbassek, H.M.; Wucher, Andreas; Staudt, C.; Heinrich, R.; Garrison, B.J.; Dandachi, C.; Betz, G.
    Experiment and simulation of cluster emission from 5 keV Ar to Cu
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 143, 1998, Nr. 3, S. 284 – 297
    DOI
  • Wucher, Andreas; Bekkerman, A.D.; Dzhemilev, N.Kh; Verkhoturov, S.V.; Veryovkin, I.V.
    Internal energy of sputtered clusters : the influence of bombarding conditions
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 140, 1998, Nr. 3-4, S. 311 – 318
    DOI
  • Garrison, Barbara J.; Winograd, Nicholas; Chatterjee, Reema; Postawa, Zbigniew; Wucher, Andreas; Vandeweert, Erno; Lievens, Peter; Philipsen, Vicky; Silverans, Roger E.
    Sputtering of Atoms in Fine Structure States : A Probe of Excitation and De-excitation Events
    In: Rapid Communications in Mass Spectrometry, Jg. 12, 1998, Nr. 18, S. 1266 – 1272
    DOI
  • Wucher, Andreas; Heinrich, Ralf; Braun, Robert M.; Willey, Kenneth F.; Winograd, Nicholas
    Vacuum ultraviolet single photon versus femtosecond multiphoton ionization of sputtered germanium clusters
    In: Rapid Communications in Mass Spectrometry, Jg. 12, 1998, Nr. 18, S. 1241 – 1245
    DOI
  • Heinrich, R.; Wucher, Andreas
    Yields and energy distributions of sputtered semiconductor clusters
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 140, 1998, Nr. 1-2, S. 27 – 38
    DOI
  • Berthold, W.; Wucher, Andreas
    Energy- and angle-dependent excitation probability of sputtered metastable silver atoms
    In: Physical Review B: Condensed matter and materials physics, Jg. 56, 1997, Nr. 7, S. 4251 – 4260
    DOI
  • Wucher, Andreas; Sroubek, Z.
    Formation of metastable excited states during sputtering of transition metals
    In: Physical Review B: Condensed matter and materials physics, Jg. 55, 1997, Nr. 2, S. 780 – 786
    DOI
  • Krimke, Ralf; Urbassek, Herbert M.; Wucher, Andreas
    High-frequency electron-gas secondary neutral mass spectrometry: evaluation of transient effects
    In: Journal of Physics D: Applied Physics, Jg. 30, 1997, Nr. 11, S. 1676 – 1682
    DOI
  • Wucher, Andreas; Garrison, B.J.
    Cluster formation in sputtering: a molecular dynamics study using the MD/MC-corrected effective medium potential
    In: The Journal of Chemical Physics (JCP), Jg. 105, 1996, Nr. 14, S. 5999 – 6007
    DOI
  • Berthold, W.; Wucher, Andreas
    Electronic excitation during sputtering of silver atoms
    In: Physical Review Letters, Jg. 76, 1996, Nr. 12, S. 2181 – 2184
    DOI
  • Berthold, W.; Wucher, Andreas
    Population of sputtered metastable silver atoms
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 115, 1996, Nr. 1-4, S. 411 – 414
    DOI
  • Wucher, Andreas; Wahl, M.
    The formation of clusters during ion induced sputtering of metals
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 115, 1996, Nr. 1-4, S. 581 – 589
    DOI
  • Berthold, W.; Wucher, Andreas
    Laterally resolved chemical analysis of solid surfaces by laser-SNMS
    In: Surface and Interface Analysis, Jg. 23, 1995, Nr. 6, S. 393 – 398
    DOI
  • Wucher, Andreas
    Oberflächenanalytik mit dem Laser
    In: Colloquia Academica, 1995, S. 55 – 91
  • Wucher, Andreas; Franzreb, K.; Mathieu, H.J.; Landolt, D.
    On the role of molecular photofragmentation during depth profiling of tantalum oxide layers by laser SNMS
    In: Surface and Interface Analysis, Jg. 23, 1995, Nr. 12, S. 844 – 848
    DOI
  • Wahl, M.; Koch, D.; Berthold, W.; Wucher, Andreas
    Relative elemental sensitivity factors in non-resonant laser-SNMS
    In: Fresenius' Journal of Analytical Chemistry, Jg. 353, 1995, Nr. 3-4, S. 354 – 359
    DOI
  • Wucher, Andreas; Berthold, W.; Oechsner, H.; Franzreb, K.
    Detection of sputtered metastable atoms by autoionization
    In: Physical Review A: Atomic, Molecular, and Optical Physics, Jg. 49, 1994, Nr. 3, S. 2188 – 2190
    DOI
  • Koch, D.; Wahl, M.; Wucher, Andreas
    Electron impact and single photon ionization cross sections of neutral silver clusters
    In: Zeitschrift für Physik D, Jg. 32, 1994, Nr. 1, S. 137 – 144
    DOI
  • Wucher, Andreas
    Internal energy of sputtered metal clusters
    In: Physical Review B: Condensed matter and materials physics, Jg. 49, 1994, Nr. 3, S. 2012 – 2020
    DOI
  • Wahl, M.; Wucher, Andreas
    VUV photoionization of sputtered neutral silver clusters
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 94, 1994, Nr. 1-2, S. 36 – 46
    DOI
  • Wucher, Andreas; Ma, Z.; Calaway, W.F.; Pellin, M.J.
    Yields of sputtered metal clusters : the influence of surface structure
    In: Surface Science, Jg. 304, 1994, Nr. 1-2, S. L439 – L444
    DOI
  • Franzreb, K.; Wucher, Andreas; Oechsner, H.
    Characterization of the fluxes of neutral and positively charged clusters (Agn and Agn+; n≤4) produced by argon ion sputtering of silver
    In: Zeitschrift für Physik D, Jg. 26, 1993, Nr. Supplement 1, S. 101 – 103
    DOI
  • Wucher, Andreas
    Microanalysis of solid surfaces by Secondary Neutral Mass Spectrometry
    In: Fresenius' Journal of Analytical Chemistry, Jg. 346, 1993, S. 3 – 10
    DOI
  • Wucher, Andreas; Garrison, B.J.
    Ro-vibrational population of sputtered metal dimers: the influence of unimolecular decomposition
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 82, 1993, Nr. 2, S. 352 – 355
    DOI
  • Wucher, Andreas; Wahl, M.; Oechsner, H.
    Sputtered neutral silver clusters up to Ag18
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 82, 1993, Nr. 2, S. 337 – 346
    DOI
  • Wucher, Andreas
    The mass distribution of sputtered metal clusters : II. Model calculation
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 83, 1993, Nr. 1-2, S. 79 – 86
    DOI
  • Wucher, Andreas; Wahl, M.; Oechsner, H.
    The mass distribution of sputtered metal clusters : I. Experiment
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 83, 1993, Nr. 1-2, S. 73 – 78
    DOI
  • Wucher, Andreas; Watgen, M.; Mößner, C.; Oechsner, H.; Garrison, Barbara
    Energy dependent studies of anisotropic atomic sputtering of Ni (111)
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 67, 1992, Nr. 1-4, S. 531 – 535
    DOI
  • Franzreb, K.; Wucher, Andreas; Oechsner, H.
    Formation of neutral and positively charged clusters (Agn and Agn+; n ⩽ 4) during sputtering of silver
    In: Surface Science Letters, Jg. 279, 1992, Nr. 3, S. L225 – L230
    DOI
  • Wucher, Andreas; Garrison, B.J.
    Internal and translational energy of sputtered silver dimers: a molecular dynamics study
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 67, 1992, Nr. 1-4, S. 518 – 522
    DOI
  • Wucher, Andreas; Garrison, B.J.
    Sputtering of silver dimers : a molecular dynamics calculation using a many-body embedded-atom potential
    In: Surface Science, Jg. 260, 1992, Nr. 1-3, S. 257 – 266
    DOI
  • Wucher, Andreas; Garrison, B.J.
    Unimolecular decomposition in the sputtering of metal clusters
    In: Physical Review B: Condensed matter and materials physics, Jg. 46, 1992, Nr. 8, S. 4855 – 4864
    DOI
  • Franzreb, K.; Wucher, Andreas; Oechsner, H.
    Absolute cross sections for electron impact ionization of Ag2
    In: Zeitschrift für Physik D, Jg. 19, 1991, Nr. 1-4, S. 77 – 79
    DOI
  • Franzreb, K.; Wucher, Andreas; Oechsner, H.
    Formation of secondary cluster ions during sputtering of silver and copper
    In: Physical Review B: Condensed matter and materials physics, Jg. 43, 1991, Nr. 18, S. 14396 – 14399
    DOI
  • Franzreb, K.; Wucher, Andreas; Oechsner, H.
    Saturation and fragmentation in non resonant laser postionization of sputtered atoms and molecules
    In: Fresenius' Journal of Analytical Chemistry, Jg. 341, 1991, Nr. 1, S. 7 – 11
    DOI
  • Franzreb, K.; Wucher, Andreas; Oechsner, H.
    Electron impact ionization of small silver and copper clusters
    In: Zeitschrift für Physik D, Jg. 17, 1990, Nr. 1, S. 51 – 56
    DOI
  • Wucher, Andreas; Oechsner, H.; Novak, F.
    Absolute depth profiling of thin film systems by low energy secondary neutral mass spectrometry
    In: Thin Solid Films, Jg. 174, 1989, Nr. Part 1, S. 133 – 137
    DOI
  • Wucher, Andreas; Oechsner, H.
    Depth Scale Calibration during Sputter Removal of Multilayer Systems by SNMS
    In: Fresenius' Zeitschrift für analytische Chemie, Jg. 333, 1989, Nr. 4, S. 470 – 473
    DOI
  • Wucher, Andreas; Reuter, W.
    Angular distribution of particles sputtered from metals and alloys
    In: Journal of Vacuum Science & Technology, Jg. 6, 1988, Nr. 4, S. 2316 – 2318
    DOI
  • Wucher, Andreas
    Calculation of postionization probabilities as a function of plasma parameters in electron gas secondary neutral mass spectrometry
    In: Journal of Vacuum Science & Technology, Jg. 6, 1988, Nr. 4, S. 2287 – 2292
    DOI
  • Wucher, Andreas; Oechsner, H.
    Emission energy dependence of ionization probabilities in secondary ion emission from oxygen covered Ta, Nb and Cu surfaces
    In: Surface Science, Jg. 199, 1988, Nr. 3, S. 567 – 578
    DOI
  • Wucher, Andreas
    Plasma studies on the Leybold-Heraeus INA3 secondary neutral mass spectrometry system
    In: Journal of Vacuum Science & Technology, Jg. 6, 1988, Nr. 4, S. 2293 – 2298
    DOI
  • Wucher, Andreas; Novak, F.; Reuter, W.
    Relative elemental sensitivity factors in secondary neutral mass spectrometry
    In: Journal of Vacuum Science & Technology, Jg. 6, 1988, Nr. 4, S. 2265 – 2270
    DOI
  • Wucher, Andreas; Oechsner, H.
    Energy distributions of metal atoms and monoxide molecules sputtered from oxidized Ta and Nb
    In: Nuclear Instruments & Methods in Physics Research B, Jg. 18, 1987, Nr. 4-6, S. 458 – 463
    DOI
  • Oechsner, H.; Wucher, Andreas
    Quantitative analysis of thin oxide and nitride layers on tantalum by sputtered neutral mass spectrometry
    In: Thin Solid Films, Jg. 90, 1982, Nr. 3, S. 327 – 328
    DOI
  • Oechsner, H.; Wucher, Andreas
    Quantitative analysis of thin oxide layers on tantalum by sputtered neutral mass spectrometry (SNMS)
    In: Applied Surface Science, Jg. 10, 1982, Nr. 3, S. 342 – 348

    • Beiträge in Sammelwerken und Tagungsbänden

  • Theyßen, Heike; Wucher, Andreas
    Interaktive Vorlesungsdemonstrationsexperimente in der Physik
    In: Flexibles Lernen mit digitalen Medien ermöglichen: Strategische Verankerung und Erprobungsfelder guter Praxis an der Universität Duisburg-Essen / van Ackeren, Isabell; Kerres, Michael; Heinrich, Sandrina (Hrsg.). Münster: Waxmann, 2018, S. 293 – 302
    DOI (Open Access)
  • Wucher, Andreas
    Laser postionization - fundamentals
    In: ToF-SIMS: surface analysis by mass spectrometry / Vickerman, John C. (Hrsg.). Manchester: SurfaceSpectra [u.a.], 2013, S. 217 – 246
  • Mahoney, Christine M.; Wucher, Andreas
    Molecular Depth Profiling with Cluster Ion Beams
    In: Cluster Secondary Ion Mass Spectrometry: Principles and Applications / Mahoney, Christine M. (Hrsg.). New York, NY: John Wiley & Sons, Inc., 2013, S. 117 – 205
    DOI
  • Shard, Alex; Gilmore, Ian; Wucher, Andreas
    Molecular depth profiling
    In: ToF-SIMS: surface analysis by mass spectrometry / Vickerman, John C. (Hrsg.). Manchester: SurfaceSpectra [u.a.], 2013, S. 311 – 334
    Online Volltext
  • Wucher, Andreas; Mahoney, Christine M.; Fisher, Gregory L.
    Three-Dimensional Imaging with Cluster Ion Beams
    In: Cluster Secondary Ion Mass Spectrometry: Principles and Applications / Mahoney, Christine M. (Hrsg.). New York, NY: John Wiley & Sons, Inc., 2013, S. 207 – 246
    DOI
  • Hopster, Johannes; Diesing, Detlef; Wucher, Andreas; Schleberger, Marika
    Comparison of ion beam and electron beam induced transport of hot charge carriers in metal-insulator-metal junctions
    In: Ion beams: new applications from mesoscale to nanoscale / 2011 MRS Spring Meeting, April 25 - 29, San Francisco, California, USA. New York: Cambridge Univ. Press, 2011
    DOI
  • Wucher, Andreas
    Laser Post-Ionisation : Fundamentals
    In: ToF-SIMS: surface analysis by mass spectrometry / Vickerman, John C.; Briggs, D. (Hrsg.). Manchester: SurfaceSpectra [u.a.], 2001, S. 347 – 373
  • Wucher, Andreas; Heinrich, Ralf; Staudt, C.
    A Method for Quantitative Determination of Secondary Ion Formation Probabilities
    In: Secondary ion mass spectrometry, SIMS XII: proceedings of the Twelfth International Conference on Secondary Ion Mass Spectrometry (SIMS XII) / Twelfth International Conference on Secondary Ion Mass Spectrometry (SIMS XII), Université Catholique de Louvain, Brussels, Belgium, September 5 - 10, 1999 / Benninghoven, Alfred; Bertrand, P.; Migeon, H.N.; Werner, H.W. (Hrsg.). Amsterdam: Elsevier Science, 2000, S. 143 – 146
  • Dzhemilev, N.Kh; Wucher, Andreas
    Formation of Sputtered Clusters: A Multistep Model
    In: Secondary Ion Mass Spectrometry SIMS XII: Proceedings of the Twelfth International Conference on Secondary Ion Mass Spectrometry (SIMS XII) / Twelfth International Conference on Secondary Ion Mass Spectrometry (SIMS XII), Université Catholique de Louvain, Brussels, Belgium, September 5-10, 1999 / Benninghoven, Alfred; Betrand, P. (Hrsg.). Amsterdam: Elesevier, 2000, S. 157 – 160
  • Heinrich, R.; Staudt, C.; Wahl, M.; Wucher, Andreas
    Ionization Probability of Sputtered Clusters
    In: Secondary Ion Mass Spectrometry (SIMS XII): Proceedings of the Twelfth International Conference on Secondary Ion Mass Spectrometry (SIMS XII) / Twelfth International Conference on Secondary Ion Mass Spectrometry (SIMS XII), Université Catholique de Louvain, Brussels, Belgium, September 5 - 10, 1999 / Benninghoven, Alfred (Hrsg.). Amsterdam: Elsevier, 2000, S. 111 – 114
  • Gnaser, H.; Oechsner, H.; Wucher, Andreas
    Microanalysis with Secondary Ion and Secondary Neutral Mass Spectrometry
    In: Surface Analysis of Glasses and Glass Ceramics / Bach, Hans; Krause, D. (Hrsg.). Berlin: Springer, Berlin, 2000
  • Staudt, C.; Heinrich, R.; Mazarov, P.; Wucher, Andreas; Tugushev, V.I.; Dzhemilev, N.Kh
    Temperature Dependence of Sputtered Cluster Yields
    In: Secondary ion mass spectrometry, SIMS XII :: proceedings of the Twelfth International Conference on Secondary Ion Mass Spectrometry (SIMS XII) / Twelfth International Conference on Secondary Ion Mass Spectrometry (SIMS XII), Université Catholique de Louvain, Brussels, Belgium, September 5 - 10, 1999 / Benninghoven, Alfred (Hrsg.). Amsterdam: Elesevier, 2000, S. 169 – 172
  • Staudt, C.; Wucher, Andreas
    Detection of Large Neutral Clusters in Sputtering
    In: Proceedings of the International Conference on Resonance Ionization Spectroscopy / International Conference on Resonance Ionization Spectroscopy RIS-98, UMIST, 1998 / Vickermann, J. (Hrsg.). Woodbury: AIP Press, 1998, S. 217 – 222
  • Heinrich, R.; Wucher, Andreas
    Formation of Sputtered Semiconductor Clusters
    In: Secondary ion mass spectrometry : SIMS 12: Proceedings of the Twelfth International Conference on Secondary Ion Mass Spectrometry (SIMS XII) / Twelfth International Conference on Secondary Ion Mass Spectrometry (SIMS XII), Université Catholique de Louvain, Brussels, Belgium, September 5 - 10, 1999 / Benninghoven, Alfred (Hrsg.). Chichester: Wiley & Sons, 1998, S. 949 – 952
  • Wulff, M.; Wucher, Andreas
    Quantitation of Single Photon Ionization Laser SNMS
    In: Secondary ion mass spectrometry: proceedings of the Eleventh International Conference on Secondary Ion Mass Spectrometry, SIMS XI / Eleventh International Conference on Secondary Ion Mass Spectrometry, SIMS XI, Orlando, Florida, September 7 - 12th, 1997 / Gillen, Greg (Hrsg.). Chichester [u.a.]: Wiley, 1998, S. 665 – 668
  • Wucher, Andreas
    Surface and thin film analysis with electron and mass spectrometric techniques
    In: Trends and new applications of thin films: proceedings of the 6th International Symposium on Trends and New Applications of Thin Films / 6th International Symposium on Trends and New Applications of Thin Films (TATF '98), Regensburg, Germany, March 1998; Hoffmann, Horst. Uetikon-Zuerich [u.a.]: Trans Tech Publ., Jg. 287-288, 1998, S. 61 – 84
  • Wucher, Andreas; Wahl, M.
    Cluster Emission in Sputtering
    In: Secondary ion mass spectrometry: proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X) / Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X), University of Muenster, Muenster, Germany, October 1 - 6th, 1995 / Benninghoven, Alfred; Hagenhoff, B.; Werner, H.W. (Hrsg.). Chichester: Wiley, 1997, S. 65 – 72
  • Wucher, Andreas; Berthold, W.
    Metastable excitation of sputtered silver atoms
    In: Resonance ionization spectroscopy 1996 / eighth international symposium, State College, PA, June 30 - July 5, 1996 / Winograd, Nicholas; Parks, J.E. (Hrsg.). Woodbury, NY: AIP Press, 1997, S. 145 – 150
  • Wucher, Andreas; Berthold, W.; Wahl, M.
    Depth Profiling of Tantalum Oxide Layers by Laser-SNMS
    In: ECASIA 95: 6th European Conference on Applications of Surface and Interface Analysis / 6th European Conference on Applications of Surface and Interface Analysis, Congress Centre, Montreux - Switzerland, October 9 - 13, 1995 / Mathieu, Hans Jörg (Hrsg.). Chichester [u.a.]: Wiley, 1996, S. 260 – 264
  • Wucher, Andreas
    Rotational and vibrational excitation of sputtered silver dimers
    In: Proceedings of the International Conference on Resonance Ionization Spectroscopy / International Conference on Resonance Ionization Spectroscopy RIS-94, Bernkastel-Kues, Germany 1994 / Kluge, H.J.; Parks, J.E.; Wendt, K. (Hrsg.): AIP Press, 1995, S. 437 – 440
  • Wucher, Andreas; Berthold, W.; Oechsner, H.
    The charge state of sputtered metal clusters
    In: Secondary ion mass spectrometry: proceedings of the ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX) / Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX), Yokohama, Japan, 7 - 12 November, 1993 / Benninghoven, Alfred; Nihei, Y.; Shimizu, R.; Werner, H.W. (Hrsg.). Chichester [u.a.]: Wiley & Sons, 1994, S. 100 – 103
  • Wucher, Andreas; Oechsner, H.
    Calibration of SNMS Depth Profile Analysis
    In: Plasma Surface Engineering: Vol. 2 / First International Conference on Plasma Surface Engineering 1988, Garmisch-Partenkirchen / Broszeit, Erhard; Muenz, W.D.; Oechsner, H.; Rie, K.T.; Wolf, G.K. (Hrsg.). Oberursel: DGM-Informationsges., 1989, S. 737 – 738
  • Oechsner, H.; Bachmann, G.; Müller, K.H.; Wucher, Andreas
    Charakterisierung technischer Oberflächen für Anwendungen in der mittelständischen Industrie
    In: Dünnschichttechnologien: Tagungsband zum 1. Statusseminar 25. - 27. Mai 1988, Köln ; Berichte zu F & E-Projekten aus den Förderbereichen "Physikalische Technologien" und "Lasertechnik" des Bundesministers für Forschung und Technologie / Statusseminar Dünnschichttechnologien ; 1 (Köln) : 1988.05.25-27. Düsseldorf: VDI-Technologiezentrum, 1988, S. 4
  • Wucher, Andreas; Oechsner, H.
    Energy dependent Ionization Probabilities for Atomic Secondary Ions
    In: Secondary ion mass spectrometry : SIMS VI: proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry / Sixth International Conference on Secondary Ion Mass Spectrometry, Palais des Congrès, Versailles, Paris, France, September 13 - 18th, 1987 / Benninghoven, Alfred; Huber, A.; Werner, H.W. (Hrsg.). Chichester [u.a.]: Wiley, 1988, S. 143 – 146
  • Kopnarski, M.; Wucher, Andreas; Oechsner, H.
    Quantitation of Molecular SNMS Signals
    In: Secondary ion mass spectrometry : SIMS VI: proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry / Sixth International Conference on Secondary Ion Mass Spectrometry, Palais des Congrès, Versailles, Paris, France, September 13 - 18th, 1987 / Benninghoven, Alfred; Huber, A.M.; Werner, H.W. (Hrsg.). Chichester [u.a.]: Wiley & Sons, Chichester, 1988, S. 849 – 852
  • Wucher, Andreas; Oechsner, H.
    Absolute Ionization Probabilities in Secondary Ion Emission from Clean Metal Surfaces
    In: Microbeam analysis 1986: proceedings of the 21st annual conference of the Microbeam Analysis Society / 21st annual conference of the Microbeam Analysis Society ; Albuquerque, New Mexico, 11 - 15 August, 1986 / Romig, A.D.; Chambers, W.F. (Hrsg.). San Francisco, Calif.: San Francisco Press, 1986