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Dr. rer.nat. Martin Kammler

Fakultät Physik

Raum
MF 265
Telefon
+49 203 379 1461
E-Mail
martin.kammler@uni-due.de

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Die folgenden Publikationen sind in der Online-Universitätsbibliographie der Universität Duisburg-Essen verzeichnet. Weitere Informationen finden Sie gegebenenfalls auch auf den persönlichen Webseiten der Person.

    Artikel in Zeitschriften

  • Chee, See Wee; Kammler, Martin; Graham, Jeremy; Gignac, Lynne; Reuter, Mark C.; Hull, Robert; Ross, Frances M.
    Directed Self-Assembly of Ge Quantum Dots Using Focused Si2+ Ion Beam Patterning.
    In: Scientific Reports, Jg. 8, 2018, S. 9361
    DOI (Open Access)
  • Streubühr, Carla; Kalus, Annika; Zhou, Ping; Ligges, Manuel; Hanisch-Blicharski, Anja; Kammler, Martin; Bovensiepen, Uwe; Horn-von Hoegen, Michael; von der Linde, Dietrich
    Comparing ultrafast surface and bulk heating using time-resolved electron diffraction
    In: Applied Physics Letters (APL), Jg. 104, 2014, S. 161611
    DOI
  • Frigge, Tim; Wall, Simone; Krenzer, Boris; Wippermann, Stefan; Sanna, Simone; Klasing, Friedrich; Hanisch-Blicharski, Anja; Kammler, Martin; Schmidt, Wolf G.; Horn-von Hoegen, Michael
    Frigge et al. Reply : Comment on “Atomistic Picture of Charge Density Wave Formation at Surfaces”
    In: Physical Review Letters, Jg. 111, 2013, Nr. 14, S. 149601 – 149602
    DOI
  • Chee, See Wee; Kammler, Martin; Balasubramanian, Prabhu; Reuter, Mark C.; Hull, Robert; Ross, Frances M.
    Microstructural changes in silicon induced by patterning with focused ion beams of Ga, Si and Au
    In: Ultramicroscopy, Jg. 127, 2013, S. 126 – 131
    DOI
  • Hanisch-Blicharski, Anja; Janzen, Andreas; Krenzer, Boris; Wallutis, Simone; Klasing, Friedrich; Kalus, Annika; Frigge, Tim; Kammler, Martin; Horn-von Hoegen, Michael
    Ultra-fast electron diffraction at surfaces: From nanoscale heat transport to driven phase transitions
    In: Ultramicroscopy, Jg. 127, 2013, S. 2 – 8
    DOI
  • Wall, Simone; Krenzer, Boris; Wippermann, Stefan; Sanna, Simone; Klasing, Friedrich; Hanisch-Blicharski, Anja; Kammler, Martin; Schmidt, Wolf G.; Horn-von Hoegen, Michael
    Atomistic picture of charge density wave formation at surfaces
    In: Physical Review Letters, Jg. 109, 2012, Nr. 18, 186101
    DOI
  • Payer, T.; Klein, Carsten; Acet, Mehmet; Ney, V.; Kammler, Martin; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    High-quality epitaxial Bi(111) films on Si(111) by isochronal annealing
    In: Thin Solid Films, Jg. 520, 2012, Nr. 23, S. 6905 – 6908
    DOI
  • Klein, Claudius; Nabbefeld, Tobias; Hattab, Hichem; Meyer, D.; Jnawali, Giriraj; Kammler, Martin; Meyer zu Heringdorf, Frank; Golla-Franz, A.; Müller, B.H.; Schmidt, T.H.; Henzler, M.; Horn-von Hoegen, Michael
    Lost in reciprocal space? : Determination of scattering condition in spot profile analysis low energy electron diffraction
    In: Review of Scientific Instruments, Jg. 82, 2011, Nr. 3, S. 35111
    DOI
  • Lu, Wei; Nicoul, Matthieu; Shymanovich, Uladzimir; Tarsevitch, Alexander; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    Extreme phonon softening in laser-excited Bismuth - towards an inverse Peierls-transition
    In: MRS (Materials Research Society) Online Proceedings Library Archive, Jg. 1230E, 2010, S. 3 – 5
    Online Volltext
  • Krenzer, Boris; Hanisch-Blicharski, Anja; Schneider, P.; Payer, Thomas; Möllenbeck, Simone; Osmani, Orkhan; Kammler, Martin; Meyer, Ralf; Horn-von Hoegen, Michael
    Phonon confinement effects in ultrathin epitaxial bismuth films on silicon studied by time-resolved electron diffraction
    In: Physical Review B: Condensed matter and materials physics, Jg. 80, 2009, Nr. 2, 024307
    DOI
  • Hanisch-Blicharski, Anja; Krenzer, Boris; Möllenbeck, Simone; Ligges, Manuel; Zhou, Ping; Kammler, Martin; Horn-von Hoegen, Michael
    Transient Cooling of Ultrathin Epitaxial Bi(111)-Films on Si(111) upon Femtosecond Laser Excitation Studied by Ultrafast Reflection High Energy Electron Diffraction"
    In: MRS Proceedings, Jg. 1172, 2009, S. 4 – 8
    Online Volltext
  • Fritz, D.M.; Reis, D.A.; Adams, B.; Akre, R.A.; Arthur, J.; Blome, C.; Bucksbaum, P.H.; Cavalieri, A.L.; Engemann, S.; Fahy, S.; Falcone, R.W.; Fuoss, P.H.; Gaffney, K.J; George, M.J.; Hajdu, J.; Hertlein, M.P.; Hillyard, P.B.; Horn-von Hoegen, Michael; Kammler, Martin; Kaspar, J.; Kienberger, R.; Krejcik, P.; Lee, S.H.; Lindenberg, A.M.; McFarland, B.; Meyer, D.; Montagne, T.; Murray, E.D.; Nelson, A.J.; Nicoul, Matthieu; Pahl, R.; Rudati, J.; Schlarb, H.; Siddons, D.P.; Sokolowski-Tinten, Klaus; Tschentscher, Th.; von der Linde, Dietrich; Hastings, J.B.
    Ultrafast bond softening in Bismuth: Mapping a solid`s interatomic potential with X-rays
    In: Science, Jg. 315, 2007, Nr. 5812, S. 633 – 636
    Online Volltext
  • Schmidt, Th.; Kröger, R.; Flege, J.I.; Clausen, T.; Falta, J.; Janzen, A.; Zahl, P.; Kury, Peter; Kammler, Martin; Horn-von Hoegen, Michael
    Less strain energy despite fewer misfit dislocations: The impact of ordering
    In: Physical Review Letters, Jg. 96, 2006, Nr. 6, 66101 (4p)
    Online Volltext
  • Kammler, Martin; Chidambarrao, D.; Schwarz, K.W.; Black, C.T.; Ross, Frances M.
    Controlled nucleation of dislocations by a spatially localized stress field,
    In: Applied Physics Letters, Jg. 87, 2005, Nr. 13, 133116 (3p)
    Online Volltext
  • Kammler, Martin; Horn-von Hoegen, Michael
    Low energy electron diffraction of epitaxial growth of bismuth on Si(111)
    In: Surface Science, Jg. 576, 2005, Nr. 1-3, S. 56 – 60
    DOI
  • AlFalou, A.A.; Kammler, Martin; Horn-von Hoegen, Michael
    Strain state analysis of hetero-epitaxial systems
    In: EPL (Europhysics Letters), Jg. 69, 2005, Nr. 4, S. 570
    Online Volltext
  • Schmidt, Th.; Kröger, R.; Clausen, T.; Falta, J.; Janzen, A.; Kammler, Martin; Kury, Peter; Zahl, P.; Horn-von Hoegen, Michael
    Surfactant-mediated epitaxy of Ge on Si(111): beyond the surface
    In: Applied Physics Letters, Jg. 86, 2005, Nr. 11, 111910 (3p)
    Online Volltext
  • Sokolowski-Tinten, Klaus; Blome, C.; Blums, J.; Shymanovich, Uladzimir; Nicoul, Matthieu; Cavalleri, Andrea; Tarasevitch, Alexander; Horn-von Hoegen, Michael; Kammler, Martin; von der Linde, Dietrich
    Ultrafast X-Ray Diffraction
    In: Ultrafast Phenomena XIV, Jg. 79, 2005, S. 170 – 174
    Online Volltext
  • Kammler, Martin; Horn-von Hoegen, Michael
    Transition in growth mode by competing strain relaxation mechanisms: surfactant mediated epitaxy of SiGe alloys on Si
    In: Applied Physics Letters, Jg. 85, 2004, Nr. 15, 3056 (3p)
    Online Volltext
  • Menzel, A.; Conrad, E.H.; Tringides, M.C.; Kammler, Martin; Horn-von Hoegen, Michael
    Finite collection time effects in autocovariance function measurements
    In: Journal of Applied Physics, Jg. 93, 2003, Nr. 4, S. 2229 – 2235
    Online Volltext
  • Hild, R.; Seifert, C.; Kammler, Martin; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael; Zachuk, R.; Olshanetsky, B. Z.
    Kinetics of Au induced faceting of vicinal Si(111)
    In: Surface Science, Jg. 512, 2002, Nr. 1-2, S. 117 – 127
    DOI
  • Hild, R.; Kammler, Martin; Dumkow, I.; Horn-von Hoegen, Michael
    Self-organisation of Ge nanostructures on i(111): A SPA-LEED and STM Study,
    In: Omicron Newsletter, Jg. 5, 2002, Nr. 3, S. 2
  • Kammler, Martin; Horn-von Hoegen, Michael; Voss, N.; Tringides, M.; Menzel, A.; Conrad, E.H.
    Si(001)step dynamics: a temporal low-energy electron diffraction study
    In: Physical Review B: Condensed matter and materials physics, Jg. 65, 2002, Nr. 7, S. 75312 – 75319
    Online Volltext
  • Sokolowski-Tinten, Klaus; Blome, C.; Dietrich, C.; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, Andrea; Squier, J.A.; Kammler, Martin
    Time-Resolved X-ray Diffraction Study of Ultrafast Structural Dynamics in Laser-Excited Solids
    In: Ultrafast Phenomena XIII, Jg. 71, 2002, S. 36
  • Sokolowski-Tinten, Klaus; Blome, C.; Dietrich, C.; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, Andrea; Squier, J.; Kammler, Martin
    Femtosecond X-ray measurement of ultrafast melting and large acoustic transients
    In: Physical Review Letters, Jg. 87, 2001, Nr. 22, 225701 (4p)
    Online Volltext
  • Sokolowski-Tinten, Klaus; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, Andrea; Siders, Craig W.; Brown, F.L.H.; Leitner, D.M.; Tóth, Csaba; Barty, Christopher P.P.; Squier, J.A.; Wilson, Kent R.; Kammler, Martin
    Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast x-ray diffraction
    In: Journal de Physique . IV France, Jg. 11, 2001, Nr. PR2, S. 473 – 477
    DOI
  • Cavalleri, Andrea; Siders, Craig W.; Brown, F.L.H.; Leitner, D.M.; Tóth, Csaba; Squier, J.A.; Barty, Christopher P.P.; Wilson, Kent R.; Sokolowski-Tinten, Klaus; Horn-von Hoegen, Michael; von der Linde, Dietrich; Kammler, Martin
    Anharmonic lattice dynamics in Germanium measured with ultrafast x-ray diffraction
    In: Physical Review Letters, Jg. 85, 2000, Nr. 3, S. 586 – 589
    Online Volltext
  • Sokolowski-Tinten, Klaus; Cavalleri, Andrea; Siders, Craig W.; Brown, F.L.H.; Leitner, D.M.; Tóth, Csaba; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Squier, J.A.; Barty, Christopher P.P.; Wilson, Kent R.
    Time-resolved X-ray diffraction study of ultrafast acoustic phonon dynamics in Ge/Si heterostructures
    In: Ultrafast Phenomena XII, Jg. 66, 2000, S. 281 – 283
    Online Volltext
  • Kammler, Martin; Schmidt, Th.; Zahl, P.; Kury, P.; Falta, J.; Horn-von Hoegen, Michael
    3-dim. Reciprocal space mapping of a quasi periodic misfit dislocation array
    In: HASYLAB/DESY Annual Report, 1999
    Online Volltext
  • Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank; Kammler, Martin; Schaeffer, C.; Reinking, Dirk; Hofmann, Karl R.
    Bi surfactant mediated epitaxy of Ge on Si(111)
    In: Thin Solid Films, Jg. 343-344, 1999, S. 579 – 582
    DOI
  • Siders, Craig W.; Cavalleri, Andrea; Sokolowski-Tinten, Klaus; Toth, Csabe; Guo, Ting; Kammler, Martin; Horn-von Hoegen, Michael; Wilson, Kent R.; von der Linde, Dietrich; Barty, Christopher P.P.
    Detection of nonthermal melting by ultrafast X-ray diffraction
    In: Science, Jg. 286, 1999, Nr. 5443, S. 1340 – 1342
    Online Volltext
  • Reinking, Dirk; Kammler, Martin; Hoffmann, N.; Horn-von Hoegen, Michael; Hofmann, Karl R.
    Fabrication of high-mobility Ge p-channel MOSFETs on Si substrates
    In: Electronic Letters, Jg. 35, 1999, S. 503 – 504
    Online Volltext
  • Kammler, Martin; Reinking, Dirk; Hofmann, Karl R.; Horn-von Hoegen, Michael
    Surfactant-mediated epitaxy of Ge on Si: progress in growth and electrical characterization
    In: Thin Solid Films, Jg. 336, 1999, Nr. 1-2, S. 29 – 33
    DOI
  • Falta, J.; Mielmann, O.; Schmidt, T.; Hille, A.; Sanchez-Hanke, C.; Sonntag, P.; Materlik, G.; Meyer zu Heringdorf, Frank; Kammler, Martin; Horn-von Hoegen, Michael; Copel, M.
    High concentration Bi delta-doping layers on Si(001)
    In: Applied Surface Science, Jg. 123/124, 1998, S. 538 – 541
    DOI
  • Larsson, Mats I.; Tringides, Michael C.; Pfnür, Herbert; Frischat, Hannes; Budde, Knut; Kammler, Martin; Henzler, Martin
    Intensity fluctuations from surfaces and the assessment of time constants
    In: Surface Science, Jg. 411, 1998, Nr. 1-2, S. 789 – 793
    DOI
  • Kammler, Martin; Falta, J.; Kury, Peter; Müller, B.H.; Schmidt, T.; Horn-von Hoegen, Michael
    Strain Field of Periodic Dislocation Networks of SME grown Ge on Si(111)
    In: HASYLAB/DESY Annual Report, Jg. 0, 1998
    Online Volltext
  • Hofmann, Karl R.; Reinking, Dirk; Kammler, Martin; Horn-von Hoegen, Michael
    Surfactant-grown low-doped Germanium layers on Silicon with high electron mobilities
    In: Thin Solid Films, Jg. 321, 1998, Nr. 1-2, S. 125 – 130
    DOI
  • Reinking, Dirk; Kammler, Martin; Horn-von Hoegen, Michael; Hofmann, Karl R.
    Enhanced Sb segregation in surfactant-mediated heterogrowth: High-mobility, low-doped Ge on Si
    In: Applied Physics Letters, Jg. 71, 1997, Nr. 7, S. 924 – 926
    Online Volltext
  • Reinking, Dirk; Kammler, Martin; Horn-von Hoegen, Michael; Hofmann, Karl R.
    High electron mobilities in surfactant-grown Germanium on Silicon substrates
    In: Japanese Journal of Applied Physics, Jg. 36, 1997, S. 1082 – 1085
    Online Volltext
  • Falta, J.; Bahr, D.; Hille, A.; Materlik, G.; Kammler, Martin; Horn-von Hoegen, Michael
    Stress reduction and interface quality of buried Sb delta-layers on Si(001)
    In: Applied Physics Letters, Jg. 69, 1996, Nr. 19, S. 2906 – 2908
    Online Volltext

    • Abstracts

  • Siders, C. W.; Cavalleri, A.; Tóth, C.; Wilson, K. R.; Squier, J. A.; Barty, C. P. J.; Kammler, Martin; Sokolowski-Tinten, Klaus; Horn-von Hoegen, Michael; von der Linde, Dietrich
    Femtosecond X-ray diffraction of short-pulse irradiated semiconductors
    In: Technical Digest: Summaries of Papers Presented at the Conference on Lasers and Electro-Optics ; Long Beach Convention Center, Long Beach, California, May 19-24, 2002 / Conference on Lasers and Electro-Optics ; CLEO 2002 ; May 19-24, 2002, Long Beach, California, USA / Optical Society of America (Hrsg.). Washington: Optical Society of America, 2002, S. 297 – 298
    DOI, Online Volltext
  • Sokolowski-Tinten, Klaus; Blome, C.; Dietrich, C.; Blums, J.; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, A.; Squier, J.; Kammler, Martin
    Structural dynamics in laser-excited solids investigated with femtosecond X-ray diffraction
    In: Technical Digest: Summaries of Papers Presented at the Conference on Lasers and Electro-Optics ; Long Beach Convention Center, Long Beach, California, May 19-24, 2002 / Conference on Lasers and Electro-Optics ; CLEO 2002 ; May 19-24, 2002, Long Beach, California, USA / Optical Society of America (Hrsg.). Washington: Optical Society of America, 2002, S. 300
    DOI, Online Volltext

    • Beiträge in Sammelwerken und Tagungsbänden

  • Siders, C.W.; Cavalieri, A.; Tóth, Cs.; Wilson, K.R.; Barty, C.P.J.; Sokolowski-Tinten, Klaus; Horn-von Hoegen, Michael; von der Linde, Dietrich; Kammler, Martin
    Direct Observation of Ultrafast Non-thermal Melting by Ultrafast X-ray Diffraction
    In: Optical Sensors / Optical Society of America; Part of Advanced Photonics, 27 - 31 July 2014, Barcelona, Spain. Washington, DC: Optica Publishing Group (formerly OSA), 2014, S. 334 – 336
  • Sokolowski-Tinten, Klaus; von der Linde, Dietrich; Siders, C.W.; Cavalleri, A.; Toth, C.; Guo, T.; Wilson, K.R.; Barty, C.P.J.; Kammler, Martin; Horn-von Hoegen, Michael
    Lattice dynamics of femtosecond laser-excited semiconductors probed by ultrafast x-ray diffraction
    In: Specialty Optical Fibers: Part of Advanced Photonics / Specialty Optical Fibers, Part of Advanced Photonics ; 27 - 31 July 2014, Barcelona, Spain / Optical Society of America (Hrsg.). Washington, DC: Optica Publishing Group (formerly OSA), 2014, PD3
  • Sokolowski-Tinten, Klaus; Blome, C.; Dietrich, Constanze; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, A.; Squier, J.; Uschmann, I.; Förster, E.; Kammler, Martin
    Observation of ultrafast structural transitions in solids using femtosecond x-ray pulses
    In: Specialty Optical Fibers: Part of Advanced photonics / Specialty Optical Fibers, Part of Advanced photonics ; 27 - 31 July 2014, Barcelona, Spain / Optical Society of America (Hrsg.). Washington, DC: Optica Publishing Group (formerly OSA), 2014, CPD18
  • Cavalleri, A.; Siders, C.W.; Guo, T.; Wilson, K.R.; Barty, C.P.J.; Sokolowski-Tinten, Klaus; von der Linde, Dietrich; Kammler, Martin; Horn-von Hoegen, Michael
    Propagation of picosecond acoustic pulses in semiconductor heterostructures probed by ultrafast X-ray diffraction
    In: Specialty Optical Fibers: Part of Advanced Photonics / Specialty Optical Fibers, Part of Advanced photonics ; 27 - 31 July 2014, Barcelona, Spain / Optical Society of America (Hrsg.). Washington, DC: Optica Publishing Group (formerly OSA), 2014, QPD8
  • Sokolowski-Tinten, Klaus; Blome, C.; Dietrich, Constanze; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, A.; Squier, J.; Kammler, Martin
    Ultrafast structural dynamics in solids investigated with femtosecond x-ray pulses
    In: Specialty Optical Fibers: Part of Advanced photonics / Specialty Optical Fibers, Part of Advanced photonics ; 27 - 31 July 2014, Barcelona, Spain / Optical Society of America (Hrsg.). Washington, DC: Optica Publishing Group (formerly OSA), 2014, TuD2
  • Zhou, Ping; Streubühr, Carla; Kalus, Annika; Frigge, Tim; Wall, Simone; Hanisch-Blicharski, Anja; Kammler, Martin; Ligges, Manuel; Bovensiepen, Uwe; von der Linde, Dietrich; Horn-von Hoegen, Michael
    Ultrafast time resolved reflection high energy electron diffraction with tilted pump pulse fronts
    In: XVIIIth International Conference on Ultrafast Phenomena / XVIIIth International Conference on Ultrafast Phenomena Lausanne, Switzerland, July 8-13, 2012 / Chergui, M.; Taylor, A.; Cundiff, S. (Hrsg.). Lausanne, 2013, S. 10016-p1 – 10016-p3
    DOI
  • Frigge, Tim; Kalus, Annika; Klasing, Friedrich; Kammler, Martin; Hanisch-Blicharski, Anja; Horn-von Hoegen, Michael
    Nanoscale Heat Transport in Self-Organized Ge Clusters on Si(001)
    In: Nanoscale Thermoelectrics 2012: Materials and Transport Phenomena / Symposium JJ, Nanoscale Thermoelectrics - Materials and Transport Phenomena, April 9 - 13, 2012, San Francisco, California, USA. New York: Cambridge Univ. Press, 2012, S. 51 – 56
    DOI
  • Shymanovich, Uladzimir; Nicoul, Matthieu; Lu, Wei; Tarasevitch, Alexander; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    Coherent acoustic and optical phonons in laser-excited solids studied by ultrafast time-resolved X-ray diffraction
    In: International Symposium on High Power Laser Ablation 2010 / International Symposium on High Power Laser Ablation, Santa Fe, New Mexico, 18 - 22 April 2010 / Phipps, Claude R. (Hrsg.). Melville, NY: American Inst. of Physics, 2010, S. 558 – 566
    DOI
  • Lu, Wei; Nicoul, Matthieu; Shymanovich, Uladzimir; Tarasevitch, Alexander; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    Extreme phonon softening in laser-excited Bismuth - Towards an inverse Peierls-transitiom
    In: Ultrafast processes in materials science / Ultrafast processes in materials science, November 30 - December 4, 2009, Boston, Massachusetts, USA. Warrendale, Pa.: MRS, 2010, S. 18 – 22
  • Lu, Wei; Nicoul, Matthieu; Shymanovich, Uladzimir; Tarasevitch, Alexander; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    Transient reversal of a peierls-transition : Extreme phonon softening in laser-excited bismuth
    In: International Conference on Ultrafast Phenomena 2010 / UP2010; 18 - 23 July 2010; Snowmass Village, United States. Washington: The Optical Society of America (OSA), 2010, S. ME41
    DOI
  • Möllenbeck, Simone; Hanisch-Blicharski, Anja; Schneider, Paul; Ligges, Manuel; Zhou, Ping; Kammler, Martin; Krenzer, Boris; Horn-von Hoegen, Michael
    Ultra-fast time-resolved electron diffraction of strongly driven phase transitions on silicon surfaces
    In: Materials Research Society Symposium Proceedings / Ultrafast processes in materials science, November 30 - December 4, 2009, Boston, Massachusetts, USA. Red Hook, NY: MRS, 2010, S. 86 – 93
    DOI
  • Fritz, David M.; Adams, Bernhard W.; Blome, Christian; Bucksbaum, Phillip H.; Cavalieri, Adrian L.; Engemann, S.; Fahy, Stephen B.; Fuoss, Paul H.; Gaffney, Kelly J.; Hillyard, P.; Horn-von Hoegen, Michael; Kammler, Martin; Kaspar, Jen D.; Lindenberg, Aaron M.; Lee, Soo Heyong; McFarland, Brian K.; Meyer, D.; Murray, Éamonn D.; Nicou, M.; Pahl, Reinhard; Rudati, Juana I.; Siddons, David P.; Sokolowski-Tinten, Klaus; von der Linde, Dietrich; Wahlstrand, Jared K.; Hastings, Jerome B.; Reis, David A.
    Ultrafast optical and X-ray measurements of femtosecond lattice dynamics in photoexcited bismuth
    In: 15th International Conference on Ultrafast Phenomena / UP 2006; Pacific Grove, United States; 31 July – 4 August 2006. Washington: Optical Society of America (OSA), 2006, S. WD7
    DOI
  • Sokolowski-Tinten, Klaus; Blome, Christian; Blums, Juris; Dietrich, Constanze; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, Andrea; Kammler, Martin; Uschmann, Ingo; Förster, Eckhard
    Femtosecond X-ray Diffraction Study of Large Amplitude Coherent Optical Phonons in Laser-Excited Bismuth
    In: Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference / Conference on Lasers and Electro-Optics (CLEO): Baltimore, United States; 1–6 June 2003. Washington: Optica Publishing Group (formerly OSA), 2003, CMZ6
    Online Volltext
  • Sokolowski-Tinten, Klaus; Blome, C.; Dietrich, Constanze; Blums, J.; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, A.; Squier, J.; Kammler, Martin
    Femtosecond time-resolved X-ray diffraction study of ultrafast structural dynamics in laser-excited solids
    In: Optics InfoBase Conference Papers / International Conference on Ultrafast Phenomena, UP 2002, Vancouver,12 May 2002 / Gakkai, Ōyō Butsuri (Hrsg.): Optica Publishing Group, 2002, S. 19 – 20
  • Reinking, Dirk; Kammler, Martin; Hoffmann, N.; Horn-von Hoegen, Michael; Hofmann, Karl R.
    Ge p-MOSFETs Compatible with Si CMOS-Technology
    In: ESSDERC'99 : Proceedings of the 29th European solid-state device research conference / Maes,, H.E.; Mertens, R.P.; Declerk, G. (Hrsg.). Leuven, Belgium,13-15 september: Neuilly, 1999, S. 300 – 303
    Online Volltext
  • Siders, Craig W.; Cavalleri, Andrea; Sokolowski-Tinten, Klaus; Guo, Ting; Toth, Csaba; Jimenez, Ralph; Rose-Petruck, Christoph; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Wilson, Kent R.; Barty, Christopher P.J.
    Ultrafast movies of atomic motion with femtosecond laser-based X-rays
    In: Soft X-Ray Lasers and Applications III: 19 - 20 July 1999, Denver, Colorado / SPIE Conference on Soft X-Ray Lasers and Applications ; 2; 1999; Denver, Colo. / Rocca, Jorge J. (Hrsg.). Bellingham: SPIE, 1999, S. 302 – 311
    DOI