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Fakultät für Physik, Experimentalphysik
Anschrift
Mülheimer Str.
47057 Duisburg
47057 Duisburg
Raum
MC 370
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Wissenschaftliche/r Mitarbeiter/in, Arbeitsgruppe Prof. Schleberger
Aktuelle Veranstaltungen
Keine aktuellen Veranstaltungen.
Vergangene Veranstaltungen (max. 10)
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2023 SS
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2022 WS
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2021 WS
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2021 SS
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2020 WS
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2017 SS
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2012 WS
Die folgenden Publikationen sind in der Online-Universitätsbibliographie der Universität Duisburg-Essen verzeichnet. Weitere Informationen finden Sie gegebenenfalls auch auf den persönlichen Webseiten der Person.
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Path to ion-based pump-probe experiments: Generation of 18 picosecond keV Ne+ ion pulses from a cooled supersonic gas beamIn: Physical Review Research Jg. 5 (2023) Nr. 3,ISSN: 2643-1564Online Volltext: dx.doi.org/ Online Volltext (Open Access)
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Velocity distributions of particles sputtered from supported two-dimensional MoS2 during highly charged ion irradiationIn: Physical Review B Jg. 107 (2023) Nr. 7,ISSN: 1095-3795; 1550-235X; 2469-9969; 0163-1829; 0556-2805; 1098-0121; 2469-9950Online Volltext: dx.doi.org/ (Open Access)
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Generation of ultrashort keV-Ar+ ion pulses via femtosecond laser photoionizationIn: New Journal of Physics (NJP) Jg. 23 (2021) Nr. 3, S. 033023ISSN: 1367-2630Online Volltext: dx.doi.org/ (Open Access)
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Large-Area, Two-Dimensional MoS2 Exfoliated on Gold : Direct Experimental Access to the Metal–Semiconductor InterfaceIn: ACS Omega Jg. 6 (2021) Nr. 24, S. 15929 - 15939ISSN: 2470-1343Online Volltext: dx.doi.org/ Online Volltext (Open Access)
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A swift technique to hydrophobize graphene and increase its mechanical stability and charge carrier densityIn: npj 2D Materials and Applications Jg. 4 (2020) Nr. 1,ISSN: 2397-7132Online Volltext: dx.doi.org/ (Open Access)
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Corrigendum to “Mass spectrometric investigation of material sputtered under swift heavy ion bombardment” [Nucl. Instrum. Methods B 435 (2018) 101–110](S0168583X17309382)(10.1016/j.nimb.2017.10.019)In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Jg. 469 (2020) S. 57ISSN: 0168-583XOnline Volltext: dx.doi.org/ (Open Access)
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Ionization probability of sputtered indium under irradiation with 20-keV fullerene and argon gas cluster projectilesIn: International Journal of Mass Spectrometry and Ion Physics Jg. 438 (2019) S. 13 - 21ISSN: 1387-3806; 1873-2798Online Volltext: dx.doi.org/
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Molecular SIMS Ionization Probability Studied with Laser Postionization : Influence of the Projectile ClusterIn: Journal of Physical Chemistry C: Nanomaterials and Interfaces Jg. 123 (2019) Nr. 1, S. 565 - 574ISSN: 1932-7447; 1932-7455Online Volltext: dx.doi.org/
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Release of large polycyclic aromatic hydrocarbons and fullerenes by cosmic rays from interstellar dust : Swift heavy ion irradiations of interstellar carbonaceous dust analogueIn: Astronomy & Astrophysics Jg. 623 (2019) S. 1834855ISSN: 1432-0746; 0004-6361Online Volltext: dx.doi.org/ (Open Access)
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Release of large polycyclic aromatic hydrocarbons and fullerenes by cosmic rays from interstellar dust. : Swift heavy ion irradiations of interstellar carbonaceous dust analogueIn: Astronomy & Astrophysics Jg. 623 (2019) S. A134ISSN: 1432-0746; 0004-6361Online Volltext: dx.doi.org/ (Open Access)
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Mass spectrometric investigation of material sputtered under swift heavy ion bombardmentIn: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Jg. 435 (2018) S. 101 - 110ISSN: 0168-583X; 1872-9584Online Volltext: dx.doi.org/
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Secondary ion formation during electronic and nuclear sputtering of germaniumIn: Nuclear Instruments and Methods in Physics Research: Section B: Beam Interactions with Materials and Atoms Jg. 424 (2018) S. 1 - 9ISSN: 0168-583XOnline Volltext: dx.doi.org/
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Secondary ion formation on indium under nuclear and electronic sputtering conditionsIn: Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics Jg. 36 (2018) Nr. 3, S. 03F110ISSN: 2166-2754; 2166-2746; 1071-1023; 0734-211XOnline Volltext: dx.doi.org/ Online Volltext (Open Access)
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Reducing the matrix effect in molecular secondary ion mass spectrometry by laser post-ionizationIn: Journal of Physical Chemistry C: Nanomaterials and Interfaces Jg. 121 (2017) Nr. 36, S. 19705 - 19715ISSN: 1932-7447; 1932-7455Online Volltext: dx.doi.org/
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A new setup for the investigation of swift heavy ion induced particle emission and surface modificationsIn: Review of Scientific Instruments Jg. 87 (2016) Nr. 1, S. 013903ISSN: 1089-7623; 0034-6748Online Volltext: dx.doi.org/ (Open Access)