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Fakultät für Physik, Experimentalphysik
Anschrift
Mülheimer Str.
47057 Duisburg
47057 Duisburg
Raum
MC 370
Telefon
E-Mail
Funktionen
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Wissenschaftliche/r Mitarbeiter/in, Arbeitsgruppe Prof. Schleberger
Aktuelle Veranstaltungen
Vergangene Veranstaltungen (max. 10)
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WiSe 2024
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SoSe 2024
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SoSe 2023
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WiSe 2022
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WiSe 2021
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SoSe 2021
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WiSe 2020
Die folgenden Publikationen sind in der Online-Universitätsbibliographie der Universität Duisburg-Essen verzeichnet. Weitere Informationen finden Sie gegebenenfalls auch auf den persönlichen Webseiten der Person.
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Irradiation with highly charged ions : impact of the kinetic and potential energy on particle emission
The 15th International Symposium on Electron Beam Ion Sources and Traps, 27–30 August 2024, Kielce, Poland,In: Journal of Instrumentation , Jg. 20 2025, Nr. 4, C04027DOI (Open Access) -
Nonequilibrium Dynamics of Electron Emission from Cold and Hot Graphene under Proton IrradiationIn: Nano Letters , Jg. 24 2024, Nr. 17, S. 5174 – 5181DOI, Online Volltext (Open Access)
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Path to ion-based pump-probe experiments: Generation of 18 picosecond keV Ne+ ion pulses from a cooled supersonic gas beamIn: Physical Review Research , Jg. 5 2023, Nr. 3, 033106DOI, Online Volltext (Open Access)
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Ultrashort Ne+ ion pulses for use in pump-probe experiments : numerical simulationsIn: New Journal of Physics (NJP) , Jg. 25 2023, Nr. 12, 123015DOI (Open Access)
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Velocity distributions of particles sputtered from supported two-dimensional MoS2 during highly charged ion irradiationIn: Physical Review B , Jg. 107 2023, Nr. 7, 075418DOI (Open Access)
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Generation of ultrashort keV-Ar+ ion pulses via femtosecond laser photoionizationIn: New Journal of Physics (NJP) , Jg. 23 2021, Nr. 3, S. 033023DOI (Open Access)
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Large-Area, Two-Dimensional MoS2 Exfoliated on Gold : Direct Experimental Access to the Metal–Semiconductor InterfaceIn: ACS Omega , Jg. 6 2021, Nr. 24, S. 15929 – 15939DOI, Online Volltext (Open Access)
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A swift technique to hydrophobize graphene and increase its mechanical stability and charge carrier densityIn: npj 2D Materials and Applications , Jg. 4 2020, Nr. 1, 11DOI (Open Access)
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Corrigendum to “Mass spectrometric investigation of material sputtered under swift heavy ion bombardment” [Nucl. Instrum. Methods B 435 (2018) 101–110](S0168583X17309382)(10.1016/j.nimb.2017.10.019)In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms , Jg. 469 2020, S. 57DOI (Open Access)
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Ionization probability of sputtered indium under irradiation with 20-keV fullerene and argon gas cluster projectilesIn: International Journal of Mass Spectrometry and Ion Physics , Jg. 438 2019, S. 13 – 21
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Molecular SIMS Ionization Probability Studied with Laser Postionization : Influence of the Projectile ClusterIn: Journal of Physical Chemistry C: Nanomaterials and Interfaces , Jg. 123 2019, Nr. 1, S. 565 – 574
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Release of large polycyclic aromatic hydrocarbons and fullerenes by cosmic rays from interstellar dust : Swift heavy ion irradiations of interstellar carbonaceous dust analogueIn: Astronomy and Astrophysics (A&A) , Jg. 623 2019, S. 1834855DOI (Open Access)
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Release of large polycyclic aromatic hydrocarbons and fullerenes by cosmic rays from interstellar dust. : Swift heavy ion irradiations of interstellar carbonaceous dust analogueIn: Astronomy and Astrophysics (A&A) , Jg. 623 2019, S. A134DOI (Open Access)
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Mass spectrometric investigation of material sputtered under swift heavy ion bombardmentIn: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms , Jg. 435 2018, S. 101 – 110
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Secondary ion formation during electronic and nuclear sputtering of germaniumIn: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms , Jg. 424 2018, S. 1 – 9
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Secondary ion formation on indium under nuclear and electronic sputtering conditionsIn: Journal of Vacuum Science and Technology (JVST) B: Nanotechnology and Microelectronics , Jg. 36 2018, Nr. 3, S. 03F110
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Reducing the matrix effect in molecular secondary ion mass spectrometry by laser post-ionizationIn: Journal of Physical Chemistry C: Nanomaterials and Interfaces , Jg. 121 2017, Nr. 36, S. 19705 – 19715
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A new setup for the investigation of swift heavy ion induced particle emission and surface modificationsIn: Review of Scientific Instruments , Jg. 87 2016, Nr. 1, S. 013903DOI, Online Volltext (Open Access)