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Prof. em. Dr.-Ing. Erich Kubalek

Anschrift
Bismarckstr. 81 (BA)
47057 Duisburg
Raum
BA 131
Telefon
+49 203 379 3191
Telefax
+49 203 379 34 04
E-Mail
erich.kubalek@uni-due.de

Funktionen

  • Universitätsprofessor/in em./i.R., Werkstoffe der Elektrotechnik

Aktuelle Veranstaltungen

Keine aktuellen Veranstaltungen.

Vergangene Veranstaltungen (max. 10)

Keine vergangenen Veranstaltungen.

Die folgenden Publikationen sind in der Online-Universitätsbibliographie der Universität Duisburg-Essen verzeichnet. Weitere Informationen finden Sie gegebenenfalls auch auf den persönlichen Webseiten der Person.

    Artikel in Zeitschriften

  • Seifert, Frank; Weber, Rainer; Mertin, Wolfgang; Kubalek, Erich
    A new technique for contactless current contrast imaging of high frequency signals
    In: Microelectonics Reliability Jg. Vol. 43 (2003) Nr. 9-11, S. 1633 - 1638
    ISSN: 0026-2714
  • Neinhüs, Marcus; Weber, Rainer; Behnke, Ulf; Mertin, Wolfgang; Kubalek, Erich; Breil, Raimund; Detje, Martin; Feltz, Albrecht
    Contactless current and voltage measurements in integrated circuits via a needle sensor
    In: Microelectronics Reliability Jg. Vol. 42 (2002) Nr. 9-11, S. 1695 - 1700
    ISSN: 0026-2714
  • Hartmann, Claus; Weber, Rainer; Mertin, Wolfgang; Kubalek, Erich; Müller, Anne-Dorothea; Hietschold, Michael
    Simultaneous IC-internal voltage and current measurements via a multi lever Scanning Force Microscope
    In: Microelectronics Reliability Jg. Vol. 42 (2002) Nr. 9-11, S. 1759 - 1762
    ISSN: 0026-2714
  • Behnke, Ulf; Mertin, Wolfgang; Kubalek, Erich
    Cross-talk in electric force microscopy testing of parallel sub-micrometer conducting lines
    In: Microelectronics Reliability Jg. Vol. 40 (2000) Nr. 8-10, S. 1401 - 1406
    ISSN: 0026-2714
  • Weber, Rainer; Mertin, Wolfgang; Kubalek, Erich
    Voltage-influence of biased interconnection line on integrated circuit-internal current contrast measurements via magnetic force microscopy
    In: Microelectronics Reliability Jg. Vol. 40 (2000) Nr. 8-10, S. 1389 - 1394
    ISSN: 0026-2714
  • Bae, Seong-Woo; Schiemann, Klaus; Mertin, Wolfgang; Kubalek, Erich; Maywald, Martin
    A new bifunctional topography and current probe for scanning force microscopy testing of integrated circuits
    In: Microelectronics Reliability Jg. Vol. 39 (1999) Nr. 6-7, S. 975 - 980
    ISSN: 0026-2714
  • Wittpahl, Volker; Ney, Christian; Behnke, Ulf; Mertin, Wolfgang; Kubalek, Erich
    Quantitative high frequency-electric force microscope testing of monolithic microwave integrated circuits at 20 GHz
    In: Microelectronics Relability Jg. Vol. 39 (1999) Nr. 6-7, S. 951 - 956
    ISSN: 0026-2714
  • Behnke, Ulf; Wand, B.; Mertin, Wolfgang; Kubalek, Erich
    Voltage contrast measurements on sub-micrometer structures with an electric force microscope based test system
    In: Microelectronics Reliability Jg. Vol. 39 (1999) Nr. 6-7, S. 969 - 974
    ISSN: 0026-2714
  • Mertin, Wolfgang; Leyk, A.; Novak, T.; David, G.; Jäger, Dieter; Kubalek, Erich
    Characterization of a MMIC by direct and indirect electro-optic sampling and by network analyzer measurements
    In: Microelectronic Engineering Jg. 24 (1994) Nr. 1-4, S. 377 - 384
    ISSN: 0167-9317
    Online Volltext: dx.doi.org/
  • Taenzler, F.; Mertin, Wolfgang; David, Gerhard; Jäger, Dieter; Kubalek, Erich
    Experimental characterization of the perturbations of microwave devices by the electro-optic probe tip
    In: Microelectronic Engineering Jg. 24 (1994) Nr. 1-4, S. 123 - 130
    ISSN: 0167-9317
    Online Volltext: dx.doi.org/
  • David, G.; Redlich, S.; Mertin, W.; Kubalek, Erich; Jäger, Dieter
    Two-dimensional field mapping in coplanar MMIC-components using direct electro-optic probing
    In: Microelectronic Engineering Jg. 24 (1994) Nr. 1-4, S. 385 - 392
    ISSN: 0167-9317
    Online Volltext: dx.doi.org/
  • Kraus, Jörg; Meschede, Herbert; Liu, Q.; Prost, Werner; Tegude, Franz-Josef; Lakner, Hubert; Kubalek, Erich
    InyGa₁₋yAs{plus 45 degree rule}GaAs interface smoothing by GaAs monolayers in highly strained graded superlattice channels (0.2 ≤ y ≤ 0.4) for pseudomorphic AlₓGa₁₋ₓAs{plus 45 degree rule}InyGa₁₋yAs HFET
    In: Journal of Crystal Growth Jg. 127 (1993) Nr. 1-4, S. 589 - 591
    ISSN: 0022-0248; 1873-5002
    Online Volltext: dx.doi.org/
  • Lakner, Hubert; Bollig, Bernd; Kubalek, Erich; Heuken, Michael; Heime, Klaus; Scheffer, F.; Guimaraes, Francisco Eduardo Gontijo
    Scanning transmission electron microscopy of heterointerfaces grown by metalorganic vapor phase epitaxy (MOVPE)
    In: Journal of Crystal Growth Jg. 107 (1991) Nr. 1-4, S. 452 - 457
    ISSN: 0022-0248; 1873-5002
    Online Volltext: dx.doi.org/

    • Beiträge in Sammelwerken und Tagungsbänden

  • Boehm, Christoph; Otterbeck, Markus; Lipp, Stephan; Frey, L.; Reuter, Ralf; Leyk, A.; Mertin, Wolfgang; Tegude, Franz-Josef; Kubalek, Erich
    Design and characterization of integrated probes for millimeter wave applications in scanning probe microscopy
    In: Proceedings of the 1996 IEEE MTT-S International Microwave Symposium Digest / San Franscisco, USA; 17 - 21 June 1996 1996, S. 1529 - 1532
    ISBN: 0-7803-3246-6 ISSN: 0149-645X
    Online Volltext: dx.doi.org/
  • Mertin, Wolfgang; Leyk, A.; David, Gerhard; Bertenburg, Ralf M.; Koßlowski, Stefan; Wolff, Ingo; Jäger, Dieter; Kubalek, Erich
    Two-dimensional mapping of amplitude and phase of microwave fields inside a MMIC using the direct electro-optic sampling technique
    In: Proceedings of the IEEE MTT-S International Microwave Symposium Digest / San Diego, USA; 23-27 May 1994 Jg. 3 1994, S. 1597 - 1600
    ISBN: 0780317793 ISSN: 0149-645X
    Online Volltext: dx.doi.org/
  • David, Gerhard; Redlich, Stefan; Mertin, Wolfgang; Bertenburg, Ralf M.; Koblowski, S.; Tegude, Franz-Josef; Kubalek, Erich; Jäger, Dieter
    Two-dimensional direct electra-optic field mapping in a monolithic integrated GaAs amplifier
    In: 23rd European Microwave Conference / EuMA 1993; Madrid, Spain; 6 - 10 September 1993 1993, S. 497 - 499
    Online Volltext: dx.doi.org/
  • David, G.; Redlich, S.; Mertin, Wolfgang; Bertenburg, Ralf M.; Koßlowski, S.; Tegude, Franz-Josef; Kubalek, Erich; Jäger, Dieter
    Two-dimensional direct electro-optic field mapping in a monolithic integrated GaAs amplifier
    In: Proceedings of the 23rd European Microwave Conference (EuMC'93) / EuMC'93, 10. September 1993, Madrid, Spain 1993, S. 497 - 499
    Online Volltext

    • Vorträge

  • Redlich, S.; Kremer, R.; Neubauer, A.; Bollig, B.; Liu, Q.; Kubalek, Erich; Tegude, Franz-Josef; Laws, P.; Jäger, Dieter;
    InAlAs/InGaAs Heterostrukturen auf InP zur Realisierung optisch steuerbarer Höchstfrequenzleitungen
    9. Treffen des DGKK Arbeitskreises "Epitaxie von III/V-Halbleitern", Duisburg, Dezember 1994,
    (1994)
  • David, G.; Redlich, S.; Mertin, Wolfgang; Tempel, R.; Kubalek, Erich; Wolff, I.; Jäger, Dieter;
    Electro-optical testing of MMICs
    24th General Assembly, August 25-September 2, 1993, Kyoto, Japan, 1993,
    Kyoto (1993)
  • Lakner, Hubert; Kubalek, Erich; Kraus, J.; Tegude, Franz-Josef;
    High Resolution STEM Analysis of InGaAs/AlGaAs Heterostructures
    10th International Congress on Electron Microscopy, Granada, Spain, 07.09.1992 - 12.09.1992,
    Granada, Spain (1992)
  • Kraus, Jörg; Meschede, Herbert; Liu, Q.; Prost, Werner; Tegude, Franz-Josef; Lakner, Hubert; Kubalek, Erich;
    InyGa₁₋yAs{plus 45 degree rule}GaAs interface smoothing by GaAs monolayers in highly strained graded superlattice channels (0.2 ≤ y ≤ 0.4) for pseudomorphic AlₓGa₁₋ₓAs{plus 45 degree rule}InyGa₁₋yAs HFET
    7th International Conference on Molecular Beam Epitaxy (MBE), Schwäbisch Gmünd, Germany, 24.08.1992 - 28.08.1992,
    Schwäbisch Gmünd, Germany (1992)