Experimental Methods

We use a variety of surface sensitive analysation methods in this workgroup. For example XPS, UPS, LEED, HREELS and more.

Photo Electron Spectroscopy (XPS, UPS)

Apparatus

• SPECS Phoibos 100, Hemispherical Analyzer, 5-Channel MCD detector
• VSW, 150mm Hemispherical Analyzer, 15-Channel MCD detector

Light Sources

• SPECS XR 50, X-ray source, Al Ka, Mg Ka
• High-power Soft X-ray source, Zr Mzeta, Yt
• SPECS UVS 10/35, UV Source
• SPECS UVS 300, High power UV Source

Auger Electron Spectroscopy (AES)

High resolution Varian CMA with integrated electron gun.

Electron Loss Spectroscopy (EELS, HREELS)

Low Energy Electron Diffraction (LEED)

Apparatus

• SPECS ErLEED, electron energy between 0eV and 3000eV and RFA mode

Kelvin Probe (CPD)

Apparatus

• McAllister Technical Services KP6500 Kelvin Probe

In-situ Device Characterisation (I/V, C/V, photocurrent, chemicurrent)

Keithley 236

Lock in

Rare Gas Ion-Sputtering

Thin Film Growth and Characterization (MBE, PVD)

Mass Spectrometry

Molecular Beam Chamber