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Dr.-Ing. Wolfgang Mertin

Fakultät für Ingenieurwissenschaften/Lehrstuhl Wekstoffe der Elektrotechnik

Anschrift
Bismarckstr. 81 (BA)
47057 Duisburg
Raum
BA 111
Telefon
+49 203 379 3407
Telefax
+49 203 379 34 04
E-Mail
wolfgang.mertin@uni-due.de
Webseite
http://www.uni-due.de/wet

Funktionen

  • Akad. Direktor/in, Werkstoffe der Elektrotechnik

Die folgenden Publikationen sind in der Online-Universitätsbibliographie der Universität Duisburg-Essen verzeichnet. Weitere Informationen finden Sie gegebenenfalls auch auf den persönlichen Webseiten der Person.

    Artikel in Zeitschriften

  • Abdelbaky, Mohamed; Beckmann, Yannick; Klein, Julian; Fabunmi, Tobiloba Grace; Stracke, Nicole; Grundmann, Annika; Heuken, Michael; Kalisch, Holger; Vescan, Andrei; Kümmell, Tilmar; Mertin, Wolfgang; Bacher, Gerd
    Band structure alignment in transfer-free MOCVD grown 2D-TMDC heterostructures revealed by ambient KPFM
    In: APL Materials , Jg. 13 2025 , Nr. 4 , 041112
    DOI (Open Access)
  • Meier, Johanna; Zhang, Hehe; Kaya, Umut; Mertin, Wolfgang; Bacher, Gerd
    Graphene-Enhanced UV-C LEDs
    In: Advanced Materials , Jg. 36 2024 , Nr. 32 , 2313037
    DOI (Open Access)
  • Beckmann, Yannick; Myja, Henrik; Kramberg, Tom; Konietzka, Julius; Abdelbaky, Mohamed; Grundmann, Annika; Ghiami, Amir; Heuken, Michael; Kalisch, Holger; Vescan, Andrei; Mertin, Wolfgang; Kümmell, Tilmar; Bacher, Gerd
    Self-Powered Photodetectors Based on Scalable MOCVD-Grown WS₂-MoS₂ Heterostructures
    In: ACS Photonics , Jg. 11 2024 , Nr. 16 , S. 2228 - 2235
    DOI
  • Ghosh, Sanyukta; Abdelbaky, Mohamed; Mertin, Wolfgang; Müller, Eckhard; de Boor, Johannes
    Surface Degradation of Mg₂X-Based Composites at Room Temperature : Assessing Grain Boundary and Bulk Diffusion Using Atomic Force Microscopy and Scanning Electron Microscopy
    In: ACS Applied Materials & Interfaces , Jg. 16 2024 , Nr. 36 , S. 48619 - 48628
    DOI (Open Access)
  • Zhang, Hehe; Mischke, Jan; Mertin, Wolfgang; Bacher, Gerd
    Graphene as a Transparent Conductive Electrode in GaN-Based LEDs
    In: Materials , Jg. 15 2022 , Nr. 6 , 2203
    DOI (Open Access)
  • Beckmann, Yannick; Grundmann, Annika; Daniel, Leon; Abdelbaky, Mohamed; McAleese, Clifford; Wang, Xiaochen; Conran, Ben; Pasko, Sergej; Krotkus, Simonas; Heuken, Michael; Kalisch, Holger; Vescan, Andrei; Mertin, Wolfgang; Kümmell, Tilmar; Bacher, Gerd
    Role of Surface Adsorbates on the Photoresponse of (MO)CVD-Grown Graphene–MoS2 Heterostructure Photodetectors
    In: ACS Applied Materials & Interfaces , Jg. 14 2022 , Nr. 30 , S. 35184 - 35193
    DOI
  • Hutten, Ulrike; Daniel, Leon; Grundmann, Annika; Stracke, Nicole; Abdelbaky, Mohamed; Beckmann, Yannick; Heuken, Michael; Mertin, Wolfgang; Kalisch, Holger; Vescan, Andrei; Bacher, Gerd; Kümmell, Tilmar
    Transfer-free, scalable photodetectors based on MOCVD-grown 2D-heterostructures
    In: 2D Materials , Jg. 8 2021 , Nr. 4 , 045015
    DOI (Open Access)
  • Mischke, Jan; Pennings, Joel; Weisenseel, Erik; Kerger, Philipp; Rohwerder, Michael; Mertin, Wolfgang; Bacher, Gerd
    Direct growth of graphene on GaN via plasma-enhanced chemical vapor deposition under N₂ atmosphere
    In: 2D Materials , Jg. 7 2020 , Nr. 3 , 035019
    DOI (Open Access)
  • Bekdüz, Bilge; Kaya, Umut; Langer, Moritz; Mertin, Wolfgang; Bacher, Gerd
    Direct growth of graphene on Ge(100) and Ge(110) via thermal and plasma enhanced CVD
    In: Scientific Reports , Jg. 10 2020 , Nr. 1 , S. 12938
    DOI (Open Access)
  • Bekdüz, Bilge; Beckmann, Y.; Mischke, Jan; Twellmann, J.; Mertin, Wolfgang; Bacher, Gerd
    Graphene growth through a recrystallization process in plasma enhanced chemical vapor deposition
    In: Nanotechnology , Jg. 29 2018 , Nr. 45 , S. 455603
    DOI
  • Bekdüz, Bilge; Kampermann, Laura; Mertin, Wolfgang; Punckt, Christian; Aksay, Ilhan A.; Bacher, Gerd
    Influence of atmospheric species on the electrical properties of functionalized graphene sheets
    In: RSC Advances , Jg. 8 2018 , Nr. 73 , S. 42073 - 42079
    DOI, Online Volltext (Open Access)
  • Shaygan, Mehrdad; Otto, Martin; Sagade, Abhay A.; Chavarin, Carlos A.; Bacher, Gerd; Mertin, Wolfgang; Neumaier, Daniel
    Low Resistive Edge Contacts to CVD-Grown Graphene Using a CMOS Compatible Metal
    In: Annalen der Physik , Jg. 529 2017 , Nr. 11, Special Issue: Science and Technology of Graphene , 1600410
    DOI, Online Volltext (Open Access)
  • Bekdüz, Bilge; Beckmann, Y.; Meier, J.; Rest, J.; Mertin, Wolfgang; Bacher, Gerd
    Relation between growth rate and structure of graphene grown in a 4″ showerhead chemical vapor deposition reactor
    In: Nanotechnology , Jg. 28 2017 , Nr. 18 , S. 185601
    DOI
  • Chavarin, Carlos Alvarado; Sagade, Abhay A.; Neumaier, Daniel; Bacher, Gerd; Mertin, Wolfgang
    On the origin of contact resistances in graphene devices fabricated by optical lithography
    In: Applied Physics A: Materials Science and Processing , Jg. 122 2016 , Nr. 2 , S. 58
    DOI
  • Wolff, Svenja; Jansen, Dennis; Terlinden, Hendrik; Kelestemur, Yusuf; Mertin, Wolfgang; Demir, Hilmi Volkan; Bacher, Gerd; Nannen, Ekaterina
    Implementation of graphene multilayer electrodes in quantum dot light-emitting devices
    In: Applied Physics A: Materials Science and Processing , Jg. 120 2015 , Nr. 3 , S. 1197 - 1203
    DOI (Open Access)
  • Punckt, Christian; Muckel, Franziska; Wolff, Svenja; Aksay, Ilhan A.; Alvarado Chavarin, Carlos; Bacher, Gerd; Mertin, Wolfgang
    The effect of degree of reduction on the electrical properties of functionalized graphene sheets
    In: Applied Physics Letters (APL) , Jg. 102 2013 , Nr. 2 , 023114
    DOI
  • Yan, Liang; Punckt, Christian; Aksay, Ilhan A.; Mertin, Wolfgang; Bacher, Gerd
    Local voltage drop in a single functionalized graphene sheet characterized by kelvin probe force microscopy
    In: Nano Letters , Jg. 11 2011 , Nr. 9 , S. 3543 - 3549
    DOI
  • Lysov, Andrey; Vinaji, Sasa; Offer, Matthias; Gutsche, Christoph; Regolin, Ingo; Mertin, Wolfgang; Geller, Martin Paul; Prost, Werner; Bacher, Gerd; Tegude, Franz-Josef
    Spatially resolved photoelectric performance of axial GaAs nanowire pn-diodes
    In: Nano Research , Jg. 4 2011 , Nr. 10 , S. 987 - 995
    DOI
  • Vinaji, Sasa; Lochthofen, André; Mertin, Wolfgang; Regolin, Ingo; Gutsche, Christoph; Prost, Werner; Tegude, Franz-Josef; Bacher, Gerd
    Material and doping transitions in single GaAs-based nanowires probed by Kelvin probe force microscopy
    In: Nanotechnology , Jg. 20 2009 , Nr. 38 , S. 385702
    DOI
  • Lochthofen, André; Mertin, Wolfgang; Bacher, Gerd; Hoeppel, Lutz; Bader, Stefan; Off, Johannes; Hahn, Berthold
    Electrical investigation of V-defects in GaN using Kelvin probe and conductive atomic force microscopy
    In: Applied Physics Letters (APL) , Jg. 93 2008 , Nr. 2 , S. 022107
    DOI
  • Lochthofen, André; Mertin, Wolfgang; Bacher, Gerd; Furitsch, Michael; Brüderl, Georg; Härle, Volker
    Microscopic investigation of InGaN/GaN heterostructure laser diode degradation using Kelvin probe force microscopy
    In: Journal of Physics D: Applied Physics , Jg. 41 2008 , Nr. 13 , S. 135115
    DOI
  • Hartmann, Claus; Mertin, Wolfgang; Bacher, Gerd
    Circuit internal signal measurements with a needle sensor
    In: Microelectronics Reliability , Jg. Vol. 45 2005 , Nr. 9-11 , S. 1505 - 1508
  • Hartmann, Claus; Mertin, Wolfgang; Bacher, Gerd
    Contactless current measurements using a needle sensor
    In: Ultramicroscopy , Jg. Vol. 105 2005 , Nr. 1-4 , S. 228 - 232
  • Hartmann, Claus; Mertin, Wolfgang; Bacher, Gerd
    High AC-voltage sensitivity of a quartz needle sensor used in noncontact scanning force microscopy
    In: Applied Physics Letters , Jg. Vol. 87 2005 , Nr. 21 , S. 214104
  • Seifert, Frank; Weber, Rainer; Mertin, Wolfgang; Kubalek, Erich
    A new technique for contactless current contrast imaging of high frequency signals
    In: Microelectonics Reliability , Jg. Vol. 43 2003 , Nr. 9-11 , S. 1633 - 1638
  • Behnke, Ulf; Klümper, Dirk; Mertin, Wolfgang
    Electric force microscopy testing of digital voltages using the heterodyne mixing technique
    In: Journal of Physics D: Applied Physics , Jg. 36 2003 , Nr. 6 , S. 748 - 752
  • Neinhüs, Marcus; Weber, Rainer; Behnke, Ulf; Mertin, Wolfgang; Kubalek, Erich; Breil, Raimund; Detje, Martin; Feltz, Albrecht
    Contactless current and voltage measurements in integrated circuits via a needle sensor
    In: Microelectronics Reliability , Jg. Vol. 42 2002 , Nr. 9-11 , S. 1695 - 1700
  • Hartmann, Claus; Weber, Rainer; Mertin, Wolfgang; Kubalek, Erich; Müller, Anne-Dorothea; Hietschold, Michael
    Simultaneous IC-internal voltage and current measurements via a multi lever Scanning Force Microscope
    In: Microelectronics Reliability , Jg. Vol. 42 2002 , Nr. 9-11 , S. 1759 - 1762
  • Behnke, Ulf; Mertin, Wolfgang; Kubalek, Erich
    Cross-talk in electric force microscopy testing of parallel sub-micrometer conducting lines
    In: Microelectronics Reliability , Jg. Vol. 40 2000 , Nr. 8-10 , S. 1401 - 1406
  • Weber, Rainer; Mertin, Wolfgang; Kubalek, Erich
    Voltage-influence of biased interconnection line on integrated circuit-internal current contrast measurements via magnetic force microscopy
    In: Microelectronics Reliability , Jg. Vol. 40 2000 , Nr. 8-10 , S. 1389 - 1394
  • Bae, Seong-Woo; Schiemann, Klaus; Mertin, Wolfgang; Kubalek, Erich; Maywald, Martin
    A new bifunctional topography and current probe for scanning force microscopy testing of integrated circuits
    In: Microelectronics Reliability , Jg. Vol. 39 1999 , Nr. 6-7 , S. 975 - 980
  • Wittpahl, Volker; Ney, Christian; Behnke, Ulf; Mertin, Wolfgang; Kubalek, Erich
    Quantitative high frequency-electric force microscope testing of monolithic microwave integrated circuits at 20 GHz
    In: Microelectronics Relability , Jg. Vol. 39 1999 , Nr. 6-7 , S. 951 - 956
  • Behnke, Ulf; Wand, B.; Mertin, Wolfgang; Kubalek, Erich
    Voltage contrast measurements on sub-micrometer structures with an electric force microscope based test system
    In: Microelectronics Reliability , Jg. Vol. 39 1999 , Nr. 6-7 , S. 969 - 974
  • Mertin, Wolfgang; Leyk, A.; Novak, T.; David, G.; Jäger, Dieter; Kubalek, Erich
    Characterization of a MMIC by direct and indirect electro-optic sampling and by network analyzer measurements
    In: Microelectronic Engineering , Jg. 24 1994 , Nr. 1-4 , S. 377 - 384
    DOI
  • Taenzler, F.; Mertin, Wolfgang; David, Gerhard; Jäger, Dieter; Kubalek, Erich
    Experimental characterization of the perturbations of microwave devices by the electro-optic probe tip
    In: Microelectronic Engineering , Jg. 24 1994 , Nr. 1-4 , S. 123 - 130
    DOI
  • David, G.; Redlich, S.; Mertin, W.; Kubalek, Erich; Jäger, Dieter
    Two-dimensional field mapping in coplanar MMIC-components using direct electro-optic probing
    In: Microelectronic Engineering , Jg. 24 1994 , Nr. 1-4 , S. 385 - 392
    DOI

    • Abstracts

  • Schaberg, Lars; Kubiczek, Tobias; Santhakumaran, Sabisan; Burkard, Roman; Mertin, Wolfgang; Muckel, Franziska; Bacher, Gerd; Schall-Giesecke, A. L.; Neumaier, D; Balzer, Jan C.; Kirchner, Elsa Andrea; Benson, Niels
    Body Motion detection using epidermal electronic graphene patches
    In: Biomedical engineering = Biomedizinische Technik , Jg. 68 2023 , Nr. s1: 57th Annual Meeting of the German Society of Biomedical Engineering 26 – 28 September 2023, Duisburg, including: The Artificial Vision Symposium – The International Symposium on Visual Prosthetics , S. 1 - 261
    DOI

    • Beiträge in Sammelwerken und Tagungsbänden

  • Vinaji, Sasa; Bacher, Gerd; Mertin, Wolfgang
    Material and doping contrast in III/V nanowires probed by Kelvin probe force microscopy
    In: Nanoparticles from the gasphase: formation, structure, properties / Lorke, Axel; Winterer, Markus; Schmechel, Roland; Schulz, Christof (Hrsg.) 2012 , S. 185 - 206
    DOI
  • Yan, Liang; Punckt, Christian; Aksay, Ilhan A.; Mertin, Wolfgang; Bacher, Gerd; Ihm, Jisoon; Cheong, Hyeonsik
    Potential distribution in functionalized graphene devices probed by Kelvin probe force microscopy
    In: Physics of Semiconductors / Ihm, Jisoon; Cheong, Hyeonsik; 30th International Conference on the Physics of Semiconductors, 25-30 Jul 2010. Seoul, Korea 2011 , S. 819 - 820
    DOI
  • Do, Quoc Thai; Katzer, Klaus Dieter; Martinez-Albertos, José Luis; Khorenko, Victor; Mertin, Wolfgang; Prost, Werner; Moore, Barry D.; Tegude, Franz-Josef
    A nanoparticle-coated nanocrystal-gate for an INP-based heterostructure field-effect transistor
    In: 16th International Conference on Indium Phosphide and Related Materials: Conference Proceedings / IPRM`04; Kagoshima, Japan; 31 May - 4 June 2004 2004 , S. 435 - 438
    DOI, Online Volltext
  • Mertin, Wolfgang
    Contactless probing of high-frequency electrical signals with scanning probe microscopy
    In: 2002 IEEE MTT-S International Microwave Symposium digest : June 2 - 7, 2002, Washington (Vol. 3) / Hamilton, Rob (Hrsg.) 2002 , S. 1493 - 1496
  • Boehm, Christoph; Otterbeck, Markus; Lipp, Stephan; Frey, L.; Reuter, Ralf; Leyk, A.; Mertin, Wolfgang; Tegude, Franz-Josef; Kubalek, Erich
    Design and characterization of integrated probes for millimeter wave applications in scanning probe microscopy
    In: Proceedings of the 1996 IEEE MTT-S International Microwave Symposium Digest / San Franscisco, USA; 17 - 21 June 1996 1996 , S. 1529 - 1532
    DOI, Online Volltext
  • Mertin, Wolfgang; Leyk, A.; David, Gerhard; Bertenburg, Ralf M.; Koßlowski, Stefan; Wolff, Ingo; Jäger, Dieter; Kubalek, Erich
    Two-dimensional mapping of amplitude and phase of microwave fields inside a MMIC using the direct electro-optic sampling technique
    In: Proceedings of the IEEE MTT-S International Microwave Symposium Digest / San Diego, USA; 23-27 May 1994 , Jg. 3 1994 , S. 1597 - 1600
    Online Volltext, DOI
  • David, Gerhard; Redlich, Stefan; Mertin, Wolfgang; Bertenburg, Ralf M.; Koblowski, S.; Tegude, Franz-Josef; Kubalek, Erich; Jäger, Dieter
    Two-dimensional direct electra-optic field mapping in a monolithic integrated GaAs amplifier
    In: 23rd European Microwave Conference / EuMA 1993; Madrid, Spain; 6 - 10 September 1993 1993 , S. 497 - 499
    DOI, Online Volltext
  • David, G.; Redlich, S.; Mertin, Wolfgang; Bertenburg, Ralf M.; Koßlowski, S.; Tegude, Franz-Josef; Kubalek, Erich; Jäger, Dieter
    Two-dimensional direct electro-optic field mapping in a monolithic integrated GaAs amplifier
    In: Proceedings of the 23rd European Microwave Conference (EuMC'93) / EuMC'93, 10. September 1993, Madrid, Spain 1993 , S. 497 - 499

    • Poster / Posterbeiträge

  • Mischke, Jan; Bekdüz, Bilge; Beckmann, Yannick; Meier, Johanna; Twellmann, Jonas; Weisenseel, Erik; Mertin, Wolfgang; Bacher, Gerd
    Graphene growth on conductive and nonconductive substrates via plasma-enhanced CVD
    Materials Chain Workshop on 2D- and Hybrid Materials, 05.07.2019, Bochum, Germany,
    2019
  • Bekdüz, Bilge; Beckmann, Yannick; Meier, Johanna; Mischke, Jan; Twellmann, Jonas; Mertin, Wolfgang; Bacher, Gerd
    Graphene growth at low temperatures via chemical vapor deposition
    CENIDE-Jahresfeier 2017, 15.11.2017, Duisburg,
    2017
  • Mischke, Jan; Bekdüz, Bilge; Mertin, Wolfgang; Bacher, Gerd
    Plasma-enhanced chemical vapor deposition in a 4-inch reactor for the growth of graphene on metallic and non-metallic substrates
    Graphene Study: Hjortviken Konferens AB, 25.-30.06.2017, Hindås, Sweden,
    2017
  • Mischke, Jan; Bekdüz, Bilge; Mertin, Wolfgang; Bacher, Gerd
    Plasma-enhanced chemical vapor deposition in a 4-inch reactor for the growth of graphene on metallic and non-metallic substrates
    CENIDE-Jahresfeier 2017, 15.11.2017, Duisburg,
    2017

    • Vorträge

  • Mischke, Jan; Weisenseel, Erik; Mertin, Wolfgang; Bacher, Gerd
    Direct PE-CVD growth of graphene on GaN under N2 atmosphere
    9th Graphene 2019, 25.-28.06.2019, Rome, Italy,
    2019
  • Mischke, Jan; Pennings, Joel; Weisenseel, Erik; Mertin, Wolfgang; Bacher, Gerd
    Direct PECVD growth of graphene on GaN under N2 atmosphere in a 4" cold-wall CVD reactor
    Graphene & 2DM Singapore Summit 2019, 11-12 November 2019, Singapore,
    Singapur 2019
  • Bekdüz, Bilge; Twellmann, Jonas; Mischke, Jan; Mertin, Wolfgang; Bacher, Gerd
    CVD growth of graphene at reduced temperatures
    The Second WIN-Cenide Reciprocal Workshop, 18.-21.6.2018, Waterloo, Canada,
    2018
  • Bekdüz, Bilge; Beckmann, Yannick; Mischke, Jan; Twellmann, Jonas; Mertin, Wolfgang; Bacher, Gerd
    Defect-free graphene growth at low temperatures via plasma enhanced chemical vapor deposition
    MRS Fall Meeting & Exhibit, 26.11.-01.12.2018, Boston, Ma, USA,
    2018
  • Bekdüz, Bilge; Twellmann, Jonas; Mischke, Jan; Mertin, Wolfgang; Bacher, Gerd
    Plasma enhanced CVD growth of graphene on Cu and Ge
    AiMES 2018 Meeting : Americas International Meeting on Electrochemistry and Solid State Science, 30.9.-4.10.2018, Cancun, Mexico,
    2018
  • Bekdüz, Bilge; Beckmann, Yannick; Meier, Johanna; Mischke, Jan; Twellmann, Jonas; Mertin, Wolfgang; Bacher, Gerd
    CVD growth of graphene at reduced temperatures
    MiFun: Microstructural Functionality at the Nanoscale, 04.-06.10.2017, Duisburg,
    2017
  • Bekdüz, Bilge; Beckmann, Yannick; Meier, Johanna; Mischke, Jan; Twellmann, Jonas; Mertin, Wolfgang; Bacher, Gerd
    CVD growth of graphene at reduced temperatures
    12th Graphene Week 2017, 24.-29.09.2017, Athens, Greece,
    2017
  • Regolin, Ingo; Gutsche, C.; Lysov, A.; Prost, Werner; Malek, Margarethe; Vinaji, S.; Mertin, Wolfgang; Bacher, Gerd; Offer, Matthias; Lorke, Axel; Tegude, Franz-Josef
    Axial doping profile in VLS grown GaAs:Zn nanowires
    13th European Workshop on Metalorganic Vapor Phase Epitaxy, 7. – 10. Juni 2009, Ulm, Germany,
    2009
  • David, G.; Redlich, S.; Mertin, Wolfgang; Tempel, R.; Kubalek, Erich; Wolff, I.; Jäger, Dieter
    Electro-optical testing of MMICs
    24th General Assembly, August 25-September 2, 1993, Kyoto, Japan, 1993,
    Kyoto 1993