• W. Mertin, Kl.-D. Katzer, G. Bacher, A. Jaeger, K. Streubel
  "Kelvin force microscopy on a (GaAl1-x)0.5In0.5P light-emitting diode"

  SPIE International Symposium OPTO 2006 Integrated Optoelectronic Devices, 21.-26. Januar 2006, San Jose, CA, USA

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