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Fakultät für Ingenieurwissenschaften/Lehrstuhl Wekstoffe der Elektrotechnik
Anschrift
Bismarckstr. 81 (BA)
47057 Duisburg
Raum
BA 111

Funktionen

  • Akad. Direktor/in, Werkstoffe der Elektrotechnik

Die folgenden Publikationen sind in der Online-Universitätsbibliographie der Universität Duisburg-Essen verzeichnet. Weitere Informationen finden Sie gegebenenfalls auch auf den persönlichen Webseiten der Person.

    Artikel in Zeitschriften

  • Mischke, Jan; Pennings, Joel Richard; Weisenseel, Erik; Kerger, Philipp; Rohwerder, Michael; Mertin, Wolfgang; Bacher, Gerd
    Direct growth of graphene on GaN via plasma-enhanced chemical vapor deposition under N2 atmosphere
    In: 2D Materials (2DM) Jg. 7 (2020) Nr. 3, S. 035019
    ISSN: 2053-1583
  • Mischke, Jan; Pennings, Joel; Weisenseel, Erik; Kerger, Philipp; Rohwerder, Michael; Mertin, Wolfgang; Bacher, Gerd
    Direct growth of graphene on GaN via plasma-enhanced chemical vapor deposition under N₂ atmosphere
    In: 2D Materials Jg. 7 (2020) Nr. 3, S. 035019
    ISSN: 2053-1583
  • Bekdüz, Bilge; Kaya, Umut; Langer, Moritz; Mertin, Wolfgang; Bacher, Gerd
    Direct growth of graphene on Ge(100) and Ge(110) via thermal and plasma enhanced CVD
    In: Scientific Reports Jg. 10 (2020) Nr. 1, S. 12938
    ISSN: 2045-2322
  • Bekdüz, Bilge; Beckmann, Y.; Mischke, Jan; Twellmann, J.; Mertin, Wolfgang; Bacher, Gerd
    Graphene growth through a recrystallization process in plasma enhanced chemical vapor deposition
    In: Nanotechnology Jg. 29 (2018) Nr. 45, S. 455603
    ISSN: 1361-6528; 0957-4484
  • Bekdüz, Bilge; Kampermann, Laura; Mertin, Wolfgang; Punckt, Christian; Aksay, Ilhan A.; Bacher, Gerd
    Influence of atmospheric species on the electrical properties of functionalized graphene sheets
    In: RSC Advances Jg. 8 (2018) Nr. 73, S. 42073 - 42079
    ISSN: 2046-2069
  • Shaygan, Mehrdad; Otto, Martin; Sagade, Abhay A.; Chavarin, Carlos A.; Bacher, Gerd; Mertin, Wolfgang; Neumaier, Daniel
    Low Resistive Edge Contacts to CVD-Grown Graphene Using a CMOS Compatible Metal
    In: Annalen der Physik Jg. 529 (2017) Nr. 11, Special Issue: Science and Technology of Graphene, S. 1600410
    ISSN: 1521-3889; 0003-3804
  • Bekdüz, Bilge; Beckmann, Y.; Meier, J.; Rest, J.; Mertin, Wolfgang; Bacher, Gerd
    Relation between growth rate and structure of graphene grown in a 4″ showerhead chemical vapor deposition reactor
    In: Nanotechnology Jg. 28 (2017) Nr. 18, S. 185601
    ISSN: 1361-6528; 1361-6528
  • Chavarin, Carlos Alvarado; Sagade, Abhay A.; Neumaier, Daniel; Bacher, Gerd; Mertin, Wolfgang
    On the origin of contact resistances in graphene devices fabricated by optical lithography
    In: Applied Physics A: Materials Science and Processing Jg. 122 (2016) Nr. 2, S. 58
    ISSN: 1432-0630; 0947-8396
  • Wolff, Svenja; Jansen, Dennis; Terlinden, Hendrik; Kelestemur, Yusuf; Mertin, Wolfgang; Demir, Hilmi Volkan; Bacher, Gerd; Nannen, Ekaterina
    Implementation of graphene multilayer electrodes in quantum dot light-emitting devices
    In: Applied Physics A: Materials Science and Processing Jg. 120 (2015) Nr. 3, S. 1197 - 1203
    ISSN: 1432-0630; 0947-8396
  • Punckt, Christian; Muckel, Franziska; Wolff, Svenja; Aksay, Ilhan A.; Alvarado Chavarin, Carlos; Bacher, Gerd; Mertin, Wolfgang
    The effect of degree of reduction on the electrical properties of functionalized graphene sheets
    In: Applied Physics Letters Jg. 102 (2013) Nr. 2, S. 023114-1 - 023114-5
    ISSN: 1077-3118; 0003-6951
  • Yan, Liang; Punckt, Christian; Aksay, Ilhan A.; Mertin, Wolfgang; Bacher, Gerd
    Local voltage drop in a single functionalized graphene sheet characterized by kelvin probe force microscopy
    In: Nano Letters Jg. 11 (2011) Nr. 9, S. 3543 - 3549
    ISSN: 1530-6992; 1530-6984
  • Lysov, Andrey; Vinaji, Sasa; Offer, Matthias; Gutsche, Christoph; Regolin, Ingo; Mertin, Wolfgang; Geller, Martin Paul; Prost, Werner; Bacher, Gerd; Tegude, Franz-Josef
    Spatially resolved photoelectric performance of axial GaAs nanowire pn-diodes
    In: Nano Research Jg. 4 (2011) Nr. 10, S. 987 - 995
    ISSN: 1998-0000; 1998-0124
  • Vinaji, Sasa; Lochthofen, André; Mertin, Wolfgang; Regolin, Ingo; Gutsche, Christoph; Prost, Werner; Tegude, Franz-Josef; Bacher, Gerd
    Material and doping transitions in single GaAs-based nanowires probed by Kelvin probe force microscopy
    In: Nanotechnology Jg. 20 (2009) Nr. 38, S. 385702
    ISSN: 0957-4484; 1361-6528
  • Lochthofen, André; Mertin, Wolfgang; Bacher, Gerd; Hoeppel, Lutz; Bader, Stefan; Off, Johannes; Hahn, Berthold
    Electrical investigation of V-defects in GaN using Kelvin probe and conductive atomic force microscopy
    In: Applied Physics Letters Jg. 93 (2008) Nr. 2, S. 022107
    ISSN: 0003-6951; 1077-3118
  • Lochthofen, André; Mertin, Wolfgang; Bacher, Gerd; Furitsch, Michael; Brüderl, Georg; Härle, Volker
    Microscopic investigation of InGaN/GaN heterostructure laser diode degradation using Kelvin probe force microscopy
    In: Journal of Physics D: Applied Physics Jg. 41 (2008) Nr. 13, S. 135115
    ISSN: 0022-3727; 1361-6463
  • Hartmann, Claus; Mertin, Wolfgang; Bacher, Gerd
    Circuit internal signal measurements with a needle sensor
    In: Microelectronics Reliability Jg. Vol. 45 (2005) Nr. 9-11, S. 1505 - 1508
    ISSN: 0026-2714
  • Hartmann, Claus; Mertin, Wolfgang; Bacher, Gerd
    Contactless current measurements using a needle sensor
    In: Ultramicroscopy Jg. Vol. 105 (2005) Nr. 1-4, S. 228 - 232
    ISSN: 0304-3991
  • Hartmann, Claus; Mertin, Wolfgang; Bacher, Gerd
    High AC-voltage sensitivity of a quartz needle sensor used in noncontact scanning force microscopy
    In: Applied Physics Letters Jg. Vol. 87 (2005) Nr. 21, S. 214104
    ISSN: 0003-6951; 1077-3118
  • Seifert, Frank; Weber, Rainer; Mertin, Wolfgang; Kubalek, Erich
    A new technique for contactless current contrast imaging of high frequency signals
    In: Microelectonics Reliability Jg. Vol. 43 (2003) Nr. 9-11, S. 1633 - 1638
    ISSN: 0026-2714
  • Behnke, Ulf; Klümper, Dirk; Mertin, Wolfgang
    Electric force microscopy testing of digital voltages using the heterodyne mixing technique
    In: Journal of Physics D: Applied Physics Jg. 36 (2003) Nr. 6, S. 748 - 752
    ISSN: 0022-3727; 1361-6463
  • Neinhüs, Marcus; Weber, Rainer; Behnke, Ulf; Mertin, Wolfgang; Kubalek, Erich; Breil, Raimund; Detje, Martin; Feltz, Albrecht
    Contactless current and voltage measurements in integrated circuits via a needle sensor
    In: Microelectronics Reliability Jg. Vol. 42 (2002) Nr. 9-11, S. 1695 - 1700
    ISSN: 0026-2714
  • Hartmann, Claus; Weber, Rainer; Mertin, Wolfgang; Kubalek, Erich; Müller, Anne-Dorothea; Hietschold, Michael
    Simultaneous IC-internal voltage and current measurements via a multi lever Scanning Force Microscope
    In: Microelectronics Reliability Jg. Vol. 42 (2002) Nr. 9-11, S. 1759 - 1762
    ISSN: 0026-2714
  • Behnke, Ulf; Mertin, Wolfgang; Kubalek, Erich
    Cross-talk in electric force microscopy testing of parallel sub-micrometer conducting lines
    In: Microelectronics Reliability Jg. Vol. 40 (2000) Nr. 8-10, S. 1401 - 1406
    ISSN: 0026-2714
  • Weber, Rainer; Mertin, Wolfgang; Kubalek, Erich
    Voltage-influence of biased interconnection line on integrated circuit-internal current contrast measurements via magnetic force microscopy
    In: Microelectronics Reliability Jg. Vol. 40 (2000) Nr. 8-10, S. 1389 - 1394
    ISSN: 0026-2714
  • Bae, Seong-Woo; Schiemann, Klaus; Mertin, Wolfgang; Kubalek, Erich; Maywald, Martin
    A new bifunctional topography and current probe for scanning force microscopy testing of integrated circuits
    In: Microelectronics Reliability Jg. Vol. 39 (1999) Nr. 6-7, S. 975 - 980
    ISSN: 0026-2714
  • Wittpahl, Volker; Ney, Christian; Behnke, Ulf; Mertin, Wolfgang; Kubalek, Erich
    Quantitative high frequency-electric force microscope testing of monolithic microwave integrated circuits at 20 GHz
    In: Microelectronics Relability Jg. Vol. 39 (1999) Nr. 6-7, S. 951 - 956
    ISSN: 0026-2714
  • Behnke, Ulf; Wand, B.; Mertin, Wolfgang; Kubalek, Erich
    Voltage contrast measurements on sub-micrometer structures with an electric force microscope based test system
    In: Microelectronics Reliability Jg. Vol. 39 (1999) Nr. 6-7, S. 969 - 974
    ISSN: 0026-2714
  • Mertin, Wolfgang; Leyk, A.; Novak, T.; David, G.; Jäger, Dieter; Kubalek, Erich
    Characterization of a MMIC by direct and indirect electro-optic sampling and by network analyzer measurements
    In: Microelectronic Engineering Jg. 24 (1994) Nr. 1-4, S. 377 - 384
    ISSN: 0167-9317
  • Taenzler, F.; Mertin, Wolfgang; David, Gerhard; Jäger, Dieter; Kubalek, Erich
    Experimental characterization of the perturbations of microwave devices by the electro-optic probe tip
    In: Microelectronic Engineering Jg. 24 (1994) Nr. 1-4, S. 123 - 130
    ISSN: 0167-9317
  • Beiträge in Sammelwerken und Tagungsbänden

  • Vinaji, Sasa; Bacher, Gerd; Mertin, Wolfgang
    Material and doping contrast in III/V nanowires probed by Kelvin probe force microscopy
    In: Nanoparticles from the gas phase: formation, structure, properties / Lorke, Axel; Winterer, Markus; Schmechel, Roland; Schulz, Christof (Hrsg.) 2012, S. 185 - 206
    ISBN: 978-3-642-28545-5; 978-3-642-28546-2
  • Yan, Liang; Punckt, Christian; Aksay, Ilhan A.; Mertin, Wolfgang; Bacher, Gerd; Ihm, Jisoon; Cheong, Hyeonsik
    Potential distribution in functionalized graphene devices probed by Kelvin probe force microscopy
    In: Physics of Semiconductors / Ihm, Jisoon; Cheong, Hyeonsik; 30th International Conference on the Physics of Semiconductors, 25-30 Jul 2010. Seoul, Korea 2011, S. 819 - 820
    ISBN: 978-0-7354-1002-2 ISSN: 1551-7616
  • Do, Quoc Thai; Katzer, Klaus Dieter; Martinez-Albertos, José Luis; Khorenko, Victor; Mertin, Wolfgang; Prost, Werner; Moore, Barry D.; Tegude, Franz-Josef
    A nanoparticle-coated nanocrystal-gate for an INP-based heterostructure field-effect transistor
    In: 16th International Conference on Indium Phosphide and Related Materials: Conference Proceedings / IPRM`04; Kagoshima, Japan; 31 May - 4 June 2004 2004, S. 435 - 438
    ISBN: 0-7803-8595-0
  • Mertin, Wolfgang
    Contactless probing of high-frequency electrical signals with scanning probe microscopy
    In: 2002 IEEE MTT-S International Microwave Symposium digest : June 2 - 7, 2002, Washington (Vol. 3) / Hamilton, Rob (Hrsg.) 2002, S. 1493 - 1496
    ISBN: 0-7803-7239-5
  • Boehm, Christoph; Otterbeck, Markus; Lipp, Stephan; Frey, L.; Reuter, Ralf; Leyk, A.; Mertin, Wolfgang; Tegude, Franz-Josef; Kubalek, Erich
    Design and characterization of integrated probes for millimeter wave applications in scanning probe microscopy
    In: Proceedings of the 1996 IEEE MTT-S International Microwave Symposium Digest / San Franscisco, USA; 17 - 21 June 1996 1996, S. 1529 - 1532
    ISBN: 0-7803-3246-6 ISSN: 0149-645X
  • Mertin, Wolfgang; Leyk, A.; David, Gerhard; Bertenburg, Ralf M.; Koßlowski, Stefan; Wolff, Ingo; Jäger, Dieter; Kubalek, Erich
    Two-dimensional mapping of amplitude and phase of microwave fields inside a MMIC using the direct electro-optic sampling technique
    In: Proceedings of the IEEE MTT-S International Microwave Symposium Digest / San Diego, USA; 23-27 May 1994 Jg. 3 1994, S. 1597 - 1600
    ISBN: 0780317793 ISSN: 0149-645X
  • David, Gerhard; Redlich, Stefan; Mertin, Wolfgang; Bertenburg, Ralf M.; Koblowski, S.; Tegude, Franz-Josef; Kubalek, Erich; Jäger, Dieter
    Two-dimensional direct electra-optic field mapping in a monolithic integrated GaAs amplifier
    In: 23rd European Microwave Conference / EuMA 1993; Madrid, Spain; 6 - 10 September 1993 1993, S. 497 - 499
  • David, G.; Redlich, S.; Mertin, Wolfgang; Bertenburg, Ralf M.; Koßlowski, S.; Tegude, Franz-Josef; Kubalek, Erich; Jäger, Dieter
    Two-dimensional direct electro-optic field mapping in a monolithic integrated GaAs amplifier
    In: Proceedings of the 23rd European Microwave Conference (EuMC'93) / EuMC'93, 10. September 1993, Madrid, Spain 1993, S. 497 - 499
  • Poster / Posterbeiträge

  • Mischke, Jan; Bekdüz, Bilge; Beckmann, Yannick; Meier, Johanna; Twellmann, Jonas; Weisenseel, Erik; Mertin, Wolfgang; Bacher, Gerd;
    Graphene growth on conductive and nonconductive substrates via plasma-enhanced CVD
    Materials Chain Workshop on 2D- and Hybrid Materials, 05.07.2019, Bochum, Germany,
    (2019)
  • Bekdüz, Bilge; Beckmann, Yannick; Meier, Johanna; Mischke, Jan; Twellmann, Jonas; Mertin, Wolfgang; Bacher, Gerd;
    Graphene growth at low temperatures via chemical vapor deposition
    CENIDE-Jahresfeier 2017, 15.11.2017, Duisburg,
    (2017)
  • Mischke, Jan; Bekdüz, Bilge; Mertin, Wolfgang; Bacher, Gerd;
    Plasma-enhanced chemical vapor deposition in a 4-inch reactor for the growth of graphene on metallic and non-metallic substrates
    Graphene Study: Hjortviken Konferens AB, 25.-30.06.2017, Hindås, Sweden,
    (2017)
  • Mischke, Jan; Bekdüz, Bilge; Mertin, Wolfgang; Bacher, Gerd;
    Plasma-enhanced chemical vapor deposition in a 4-inch reactor for the growth of graphene on metallic and non-metallic substrates
    CENIDE-Jahresfeier 2017, 15.11.2017, Duisburg,
    (2017)
  • Vorträge

  • Mischke, Jan; Weisenseel, Erik; Mertin, Wolfgang; Bacher, Gerd;
    Direct PE-CVD growth of graphene on GaN under N2 atmosphere
    9th Graphene 2019, 25.-28.06.2019, Rome, Italy,
    (2019)
  • Mischke, Jan; Pennings, Joel; Weisenseel, Erik; Mertin, Wolfgang; Bacher, Gerd;
    Direct PECVD growth of graphene on GaN under N2 atmosphere in a 4" cold-wall CVD reactor
    Graphene & 2DM Singapore Summit 2019, 11-12 November 2019, Singapore,
    Singapur (2019)
  • Bekdüz, Bilge; Twellmann, Jonas; Mischke, Jan; Mertin, Wolfgang; Bacher, Gerd;
    CVD growth of graphene at reduced temperatures
    The Second WIN-Cenide Reciprocal Workshop, 18.-21.6.2018, Waterloo, Canada,
    (2018)
  • Bekdüz, Bilge; Beckmann, Yannick; Mischke, Jan; Twellmann, Jonas; Mertin, Wolfgang; Bacher, Gerd;
    Defect-free graphene growth at low temperatures via plasma enhanced chemical vapor deposition
    MRS Fall Meeting & Exhibit, 26.11.-01.12.2018, Boston, Ma, USA,
    (2018)
  • Bekdüz, Bilge; Twellmann, Jonas; Mischke, Jan; Mertin, Wolfgang; Bacher, Gerd;
    Plasma enhanced CVD growth of graphene on Cu and Ge
    AiMES 2018 Meeting : Americas International Meeting on Electrochemistry and Solid State Science, 30.9.-4.10.2018, Cancun, Mexico,
    (2018)
  • Bekdüz, Bilge; Beckmann, Yannick; Meier, Johanna; Mischke, Jan; Twellmann, Jonas; Mertin, Wolfgang; Bacher, Gerd;
    CVD growth of graphene at reduced temperatures
    MiFun: Microstructural Functionality at the Nanoscale, 04.-06.10.2017, Duisburg,
    (2017)
  • Bekdüz, Bilge; Beckmann, Yannick; Meier, Johanna; Mischke, Jan; Twellmann, Jonas; Mertin, Wolfgang; Bacher, Gerd;
    CVD growth of graphene at reduced temperatures
    12th Graphene Week 2017, 24.-29.09.2017, Athens, Greece,
    (2017)
  • ; Regolin, Ingo; Gutsche, C.; Lysov, A.; Prost, Werner; Malek, Margarethe; Vinaji, S.; Mertin, Wolfgang; Bacher, Gerd; Offer, Matthias; Lorke, Axel; Tegude, Franz-Josef
    Axial doping profile in VLS grown GaAs:Zn nanowires
    13th European Workshop on Metalorganic Vapor Phase Epitaxy, 7. – 10. Juni 2009, Ulm, Germany,
    (2009)
  • David, G.; Redlich, S.; Mertin, Wolfgang; Tempel, R.; Kubalek, Erich; Wolff, I.; Jäger, Dieter;
    Electro-optical testing of MMICs
    24th General Assembly, August 25-September 2, 1993, Kyoto, Japan, 1993,
    Kyoto (1993)