RefDex RefDex

RefDex is a simulation tool for calculating the complex refractive index (n + ik) of thin films. Our motivation is to tackle "problem" samples, ones with rough surfaces, inhomogineities, etc.

Brief Overview

  • Uses reflection/transmission or ellipsometry measurements.
  • Simulations via the transfer matrix method
  • "Model Free" method, no model for the refractive index is assumed
  • Rough surfaces taken into account with scalar scattering theory
  • Inhomogeneous layers implemented through novel methods
  • More information: RefDex Presentation and RefDex Manual

 

When publishing results produced in wholey or in part by the use of RefDex, one of the following references should be cited as stipulated by the licence agreement ( de , en ):

  • P. Manley, G. Yin, M. Schmid “A method for calculating the complex refractive index of inhomogeneous thin films” Journal of Physics D: Applied Physics 47(20), 205301 (2014)
  • G. Yin, P. Manley, M. Schmid “Influence of substrate and its temperature on the optical constants of CuIn1-xGaxSe2 thin films” Journal of Physics D: Applied Physics 47(13), 135101 (2014)
  • G. Yin, C. Merschjann, M. Schmid “The effect of surface roughness on the determination of optical constants of CuInSe and CuGaSe thin films” Journal of Applied Physics 113, 213510 (2013)

 

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