RefDex is unique software that allows the refractive index (n, k) to be recalculated directly from the measured transmission and reflection of a thin film. Its particularity lies in its consideration of rough surfaces and interfaces, and we are sure that many interesting applications await its future use.

Since 2019, we have achieved over 200 downloads from more than 100 institutions worldwide!

Brief Overview

• Uses reflection/transmission or ellipsometry measurements
• Simulations via the transfer matrix method
• "Model Free" method, no model for the refractive index is assumed
• Rough surfaces taken into account with scalar scattering theory
• Inhomogeneous layers implemented through novel methods
• More information: RefDex Presentation and RefDex Manual

Terms of use

• A version for non-commercial user and for commercial user is available.
• When publishing results produced in wholey or in part by the use of RefDex, one of the following references should be cited as stipulated by the licence agreement ( de , en ):
  • P. Manley, G. Yin, M. Schmid “A method for calculating the complex refractive index of inhomogeneous thin films” Journal of Physics D: Applied Physics 47(20), 205301 (2014)
  • G. Yin, P. Manley, M. Schmid “Influence of substrate and its temperature on the optical constants of CuIn_1-xGa_xSe₂ thin films” Journal of Physics D: Applied Physics 47(13), 135101 (2014)
  • G. Yin, C. Merschjann, M. Schmid “The effect of surface roughness on the determination of optical constants of CuInSe and CuGaSe thin films” Journal of Applied Physics 113, 213510 (2013)

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