The Atomic Force Microscope (AFM) is an indispensable tool for nanoscience, enabling the visualization of surface structures with atomic precision and the characterization of physical properties directly at the nanometer scale. By combining high resolution with a variety of measurement modes, the system supports researchers in gaining a deeper understanding of the correlation between structure and material properties.

Functions

Information about: Topography, size, and height of nano-objects, as well as mechanical, chemical, and electronic/electrical properties on the nanometer scale.

Using the Bruker Dimension Icon / Dimension FastScan, surfaces can be imaged with high resolution and analyzed based on material-specific properties. In addition to topography, local mechanical (e.g., hardness, elasticity, adhesion), electrical (e.g., conductivity, surface potential), and chemically relevant contrasts can be determined. The FastScan mode allows for the investigation of rapid, dynamic processes; additional modules support Conductive-AFM (TUNA/pcAFM), KPFM, SSRM, QNM, as well as controlled measurements in liquid and gas environments at variable temperatures.

Materials

Inorganic and organic materials; measurements are recommended on smooth substrates (e.g., Si, glass, mica, coated substrates).

Performance Data

• Lateral resolution: < 20 nm

• Vertical resolution (Z): < 0.1 nm

• Scan area (XY): 90 µm × 90 µm (max.)

• Max. Z-range: 10 µm

• Image size: up to 5120 × 5120 pixels

• Available modes / extensions: PeakForce TUNA, pcAFM, PeakForce KPFM, PeakForce SSRM, PeakForce QNM (and others)

Special Features

• FastScan: For the investigation of dynamic processes

• Nanolithography / -manipulation: Allows for targeted modifications

• Environmental control: Liquid / gas flow cell

• Temperature control: -35 °C to 250 °C

• Precision: Motorized positioning stage with 3 µm resolution