Total device list
A practical overview of the available ICAN devicesDevices from A-Z
3
- 3D optical profilometer, Contact: Steffen Franzka | steffen.franzka[at]uni-due.de
- 3D X-ray microscopy (µCT/XRM), Contact: Verena Lukassek (ZBT) | v.lukassek[at]zbt.de
A
- Analytical centrifuge, Contact: ICAN | ican[at]uni-due.de
- Analytical ultracentrifuge, Contact: ICAN | ican[at]uni-due.de
- Atomic force microscopy, Contact: Steffen Franzka | steffen.franzka[at]uni-due.de
C
- Coating machine, Contact: ICAN | ican[at]uni-due.de
- Critical Point Dryer, Contact: Thai Binh Nguyen | thai.nguyen[at]uni-due.de
- Cross Section Polisher, Contact: Thai Binh Nguyen | thai.nguyen[at]uni-due.de
- Cryo-Ultramicrotome, Contact: Thai Binh Nguyen | thai.nguyen[at]uni-due.de
D
- Diamond saw, Contact: Thai Binh Nguyen | thai.nguyen[at]uni-due.de
- Diffractometer (XRD), Contact: Contact: ICAN | ican[at]uni-due.de
- Dimple grinder, Contact: Thai Binh Nguyen | thai.nguyen[at]uni-due.de
- Disc centrifuge (CPS), Contact: ICAN | ican[at]uni-due.de
E
- Electrolytical thinning, Contact: Thai Binh Nguyen | thai.nguyen[at]uni-due.de
- ESR spectrometer, Contact: ICAN | ican[at]uni-due.de
F
- Focused Ion Beam (FIB), Contact: Thai Binh Nguyen | thai.nguyen[at]uni-due.de
- Freeze-dryer, Contact: ICAN | ican[at]uni-due.de
- FTIR-spectrometer, Contact: ICAN | ican[at]uni-due.de
G
- Glow discharge spectrometer, Contact: ICAN | ican[at]uni-due.de
- Goniometer, Contact: Verena Lukassek (ZBT) | v.lukassek[at]zbt.de
H
- Helium pycnometer, Contact: Verena Lukassek (ZBT) | v.lukassek[at]zbt.de
- High performance cut-off machine, Contact: Thai Binh Nguyen | thai.nguyen[at]uni-due.de
I
- Ion Slicer, Contact: Thai Binh Nguyen | thai.nguyen[at]uni-due.de
L
- Laser flash analysis (LFA), Contact: Verena Lukassek (ZBT) | v.lukassek[at]zbt.de
M
- Mercury intrusion porosimetry (MIP), Contact: Verena Lukassek (ZBT) | v.lukassek[at]zbt.de
- Microwave spectroscope, Contact: ICAN | ican[at]uni-due.de
P
- Photoelectron spectroscope (XPS), Contact: Ulrich Hagemann | ulrich.hagemann[at]uni-due.de
- Physical Property Measurement System (PPMS), Contact: ICAN | ican[at]uni-due.de
- Plasmacleaner, Contact: Markus Heidelmann | markus.heidelmann[at]uni-due.de
- Polishing machine, Contact: Thai Binh Nguyen | thai.nguyen[at]uni-due.de
- Pore size analyzer (BET), Contact: ICAN | ican[at]uni-due.de
- Precision Ion Polishing System (PIPS), Contact: Thai Binh Nguyen | thai.nguyen[at]uni-due.de
- Pressure-dependent electrical resistance (Beppel test bench, self-built), Contact: Verena Lukassek (ZBT) | v.lukassek[at]zbt.de
- Profilometry, Contact: Steffen Franzka | steffen.franzka[at]uni-due.de
R
- Raman spectroscope, Contact: Ulrich Hagemann | ulrich.hagemann[at]uni-due.de
- Rheometer, Contact: ICAN | ican[at]uni-due.de
S
- Scanning augerelectron microscope, Contact: Ulrich Hagemann | ulrich.hagemann[at]uni-due.de
- Scanning electron microscope Jeol JSM 7500F (SEM), Contact: Contact: ICAN | ican[at]uni-due.de
- Spray Dryer, Contact: ICAN | ican[at]uni-due.de
- Sputter Coater, Contact: Thai Binh Nguyen | thai.nguyen[at]uni-due.de
- SQUID magnetometer, Contact: Contact: ICAN | ican[at]uni-due.de
- Stereo zoom microscope, Contact: Steffen Franzka | steffen.franzka[at]uni-due.de
- Systemmicroskope, Contact: Thai Binh Nguyen | thai.nguyen[at]uni-due.de
T
- Tensiometer, Contact: Verena Lukassek (ZBT) | v.lukassek[at]zbt.de
- Thermogravimetric analysis (TGA), Contact: Contact: ICAN | ican[at]uni-due.de
- Time-of-Flight secondary ion mass spectrometry, Contact: Nils Hartmann | nils.hartmann[at]uni-due.de
- Transmission electron microscope (TEM), Contact: Markus Heidelmann | markus.heidelmann[at]uni-due.de
U
- Ultrasonic Spray Coater, Contact: ICAN | ican[at]uni-due.de
- UV/Vis-spectrometer, Contact: Contact: ICAN | ican[at]uni-due.de
W
- Wet impact mill, Contact: ICAN | ican[at]uni-due.de
X
- X-ray fluorescence spectroscopy (XRF), Contact: Verena Lukassek (ZBT) | v.lukassek[at]zbt.de
Z
- Zetasizer, Contact: Contact: ICAN | ican[at]uni-due.de