Prof. Dr. Lorke's working group uses a FIB/SEM DualBeam™ microscope from FEI as a "nanoworkbench" for sample preparation on a nanometre scale. With this device, it is possible on the one hand - as with a classic scanning electron microscope (SEM) - to take images of samples with very high resolution and on the other hand to structure samples with the help of gallium ions. The abbreviation FIB stands for Focused Ion Beam. Both possibilities are combined here in one device.

Figure 1: Electron microscope image of a cross-section prepared with the ion beam through an electrode for a Li battery top view (left), view of the cross-section (right).

Figure 2: CENIDE lettering textured into a hair with the ion beam (subsequently coloured).

Figure 3: Hall measurement geometry structured with the ion beam from a nanoporous indium tin oxide film.