The Ion Slicer is used for the preparation of thin films using argon ion sputtering.

With this method samples for TEM-, STEM-, SEM- or SPM-investigations can be fabricated without the need for any chemicals.

The argon ions have a small incident angly onto the sample surface, minimizing radiation damage and amorphisation.

The sample can be tiltes by 30°, to achieve a homogenously polished area.