AG Wucher - Veröffentlichungen
| 205. |
A concept to generate ultrashort ion pulses for pump-probe experiments in the keV energy range Breuers, A., Herder, M., Kucharczyk, P., Schleberger, M., Sokolowski-Tinten, K., Wucher, A., New J. Phys. 21 (2019) |
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| 204. |
Ionization probability of sputtered indium under irradiation with 20-keV fullerene and argon gas cluster projectiles Wucher, A., Breuer, L., Winograd, N., Int. J. Mass Spectrom. 438 (2019) 13-21 |
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| 203. |
Molecular SIMS ionization probability studied with laser post-ionization: influence of the projectile cluster Breuer, L., Tian, H., Wucher, A., Winograd, N., J Phys Chem C, in press |
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| 202. |
Cluster induced sputtering of gold atoms and clusters investigated by strong-field laser post-ionization Wucher, A., Breuer, L., Tian, H., Winograd, N., to be published |
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| 201. |
Molecular secondary ion formation during electronic sputtering of coronene under swift heavy ion bombardment Wucher, A., Breuer, L., Herder, M., Bender, H., Severin, D., to be published |
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| 200. |
Molecular ionization probability in cluster-SIMS Wucher, A, J Vac Sci Technol B, 36-3 (2018) 03F123 |
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| 199. |
The influence of internal and external electric fields on the transport of energetic electrons in nanostructures Marpe, M., Wucher, A., Diesing, D., J Electron Spectrosc 227 (2018) 51-68 |
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| 198. |
Transport of 75–1000 eV electrons in metal–insulator–metal devices Marpe, M., Wucher, A., Diesing, D. J Electron Spectrosc 223 (2018) 37–52 |
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| 197. |
Computer simulation of sputtering induced by swift heavy ions Kucharczyk, P., Füngerlings, A., Weidtmann, B., Wucher, A., Nucl Instrum Meth B 426 (2018) 5-12 |
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| 196. |
Secondary ion formation on indium under nuclear and electronic sputtering conditions Herder, M., Ernst, P., Breuer, L., Bender, M., Severin, D., Wucher, A., J Vac Sci Technol A, 36-3 (2018) 03F110 |
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| 195. |
Ionization probability of sputtered coronene molecules Herder, M., Breuer, L., Bender, M., Severin, D., Wucher, A., Nucl Instrum Meth B 460, (2019) 193-200 |
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| 194. |
A ballistic transport model for electronic excitation following particle impact Hanke, S., Heuser, C., Weidtmann, B., Wucher, A., Nucl Instrum Meth B 415 (2018) 127-135 |
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| 193. |
Secondary ion formation during electronic and nuclear sputtering of Germanium Breuer, L., Ernst, P., Herder, M, Meinerzhagen, F., Bender, M., Severin, D., Wucher, A Nucl Instrum Meth B, 24 (2018) 1-9 |
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| 192. |
Ion induced electron emission statistics under Agm- cluster bombardment of Ag Breuers, A., Penning, R., Wucher, A., Nucl Instrum Meth B,422 (2018) 24-30 |
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| 191. |
Mass spectrometric investigation of material sputtered under swift heavy ion bombardment Breuer, L., Ernst, P., Herder, M., Meinerzhagen, F., Bender, M.,Severin, D.,Wucher, A., Nucl Instrum Meth B, (2018) in press |
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| 190. |
Effect of SIMS ionization probability on depth resolution for organic/inorganic interfaces Popczun, N. J., Breuer, L.,Wucher, A., Winograd, N., Surf. Interface Anal, 49-10 (2017) 933-939 |
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| 189. |
Ionization Probability in Molecular Secondary Ion Mass Spectrometry: Protonation Efficiency of Sputtered Guanine Molecules Studied by Laser Postionization Popczun, N. J.,Breuer, L.,Wucher, A., Winograd, N. J Phys Chem C 121-19 (2017) 8931-8937 |
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| 188. |
On the SIMS Ionization Probability of Organic Molecules Popczun, Nicholas J., Breuer, Lars, Wucher, Andreas, Winograd, Nicholas, J Am Soc Mass Spectr (2017) 1-10 |
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| 187. |
Reducing the Matrix Effect in Organic Cluster SIMS Using Dynamic Reactive Ionization Tian, H., Wucher, A., Winograd, N. J Am Soc Mass Spectr 27-12 (2016) 2014-2024 |
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| 186. |
Reduce the matrix effect in biological tissue imaging using dynamic reactive ionization and gas cluster ion beams Tian, H., Wucher, A., Winograd, N., Biointerphases 11-2 (2016) |
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| 185. |
SHIPS: A new setup for the investigation of swift heavy ion induced particle emission and surface modifications Meinerzhagen, F., Breuer, L., Bukowska, H., Herder, M., Bender, M., Severin, D., |
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| 184. |
Reducing the matrix effect in molecular depth profiling by laser post-ionization Breuer, L., Popczun, N., Wucher, A., Winograd, N J. Phys. Chem. C (2017), 121, 19705−19715 |
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| 183. |
Secondary ion and neutral mass spectrometry with swift heavy ions: Organic molecules Breuer, L., Meinerzhagen, F., Herder, M., Bender, M., Severin, D., Lerach, J. O., Wucher, A., J Vac Sci Technol B 34-3 (2016) 03H130 |
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| 182. |
Dynamic Reactive Ionization with Cluster Secondary Ion Mass Spectrometry Tian, H., Wucher, A., Winograd, N., J Am Soc Mass Spectr 27-2 (2015) 285-292 |
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| 181. |
Molecular Depth Profiling with Argon Gas Cluster Ion Beams Shen, K.,,Wucher, A., Winograd, N., J Phys Chem C 119-27 (2015) 15316-15324 |
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| 180. |
Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study Shard, Alexander G., Havelund, Rasmus, Spencer, Steve J., Gilmore, Ian S., Alexander, Morgan R., Angerer, Tina B., Aoyagi, Satoka, Barnes, Jean-Paul, Benayad, Anass, Bernasik, Andrzej, Ceccone, Giacomo, Counsell, Jonathan D. P., Deeks,Christopher, Fletcher, John S., Graham, Daniel J., Heuser, Christian, Lee, Tae, Geol, Marie, Camille, Marzec, Mateusz M., Mishra, Gautam, Rading, Derk,Renault, Olivier, Scurr, David J., Shon, Hyun Kyong, Spampinato, Valentina, Tian, Hua, Wang, Fuyi, Winograd, Nicholas, Wu, Kui, Wucher, Andreas, Zhou, Yufan, Zhu, Zihua, J. Phys. Chem. A 119-33 (2015) 10784-10797 |
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| 179. |
A hybrid model describing ion induced kinetic electron emission Hanke, S., Duvenbeck, A., Heuser, C., Weidtmann, B., Wucher, A., Nucl Instrum Meth B,352 (2015) 18-21 |
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| 178. |
Time-of-flight secondary neutral & ion mass spectrometry using swift heavy ions Breuer, L., Meinerzhagen, F., Bender, M., Severin, D., Wucher, A., Nucl Instrum Meth B, 365, Part B (2015) 482-489 |
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| 177. |
Secondary ion & neutral mass spectrometry using swift heavy ions Breuer, L., Meinerzhagen, F., Bender, M., Severin, D., Wucher, A, Nucl Instrum Meth B (2015) in press |
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| 176. |
A mixed cluster ion beam to enhance the ionization efficiency in molecular secondary ion mass spectrometry Wucher, A., Tian, H., Winograd, N., Rapid Commun Mass Sp; 28-4 (2014) 396-400 |
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| 175. |
Does local disorder influence secondary ion formation? Weidtmann, B., Duvenbeck, A., Wucher, A., Surf. Interface Anal; 46 (2014) 18-21 |
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| 174. |
Molecular imaging of biological tissue using gas cluster ions Tian, H., Wucher, A., Winograd, N.Surf. Interface Anal; 46 (2014) 115-117 |
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173. |
Strong field photoionization of ß-estradiol between 1200 nm and 2000 nm: Strategies to optimize molecular post-ionization in Secondary Neutral Mass Spectrometry Kucher, A., Wucher, A., Winograd, N., J. Am. Chem. Soc., submitted (2014) |
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172. |
Formation of neutral InnCm clusters under C60 ion bombardment of indium Breuer, L. Kucher, A., Herder, M., Wucher, A., Winograd, N. J. Phys. Chem. A submitted (2014) |
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171. |
A microscopic view of secondary ion formation Wucher, A., Weidtmann, B., Duvenbeck, A., Nucl Instrum Meth B 303-0 (2013) 108-111 |
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170. |
Three-Dimensional Imaging with Cluster Ion Beams Wucher, A., Fisher, G. L., Mahoney, C. M., ., in: Cluster Secondary Ion Mass Spectrometry, Ed. Mahoney, C. M , Wiley (2013) 207-246 |
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169. |
Molecular Depth Profiling with Cluster Ion Beams Mahoney, C. M., Wucher, A., in: Cluster Secondary Ion Mass Spectrometry, Ed. Mahoney, C. M , Wiley (2013) 117-205 |
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168. |
Laser postionization - fundamentals Wucher, A., in: TOF-SIMS: Materials analysis by mass spectrometry (IM Publications and SurfaceSpectra) ed. Vickerman, J.C.; Briggs, D. 8-2 (2013) 217-246 |
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167. |
Computer simulation of cluster impact induced electronic excitation of solids Weidtmann, B., Hanke, S., Duvenbeck, A., Wucher, A., Nucl Instrum Meth B 303-0 (2013) 51-54 |
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166. |
Molecular depth profiling Shard, A.G., Gilmore, I. S., Wucher, A., in: TOF-SIMS: Materials analysis by mass spectrometry (IM Publications and SurfaceSpectra), Ed. J. Vickerman, 12 (2013) 311-334 |
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165. |
Computer simulation of internal electron emission in ion-bombarded metals Hanke, S.; Duvenbeck, A.; Heuser, C.; Weidtmann, B.; Diesing, D.; Marpe, M.; Wucher, A. . Nucl Instrum Meth B 303-0 (2013) 55-58 |
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164. |
An experimental and theoretical view of energetic C-60 cluster bombardment onto molecular solids Brenes, D. A.; Postawa, Z.; Wucher, A.; Blenkinsopp, P.; Garrison, B. J.; Winograd, N. Surf. Interface Anal; 45-1 (2013) 50-53 |
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| 163. |
Ionization probability of sputtered indium atoms: Dependence on projectile impact angle Mai, M., Weidtmann, B., Marpe, M., Wucher, A., Nucl Instrum Meth B 317(2013) 130-136 |
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162. |
A statistical interpretation of molecular delta layer depth profiles Wucher,A., Krantzman,K.D., Lu,C., Winograd,N., Surf. Interface Anal (2012) |
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161. |
A statistical approach to delta layer depth profiling Wucher A., Krantzman,K.D., Surf. Interface Anal., 44-9 (2012) 1243-1248 |
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160. |
The role of electron temperature dynamics for secondary ion formation Weidtmann,B., Hanke,S., Duvenbeck,A., Wucher,A. Surf. Interface Anal. (2012) |
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159. |
Ionization probabilities of sputtered indium atoms under atomic and polyatomic Aum- ion bombardment Samartsev,A.V. Heuser,C. Wucher,A., Interface Anal. 45 (2012) 87-89 |
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158. |
Steady-State Statistical Sputtering Model for Extracting Depth Profiles from Molecular Dynamics Simulations of Dynamic SIMS Paruch, R. J., Postawa, Z., Wucher, A., Garrison, B. J., J. Phys. Chem. C 116-1 (2012) 1042-1051 |
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157. |
Cluster Secondary Ion Mass Spectrometry and the Temperature Dependence of Molecular Depth Profiles Mao,D., Wucher,A., Brenes,D.A., Lu,C., Winograd,N. Anal Chem. (2012) |
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156. |
Temperature effects of sputtering of Langmuir–Blodgett multilayers Mao D, Brenes D, A., Lu C., Wucher A., Winograd, N., Surf. Interface Anal. (2012) |
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155. |
Investigations of molecular depth profiling with dual beam sputtering Lu, C., Wucher, A., Winograd, N., Surf. Interface Anal. (2012) |
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154. |
Ionization probabilities of sputtered indium atoms under atomic and polyatomic Aum- ion bombardment Samartev, A: V., Heuser, C., Wucher, A., Surf. Interface Anal. (2012) |
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153. |
Temperature effects in the sputtering of a molecular solid by energetic atomic and cluster projectiles Brenes, D, A.,Willingham D, Winograd, N, Wucher, A, Surf. Interface Anal. (2011), 43, 78–80 |
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152. |
Fluid Flow and Effusive Desorption: Dominant Mechanisms of Energy Dissipation after Energetic Cluster Bombardment of Molecular Solids Brenes, D., A., Garrison, B., J., Winograd, N., Postawa, Z., Wucher, A.,Blenkinsopp, P., J. Phys. Chem. Lett. (2011), 2, 2009–2014 |
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151. |
Molecular Depth Profiling of Buried Lipid Bilayers Using C60-Secondary Ion Mass Spectrometry Lu, C., Wucher, A., Winograd, N., Anal Chem. 83 1 (2011) 351-358 |
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150. |
Ionization effects in molecular depth profiling of trehalose films using buckminsterfullerene (C60) cluster ions Lu, C., Wucher, A., Winograd, N., Surf. Interface Anal. . 43 1-2 (2011) 99 |
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149. |
Fundamental studies of molecular depth profiling using organic delta layers as model systems Lu, C., Wucher, A., Winograd, N., Surf. Interface Anal. . 43 1-2 (2011) 81 |
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148. |
Molecular depth profiling by wedged crater beveling Mao, D., Lu, C., Winograd, N., Wucher, A., Anal Chem, 83 (2011) 6410 -6417 |
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147. |
Internal electron emission in metal-insulator-metal thin film tunnel devices bombarded with keV argon and gold-cluster projectiles Marpe, M., Heuser, C., Diesing, D., Wucher, A., Nuclear Instruments & Methods in Physics Research B.,269 (2011), 972 – 976 |
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146. |
Steady-state statistical sputtering model for extracting depth profiles from molecular dynamics simulations of dynamic SIMS Paruch, R, Postawa, Z, Wucher, A, Garrison, B. J., Journal of Physical Chemistry (2011) |
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145. |
Depth Profiling of Anodic Tantalum Oxide Films with Gold Cluster Ions Poerschke, D, Wucher, A, Surf. Interface Anal. 43 1-2 (2011) 171-174 |
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144. |
Influence of the polar angle of incidence on secondary ion formation in self-sputtering of silver Weidtmann, B, Hanke, S, Duvenbeck, A, Wucher, A, Surf. Interface Anal. 43 1-2 (2011) 24 |
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143. |
Investigating the fundamentals of molecular depth profiling using strong-field photoionization of sputtered neutrals Willingham D, Surf. Interf. Anal 43 (2011), 45 – 48 |
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142. |
A statistical model describing delta layer sputter depth profiles Wucher, A. , Kranztman, KD, Surface and Interface Analysis (2012) |
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141. |
Retrospective sputter depth profiling using 3D mass spectral imaging techniques Zheng,L., Wucher,A.; Winograd N., Applied Surface Science (2011), 41 |
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140. |
Predicting Kinetic Electron Emission in MD-Simulations of Atomic Collision Cascades Duvenbeck,A; Wucher,A. Physical Review B, (2010), 5715-5720 |
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139. |
Fluence Effects in C60 bombardment of Silicon Krantzman,K.D.; Wucher,A., Journal of Physical Chemistry C, (2010), 5480-5490 |
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138. |
Influence of the polar angle of incidence on secondary ion formation in self-sputtering silver Weidtmann,B.; Hanke,S.; Duvenbeck,A; Wucher,A., Surface and Interface Analysis |
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137. |
Strong field photoionization of neutrals and the fundamentals of molecular depth profiling Willingham,D.; Wucher,A.; Winograd,N., Journal of Chemical Physics, (2010), 5391-5399 |
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136. |
Kinetic excitation of solids induced by energetic particle bombardment: Influence of impact angle Heuser,C.; Marpe,M.; Diesing,D.; Wucher,A., Nuclear Instruments & Methods in Physics Research B., (2009), 601-604 |
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135. |
The influence of projectile charge state on ionization probabilities of sputtered atoms Meyer,S.; Wucher,A. Nuclear Instruments & Methods in Physics Research B, (2009), 646, 648 |
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134. |
HICS: Highly charged ion collisions with surfaces Peters,T.; Haake,C.; Hopster,J.; Sokolovsky,V.; Wucher,A.; Schleberger,M. Nuclear Instruments & Methods in Physics Research B, (2009), 687-690 |
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133. |
Crystallographic effects in the kinetic excitation of metal surfaces: A computational study Weidtmann,B.; Duvenbeck,A.; Hanke,S.; Wucher,A., Nuclear Instruments & Methods in Physics Research B, (2009), 598-600 |
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132. |
Molecular sputter depth profiling using carbon cluster beams Wucher,A.; Winograd,N., (2010), Analytical and Bioanalytical Chemistry, 105-114 |
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131. |
Retrospective sputter depth profiling using 3D mass spectral imaging techniques Zheng,L.; Wucher,A.; Winograd,N., (2011), Surface and Interface Analysis 43, 41-44 |
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130. |
Predicting Secondary Ion Formation in Molecular Dynamics Simulations of Sputtering Weidtmann,B.; Duvenbeck,A; Wucher,A., (2008), Applied Surface Science 813-815 |
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129. |
Three-dimensional Molecular Imaging using Mass Spectrometry and Atomic Force Microscopy Wucher,A.; Cheng,J.; Zheng,L.; Willingham,D.; Winograd,N.,(2008), Applied Surface Science, 984-986 |
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| 128. | On the internal energy of sputtered clusters A. Wucher, C. Staudt, S. Neukermans, E. Janssens, F. Vanhoutte, R.E. Silverans, P. Lievens, New J. Phys.10 (2008), 103007-103007-22 |
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| 127. | Molecular Depth Profiling using a C60 Cluster Beam: the Role of Impact Energy A. Wucher, J. Cheng and N. Winograd, Anal. Chem. 112 2008, 16550-16555 |
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| 126. | A simple erosion dynamics model of molecular sputter depth profiling A. Wucher, Surf. Interf. Anal.40 (2008), 1545-1551 |
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| 125. | Kinetic electron excitation of solids induced by fast particle bombardment S. Meyer, C. Heuser, D. Diesing and A. Wucher, Phys. Rev. B 78 (2008), 035428 (1-13) |
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| 124 | Molecular depth profiling of trehalose using a C60 cluster ion beam A. Wucher, J. Cheng and N. Winograd, Appl. Surf. Sci. 255 (2008), 959-961 |
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| 123. | Fundamental Studies of Molecular Depth Profiling and 3-D Imaging using Langmuir-Blodgett Films as a Model L. Zheng, A. Wucher and N. Winograd, Appl. Surf. Sci. 255 (2008), 816-818 |
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| 122. | Depth resolution during C60+ profiling of multilayer molecular films L. Zheng, A. Wucher and N. Winograd, Anal. Chem. 80 (2008), 7363-7371 |
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| 121. | Modeling hot electron generation induced by electron promotion in atomic-collision cascades in metals A. Duvenbeck, B. Weidtmann, O. Weingart and A. Wucher, Phys. Rev. B 77 (2008) 245444 (1-7) |
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| 120. | Hot electrons induced by cold multiply charged ions T. Peters, C. Haake, D. Diesing, D. Kovacs, A. Golczewski, G. Kowarik, F. Aumayr, A. Wucher and M. Schleberger, New J. Phys. 10 (2008), 073019 (1-8) |
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| 119. | Formation of atomic secondary ions in sputtering A. Wucher, Appl. Surf. Sci. 255 (2008), 1194-1200 |
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| 118. | Predicting secondary ion formation in molecular dynamics simulations of sputtering B. Weidtmann, A. Duvenbeck and A. Wucher, Appl. Surf. Sci 255 (2008), 813-815 |
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| 117. | Energy Deposition during Molecular Depth Profiling Experiments with Cluster Ion Beams J. Kozole, A. Wucher and N. Winograd, Anal. Chem. 80 (2008), 5293-5301 |
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| 116. | Potential electron emission induced by multiply charged ions in thin film junnel junctions D. A. Kovacs, T. Peters, C. Haake, M.Schleberger, A. Wucher, A. Golczewski, F. Aumayr, D. Diesing, Phys. Rev. B 77 (2008) 77 245432 (1-11) |
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| 115. | Photo and particle induced transport of excited carriers in thin film tunnel junctions D. A. Kovacs, J. Winter, S. Meyer, A. Wucher and D. Diesing, Phys. Rev. B 76(2007) 235408 (1-12) |
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| 114. | Protocols for Three-Dimensional Molecular Imaging using Mass Spectrometry A. Wucher, J. Cheng and N. Winograd, Anal. Chem. 79 (2007) 5529-5539 |
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| 113. | The role of electronic friction of low-energy recoils in atomic collision cascades A. Duvenbeck, O. Weingart, V. Buss, A. Wucher, Nucl. Instr. Meth. B. 258 (2007) 83-86 |
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| 112. | Electron promotion and electronic friction in atomic collision cascades A. Duvenbeck, O. Weingart, V. Buss, A. Wucher, New J. Phys. 9 (2007) 38 (1-19) |
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| 111. | On the role of electronic friction and electron promotion in kinetic excitation of solids A. Duvenbeck, O. Weingart, V. Buss, A. Wucher, Nucl. Instr. Meth. B. 255 (2007) 281-285 |
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| 110. | Sputtering: Experiment A. Wucher, K. Dan. Vidensk. Selsk, Mat. Fys. Medd. 52 (2007) 405-432 |
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| 109. | Kinetic excitation of solids: The concept of electronic friction M. Lindenblatt, E. Pehlke, A. Duvenbeck, B. Rethfeld, A. Wucher, Nucl. Instr. Meth. B. 246 (2006) 333-339 |
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| 108. | Molecular secondary ion formation under cluster bombardment: A fundamental review A. Wucher, Appl. Surf. Sci. 252 (2006) 6482-6489 |
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| 107. | Kinetic energy distributions of neutral In and In2 sputtered by polyatomic ion bombardment A.V. Samartsev and A. Wucher, Appl. Surf. Sci. 252 (2006) 6470-6473 |
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| 106. | Chemically alternating Langmuir-Blodgett thin films as a model for molecular depth profiling by mass spectrometry J. Zheng, A. Wucher and N. Winograd, J. Am. Soc. Mass. Spectrom. 19 (2007) 96-102 |
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| 105. | Molecular Depth Profiling with Cluster Ion Beams J. Cheng, A. Wucher and N. Winograd, J. Phys. Chem. B. 110 (2006) 8329-8336 |
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| 104. | Yields and ionization probabilities of sputtered Inn particles under atomic and polyatomic Aum ion bombardment A.V. Samartsev and A. Wucher Appl. Surf. Sci. 252 (2006) 6474-6477 |
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| 103. | Determination of energy dependent ionization probabilities for sputtered particles P. Mazarov, A.V. Samartsev and A. Wucher, Appl. Surf. Sci. (2006) 6452-6455 |
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| 102. | Low energy electronic excitation in atomic collision cascades: a nonlinear transport model A. Duvenbeck and A. Wucher, Phys. Rev. B 72 (2005) 165408 (1-9) |
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| 101. | Energetic Ion Bombardment of Ag Surfaces by C+60 and Ga+ Projectiles S. Sun, C. Szakal, A. Wucher and N. Winograd, J. Am. Soc. Mass. Spectrom. 16 (2005) 1677-1686 |
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| 100. | Laser post-ionization secondary neutral mass spectrometry for ultra-trace analysis of samples from space return missions I.V. Veryovkin, W.F. Calaway, C.E Tripa, J.F. Moore, A. Wucher, M.J. Pellin, Nucl. Instrum. Methods B 241 (2005) 356-360 |
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| 99. | Sputtering of Indium using Aum Projectiles: Transition from Linear Cascade to Spike Regime A.V. Samartsev, A. Duvenbeck and A. Wucher, Phys. Rev. B 72 (2005) 115417 (1-10) |
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| 98. | The use of MIM tunnel junctions to investigate kinetic electron excitation in atomic collision cascades S. Meyer, D. Diesing, A. Wucher, Nucl. Instr. Meth. B 230, 608-612 |
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| 97. | Molecular Depth-Profiling of Histamine in Ice using a Backmininster fullerence probe A. Wucher, S. Sun, C. Szakal, N. Winograd, Anal. Chem. 76 (2004) 7234-7242 |
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| 96. | Self Sputtering Yields of Silver under Bombardment with polyatomic Projectiles A. Duvenbeck, M. Lindenblatt, A. Wucher, Nucl. Instr. Meth. B 228 (2005) 170-175 |
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| 95. | Electronic Excitation in Atomic Collision Cascades A. Duvenbeck, Z. Sroubek, A. Wucher, Nucl. Instr. Meth. B 228 (2005) 325-329 |
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| 94. | Depth-Profiling of Langmuir-Blodgett Films with a Buckminsterfullerene Probe A. G. Sostarecz, C. M. McQuaw, A. Wucher, N. Winograd, Anal. Chem. 76 (2004) 6651-6658 |
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| 93. | Kinetic electron excitation in atomic collision cascades S. Meyer, D. Diesing, A. Wucher, Phys. Rev. Lett. 93 (2004) 137601 (1-4) |
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| 92. | The Use of C60 Cluster Projectiles for Sputter Depth Profiling of Polycrystalline Metals S. Sun, C. Szakal, T. Roll, P. Mazarov, A. Wucher, N. Winograd, Surf. Interface Anal. 36 (2004) 1367-1372 |
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| 91. | Cluster Formation at Metal Surfaces under Bombardment with SFm+(m = 1,..,5) and Ar+ Projectiles S. Ghalab, A. Wucher, Nucl. Instr. Meth. B 226 (2004) 264-273 |
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| 90. | Computer simulation of low-energy electronic excitations in atomic collision cascades A. Duvenbeck, F. Sroubek, Z. Sroubek, A. Wucher, Nucl. Instr. Meth. B 225 (2004) 464-477 |
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| 89. | C60 Molecular Depth Profiling of a Model Polymer C. Szakal, S. Sun, A. Wucher and N. Winograd, Appl. Surf. Sci. 231-232 (2004) 183-185 |
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| 88. | Depth Profiling Studies of Multilayer Films with a C60+ Ion Source A. Sostarecz, S. Sun, A. Wucher and N. Winograd, Appl. Surf. Sci. 231-232 (2004) 179-182 |
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| 87. | Depth Profiling of Polycrystalline Multilayers using a Buckminsterfullerene Projectile S. Sun, A. Wucher, C. Szakal, N. Winograd, Appl. Phys. Lett. 84 (2004) 5177-5179 |
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| 86. | Sputtering of Ag under C60+ and Ga+ Projectile Bombardment S. Sun, C. Szakal, E. J. Smiley, Z. Postawa, A. Wucher, B. J. Garrison, N. Winograd, Appl. Surf. Sci. 231-232 (2004) 64-67 |
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| 85. | Sputtering of Indium Using Polyatomic Projectiles A. V. Samartsev, A. Wucher, Appl. Surf. Sci. 231/232 (2004) 191-195 |
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| 84. | Molecular Depth Profiling in Ice Matrices Using C60 Projectiles A. Wucher, S. Sun, N. Winograd, Appl. Surf. Sci. 231/232 (2004) 68-71 |
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| 83. | Molecule-specific imaging with mass spectrometry and a buckminsterfullerene probe: Application to characterizing solid-phase synthesized combinatorial libraries J. Y. Xu, C. W. Szakal, S. E. Martin, B. R. Peterson, A. Wucher; N. J. Winograd, J. Am. Chem. Soc. 126 (2004) 3902-3909 |
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| 82. | Formation of excited Ag atoms in sputtering of silver Z. Sroubek, F. Sroubek, A. Wucher and Y. Yarmoff, Phys. Rev. B 68 (2003), 115426 (1-5) |
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| 81. | Laser Desorption Imaging of Proteins from Ice via UV Femtosecond Laser Pulses J. I. Berry, S. Sun, Y. Dou, A. Wucher, N. Winograd, Anal. Chem. 75 (2003) 5146-5151 |
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| 80. | Ionization Probability of Atoms and Molecules sputtered from a Cesium covered Silver Surface S. Meyer, C. Staudt, A. Wucher, Appl. Surf. Sci. 203/204 (2003) 48-51 |
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| 79. | Projectile Size Effects on Cluster Formation in Sputtering R. Heinrich and A. Wucher, Nucl. Instr. Meth. B 207 (2003), 136-144 |
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| 78. | Formation of Sputtered Silver Clusters under Bombardment with SF5+ Ions S. Ghalab, C. Staudt, S.E. Maksimov, P. Mazarov, V.I. Tugushev, N. Kh. Dzhemilev and A. Wucher, Nucl. Instr. Meth. B 197 (2002), 43-48 |
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| 77. | Sputtering of Ag atoms into Metastable Excited States C. Staudt, A. Wucher, J. Bastiaansen, V. Philipsen, E. Vandeweert, P. Lievens, R.E. Silverans and Z. Sroubek, Phys. Rev. B 66 (2002), 085415 (1-12) |
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| 76. | Generation of Large Indium Clusters by Sputtering C. Staudt and A. Wucher, Phys. Rev. B 66 (2002), 075419 (1-12) |
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| 75. | Self Sputtering of Silver under Bombardment with Polyatomic Projectiles R. Heinrich and A. Wucher, Nucl. Instr. Meth. B 193 (2002), 781-786 |
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| 74. | Internal Excitation of Sputtered Neutral Indium Clusters C. Staudt, A. Wucher, S. Neukermans, E. Janssens, F. Vanhoutte, E. Vandeweert R.E. Silverans and P. Lievens, Nucl. Instr. Meth. B 193 (2002), 787-793 |
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| 73. | Laser Postionization: Fundamentals A. Wucher in ToF-SIMS: Surface Analysis by mass spectrometry, Ed. J. C. Vickerman, D. Briggs, IM Publications and Surface Spectra 2001, 347-374 |
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| 72. | Formation of Clusters in Sputtering A. Wucher, Izvestja Academnii Nauk Ser.Fys. 66 (2002), 499-508 |
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| 71. | Self-sputtering of silver by mono- and polyatomic projectiles: A molecular dynamics investigation M. Lindenblatt, R. Heinrich, A. Wucher and B. J. Garrison, J.Chem.Phys. 115 (2001), 8643-8654 |
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| 70. | Formation of Sputtered Clusters: A Multistep Model N. Kh. Dzhemilev and A. Wucher, "Secondary Ion Mass Spectrometry SIMS XII" (Proceedings of 12th International Conference on Secondary Ion Mass Spectrometry, Louvain-la-Neuve, Belgium 1999), Ed. P. Bertrand, A. Benninghoven, H.W. Werner, Elsevier, Amsterdam 2000, p. 157-160 |
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| 69. | Ionization Probability of Sputtered Clusters R. Heinrich, C. Staudt, M. Wahl and A. Wucher, "Secondary Ion Mass Spectrometry SIMS XII" (Proceedings of 12th International Conference on Secondary Ion Mass Spectrometry, Louvain-la-Neuve, Belgium 1999), Ed. P. Bertrand, A. Benninghoven, H.W. Werner, Elsevier, Amsterdam 2000, p. 111-114 |
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| 68. | A Method for Quantitative Determination of Secondary Ion Formation Probabilities A. Wucher, R. Heinrich and C. Staudt, "Secondary Ion Mass Spectrometry SIMS XII" (Proceedings of 12th International Conference on Secondary Ion Mass Spectrometry, Louvain-la-Neuve, Belgium 1999), Ed. P. Bertrand, A. Benninghoven, H.W. Werner, Elsevier, Amsterdam 2000, p. 143-146 |
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| 67. | Temperature Dependence of Sputtered Cluster Yields C. Staudt, R. Heinrich, P. Mazarov, A. Wucher, V.I. Tugushev and N. Kh. Dzhemilev, "Secondary Ion Mass Spectrometry SIMS XII" (Proceedings of 12th International Conference on Secondary Ion Mass Spectrometry, Louvain-la-Neuve, Belgium 1999), Ed. P. Bertrand, A. Benninghoven, H.W. Werner, Elsevier, Amsterdam 2000, p. 169-172 |
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| 66. | Cluster Formation under Bombardment with Polyatomic Projectiles R. Heinrich and A. Wucher, Nucl. Inst. Meth. B 164-165 (2000), 720-726 |
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| 65. | Formation of Large Clusters during Sputtering of Metal Surfaces C. Staudt, R. Heinrich and A. Wucher, Nucl. Instr. Meth. B 164-165 (2000), 677-686 |
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| 64. | On the Temperature Dependence of sputtered Cluster Yields C. Staudt, R. Heinrich, P. Mazarov, A. Wucher, V. I. Tugushev, N. Kh. Dzhemilev, Nucl. Instr. Meth. B 164-165 (2000), 715-719 |
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| 63. | Microanalysis with Secondary Ion and Secondary Neutral Mass Spectrometry H. Gnaser, H. Oechsner and A. Wucher in Surface Analysis of Glasses and Glass Ceramics – Science, Technology and Applications, ed. H. Bach, D. Krause (Springer Berlin, in preparation) |
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| 62. | Effects of oxygen dosing on Ca cluster yields and energy distributions C.S. Hansen, W.F. Calaway, M.J. Pelling. B.V. King, A. Wucher: Surf. Sci. 432 (1999), 199-210 |
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| 61. | Detection of Large Neutral Clusters in Sputtering C. Staudt and A. Wucher, Proceedings of the International Conference on Resonance Ionization Spectroscopy RIS-98, UMIST, 1998, eds. J. Vickerman, J.E. Parks (AIP Press 1999), p. 217-222 |
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| 60. | Sputtering of Atoms in Fine Structure States: A Probe of Excitation and De-excitation Events B.J. Garrison, N. Winograd, R. Chatterjee, Z. Postawa, A. Wucher, E. Vandeweert, P. Lievens, V. Philipsen and R.E. Silverans, Rapid Commun. Mass Spectrom. 12 (1998), 1266-1272 |
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| 59. | VUV Single Photon versus Femtosecond Multiphoton Ionization of Sputtered Germanium Clusters A. Wucher, R. Heinrich, R.M. Braun, K.F. Willey and N. Winograd, Rapid Commun. Mass Spectrom. 12 (1998), 1241-1245 |
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| 58. | Surface and Thin Film Analysis with Electron and Mass Spectrometric Techniques A. Wucher, Trends and New Applications of Thin Films (Proceedings of the 6th International Symposium on Trends and Applications of Thin Films TATF, 17-20 March 1998 in Regensburg), Ed. H. Hoffmann (TransTech Publications 1998), p. 61-84 |
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| 57. | Fragmentation lifetimes and the internal energy of sputtered clusters A. Wucher, N. Kh. Dzhemilev, I.V. Veryovkin and S.V. Verkhoturov, Nucl. Instr. Meth. B 149 (1998), 285-293 |
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| 56. | Experiment and Simulation of cluster emission from 5 keV Ar --> Cu Th. J. Colla, H.M. Urbassek, A. Wucher, C. Staudt, R. Heinrich, B.J. Garrison, C. Dandachi and G. Betz, Nucl. Instr. Meth. B 143 (1998), 284-297 |
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| 55. | Quantitation of Single Photon Ionization Laser SNMS M. Wulff, A. Wucher: "Secondary Ion Mass Spectrometry SIMS XI" (Proceedings of 11th International Conference on Secondary Ion Mass Spectrometry, Orlando, Florida 1997), Ed. G. Gillen, R. Lareau, J. Bennet and F. Stevie (Whiley, New York 1998), p. 665-668 |
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| 54. | Formation of Sputtered Semiconductor Clusters R. Heinrich, A. Wucher: "Secondary Ion Mass Spectrometry SIMS XI" (Proceedings of 11th International Conference on Secondary Ion Mass Spectrometry, Orlando, Florida 1997), Ed. G. Gillen, R. Lareau, J. Bennet and F. Stevie (Whiley, New York 1998), p. 949-952 |
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| 53. | Internal Energy of Sputtered Clusters: The Influence of Bombarding Conditions A. Wucher, A.D. Bekkerman, N. Kh. Dzhemilev, S.V. Verkhoturov, I.V. Veryovkin: Nucl. Instr. Meth. B 140 (1998), 311-318 |
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| 52. | Yields and Energy Distributions of Sputtered Semiconductor Clusters R. Heinrich, A. Wucher: Nucl. Instr. Meth. B 140 (1998), 27-38 |
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| 51. | Energy- and Angle-Dependent Excitation Probability of Sputtered Silver Atoms W. Berthold and A. Wucher: Phys. Rev. B 56 (1997), 4251-4260 |
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| 50. | High Frequency Electron-Gas Secondary-Neutral-Mass Spectrometry: Evaluation of Transient Sputtering Effects R. Krimke, H. M. Urbassek, A. Wucher: J. Phys. D:Appl. Phys. 30 (1997), 1676-1682 |
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| 49. | Metastable Excitation of Sputtered Silver Atoms A. Wucher and W. Berthold: Proceedings of the International Conference on Resonance Ionization Spectroscopy RIS-96, Penn State University, 1996, eds. N. Winograd, J.E. Parks (AIP Press 1997), p. 145-150 |
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| 48. | Formation of Metastable Excited States during Sputtering of Transition Metals A. Wucher and Z. Sroubek: Phys. Rev. B 55 (1997), 780-786 |
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| 47. | Cluster Formation in Sputtering: A Molecular Dynamics Study using the MD/MC-Corrected Effective Medium Potential A. Wucher and B.J. Garrison: J. Chem. Phys. 105, (1996), 5999-6007 |
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| 46. | Depth Profiling of Tantalum Oxide Layers by Laser-SNMS A. Wucher, W. Berthold and M. Wahl: Proceedings of the European Conference on Surface and Interface Analysis, Montreux, 1995, p. 260 |
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| 45. | Cluster Emission in Sputtering A.Wucher and M. Wahl: "Secondary Ion Mass Spectrometry SIMS X" (Proceedings of 10th International Conference on Secondary Ion Mass Spectrometry, Münster 1995), Ed. A. Benninghoven, B. Hagenhoff and H.W. Werner, Wiley 1997, p. 65-72 |
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| 44. | Population of sputtered Metastable Silver Atoms W. Berthold and A. Wucher: Nucl. Instr. Meth. B 115 (1996), 411-414 |
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| 43. | The Formation of Clusters during Ion Induced Sputtering of Metals A. Wucher and M. Wahl: Nucl. Instr. Meth. B 115 (1996), 581-589 |
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| 42. | Electronic Excitation during Sputtering of Silver Atoms W. Berthold and A. Wucher: Phys. Rev. Lett. 76 (1996), 2181-2184 |
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| 41. | Oberflächenanalytik mit dem Laser A. Wucher: Colloquia Academica (Akademie der Wissenschaften und der Literatur, Mainz), Franz Steiner Verlag Stuttgart 1995, p. 55 -91 |
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| 40. | On the Role of Molecular Fragmentation during Depth Profiling of Tantalum Oxide Layers by Laser SNMS A. Wucher, K. Franzreb, H.J. Mathieu and D. Landolt: Surf. Interf. Anal. 23 (1995), 844-848 |
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| 39. | Laterally Resolved Chemical Analysis of Solid Surfaces by Laser- SNMS W. Berthold and A. Wucher: Surf. Interf. Anal. 23 (1995), 393-398 |
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| 38. | Relative Elemental Sensitivity Factors in Non-Resonant Laser-SNMS M. Wahl, D. Koch, W. Berthold and A. Wucher: Fres. J. Anal. Chem. 353 (1995), 354-359 |
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| 37. | Rotational and vibrational excitation of sputtered silver dimers A. Wucher: Proceedings of the International Conference on Resonance Ionization Spectroscopy RIS-94, Bernkastel-Kues, Germany 1994, eds. H.-J. Kluge, J.E. Parks, K. Wendt (AIP Press 1995), p. 437-440 |
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| 36. | VUV photoionization of sputtered neutral silver clusters M. Wahl and A. Wucher: Nucl. Instr. Meth. B 94 (1994), 36-46 |
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| 35. | Electron impact and single photon ionization cross sections of neutral silver clusters D. Koch, M. Wahl and A. Wucher: Z. Phys. D 32 (1994), 137-144 |
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| 34. | The charge state of sputtered metal clusters A. Wucher, M. Wahl and H. Oechsner: SIMS IX (Proceedings of the SIMS 9 conference, Yokohama, Japan 1993),eds. A. Benninghoven, Y. Nihei, R. Shimizu, H.W. Werner, Whiley 1994, p.100-103 |
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| 33. | Detection of sputtered metastable atoms by autoionization A. Wucher, W. Berthold, H. Oechsner and K. Franzreb: Phys. Rev. A 49 (1994), 2188-2190 |
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| 32. | Yields of sputtered metal clusters: the influence of surface structure A. Wucher, Z. Ma, W.F. Calaway and M.J. Pellin: Surf. Sci. Lett. 304 (1994), L439-L444 |
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| 31. | Internal energy of sputtered metal clusters A. Wucher: Phys. Rev. B 49 (1994), 2012-2020 |
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| 30. | The mass distribution of sputtered metal clusters II. Model calculation A. Wucher: Nucl. Instr. Meth. B 83 (1993), 79-86 |
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| 29. | The mass distribution of sputtered metal clusters I. Experiment A. Wucher, M. Wahl and H. Oechsner: Nucl. Instr. Meth. B 83 (1993), 73-78 |
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| 28. | Sputtered Neutral Silver Clusters up to Ag18 A. Wucher, M. Wahl and H. Oechsner: Nucl. Instr. Meth. B 82 (1993), 337-346 |
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| 27. | Ro-Vibrational population of sputtered metal dimers: The influence of unimolecular decomposition A. Wucher and B.J. Garrison: Nucl. Instr. Meth. B 82 (1993), 352-355 |
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| 26. | Microanalysis of Solid Surfaces by Secondary Neutral Mass Spectrometry A. Wucher: Fres. J. Anal. Chem. 346 (1993), 3-10 |
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| 25. | Characterization of the Fluxes of Neutral and Positively Charged Clusters Produced by Argon Ion Sputtering of Silver K. Franzreb, A. Wucher and H. Oechsner: Z. Phys. D 26 (1993), 101-103 |
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| 24. | Formation of Neutral and Positively Charged Clusters during Sputtering of Silver K. Franzreb, A. Wucher and H. Oechsner: Surf. Sci. Lett. 279 (1992), L225-L230 |
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| 23. | Unimolecular Decomposition in the Sputtering of Metal Clusters A. Wucher and B.J. Garrison: Phys. Rev. B 46 (1992) 4855-4864 |
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| 22. | Energy Dependent Studies of Anisotropic Atomic Sputtering of Ni(111) A. Wucher, M. Watgen, C. Mößner, H. Oechsner and B.J. Garrison: Nucl. Instr. Meth. B67 (1992), 531-535 |
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| 21. | Internal and Translational Energy of Sputtered Silver Dimers: A Molecular Dynamics Study A. Wucher and B.J. Garrison: Nucl. Instr. Meth. B67 (1992), 518-522 |
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| 20. | Sputtering of Silver Dimers: A Molecular Dynamics Calculation Using a Many-Body Embedded-Atom Potential A. Wucher and B.J. Garrison: Surf. Sci 260 (1992), 257-266 |
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| 19. | Formation of Secondary Cluster Ions during Sputtering of Silver and Copper K. Franzreb, A. Wucher and H. Oechsner: Phys. Rev. B 43 (1991), 14396-14399 |
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| 18. | Saturation and Fragmentation in Non Resonant Laser Postionization of Sputtered Atoms and Molecules K. Franzreb, A. Wucher and H. Oechsner: Fres. J. Anal. Chem. 341 (1991), 7-11 |
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| 17. | Absolute Cross Section for Electron Impact Ionization of Ag2 K. Franzreb, A. Wucher and H. Oechsner: Z. Phys. D19 (1991), 77-79 |
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| 16. | Electron Impact Ionization of Small Silver and Copper Clusters K. Franzreb, A. Wucher and H. Oechsner: Z. Phys. D17 (1990), 51-56 |
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| 15. | Absolute Depth Profiling of Thin Film Systems by Low Energy Secondary Neutral Mass Spectrometry A. Wucher, H. Oechsner and F. Novak: Thin Solid Films 174 (1989), 133-137 |
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| 14. | Calibration of SNMS Depth Profile Analysis A. Wucher and H. Oechsner: "Plasma Surface Engineering", ed.E. Broszeit, W.D. Münz, H. Oechsner, K.-T. Rie, G.K. Wolf, DGM Informationsgesellschaft Verlag, Oberursel 1989, p. 737-738 |
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| 13. | Depth Scale Calibration During Sputter Removal of Multilayer Systems by SNMS A. Wucher and H. Oechsner: Fresenius J. Anal. Chem. 333 (1989), 470-473 |
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| 12. | Charakterisierung technischer Oberflächen für Anwendungen in der mittelständischen Industrie H. Oechsner, G. Bachmann, K.H. Müller and A. Wucher: VDI Technologiezentrum Physikalische Technologien, Statusseminar Dünnschichttechnologien Köln 1988, Tagungsband S. 4.1 |
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| 11. | Emission Energy Dependence of Ionization Probabilities in Secondary Ion Emission from Oxygen covered Ta, Nb and Cu Surfaces A. Wucher and H. Oechsner: Surf. Sci.199 (1988), 567-578 |
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| 10. | Energy dependent Ionization Probabilities for Atomic Secondary Ions A. Wucher and H. Oechsner: Secondary Ion Mass Spectrometry SIMS VI, ed. A. Benninghoven, A.M. Huber, H.W. Werner, Whiley & Sons, Chichester 1988, p. 143-146 |
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| 9. | Quantitation of Molecular SNMS Signals M. Kopnarski, A. Wucher and H. Oechsner: Secondary Ion Mass Spectrometry SIMS VI, ed. A. Benninghoven, A.M. Huber, H.W. Werner, Whiley & Sons, Chichester 1988, p. 849-852 |
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| 8. | Calculation of Post-Ionization Probabilities as a Function of Plasma Parameters in Electron Gas SNMS A. Wucher: J. Vac. Sci. Technol. A6 (1988), 2287-2292 |
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| 7. | Angular Distributions of Particles Sputtered from Metals and Alloys A. Wucher and W. Reuter: J. Vac. Sci. Technol. A6 (1988), 2316-2318 |
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| 6. | Plasma Studies on the Leybold-Heraeus INA 3 SNMS-System A. Wucher: J. Vac. Sci. Technol. A6 (1988), 2293-2298 |
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| 5. | Relative Sensitivity Factors in Secondary Neutral Mass Spectrometry SNMS A. Wucher, F. Novak and W. Reuter: J. Vac. Sci. Technol. A6 (1988), 2265-2270 |
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| 4. | Absolute Ionization probabilities in Secondary Ion Emission from Clean Metal Surfaces A. Wucher and H. Oechsner: Proc. of 21st Annual Conference of the Microbeam Analysis Society 1986, ed. A. D. Romig jr. and W. F. Chambers, San Francisco Press 1986, p. 79-81 |
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| 3. | Energy Distributions of Metal Atoms and Monoxide Molecules Sputtered from Oxidized Ta and Nb A. Wucher and H. Oechsner: Nucl. Instr. Meth. B18 (1987), 458-463 |
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| 2. | Quantitative Analysis of Thin Oxide and Nitride Layers on Tantalum by Sputtered Neutral Mass Spectrometry H. Oechsner and A. Wucher: Thin Solid Films 90 (1982), 327-328 |
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| 1. | Quantitative Analysis of Thin Oxide Layers on Tantalum by Sputtered Neutral Mass Spectrometry (SNMS) H. Oechsner and A. Wucher: Applicat. Surf. Sci. 10 (1982), 342-348 |