AFM Laboratory

Scanning force microscope Park Systems “XE-70”



Specification:

  • Scanning probe method with cantilevers
  • Modes: contact or non-contact
  • Imaging of topography and phases
  • Force-distance curves and lateral forces
  • XY- and Z-scanner separated
  • Sample size up to 100 x 100 mm
  • Stored on active vibration isolation platform Halcyonics „Micro 60“

Contact:
M. Farle
R. Meckenstock