AFM Laboratory
Scanning force microscope Park Systems “XE-70”

Specification:
- Scanning probe method with cantilevers
- Modes: contact or non-contact
- Imaging of topography and phases
- Force-distance curves and lateral forces
- XY- and Z-scanner separated
- Sample size up to 100 x 100 mm
- Stored on active vibration isolation platform Halcyonics „Micro 60“
Contact:
M. Farle
R. Meckenstock